Chroma ATE Inc.
A world leading supplier of precision test and measurement instrumentation, automated test systems, intelligent manufacturing systems, and test & automation turnkey solutions marketed globally under the brand name "Chroma".
- +886-3-327-9999
- +886-3-327-8898
- info@chromaate.com
- 88 Wenmao Road
Guishan District
Taoyuan City, 333001
Taiwan, Province of China
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Product
FPD Tester Signal Module
A291800-03
Signal Module
The A291800 is an LVDS signal model that can be used with FPD Tester to provide LVDS panel standard signals and related controls for LVDS inspection.
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Product
Component Test Scanner
Model 13001
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Support component test scanningSupport 8 slots for plug-in (removable), up to 320 channels for one unitOption A130007 40 channels scan module, input up to 500VDC for IR test without switchingMax. 8 salve units for multiple scanner (master/slave interface)Support Chroma LCR meterSupport Chroma 3302/3252/11025 turn ration functionSupport 11200 CLC/IR meter for IR testStandard RS-232, GPIB and USB interface13001 can be installed in Chroma Component ATE model 8800Support ICT applications
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Product
LED Load Simulator
63110A/ 63113A/63115A
Simulator
As shown on the V-I curve in figure 1, the LED has a forward voltage VF and a operating resistance (Rd). When using a resistor as loading, the V-I curve of the resistor is not able to simulate the V-I curve of the LED as shown in blue on figure 1. This may cause the LED driver to not start up due to the difference in V-I characteristic between the resistors and the LEDs. When using Electronic Loads, the CR and CV mode settings are set for when the LED is under stable operation and therefore, is unable to simulate turn on or PWM brightness control characteristics. This may cause the LED driver to function improperly or trigger it’s protection circuits. These testing requirements can be achieved when using a LEDs as a load; however, issues regarding the LED aging as well as different LED drivers may require different types of LEDs or a number of LEDs. This makes it inconvenient for mass production testing.
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Product
Regenerative Battery Pack Test System
17020E
Test System
Charge/discharge modes (CC, CV, CP)Power Range: 10kW / 20kW per channelVoltage Range: 60V/ 100VCurrent Range: 100A/200A/300A/400A/ 500A/600A/700A/800A per channelRegenerative battery energy discharge, efficiency 85%Channels paralleled for higher currentsDriving cycle simulationFast current conversion without current interruptHigh precision measurementSmooth current without over shootTest data analysis functionData recovery protection (after power failure)Independent protection of multi-channel
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Product
TO-CAN Package Inspection System
7925
System
Chroma 7925 is an automatic inspection system for TO-CAN package. The appearance defects over 30 um like lens scratch, partial are clearly conspicuous by using advanced illumination technology. Because the height variation of tray and package exists, Chroma 7925 can calculate the focus distance and compensate to overcome the variation with auto focus function.
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Product
IC Pick & Place Handlers
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Chroma's IC test and handler solutions assure that IC packaging meets the original design specifications and verify the performance of the IC before it is assembled into the electronic product.
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Product
Hipot Tester
19070
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Chroma 19070 series are the smallest Hipot Testers currently available in the world. Its super mini size is easy to carry and the large LCD display is suitable for viewing measurement results. These sophisticated hipot testers are most applicable to safety test for electronic components.
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Product
VLSI Test System
3380D
Test System
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.
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Product
64-bit PXI Extension Card
52906
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The function of PXI extension card is to extend the PXI backplane signal outside of the chassis. Inserting the PXI card to extension card can easily check or measure the PXI card's signal under power on condition, which resolves the problems of inconvenient inspection due to the PXI card inside the chassis for RD or maintenance personnel. PXI extension card is able to isolate the voltage and signals sent to the PXI card for hot swap when the system is powered on. Every time the extension card activates it can supply the power required for PXI initialization. It eliminates the need for rebooting PC when users read and re-write the configuration files.
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Product
PXIe Programmable Device Power Supply
33020
Programmable Power Supply
High channel density with 8 channels per card 6V-12V independently programable voltage level Max. current gang feature providing max. 4A output per card
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Product
Wafer Level Test
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Double sided wafer inspection system is an automatic inspection system for afterdicing wafer chip. It can do double side inspection simultaneously. The appearance defects of wafer chip are clearly conspicuous by using advanced illumination technology. Illumination and camera acquisition mode can be adjusted for various wafer process, like vertical chip or flip chip.
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Product
High Precision Source Measure Unit (SMU) - Hybrid Compatible PXI, 100ks/S Programming/Measurement Speed
52400 series
Source Measure Unit
Hybrid Compatible PXIFour quadrant operationHigh source/measurement resolution (multiple ranges)Low output noiseHigh programming/measurement speed (100k s/S) & slew rateOptional measurement logDIO bitsOutput profiling by hardware sequencerProgrammable output resistanceFloating & Guarding output16 Control Bandwidth SelectionMaster / Slave operationDriver with LabView/LabWindows & C/C# APISoftpanel GUI
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Product
SoC Test Systems
Test System
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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Product
Hipot Tester
19052/19053/19054
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The Chroma Hipot Tester 19050 series provide 3 models for choice. The 19052 for AC/DC/IR Hipot testing and insulation resistance (IR) measurements, the 19053 which combines both AC and DC Hipot tests and IR measurements with 8HV scan channel capability into a single compact unit, and the 19054 which combines both AC and DC Hipot tests and IR measurements with 4HV scan channel capability into a single compact unit.
Parent
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Chroma Group
The focal points of Chroma are tests and measurements on power electronics, passive components, electrical safety, video & color, LCD/LCM, automotive electronics, and semiconductor industries. More importantly, Chroma also drives itself toward clean technology by providing testing solutions in photovoltaic, LED, Li-battery, power battery pack, electric vehicles and other emerging new eco-industries. After sustained investment and expansion for nearly 30 years, the operation of Chroma Group has covered most of the precision tests and measurements for various professional fields to provide turnkey test and automation solutions, also stridden across the areas of semiconductor materials, LED Chip & semiconductor inspection service, industrial PC, commercial LED/LCD monitor, electric scooter and electric vehicle powertrain system. Rooted in Taiwan with global arrangement, Chroma Group has setup operations in America, Europe, Mainland China and East Asia along with dealers all over the major cities in the world to provide convenient and fast services for customers everywhere.
Siblings
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Chroma Systems Solutions, Inc.
From power conversion to battery to electrical safety, our test systems will maximize your time, improve your validation process, increase your throughput and help the world’s leading R&D labs with testing applications as diverse as your requirements.
Siblings
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ADLINK Technology Inc.
ADLINK Technology Inc. (TAIEX:6166) leads edge computing, the catalyst for a world powered by artificial intelligence. ADLINK manufactures edge hardware and develops edge software for embedded, distributed and intelligent computing– more than 1600 customers around the world trust ADLINK for mission-critical success. ADLINK contributes to open source, robotics, autonomous, IoT and 5G standards initiatives across 24+ consortiums, driving innovation across industries. For over 25 years, with 1800+ ADLINKers and 200+ partners, ADLINK enables the technologies of today and tomorrow, advancing technology and society around the world.
Siblings
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Adivic RF Test & Measurement
Huihong Technology specializes in RF technology for nearly 20 years. It is a leading manufacturer of RF measurement instruments in Taiwan, providing the required solutions for RF RF recording and playback, semiconductor RF signal testing, and GPS signal simulation.
Siblings
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Camtek Intelligent Imaging
Camtek is a leading developer and manufacturer of high-end inspection inspection and metrology equipment for the semiconductor industry.
Siblings
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Environmental Stress Systems, Inc.
Product line has expanded to provide an array of environmental stress screening products for the commercial, automotive, aerospace and military electronics industries.
Children
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Environmental Stress Systems, Inc.
Product line has expanded to provide an array of environmental stress screening products for the commercial, automotive, aerospace and military electronics industries.
Related
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VPC
Virginia Panel Corporation (VPC) provides VPC provides Interconnect Solutions that enable simultaneous connection of multiple test and measurement signal types through one modular interface. Designed to accommodate signal, power, RF, thermocouple, pneumatic/vacuum, and fiber optic connector modules in multiple configurations, VPC’s innovative products meet the demands of test & measurement interconnect requirements.
