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Product
Universal OTP Functional Test System for the Production of Level and Fluid Sensors
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Multifunctional function tester with parallel test function based on the LXinstruments OTP2 system platform. The system is used for assembly, final test and calibration of liquid and level sensors for commercial vehicles, construction machinery and shipbuilding in a high mix / medium volume environment.
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Product
3U CompactPCI Serial MXM GPU Carrier Card
cPCI-A3MXM
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- Follow PICMG® CompactPCI® Serial design guide- CompactPCI® Serial, 3U 4HP/8HP (100mm x 160mm)- Compatible with MXM Type A (82 mm x 70 mm) or Type B (82 mm x 105 mm)- Support NVIDIA A1000 with 2048 CUDA® cores, 16 RT Cores and 64 Tensor Cores or NVIDIA RTX™ A4500 with 5888 CUDA® cores, 46 RT Cores and 184 Tensor Cores- 4x DisplayPort 1.4, support 4K (3840x2160) resolution- Operating temperature: -40°C to +70°C- Designed to meet EN50155 standards
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Product
VLSI Test Systems
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50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
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Product
Functional Test
UTS
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The UTS functional test system is perfect for electronics manufacturing operations that have a mix of products where operators load and unload devices under test (DUT) and routinely change out fixtures for each type of DUT.
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Product
Dynamic Digital I/O With Per Channel Timing, Programmable Logic Levels And PMU PXI Card
GX5296
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The GX5296 offers advanced dynamic digital I/O performance and capabilities in a single slot, 3U PXI format. The 32-channel, GX5296 features timing per pin, multiple time sets, data formatting, and an advanced sequencer – providing users with the capability to emulate and test complex digital busses for system, board or device test applications. Offering sub-nanosecond edge placement resolution per pin and a PMU per pin, the GX5296 has the ability to perform both DC and AC parametric testing. Each digital channel can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and load value (with commutation voltage level). In addition, each channel offers a parametric measurement unit (PMU) providing users with the capability to perform parallel DC measurements on the DUT (device under test).
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Product
In-Circuit Test System
TestStation LX
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TestStation LX is a cost-effective in-circuit test solution providing high-volume electronics manufacturers with reliable, high-quality test for the latest printed circuit board assembly technologies.
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Product
Mini LED Backlight Module Automatic Optical Test System
7661-K003
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Chroma 7661-K003 Mini LED Backlight Module Automatic Optical Test System contains a 71803-2 2D color analyzer to measure chromaticity and brightness
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Product
Universal Function Test System for Industrial Electronics
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General functional test system based on LXI instrumentation for high mix / low to medium volume manufacturing. DUTs are tested which are mainly used as communication and measurement modules in power plant technology, grid management and electrical drives.The system has a Virginia Panel adapter interface to which various desk adapters can be docked, including automated contacting of the DUTs. A camera for the verification of light emitting diodes on the test object is integrated in the adapter interface.
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Product
High Throughput Test Platform for Multi-Site & Index Parallel Applications
ETS-88
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The ETS-88 is an optimal test platform for testing a wide variety of devices including: simple analog, high precision, high voltage, high current / power, automotive, video, audio, complex mixed-signal, as well as emerging power processes like SiC and GaN.
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Product
SoC Test System
V93000 SoC / Smart Scale
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Advantest’s V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. The user benefits are reduced test time, best repeatability and simplified program creation. The system design makes it easy to extend your configuration with new modules and instrumentation, as your test needs change.
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Product
In-Line Test Fixture for 6TL33/6TL36
AB799/AT799
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Fixture Kit for Platforms featuring receiver Virginia Panel 9025 and external pusher system. Its heavy duty design supports more than 1.000N.nnThe fixture kit includes the Base fixture (probe plate) as well as the Puhsers plate.
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Product
Power Line Communication (PLC) Module For Single Board Computer
MIOe-PLC
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Dual QCA7006 for EVSE / Charging Station sideEthernet Host Interface, SPI OptionalExtended Operating Temperature -40~85° C
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Product
Image Sensor Test System
IP750
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Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
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Product
EOL RF Functional Test
AS652
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With this RF test platform, integrable according to the specific needs of the product, we cover a very wide range of test needs with manual feeding.Ergonomics have been fully observed in the design, including the option of servo adjustment of the working height according to the operator.
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Product
3U CompactPCI® Single 64-bit PMC Slot Carrier Board
cPCI-8301
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- PICMG® 2.0 32,64-bit/33,66 MHz cPCI bus- Supports one single-size 32,64-bit/33,66 MHz PMC site in 4HP width- Universal V(I/O) decided by backplane- Comprehensive EMC shielding
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Product
3.5" Single Board Computer
RSB-4680
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RSB-4680 is a RISC 3.5" single board computer (SBC) powered by a high-performance Rockchip ARM Cortex-A17 RK3288 processor which supports 4K display from HDMI. It offers rich interfaces such as 6 USB2.0, 6 UART, 1 VGA, 1 LVDS, 1 GbE and 8 GPIO. RSB-4680 also features Mini-PCIe, M.2, and SIM card slots for integrating Wi-Fi, Bluetooth, and 3G/4G modules. It is an ideal solution for Kiosk, POS, and Vending machine application.
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Product
Control Board For Testing PCBs
TCC 1800
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The TCC1800 Test Controller Card is a generic control board for production testing of printed circuit boards (PCBs). The board is controlled by a command language on a PC to which it is connected via a galvanically separated USB interface. The TCC1800 is designed to work with positive voltages up to 24V. All inputs and outputs are protected against higher voltages however. The card provides basic IO: Analog and digital interfacing, counters, PWM outputs, bidirectional I/O, Serial (UART) and I2C interfacing.
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Product
PICMG 1.3 Full-Size SBC With 14/13/12th Gen Intel® Core™ Processors And Intel® Q670E Chipset
NuPRO-E47
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The NuPRO-E47 is a high-performance embedded single board computer that features with 14/13/12th Gen Intel® Core™ i7/i5/i3 processor and an Intel® Q670E Express chipset, which supports PCIe Gen 3. It comes equipped with 2 DIMM sockets that can support up to 64GB of Non-ECC DDR5 memory running at 4800MHz. The NuPRO-E47 also includes 6 SATA 3.0 ports with RAID support and 4 COM ports (including RS-232/422/485) for increased connectivity options. Additionally, the NuPRO-E47 supports Intel® PCIe bifurcation, allowing for flexible and efficient use of PCIe lanes. This single board computer is designed for use in a variety of industrial applications that require high-performance computing and reliable connectivity
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Product
GSM/EDGE Analysis Using NI PXI RF Test Instruments
NI-RFmx GSM/EDGE
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The NI-RFmx GSM/EDGE personality is a highly optimized API for performing physical layer measurements on GSM/EDGE cellular standard signals. NI-RFmx GSM/EDGE is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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Product
Battery Management (BMS) Environmental Test System
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The BMS Environmental Test System is a configurable platform simulating the essential signals used by Battery Management Systems (BMS) and cell-monitoring modules with the ability to perform environmental testing on multiple BMS units simultaneously. The system implements single-point value testing to evaluate specific BMS functions such as cell over and under voltage scenarios, cell leakage current, lost communications, or faulty system IO.
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Product
Intel® Celeron J1900 & Atom™ E3825/ E3845, 3.5" SBC
MIO-5850
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Intel® Celeron J1900 & Atom™ E3825/E3845, DDR3L-1333MHz 2/4GB on boardDirectX11, OpenGL3.2, OpenCL1.2, Dual display: HDMI, VGA, LVDSCPU bottom up design for system integration and rugged design for variable automation factory environments3 Intel i210 GbE, rich I/O: 4COM, SATA, USB3.0, SMBus/I2C, 16 bit GPIO, full-size Mini PCIe/M.2 E Key, half size mSATA, 12-24V Power input, SIM Card holder, CANBUS with IsolationSupports iManager, SUSI APIs, WISE-DeviceOn and Edge AI Suite
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Product
SAS Protocol Test System
M124A
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The SAS Sierra M124A Protocol Test System is Teledyne LeCroy's 7th generation protocol analyzer system that provides 100% accurate protocol capture of both SAS (SAS 3.0) and SATA (SATA 3.0). The industry's most widely used test platform for SAS and SATA features unmatched analysis and debug capabilities to help pinpoint problems at every layer of the protocol.
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Product
Custom Test System Solutions
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No time to think about test? One-size-fits-all testers not ideal? Existing solution no longer fits your needs? Then count on integrated test solutions from Astronics. We’ll assist you with your test strategy and your test system, setting you on the path to market at a pace and ROI that ensures your program success.
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Product
EBIRST 78-pin D-type To 68-pin Female SCSI Adapter
93-006-222
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eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
HV Test System up to 20000 Volt
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Insulated test booth with large space for test items. 2 banana sockets for AC connection and 4 banana sockets for the DC connection of the DUTs. IC’s are tested in a long-term test. These are checked in an oil bath so that there are no air gaps to reduce the insulation. Maximum voltage 20 kV. Therefore, insulation tests must be carried out. Ensuring the standard-compliant test. For the safety of the operating personnel, the test cell is electrically locked while the high voltage measurement is active.
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Product
EBIRST 200-pin LFH To 104-pin D-type Adapter
93-002-422
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eBIRST adapters allow extension to other switching system connectors, including SMB
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Product
Single Site Test Handler
3210
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Chroma Single Site Test Handler 3210 supports various package types such as BGA series, QFP series, QFN, TSOP, and more. The handler is primarily designed for early device design and engineering validation.
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Product
Intel® Atom™ SoC E3825/ J1900 Pico-ITX SBC, DDR3L, 24-Bit LVDS, VGA Or HDMI, 1 GbE, Half-Size Mini PCIe, 4 USB, 2 COM, SMBus, MSATA & MIOe
MIO-2263
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Embedded Intel® Atom™ SoC E3825 & Celeron J1900 up to Quad-Core processor design, DDR3L 1333MHz support up to 8GBIntel Gen 7 DirectX®11.1 support, dual independent display by 24-bit LVDS + VGA or 24-bit LVDS + HDMIFlexible design using integrated multiple I/O: MIOe to approach vertical applications & keep domain knowhowRich I/O interface with 2 COM, 1 SATA, USB3.0, PCIe Mini Card and mSATASupports iManager, SUSI APIs, WISE-DeviceOn and Edge AI Suite
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Product
PCI Express 5.0 Test Platform
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Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
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Product
Test System Replication/Build-to-Print
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Need to manufacture test stations? For more than 15 years we have sourced, assembled, tested and shipped fleets of robust, cost-effective solutions. We produce them at our high-volume facilities and deploy them around the world.
