Moving Probe Testers
multiple probes move robotically to contact integrated circuits, printed circuit and SMT boards.
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Product
High 3.12 (88.00) - 8.00 (227.00) High Performance Lead Free Probe
LFRE-72I-8
ICT/FCT Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
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Product
Standard 0.62 (18.00) - 4.00 (114.00) High Performance Bias Ball Probe
POGO-1J-4-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Universal A/V Tester
Tester
This tester was built for our client with the specific requirement that specific UUTs can be added to the system by our client. We handled developing test software for the first 2 UUTs utilizing an open programming structure that allowed programming modules to be strung together to create test programs for any additional UUT that our client wants to add in the future.
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Product
Standard 1.00 (28.00) - 1.80 (51.00) General Purpose Probe
P2662BG-1Q1S
General Purpose Probe
Current Rating (Amps): 3Average DC Resistance lower than (mOhm): 30Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 68Full Travel (mm): 1.73Recommended Travel (mil): 50Recommended Travel (mm): 1.27Overall Length (mil): 575Overall Length (mm): 14.60
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Product
Probe Cards
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Probe cards are the key in measuring reliability in the ever-evolving testing of semiconductor integrated circuits, which are becoming faster, more compact, and more efficient. We provide a variety of probe cards tailored to customer needs and test environments, always at the highest level of quality.
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Product
BMP-1 Board Marker Probe
BMP-1
ICT/FCT Probe
Current Rating (Amps): .05Voltage Rating (VDC): 15Recommended Duty Cycle: 1 sec. On (min.), 5 sec. OffTest Center (mil): 1,000Test Center (mm): 25.40Full Travel (mil): 62Full Travel (mm): 1.57Recommended Travel (mil): 50Recommended Travel (mm): 1.27Full Marker Travel (mil): 62Full Marker Travel (mm): 1.57Direction of Rotation: CCWScribed Diameter (mil): 50Scribed Diameter (mm): 1.27Rec. Mounting Hole Size (mil): 468Rec. Mounting Hole Size (mm): 11.89Recommended Drill Size: 15/32 (in) or 11.90 mm
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Product
High 0.75 (21.00) - 8.00 (227.00) Long Travel Bead Probe
BPLT-25F-8
Bead Target Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 350Full Travel (mm): 8.89Recommended Travel (mil): 317Recommended Travel (mm): 8.05Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,460Overall Length (mm): 37.08Full Travel Remark: Standard Spring: 400 mil / 10,16 mm, Alternate Spring 400 mil / 10,16 mm, High Spring: 400 mil / 10,16 mm, Ultra High Spring: 350 mil / 8,89 mm
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Product
Cup Reduced Concave, Standard 0.61 (17.00) - 2.80 (79.00) General Purpose Probe
HPA-0G12
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 635Overall Length (mm): 16.13
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Product
Standard 0.50 (14.00) - 3.40 (96.00) Non Replaceable General Purpose Probe
C-S-C
General Purpose Probe
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 30Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 45Full Travel (mm): 1.14Recommended Travel (mil): 30Recommended Travel (mm): 0.76Overall Length (mil): 395Overall Length (mm): 10.03Rec. Mounting Hole Size (mil): 46.5Rec. Mounting Hole Size (mm): 1.18Recommended Drill Size: 56
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Interposers and Probes
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The Summit product family includes a wide variety of Interposer systems, designed to reliably capture serial data traffic while minimizing perturbations in the serial data stream. Probes include interposers, which are designed to capture data traffic crossing the PCI Express card connector interface, and MidBus probes, which are designed to capture traffic flowing within a PCB.
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Product
SPL-03C-090 Step Probe
SPL-03C-090
Step Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 50Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 127Recommended Travel (mm): 3.22Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 1,530Overall Length (mm): 38.86Rec. Mounting Hole Size (mil): 95Rec. Mounting Hole Size (mm): 2.40Rec. Mounting Hole Remark: 94 to 96 mil / 2.39 to 2.44 mmRecommended Wire Gauge: 22-26 AWGRecommended Drill Size: #41 or 2.40 mm
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Test Probes
E-Series
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Your product descriA full portfolio designed for general purpose test on bare boards, surface mount assemblies and other forms of test specially to meet any needs.ption goes here.
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Product
CC5002X, 2 MHz, 500 A Current Oscilloscope Probe
786848-01
High Current Probe
The CC5002X, or Hioki 3275, is a clamp-on current probe that offers a wide DC to 2 MHz bandwidth and 500 A of continuous input. It is ideal for capturing transient current signals from switching power supplies, inverters, and motor controllers. The probe requires an external power supply.
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Product
HPA-50 General Purpose Probes
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 50Full Travel (mm): 1.27Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 590Overall Length (mm): 14.99
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Product
O-E PROBE
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O-E probe is the unit to convert optical signals to electrical signals. It can be connected to Oscilloscopes or data loggers via a BNC connector and monitor the conversion waveform. It can acquire the optical signal easily by just pointing the optical fiber probe at the light source. Recently, more and more light sources utilize optical modulation for next generation lighting such as LED. Acquiring the emission timing is required to measure the emission phenomenon of the light source. This O-E probe unit is the ideal tool for these tasks.
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Product
Probe Configurations
EFP Series
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Our probe template library lets us give you inexpensive customized probe configurations for every application. Give us your application dimensions and characteristics of the media you need to measure, and we will produce a customized solution made specifically to fit your needs.
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Turbidity Probe
AS16-N
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High precision probe for direct installation into pipelines and vessels measuring NIR light absorption (turbidity) of various liquid samples. The optical path length can be individually configured to meet the process control requirements with the highest accuracy.
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Product
Probe Cards
Minitile™ with Advanced Cantilever™ technology and WedgeTile™
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Each probe is designed for wide temperature ranges and so the probe expansion characteristics are closely matched to the wafer’s expansion characteristics. This allows the user to take a fast measurement while a system is in a settling or thermal stabilization mode and helps compensate for wafer expansion.
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Product
BIP-12 Battery Probes
Battery Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 30Resistance Remark: Probe Resistance Steel: 30 mOhms, Gold plated: 100 mOhmsTest Center (mil): 260Test Center (mm): 6.60Full Travel (mil): 394Full Travel (mm): 10.00Recommended Travel (mil): 315Recommended Travel (mm): 8.00Overall Length (mil): 1,220Overall Length (mm): 31.00
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Product
InfiniiMax Probe, 3.5 GHz
1131B
Oscilloscope Probe
Provides extremely low input capacitance, flat frequency response, and patented resistor probe tip technology.
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Product
Probe Card
VersaTile™
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Celadon has reduced the size of a probe card to 28mm with the VersaTile™ with Advanced Cantilever™ technology. The VersaTile™ with Advanced Cantilever™ technology can fit on a conventional 3-hole mount probe positioner for single site probing. The same VersaTile™ with Advanced Cantilever™ technology can be used in a 300mm VersaPlate™ for multi-site probing.
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Product
Light 0.83 (24.00) - 2.00 (57.00) High Performance Bias Ball Probe
POGO-1I35-2-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Alternate 2.64 (75.00) - 6.50 (184.00) General Purpose Probe
EPA-2B40-1
General Purpose Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
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Product
Elevated 2.67 (76.00) - 7.00 (198.00) High Performance Lead Free Probe
LFRE-72U-7
ICT/FCT Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
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Product
Light 0.83 (24.00) - 2.00 (57.00) High Performance Bias Ball Probe
POGO-1Z1-2-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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High 1.73 (49.00) - 8.00 (227.00) Bead Probe
BTP-1HL-8
Bead Target Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Alternate 6.00 (17.00) - 2.50 (71.00) General Purpose Probe
P2262AG-1C2S
General Purpose Probe
Current Rating (Amps): 3Average DC Resistance lower than (mOhm): 30Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 90Full Travel (mm): 2.29Recommended Travel (mil): 67Recommended Travel (mm): 1.70Overall Length (mil): 710Overall Length (mm): 18.03
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Product
Alternate 2.14 (61.00) - 6.00 (170.00) High Performance Lead Free Probe
LFRE-72U-6
ICT/FCT Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
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Probes
71 Series
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American Probe & Technologies, Inc.
10 mil (0.010") shank sizesAvailable in straight and bent shapes
