Boundry Scan Testers
Qmax Test Technologies Pvt. Ltd.
Boundary Scan Trainer Kit was developed by Qmax to provide user a good understanding and hands on the testing principals of boundary scan namely the scan chain test, interconnect test, non-BS functional testing of logic IC and cluster like a combinational or sequential circuits.
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Product
Boundary Scan Trainer Kit
QE49
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Qmax Test Technologies Pvt. Ltd.
The QE-49 IEEE1149.1 Boundary Scan Trainer Kit was developed by Qmax to provide user a good understanding and hands on the testing principals of boundary scan namely the scan chain test, interconnect test, non-BS functional testing of logic IC and cluster like a combinational or sequential circuits.
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Product
Boundary Scan Compliance Tester
QT900
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Qmax Test Technologies Pvt. Ltd.
QT900 Qscan Test system is designed to provide test solution for both Boundary Scan compliance devices and Non Boundary Scan devices. The System provided with Digital IO’s capable of driving and receiving via JTAG IEEE 1149 standard interface and synchronous to JTAG pins. Both Digital and JTAG test are carried out synchronously. Use of virtual test pin and Edge connector eliminates the need of expensive test fixture strategy.
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Product
Nodal Impedance Analyser
QT-Hi1
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Qmax Test Technologies Pvt. Ltd.
QT-Hi1 is an innovative Nodal Impedance Analyzer, which uses the industry’s proven V-I trace techniques of learn and compare of nodal impedances which are represented as VI Curves. It uses innovative Auto Best Curve fit technique an intelligent software alogorithm which enables automatic selection of the best fit value of Voltage, Source Impedance and Frequency of the stimulus waveform. The compact size with re-chargeable battery makes it an ideal companion for on-field applications. The wide 8” touch screen graphical display makes this tool more valuable in test and repair industry at all times.
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Product
Boundary Scan Compliance Tester
QT900
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Qmax Test Technologies Pvt. Ltd.
QT900 Qscan Test system is designed to provide test solution for both Boundary Scan compliance devices and Non Boundary Scan devices. The System provided with Digital IO’s capable of driving and receiving via JTAG IEEE 1149 standard interface and synchronous to JTAG pins. Both Digital and JTAG test are carried out synchronously. Use of virtual test pin and Edge connector eliminates the need of expensive test fixture strategy.
