Test System Integrators
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Product
Special leak test, pressure testing machines and systems from TQC
Leak Testing
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TQC have supplied automatic leak test / pressure test equipment for over 25 years. The supply has included simple manually connected leak test fixtures to fully automatic, high speed production leak test facility. TQC supply leak testing equipment to meet the customers requirements.
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Tracking Systems
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Portable wand based systems are utilized to walk a pipeline to precisely locate a stuck pig. These systems allow for visual and audible indication of pig location.
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Pulsed-DC Systems
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Extend process innovation with Advanced Energy’s comprehensive pulsed-DC suite. Minimize arcing, enhance deposition rate, improve film flatness and packing density.
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Test System Mainframe
ITC59000
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The ITC59000 Test Platform is a desktop DynamicParametric Test System mainframe. The ITC59000Test Platform accepts up to four Test MeasurementUnits (TMUs) that perform transient measurements onsemiconductor devices such as power MOSFETs,IGBTs, and diodes.
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Test Automation System for Driveline Testing
STARS Driveline
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STARS Driveline is an integrated automation, acquisition and control system that provides a broad range of application functionality in a single, powerful environment. It has been designed to fulfil the specialist requirements and applications for driveline testing from simple modal testing on two or four wheel drive systems, to RLS simulation or advanced applications such as service load replication (SLR).
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Benchtop Test System
300 Series Benchtop ATE
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The Circuit Check 300 Series benchtop ATE Test Platform with built-in professional fixturing solves the uncertainty of repeatable results that are common with bench testing. With the 300 Series Benchtop ATE, test procedures can become automatic, with test steps and go/ no-go limits easily programmable in common tabular form. Hand-probing is eliminated, replaced with accurate, repeatable tooling and reliable spring-loaded test probe fixturing.
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MultiBeam System
FIB
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An easy-to-use, out-lens type scanning electron microscope (SEM) equipped with a Schottky electron gun, as well as a new FIB column capable of large current processing (maximum ion current 90nA) installed into one chamber. JIB-4610F enables high-resolution SEM observation after high-speed cross-section milling with FIB, and high-speed analysis with a variety of analytical instruments, such as energy dispersive X-ray spectroscopy (EDS) that takes advantage of the Schottky electron gun delivering a large probe current (200nA), electron back scatter diffraction (EBSD) to perform crystallographic characterization, and cathodoluminescence (CLD). In addition, the 3D analysis function Cut & See is included in the standard configuration, allowing cross-section milling to be executed automatically at fixed intervals, while acquiring SEM images for each cross section.
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Recording System
Surveyor DFR DDR
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The Surveyor Recording System is a DFR/DDR with local Input Modules connected to a Controller. The Input Modules are connected to the Controller by multiconductor cables. The Controller contains a single board computer running 64-bit Microsoft Windows 10® and the E-MAX Director program, for recording, storing and transferring data.
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Vision Systems
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Our GEVA vision systems offer the performance and flexibility to inspect multiple parts, assemblies or surfaces at the same time. These systems are equipped with multi-core processors, high-speed camera ports and versatile I/O options to match your application and factory integration requirements.
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Customizable Integrated Assemblies
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Our ability to design, develop and manufacture, enables us to provide customized solutions to meet all types of signal switching needs, at a reasonable cost. We offer a variety of high-performance RF matrix systems including electromechanical, solid state, fiber optics or hybrid and considered the ideal choice for ATE, SATCOM and Space applications.
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Metrology System
Echo
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The Echo system is a comprehensive in-line metal film metrology tool for single and multi-layer metal film measurements in leading-edge logic, memory, advanced packaging, and specialty semiconductor devices.
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Macro-Vickers Hardness Testing System
LV Series
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LECO's LV Series Macro-Vickers Hardness Testing Systems offer an affordable testing system suitable for larger, heavier samples used in welding and other demanding applications. Models include analog and digital, with options to upgrade to automatic configurations.
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Missile Systems
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IES Systems is a turnkey test system solution provider with proven experience in Acceptance Test Procedure (ATP) testing, Highly Accelerated Stress Screening (HASS) and Environmental Stress Screening (ESS) testing.
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Laboratory System
EGA60
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The next generation of multi-sample analysis systems. The EGA60 is a fully integrated system, featuring an accurate and reliable CO2 analyzer that measures CO2 to 1ppm in a range of 0-2000ppm, and measures H20 to 0.1 mbar in a range of 0-75mbars.
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EMC Test System
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An electric product might cause the malfunction to other electric appliances by discharging the emission noise from it, or is oppositely caused the malfuction by the emission noise from other electric appliances. The former is checked by the EMI test and the latter is checked by the EMS test. The international standard like the CISPR standard is provided so that such an accident should not happen, and the manufacturer must declare by themselves beforehand that their product meets the standard. The generic name of the EMI test (Electro-Magnetic Interference) of the emission measurement and the EMS test (Electro-Magnetic Susceptibility) of the immunity
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Sensing System
DTS
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Our Distributed Temperature Sensor(DTS)with operating system is designed for easy installation and management in the field.Several DTS units can be controlled remotely by Ethernet configuration.
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Systems
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Our systems use an open and flexible architecture to create a platform allowing integration of technology and modules with short system set-up times which result in a reduction of costs.
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Computing Systems
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Curtiss-Wright Defense Solutions
Mission computers are the heart of every platform. To ensure your mission success, our embedded computing systems are backed by decades of experience developing C5ISR, vetronics, and program-specific system solutions.
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Surge Voltage and Surge Current Testing Systems
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HIGHVOLT Prüftechnik Dresden GmbH
Pulse Voltage Test Systems are used for surge testing on transformers, cables, gas insulated switchgear (GIS), arresters, and other high voltage equipment.
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VFTLP+ Test System
4012
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The Model 4012 VFTLP+™ test system was developed in early 2000 to add high speed measurements to the usual I-V plot, to measure and record the real TDDB waveform which causes oxide failure.*Accurate measurements of this waveform have finally been identified by Barth Electronics Inc. and CDM protection can now be based on known dimensional design parameters. We identify the response of your CDM protection circuits with 100ps risetime pulses which simulate the real CDM test. This is the only way with which to provide the total gate oxide threat voltage data.*Convenient, precise, repeatable operation*Computer controlled for automated testing
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6.8 GHz Wideband Synthesizer with Integrated VCO
ADF4356
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The ADF4356 allows implementation of fractional-N or integer-N phase-locked loop (PLL) frequency synthesizers when used with an external loop filter and an external reference frequency. A series of frequency dividers at another frequency output permits operation from 53.125 MHz to 6800 MHz. The ADF4356 has an integrated VCO with a fundamental output frequency ranging from 3400 MHz to 6800 MHz. In addition, the VCO frequency is connected to divide by 1, 2, 4, 8, 16, 32, or 64 circuits that allow the user to generate RF output frequencies as low as 53.125 MHz. For applications that require isolation, the RF output stage can be muted. The mute function is both pin- and software-controllable.
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Modular Battery Test System
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This modular battery test system provides for manufacturers versatile testing possibilities. Due to modularity it allows easy configuration of battery testers for a wide range of different power levels.
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Semiconductor Test System
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IST Information Scan Technology, Inc.
As power modules age, their performance degrades. Proper testing and maintenance of semiconductor devices used in power switching can ensure optimal performance and prevent down-time throughout a device’s lifecycle. The IST Model 8900 Series Discrete Semiconductor Test Systems allows you to effectively identify the percent of degradation in semiconductor devices by simulating the exact current and voltage of the parameters used by devices under real operating conditions.
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National Instruments System Integrator
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Knowledge of all National Instruments platforms and its wide experience in using and integrating NI hardware (CompactRIO, sbRIO, PXI, CAN, DAQ, etc.) and software (LabWindows/CVI, LabView e TestStand), IPSES offers to its clients customized solutions and services, providing both technological and economic benefits.
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Control Systems
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GCA leverages decades of electronics and software experience as we build control panels and PLC software that bring machines to life and orchestrate how the machine's various components work together.
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Impulse-Calibration-System
KAL1000 Series
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The impulse calibration system KAL1000 is a modular system to perform tests on complete impulse voltage measuring systems and on digital recorders for the measurement of high impulse voltages and impulse currents. The modular design allows an optimal KAL-configuration depending on the actual application.Additional, this modularity allows to up-grade or modify and existing KAL1000 system in case of changing or additional requirements
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Sensing System
DAS
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Our Distributed Acoustic Sensor(DAS) with excellent pattern recognition software can detect and locate the distributed thousanfs of acoustic events. Whenever any vibration or sound around its sensing fiber is detected, our DAS system will process the measured data in real-time and its pattern recognition software will recognize the types of the events, such as digging, pipeline leakage, fence breach, vehicle moving person walking. And, the detected events are reported to the alarm server to help operators take actions to protect theor facilities.
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Function Test and In-Circuit Test
CT350
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ICT test points: max 2736 CAD Data import Automatic program generator Powerful debugging tools Test coverage analysis Paperless repair station Logging- and statistic functions Full graphical functions Panel and multisite tests Fast adapter exchange High Pin Count-Interface On table optional usable shelf part.
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Blackbody System
IR-518/301
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Infrared Systems Development Corp.
The IR-518 Radiation Source provides an accurate, stable source of infrared radiation of known flux and spectral distribution. It can be used as a standard radiation source for the calibration of other laboratory sources, detectors, or other infrared devices requiring calibration against a standard.
