Bloomy Controls, Inc.
Bloomy Controls, Inc., (Bloomy) provides products and services for avionics real-time test, manufacturing functional test, battery test and simulation, as well as world-class NI LabVIEW, TestStand, and VeriStand application development. Typical applications include PCBA functional test; aerospace systems integration lab (SIL) data systems; avionics and battery hardware-in-the-loop (HIL) test; and rapid development of OEM software. These products and services exemplify the world’s best professional practices. Bloomy’s quality management system conforms to the ISO 9001:2015 standard. A National Instruments (NI) Platinum Partner, Bloomy set the industry standard in LabVIEW development best practices by publishing its internal development standards in The LabVIEW Style Book (copyright © 2007, Prentice Hall).
- 860-298-9925
- info@bloomy.com
- 68 Nutmeg Road South
South Windsor, CT 06074
United States of America
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Product
Electronics Functional Test
Functional Test
Functional test for productive manufacturing. Manufacturers of products enabled by electronics must assure proper operation prior to shipment. Bloomy’s line of universal test systems are ideal for functional test of your PCBAs and subassemblies, from the simplest to the most complex. The UTS family of products combines high-performance test instruments, switching, power control and mass-interconnect hardware with our robust UTS software suite into a low-risk, cost-effective and powerful test solution for your device under test (DUT).
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Product
Systems Integration (SIL) Lab Data Acquisition
System
Bloomy’s SIL data system allows testing and simulation of every system component on the aircraft. The functionality of these complex integrated systems are fully tested, debugged, and verified safely in the lab prior to flight testing. This reduces cost and schedule for new aircraft. Bloomy has applied its expertise to multiple SILs.
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Product
Interface Panel for SLSC
THROUGHPOINT™
Interface
Bloomy's ThroughPoint™ Interface Panel provides a simple, yet highly-flexible connection between the unit under test and resources in a National Instruments Switch/Load/Signal Conditioning (SLSC)-based test system.




