Langer EMV-Technik GmbH
Langer EMV-Technik GmbH is a medium-sized electro-technical company which is active in the field of electromagnetic compatibility-related
- +1 888 687 5 687
+49 (0) 351 430093-0 - +49 (0) 351 430093-22
- mail@langer-emv.de
- sales@langer-emv.de
- Nöthnitzer Hang 31
Bannewitz, D-01728
Germany
-
Product
Immunity
RF coupling
-
is used for the conducted measurement of the immunity according to IEC 62132-4.
-
Product
Near Field Probes 30 MHz up to 3 GHz
RF1 set
-
The RF1 near field probe set consists of 4 passive near field probes for making measurements in the development phase of E-field and magnetic field in the ranges of 30 MHz to 3 GHz on electronic assemblies. The probe heads of the RF1 set allow for measurements close to the electronic assemblies, e.g. on single IC pins, conducting paths, components and their connectors in order to localize interference sources. Field orientation and field distribution on an electronic assembly can be detected through a trained special use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.
-
Product
Near Field Probes
MFA Family
-
The micro probes allow detailed measurements of high-frequency magnetic fields in the layout, at the smallest SMD components(0603-0201) and at IC pins of printed circuit boards.
-
Product
Near Field Probes 1GHz - 10 GHz
SX set
-
The SX1 set consists of 3 passive near field probes for making measurements in the development phase of E-field and magnetic field with a high clock frequency in the range from 1 GHz to 10 GHz. The probe heads of the set SX allow for measurements close to electronic assemblies, e.g. on single IC pins, conducting paths, components and their connectors, to localize interference sources. Field orientation and field distribution on an electronic assembly can be detected through trained use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They have an internal terminating resistance.
-
Product
Immunity
ESD coupling
-
is used for conducted coupling of Langer ESD pulses (200ps rise time) into ICs.
-
-
-
Product
IC Tester
ICE1
-
The IC Test System was developed to measure the EMC behavior of circuits (ICs) in the event of targeted field or line-related interference and for measuring emissions. The test IC is tested in function. The test environment ICE1 creates the functional environment of the test IC. The respective measurement task is carried out with the corresponding probe set.
-
Product
Optical signal transmission
Bus systems
-
Allows for the transmission of high speed CAN signals via optical fibre cables during EMC tests or when there are great potential differences (high voltage).
-
Product
MP field sources calibration set
-
The MP field source calibration set is used to measure electric or magnetic fields in a frequency range up to 3 GHz. RF fields or transient fields can be measured. The MP field source calibration set is used to check fields of the Langer EMV-Technik GmbH field sources, fields of TEM cells and IC striplines.
-
Product
Burst Detectors
-
The Burst detector monitors interference threshold exceedances at cable-and line bundles. It selectively detects conducted disturbances, which would influence the monitored device.
-
Product
Immunity
EFT coupling
-
s used for direct-contact measurements of impulse immunity in IC pins, according to IEC 62215-3 and IEC 61000-4-4.
-
Product
Optical Signal Transmission
Analog
-
Used for oscillographing analog signals under EFT/EDS/RF interference.
-
Product
MP CI set
-
The MP CI set up to measure coupling impedance is used to determine EMC characteristics of connectors and cables. The coupling inductivity defines the coupling inductance of external disturbance on the shield or on the ground with the desired signals. If the coupling inductivity is considered in the construction set-up and the pin or wire assignment of connectors or cables, then the connectors or cables will be more interference-resistant. The MP CI set-up for measuring coupling impedance can be used for following measurements at connectors or cables: 1. measurement of a single signal (common mode) 2. measurement of a symmetrical signal (common mode) 3. measurement of a symmetrical signal (differential mode)
-
Product
Preamplifier
-
Is designed for the amplification of measuring signals, e.g. weak signals of near field probes with high resolution.
