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Product
Advanced SoC Test System
3680
Test System
The Chroma 3680 is an advanced SoC test system with data rate up to 1Gbps. The Chroma 3680 is capable of conducting parallel tests on multiple chips to meet the digital and analog IC testing requirements, with applications including MCU, digital audio, digital TV, set-top box, DSP, network processor, field programmable gate array (FPGA) and consumer electronics.
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Product
EMI Test System
TS9975
Test System
The R&S®TS9975 is the base system for conducted and radiated EMI measurements. Due to its modular design, it covers a wide range of applications and can be very easily adapted to the measurement task at hand. Any configuration is possible – from conducted measurements and the small precompliance system with a compact test cell to the accredited test system for large equipment under test. Combinations of different applications or incremental expansion are easily possible.
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Product
Test System Replication/Build-to-Print
Test System
Need to manufacture test stations? For more than 15 years we have sourced, assembled, tested and shipped fleets of robust, cost-effective solutions. We produce them at our high-volume facilities and deploy them around the world.
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Product
Computing VITA System
CRS 48.5
System
The CRS 48.5 is a complete, integrated, pre-tested, ready-to-run HPEC rugged subsystem enabling faster development/deployment at lower cost and risk using the most advanced VITA 48.5 compliant air-flowthrough cooling to allow the integration of up to eight quad core Intel® Core™ i7 processing nodes.
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Product
Antenna Test System
ATS1000
Test System
Offering measurements on active and passive devices - supporting also extreme temperature testing. 5G is all about data, speed and reliability using high frequency millimeter wave bands. The lack of conventional external RF connectors makes 5G antenna characterization challenging. 5G antenna, chipset and UE manufacturers as well as wireless market operators need a viable solution for research, diagnostics and debugging up to type approval.
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Product
FMV Compression System
daq8580
System
The Daq8580 is designed to address the challenges of processing, transporting and storing full motion video through video encoding, and can interface with a wide variety of analog and digital I/O and process standard video formats up to 1080p30 as well as computer resolutions up to 1600x1200.
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Product
Mezzanine System Carrier
MMS8010 / MMS8011
System
The Abaco ECM 3U VPX carrier supports up to six Abaco Systems Electrical Conversion Modules (ECMs) in a VITA 46 VPX form factor. Each ECM site connects 32 single-ended 3.3 V signals to the FPGA. The specific ECM board installed on a site converts the FPGA signals to 16 I/O signals, for a total of 96 I/O signals across the six ECM sites.
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Product
HV Test System for Patient Monitors
Test System
HV test enclosure for testing medical products (patient monitors). Insulated test booth with large space for DUT.3 different test nests for adapting different devices.Displays from patient monitors are checked. For this, insulation tests and leakage current measurements must be carried out. Ensuring the standard-compliant test. For the safety of the operating personnel, the test cell is electrically locked while the high voltage measurement is active.
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Product
Mezzanine System
5147
System
ECM P/N 5147 provides two channels of 12 bit A/D conversion using the Analog Devices AD9235, and is suitable for medium resolution high speed applications. The two differential inputs are terminated in 120 ohms and buffered with a gain of 1 differential amplifier. Differential Input range is +/-3.0V. Sample rates are 20MHz per channel with a 5MHz 4 pole elliptical analog input filter.
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Product
Validation System
FLEX BMS
System
The FLEX BMS™ Validation System is a quick-connecting, highly flexible test system for rapid evaluation of centralized, single-board and distributed battery management systems. Utilizing Bloomy’s industry-leading battery cell simulators, COTS instrumentation, industry-standard connectors, and models that run in real-time, the FLEX BMS™ Validation System can easily be reconfigured to test a wide variety of BMSs. The FLEX BMS™ Validation System is used by national and regional safety and standards labs for certifying the BMS for a wide array of e-mobility products and applications.
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Product
VLSI Test System
3380
Test System
The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexable architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-test tendency.
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Product
NI-9217, 4-Channel, 400 S/s Aggregate, 0 Ω to 400 Ω, PT100 RTD C Series Temperature Input Module
779592-01
Temperature Input Module
4-Channel, 400 S/s Aggregate, 0 Ω to 400 Ω, PT100 RTD C Series Temperature Input Module - The NI‑9217 is a resistance temperature detector (RTD) input module. You can configure the NI‑9217 for two sample rate modes: high sample rate or high resolution. The NI‑9217 is compatible with 3‑ and 4‑wire RTD measurements, and it automatically detects the type of RTD (3‑ or 4‑wire) connected to the channel and configures each channel for the appropriate mode. The module provides per channel current excitation. The NI‑9217 features calibration and includes a channel‑to‑earth ground double isolation barrier for safety, noise immunity, and a high common-mode voltage range.
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Product
PXI Test System Dev, Debug & Monitor Software
InstrumentStudio
Test System
InstrumentStudio is free application software that provides an integrated approach to interactive PXI measurements. InstrumentStudio helps you to unify your display, export instrument configurations to code, and monitor and debug your automated test system. You can view data on unified displays with large, high-resolution monitors, and then capture multi-instrument screenshots and measurement results.
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Product
Edge AI HPC System
AIR-500D
Edge AI Inference System
Edge AI HPC system powered by Intel® Xeon® D-1700 Series processors with support for up to 4 PCIe slots. Intel® Xeon® D-1700 series processor 4x DDR4 SO-DIMM sockets support ECC/nonECC memory up to 128GB.
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Product
Universal Test System
LEON System
Test System
A universal ICT, FCT, ISP and Boundary Scan platform.Based on the ABex platform, which directly integrates Konrad analog bus technology and PXI/PXIe in one chassis, the LEON platform can be configured to solve various test challenges. Due to this architecture only one system provides the complete test flow combining ICT, ISP, Boundary Scan and FCT.Various form factors and configurations allow a perfect combination between cost, speed and test coverage. The modular architecture provides the possibility to reconfigure or upgrade the systems based on your test needs.The LEON System software provides a powerful development and test execution environment which directly supports NI TestStand. All systems and components could be integrated into third party software using supplied APIs.
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Product
Communications Test System for Frontline Diagnostics
CTS-2750
Test System
The CTS-2750 is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The field-upgradeable, software-defined architecture features easy-to-use graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets can be created easily using the included TestEZ® software suite.
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Product
Memory Test System
T5833/T5833ES
Test System
T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
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Product
Modular Breakout System 8-Pin Power D-type Plugin Module
95-191-002
Modular Breakout System
The 95-191-002 Plugin Breakout Module is designed to be fitted to a PXI 40-191 Fault Insertion Switch as part of the Pickering MBoS. The Modular Breakout System is designed to Simplify HILS (Hardware In the Loop Simulation) Applications.
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Product
Memory Test System
T5851/T5851ES
Test System
The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.
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Product
Modular Breakout System 37-Pin D-type Plugin Module for 40-293
95-293-001
Modular Breakout System
The 95-293-001 Plugin Breakout Module is designed to be fitted to a PXI 40-293 Programmable Resistor Module as part of the Pickering MBoS. The Modular Breakout System is designed to Simplify HILS (Hardware In the Loop Simulation) Applications.
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Product
Scienlab Battery Test System – Pack Level, 220 KW
SL1730A
Test System
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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Product
Mezzanine System
5174
System
The 5174 provides two major functions, serving as a precision Voltage Controlled oscillator board and a variable frequency source board. These features can be use together or independently. As a variable frequency source, the 5174 provides a high-resolution variable clock source that is based upon a reference clock supplied by the ECM carrier.
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Product
NI-9213, 16-Channel, 75 S/s Aggregate, ±78 mV C Series Temperature Input Module
785185-02
Temperature Input Module
16-Channel, 75 S/s Aggregate, ±78 mV C Series Temperature Input Module - The NI‑9213 is a high-density thermocouple input module that is designed for higher channel count systems. With this module, you can add thermocouples to mixed-signal test systems without taking up too many slots. The NI‑9213 includes anti-aliasing filters, open-thermocouple detection, and cold-junction compensation for high-accuracy thermocouple measurements. The NI‑9213 features NIST‑traceable calibration and a channel‑to‑earth ground double isolation barrier for safety, noise immunity, and high common-mode voltage range.
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Product
CATR Benchtop Antenna Test System
ATS800B
Test System
Very compact far-field over-the-air (OTA) test system based on compact antenna test range (CATR) technologyUnrivaled quiet zone size within 0.8 m2 footprintState-of-the-art reflector ensuring a high quiet zone accuracyUnique benchtop CATR system supporting over 50 GHzIndirect far-field method (approved by 3GPP for 5G OTA testing)
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Product
Enclosed Fanless Industrial Embedded Computer with NXP® i.MX8M Application Processor
SYS-444Q
Computer System
The SYS-444Q is a rugged enclosed fanless embedded computer system with NXP’s i.MX8M industrial application processor with quad-core Arm Cortex®-A53 for low-power processing. This rugged system has dual Ethernet, industrial I/O, expansion options, TPM 2.0 hardware security, and options for wireless connectivity. The processor supports industry-leading video processing along with an M4 microcontroller for real-time subsystems making it an ideal fit for industrial IoT applications requiring highly reliable performance in harsh conditions such as digital signage, industrial automation, energy management, building automation, and others.
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Product
System Integration
System
G Systems develops fully integrated systems and we know that both software and hardware are equally important to system design. Our focus on code quality and optimization ensures customers receive efficient and maintainable code. We specialize in LabVIEW development and all of our LabVIEW developers are certified developers or architects. We’re also highly skilled in mechanical and electrical hardware design and builds on a wide variety of data acquisition, signal conditioning, RF, and distributed communication platforms.
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Product
Laser Diode Reliability Burn-In / Life-Test System
58602
Test System
Chroma 58602 is a high density, precision multi source measurement Unit (SMU) module with temperature control and exchangeable interface developed for burn-in, reliability and life test of optoelectronic components including laser diodes, VCSELs, VCSEL Arrays, silicon Photonics, photo-diodes and other similar components.
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Product
Mini LED Backlight Module Automatic Optical Test System
7661-K003
Test System
Chroma 7661-K003 Mini LED Backlight Module Automatic Optical Test System contains a 71803-2 2D color analyzer to measure chromaticity and brightness
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Product
Photonics Module Test System
58625
Test System
Chroma 58625 provides characterization testing for 3D sensing illumination devices. various test modules are combined for validation testing under precise temperature control.
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Product
4-Module ICT System, I307x Series 6
E9903G
In-Circuit Test System
Test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides those improvements built upon a proven technology foundation. With time-tested software, hardware, and programmability, the Series 6 are fully backward compatible with previous systems, and they make highly repeatable measurements.
