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Product
8GB DDR4-3200 1GbX8 1.2V Samsung Chip
AQD-D4U8GN32-SE
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8GB, DDR 4 3200MHz, 30u" Gold Plating Thickness, Anti-sulfurization resistance, Unbuffered.
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Product
Error Detector Remote Head 32 and 17 Gb/s
N4952A
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The N4952A is an affordable and compact error detector remote head available in 4 to 17 Gb/s and 5 to 32 Gb/s configurations. Compatible with the N4960A Serial BERT controller, it is the perfect solution to test up to 32 Gb/s per channel for 100 Gigabit Ethernet applications and other high-data rate devices. The N4952A error detector supports PRBS or user patterns and operates up to 32 Gb/s in a single band with no gaps or missing data rates. The remote head allows the test equipment to be located very close to the device under test, eliminating the need for long cables that degrade signal quality.
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Product
16GB ECC DDR5-5600 2GX8 1.1V SAM
AQD-D5V16GE56-SB
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SAM Original Chip, Anti-sulfuration, PCB: 30μ gold finger. Independent Power Management IC build-in, ECC function support.
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Product
MTM-Bus Tester
PXIe-1149.5
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The Corelis PXIe-1149.5 is a versatile, multi-mode instrument for interfacing with MTM-Bus modules. The PXIe-1149.5 adds MTM-Bus master, slave, and monitoring with full IEEE-1149.5 electrical and protocol compatibility with a standard PXIe interface for convenient integration into any Test Program Set (TPS).
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Product
KVS Rugged Igniter Tester With Current Monitor
4314
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The Valhalla Scientific Model 4314 KVS Digital Igniter Tester is designed to provide extremely safe and reliable resistance testing of explosive or volatile devices. Proven uses include fuses, squibs, igniters, explosive bolts, automobile airbag initiators and many others.
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Product
Hoist Tester
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The system has the capability of operating hyraulic powered hoists, DC powered hoists and 400Hz AC powered hoists. When a unit is connected to the system it is automatically detected and the system will load the unit's control software, acceptance procedures and operational safety limits. By doing all of this the operator does not need to worry about anything other than installing the unit and clicking Run to execute a full test procedure.
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Product
16GB SO-DDR5-5600 2GX8 1.1V SAM
AQD-SD5V16GN56-SB
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SAM Original Chip, PCB: 30μ gold finger, Anti-sulfuration, On-die ECC for Enhanced RAS, Operating Temperature: 0°C ~ 85°C.
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Product
4G DDR4-3200 512X16 1.2V SAM -20~85℃
AQD-SD4U4GN32-SP2
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SAM Original Chip, Industrial Design for Improved Reliability, PCB: 30μ gold finger. Anti-sulfuration, Semi Wide-temp Support -20~85℃.
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Product
Bit Error Rate Tester - PXI
BERT 1001/1005 Series
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The BERT is 2 or 4-channel PPG and Error Detector for the design, characterization and production of optical transceivers and opto-electrical components at data rates up to 30 Gb/s.With scalability and exceptional signal fidelity, it is a cost effective test solution for 400 Gb/s communication eco-systems.
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Product
Micron 8G DDR4 3200 288PIN 1GbX8 REG 1.2V
96D4-8G3200ER-MI
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DDR4-3200 Registered ECC DIMM, 1.2V power consumption, Supports ECC error detection and correction. Data bus inversion (DBI) for data bus, Low-power auto self refresh (LPASR).
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Product
4G DDR4 2400 288Pin 512MBX8 1.2V Registered Samsung Chip
AQD-D4U4GR24-SG
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DDR4-2400 Registered DIMM. – standard height, 30μ" gold plating thickness (IPC-2221 Standard) 1.2V power consumption. Low-power auto self- refresh (LPASR) Provides better reliability, availability and serviceability (RAS) and improves data integrity.
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Product
32GB DDR4-3200 2GbX8 1.2V Samsung Chip
AQD-D4U32GN32-SB
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32GB, Speed 3200MHz, 30u" Gold Plating Thickness, Anti-sulfurization resistance, Unbuffered.
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Product
16G R-DDR4-3200 1GX8 1.2V Samsung Chip -40~85C
AQD-D4U16R32-SEW
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Registered DIMM, 30u" Gold Plating Thickness, Anti-sulfurization resistance. 1.2V power consumption, Samsung original chip, wide temperatures from -40° to 85°C.
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Product
8GB SO-DIMM DDR5-5600 262Pin 1GX16 1.1V Unbuffered Hynix Chip
AQD-SD5V8GN56-HC
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Hynix Original Chip, Increased Banks and Burst Length, DDR5 5.6GT/s. Same-Bank Refresh, On-die ECC for Enhanced RAS.
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Product
16GB SO-DDR4-3200 1GbX8 1.2V Samsung Chip
AQD-SD4U16GN32-SE
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16GB, Speed 3200MHz, 30u" Gold Plating Thickness, Anti-sulfurization resistance, Unbuffered.
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Product
16GB DDR5-5600 2GX8 1.1V SAM
AQD-D5V16GN56-SB
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SAM Original Chip, PCB: 30μ gold finger, Anti-sulfuration, On-die ECC for Enhanced RAS, Operating Temperature: 0°C ~ 85°C.
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Product
32GB R-DDR5 5600 R-Dimm 2GX8 1.1V SAM
AQD-D5V32GR56-SB
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SAM Original Chip, Industrial Design for Improved Reliability, Compatible with server platform, 30u” golden finger, Operating Temperature: 0°C ~ 85°C.
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Product
IP-Reflective Memory
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Each IP-ReflectiveMemory can be used as a standard node or as the Master Node. Clearly labled "DIP Switches" are provided to make the selection of Master or Standard Node, and the Node Address. The Network is based on using LVDS signaling over Ethernet cabling. Nodes automatically come up for pass through operation.
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Product
Memory Burn-In Tester
H5620/H5620ES
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H5620 contributes to reduction of test cost by integrating the test process of DRAM Burn-in and Core Test. This hybrid memory test solution solves the challenge of reducing test costs while increasing test efficiency in the expanding DRAM market.
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Product
8GB SO-DDR4-3200 1GbX8 1.2V ECC Samsung Chip
AQD-SD4U8GE32-SE
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8GB, Speed 3200MHz, 30u" Gold Plating Thickness, Anti-sulfurization resistance, ECC.
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Product
Memory Recorder
MR8847A
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High-speed 20MS/s, 16-channel, Fully Isolated Memory Recorder for On-site Jobs and R&D
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Product
Memory
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Renesas offers MIL-STD-883-compliant CMOS random access memory (RAM) and CMOS programmable read-only memory (PROM) devices that are that are qualified to QML Class Q military standards.
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Product
CXL Memory
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SQRAM launches next-gen CXL 2.0 Memory Expansion, offering high-speed, low-latency performance to meet the needs of large AI training and HPC clusters.
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Product
120 GBd High-performance BERT
M8050A
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The Keysight M8050A high-performance bit error ratio tester (BERT) enables accurate characterization of receivers used in next-generation data center networks and server interfaces. With uncompromised signal integrity, support for NRZ, PAM4, PAM6, and PAM8 signals, and data rates up to 120 GBd, the flexible architecture of the M8050A supports 1.6T pathfinding as well as other leading-edge technologies.
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Product
DRAM Memory Module DDR3 Memory
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Deliver stable memory technology with Advantech! We offers DDR3 1866/1600/1333 memory with 30μ" gold plating connector (240 pin) featuring 1.35v/1.5v low operating voltage and better bandwidth. With rigorous reliability, vibration tests, and 0 ~ 95℃ (32 ~ 203℉) wide operating temperature range, our certified DIMM is suitable for edge computing, enterprise, embedded, automotive, data centers, and networking applications.
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Product
Memory Test System
T5833/T5833ES
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T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
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Product
SODIMM DDR4 3200MT/s
SQR-SD4S
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Original Hynix IC chips adopted, Data transfer rate: 3200MT/s. Capacity: 4/8/16/32GB, Operating temperature: 0 °C ~ 85 °C Lifetime warranty.
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Product
Automated Memory Analyzer
Volatility
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Volatility has become the world’s most widely used memory forensics platform. The project is supported by one of the largest and most active communities in the forensics industry. Volatility also provides a unique platform that enables cutting edge research to be immediately transitioned into the hands of digital investigators. As a result, research built on top of Volatility has appeared at the top academic conferences and Volatility has been used on some of the most critical investigations of the past decade. It has become an indispensible digital investigation tool relied upon by law enforcement, military, academia, and commercial investigators throughout the world.
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Product
64 Gbaud High-performance BERT
M8040A
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The Keysight M8040A is a highly integrated BERT for physical layer characterization and compliance testing. With support for PAM-4 and NRZ signals and data rates up to 64 Gbaud (corresponds to 128 Gbit/s) it covers all flavors of 200 and 400 GbE standards.
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Product
8GB DDR4 SODIMM-3200 1GbX8 SAM
AQD-SD4U8GN32-SE
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DDR4 3200Mhz Unbuffered SO-DIMM, 30u" Gold Plating Thickness, Anti-sulfurization resistance, 1.2V power consumption. Samsung original chip, 100% tested for stability, compatibility and performance.
