Server Test
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Product
Video QoS Monitoring Web Management Software
TSM Web
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The TSM Web is a web service program for managing Mividi Video Monitoring Systems or Multiviewer Systems. It provides an Internet gateway to Mividi Video Monitoring servers in order to remotely access test results and configure the test servers using the Internet.
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Product
End-to-End Testing of Location Based Services Software
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LBS Tester provides an end-to-end test bed for Mobile Network Operators and Network Equipment Manufacturers, to verify the accurate implementation of the location services network. The LBS Tester tests that the Location Server (System Under Test) is correctly executing the positioning procedures over the control plane and/or user plane of that network. To test normal signaling, or failure scenarios, over the LTE User Plane as the number of SETs (SUPL Enabled Terminals) simulated by the LBS Tester increases, the Location Server must execute LPP (Location Positioning Protocol) procedures over SUPL (Secure User Plane Protocol) with success, or without, respectively.
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Product
Time Shift Test Java Applications w/in a WebLogic Managed Server
Time Machine Framework for WebLogic
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The Time Machine Framework for WebLogic provides a great set of features enabling time shift testing scenarios for Java applications deployed to Oracle WebLogic. This Framework enables customers to use Time Machine functionality to time shift test Java applications within a WebLogic managed server without the need to create a separate instance of the application server for testing other time related activities. The Framework allows customers to configure and automatically create different virtual clocks on managed servers within the WebLogic domain as well as the granularity to establish virtual clock rules for specific applications deployed to the managed server.
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Product
Test Database Software Module
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The relational test database is the pivotal point of the software structure. On one hand, this is where the test applications and test systems used for productive testing are stored; on the other hand, it provides the storage space for all DUT-related test data. Depending on customer requirements, the test database may either be hosted locally on the test system or centrally on a server, supporting several test systems. The database performance is sufficient for a high-volume production environment with many test systems which access the central database in parallel. LXinstruments prefers to implement the database as a license-free MySQL database; it is however also possible to realize a version based on Microsoft SQL.
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Product
Service Assurance Remote Probe for IPTV, OTT, VoiP & Internet
µNET
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The μNET is a palm size probe for testing and monitoring Triple-Play services (IPTV, VoIP, Internet) at the customer set top box or the last mile concentrator (ie.GPON mux). Multiple μNET probes can be used throughout the IPTV network on a temporary or permanent basis. Test results are sent to the external FTP server. All tests are performed in a cycle set up by the user.
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Product
API Testing with LoadView
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Simulate 1,000s of users hitting your API every second to generate 100,000+ calls to your server per load testing session.Define your API tests to simulate traffic at the pace you need by implementing a load curve that increases the number of simultaneous users as necessary to properly test your system.Gather performance metrics consisting of the response times of each session and validation that the API returns the expected results in each response.Visualize how the average response time is affected as you increase the number of simultaneous users.Examine individual test sessions to see error codes and utilize additional troubleshooting tools such as traceroutes, waterfall charts and a copy of the server response.
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Product
9U Blade Server for 12 Blades with Dual Fabric Switch Slots
cPCIS-3300BLS
Blade Server
- PICMG® 2.16 Packet Switching Backplane architecture- Dual PICMG® 2.16 fabric slots for high availability- 21 slots, including 12 node slots, two fabric slots, three redundant 6U CompactPCI® power modules and one CMM slot- Hot swappable 800 W + 400 W redundant CompactPCI® power supply with universal AC input
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Product
3U CompactPCI Serial 2.5" SATA Storage Carrier
cPCI-A3H10
Blade Server
- 3U 4HP CPCI-S.0 peripheral- One 2.5" SATA 6Gb/s drive slot- Status LEDs on faceplate: drive activity, hot-swap status, user-configurable- Hot swap support- Operating temperature: -40°C to 85°C with qualified com
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Product
Testing Service
CloudTesting™ Service
test
CloudTesting™ Service is an Industry First, On-Demand Testing Service. CloudTesting™ Station is free rent. Fees for Testing IP are paid monthly.
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Product
1U 19” Edge Server With 4th Gen Intel® Xeon® Processor Scalable Family Processor
MECS-7120
MEC Server
- 1U 19” Edge Server with 4th Gen Intel® Xeon® Processor Scalable Family Processor- 6x DDR5 DIMMs, 4800MT/s (6 channels, 1DPC)- On-board 2x 25G SFP28 Ethernet ports- 1U 19’’ rackmount form factor for telecom infrastructure deployment- RunBMC with AST2600, IPMI v2.0/Redfish compliant- Optional clock module to provide time sync from GNSS- Designed for 5G: DU, DU+CU, DU+CU+MEC, MEC, uCPE, industrial edge computing
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Product
Semiconductors Testing
test
Our Testers support the production lines of variety of products such as 40/100 GBps Mux/DeMux, LNA, WiMAX RF Transceivers, Microwave & Millimeter Wave components. This high reliability products are being used in (a) Networking & Communications (b) Consumer Electronics (c) Military & Space
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Product
Wafer-Level Parametric Test
test
Wafer-level reliability engineers need to reduce test time without sacrificing measurement quality and accuracy.
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Product
W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
test
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Product
Wireless Device Functional Test Reference Solution
Functional Test
The Keysight S8890A Wireless Device Functional Test Reference Solution provides an automation environment which is both simple to use, yet comprehensive and powerful. Based on the Test Automation Platform www.keysight.com/find/TAP, S8890A provides optional instrument driver/plug-ins offering simplified logically grouped control steps. These steps can be sequenced, looped and swept to provide powerful individual test cases or comprehensive sequences. Each driver/plug-in is provided with extensive starter sample test cases which can be modified by Keysight or the end user the UE to be tested. Plug-in options:
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Product
Configurable Functional Test System
ATS-5000
Test System
Maximize the uptime of your most critical electronics with the ATS-5000 Functional Test System from Astronics Test Systems. Deployed globally for more than 20 years, the newest version of this tester provides a configurable, affordable solution that delivers just enough test.
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Product
In-Line RF Test Platform
AR925
Test Platform
This functional and RF test platform combines outstanding productivity with substantial equipment savings. The Faraday chamber of the fixture comes with an interchangeable cassette to minimize the testing cost of each new product
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Product
Design for Testability (DFT Test)
test
Corelis can provide you with design consultation and an analysis of your design for boundary-scan testability. We will review your design and make specific recommendations that if implemented will improve the testability. We can also suggest improvements that will increase test coverage and allow boundary-scan to be implemented in a more cost-effective manner.This service also includes a DFT test coverage analysis that we recommend to do after schematic capture and before PCB layout. At this stage of product development, Corelis provides you with a comprehensive test coverage reports that identifies all of the boundary-scan nets and pins and classifies them as completely tested, partially tested, or not tested. The report also recommends where to add test points (pads) for physical “nails” access if additional test coverage is required.
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Product
Multiple Module Serial Bus Test Instrument
Bi4-Series
Test Instrument
The wide variety of serial buses used in defense and aerospace applications typically requires multiple single-purpose instruments. Too often, they are difficult to reconfigure in order to test a different application.The Bi4-Series provides all the capabilities needed for complete communications bus access test for up to four serial buses used in board level (SRA/SRU) and box level (WRA/LRU) equipment—all in a single VXI module.The instrument includes test applications, industry-compliant software drivers and hardware enabling straightforward integration into automatic test systems.With the configuration flexibility needed to effectively test every bus format used in defense and aerospace applications, the Bi4-Series instrument plays a key role in reducing implementation time and test system cost.
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Product
EBIRST 200-pin LFH To 96-pin SCSI Adapter Cable
93-002-226
Test Adapter
eBIRST adapters allow extension to other switching system connectors, including SMB
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Product
Test System
UltraFLEX
Test System
The UltraFLEX test system delivers the power and precision you need for complex SoC devices built for mobile applications, networking, storage or high-end processing. Choose UltraFLEX when your device mix and throughput goals demand the highest speed, precision, coverage and site count.
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Product
Advanced SoC/Analog Test System
3650-EX
Test System
Chroma 3650-EX is specifically designed for high-throughput and high parallel test capabilities to provide the most cost effective solution for fabless, IDM and testing houses.
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Product
Test System Optimized for High Throughput, Low Cost of Test for Single Site, Multi-site and Index Parallel Applications
ETS-88RF
Test System
Targeting the needs of power amplifier (PA) and front-end-module (FEM) semiconductor manufacturers, the ETS-88RF test system is aligned with the test challenges associated with these direct RF radio wave interface components. The precision with which the ETS-88RF can measure high-gain, wideband frequency performance, adjacent channel leakage and power supply efficiency makes this test system the most cost-effective alternative to bench set-ups. Teradyne routinely provides timely updates to a substantial library of RF Standards (such as 802.11xx and 3GPP) targeted for PA and FEM test.
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Product
Manual Test System for ICT & ISP with Integrated ABex and up to 426 Test Points
LEON Fixture
Test System
The LEONFixture is the ideal ICT and ISP solution for small and cost sensitive applications. This manually operated test system combines optimal ergonomics with high performance, durability and precision, ensuring your investment over the long term. The LEONFixture features a test system integrated in a manual base fixture. The system is designed to be used with an Ingun ATS MA13 insert which could be customized by a lot of fixture houses all over the world.As part of the LEON Family, LEONFixture is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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Product
PXI Semiconductor/IC Test System
Test System
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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Product
Asynchronous System Level Test Platform
Titan
Test Platform
The Titan System Level Test (SLT) platform delivers maximum flexibility, scalability and density in semiconductor test environments that require the highest levels of system performance testing. Titan is Teradyne’s solution for high-volume mobile application processor SLT requirements.
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Product
Universal Test System
LEON System
Test System
A universal ICT, FCT, ISP and Boundary Scan platform.Based on the ABex platform, which directly integrates Konrad analog bus technology and PXI/PXIe in one chassis, the LEON platform can be configured to solve various test challenges. Due to this architecture only one system provides the complete test flow combining ICT, ISP, Boundary Scan and FCT.Various form factors and configurations allow a perfect combination between cost, speed and test coverage. The modular architecture provides the possibility to reconfigure or upgrade the systems based on your test needs.The LEON System software provides a powerful development and test execution environment which directly supports NI TestStand. All systems and components could be integrated into third party software using supplied APIs.
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Product
IOL & Power Cycling Test Systems
Test System
Our IOL & power cycling systems increase measurement quality and throughput and reduce testing costs on an open platform. The focus is on seamless monitoring and precise determination of all parameters of each DUT. In addition, the systems are equipped for the special requirements of wide-bandgap technology.
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Product
Iridium Physical Layer Test Systems
PLTS
Test System
Averna has worked with Iridium to ensure you have the right equipment to support their test coverage. The Iridium PLTS verifies product performance to Iridium’s standards. Find out more!
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Product
Digital Test Instrumentation
EDigital-Series™
Test Instrument
Teradyne’s eDigital IVI driver controls all parallel digital functional test parameters, including per-pin timing, data formats, pattern data, and timing alignment on 64 channels (32 static + 32 dynamic or 32 differential)—each with an 8M pattern depth and results memory.
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Product
Flexible Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131E
test
Achieve phase stability with this 96.5-cm cable when a DUT is connected, with adapter, directly to the test set port
