Chroma ATE Inc.
A world leading supplier of precision test and measurement instrumentation, automated test systems, intelligent manufacturing systems, and test & automation turnkey solutions marketed globally under the brand name "Chroma".
- +886-3-327-9999
- +886-3-327-8898
- info@chromaate.com
- 88 Wenmao Road
Guishan District
Taoyuan City, 333001
Taiwan, Province of China
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Product
PXIe High Voltage Device Power Supply - 2 Channels Per Card, 18-bit Voltage Programming Resolution and Measurement Resolution
33021
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Max. 48V DC output with 2 channels per card, 12V-48V independently Programable voltage level, Max. 250mA current per channel
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Product
Laser Diode Reliability Burn-In / Life-Test System
58602
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Chroma 58602 is a high density, precision multi source measurement Unit (SMU) module with temperature control and exchangeable interface developed for burn-in, reliability and life test of optoelectronic components including laser diodes, VCSELs, VCSEL Arrays, silicon Photonics, photo-diodes and other similar components.
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Product
Electric Vehicle Test Solution
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As the automotive industry advances power conversion and battery technologies, Chroma has been actively working to improve electric vehicle (EV) testing performance and cost by developing flexible automated power conversion test platforms and regenerative battery test systems. Chroma ATE is a world leading manufacturer of precision test and measurement instrumentation, automated test systems, intelligent manufacturing systems, and turnkey test and automation solutions. Chroma’s Automated Test Systems for Electric and Hybrid Electric Vehicles consist of standard test platforms that are combined into one expandable test system that can test most power components in an EV’s power system. Compared to specialized test equipment developed for a single EV model or application, Chroma’s systems provide greater flexibility.
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Product
Battery Pack/Module Test Solution
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Regenerative battery energy dischargeEnergy savingEnvironment protectionLow heat generateChannels paralleled for higher currentsCharge / discharge mode (CC, CV, CP) Constant current Constant voltage Constant powerDriving cycle simulationHigh precision measurement accuracyFast current conversionSmooth current without over shootTesting data analysis functionData recovery protection (after power failure)Independent protection of multi-channelBMS data recordingThermal chamber control integration
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Product
Single Site Test Handler
3210
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Chroma Single Site Test Handler 3210 supports various package types such as BGA series, QFP series, QFN, TSOP, and more. The handler is primarily designed for early device design and engineering validation.
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Product
Multi-Channel Hipot Tester
19020
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The hipot test is one of the major test items in electrical safety testing. All electrical components and products including transformers, capacitors, power supplies, chargers and home appliances require hipot testing.
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Product
Digital Power Meter
66203/66204
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Chroma 66203/66204 Power Meters are designed for multiple phase power measurement applications. The wiring mode function allows the user to take accurate power measurements for various wiring modes 1P2W/1P3W/3P3W/3P4W as well as providing accurate standard power measurements common for most electrical devices. A unique feature of the 66203/66204 is its stateof- the-art DSP digitizing technology instead of less accurate and slower traditional analog circuits. The internal 16 bits analog/digital converters with sampling rates of up to 250kHz provide both high speed and high accuracy measurements which is unprecedented within the industry for this class of power meters. The instruments include a four part display with 7-segment LED front panel readouts. Users can easily select desired parameters and readouts with a touch of a button. The 66203/66204 meters also include remote control using USB or GPIB interfaces via rear panel connections.
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Product
High Power DC Electronic Load
63200A series
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The 63200A series high power DC electronic loads are designed for testing a wide range of power conversion products including AC/DC and server power supplies, DC/DC converters, EV batteries, automotive charging stations, and other power electronics components. These units can be synchronously paralleled up to 240kW and dynamically synchronized for generating complex multi-channel transient profiles. The 300% peak overpower capability provides extra headroom for fault condition simulations in automotive batteries, fuel cells, and more. The 63200A series have three operating voltage choices, 150V, 600V & 1,200V, with models covering power levels from 4kW to 24kW and up to 2,000A in a single unit. The DC loads have unique user defined waveform (UDW) capability and external analog modulating input for s imul a t ing re a l-wor ld, cus tom waveforms. Another distinct feature is the dynamic auto-frequency sweep function, which enables detecting a UUTs worst case output deviation across a wide range of current frequencies. In addition, a 255-set of data storage function has been built in for recall of the stored settings at any time. For automated testing, the save and recall functions can save a great deal of time.
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Product
AC and DC Electronic load
63800 series
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The Chroma 63800 Loads can simulate load conditions under high crest factor and varying power factors with real time compensation even when the voltage waveform is distorted. This special feature provides real world simulation capability and prevents overstressing thereby giving reliable and unbiased test results. The 63800's state of the art design uses DSP technology to simulate non-linear rectified loads with its unique RLC operation mode. This mode improves stability by detecting the impedance of the UUT and dynamically adjusting the load's control bandwidth to ensure system stability. Comprehensive measurements allow users to monitor the output performance of the UUT. Additionally, voltage & current signals can be routed to an oscilloscope through analog outputs. The instrument's GPIB/RS232 interface options provide remote control & monitor for system integration. Built-in digital outputs may also be used to control external relays for short circuit (crowbar) testing.
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Product
Mini LED Backlight Module Automatic Optical Test System
7661-K003
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Chroma 7661-K003 Mini LED Backlight Module Automatic Optical Test System contains a 71803-2 2D color analyzer to measure chromaticity and brightness
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Product
PXIe Programmable Device Power Supply
33020
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High channel density with 8 channels per card 6V-12V independently programable voltage level Max. current gang feature providing max. 4A output per card
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Product
Component Test Scanner
Model 13001
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Support component test scanningSupport 8 slots for plug-in (removable), up to 320 channels for one unitOption A130007 40 channels scan module, input up to 500VDC for IR test without switchingMax. 8 salve units for multiple scanner (master/slave interface)Support Chroma LCR meterSupport Chroma 3302/3252/11025 turn ration functionSupport 11200 CLC/IR meter for IR testStandard RS-232, GPIB and USB interface13001 can be installed in Chroma Component ATE model 8800Support ICT applications
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Product
USB PD Power Supply/Module ATS
8000 Series
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The USB 3.1 specifications has three major features which are 10Gbit/s transmission speed, USB PD (Power Delivery) with support for 100 watt charging power, and the standard Type-C connector/cable that can be inserted with either side. It is expected to meet all kinds of data / video transfer applications. The advent of USB PD may consolidate the specifications of various power converters and the laptop, monitor, printer or Hub that implements USB PD is no longer a simple power-consuming device but able to supply power to other devices. The USB PD DRP (Dual role port) function allows the built-in USB PD module to deliver a maximum of 100 watts of power through the Type-C interface. To make sure the USB PD Type-C output power does not supply invalid voltage or poor power output characteristics with excessive noise that can damage the power consuming device and cause unsuccessful startup, each USB PD power supply or module has to be fully tested during production to ensure the product features meet the design specifications. This ensures high-quality products are provided to the market to gain acceptance.
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Product
In-Process Wafer Inspection System
7945
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Chroma 7945 wafer chip inspection system is an automated inspection system for pre and post diced patterned wafers. Change kits enable switching between various applications by allowing different carriers including metal frame or grip ring.
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Product
Passive Component ATS
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Test and packing speeds from 80ppm to1,800ppmStandard functions - Inductance/quality factor test - Winding resistance test - Polarity testOptional functions - Layer short test - Insulation resistance test - Bias current testCircular vibrating plate design feeds inductors steadily and rapidlyIndex disc design eliminates dropped inductorsFour-wire measurement test socket designAutomatic discharge mechanism when feeding errors occurEach test station has an independent NG (No Good) product collection boxTest without packaging function provided, good products gathered in bulk collection boxExclusive data collection software designed for monitoring product quality in real timeReserved stations for number spraying and automatic optical inspectionSwitchable Chinese/English/Japanese operating interfaceEquipment is fast, stable and safe






















