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Semiconductor
active or passive elements connected as an electronic circuit using a crystalline subtance, eg. silicon or germanium.
See Also: iJTAG
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Metrology Solutions for Semiconductors
Bruker Semiconductor develops, manufactures, markets, and supports metrology solutions for thin films, which are based on novel, rapid, non-contacting and non-destructive X-ray technology. With Bruker’s acquisition of Jordan Valley Semiconductors, a name synonymous with unparalleled worldwide customer service and support, 75% of the world's top 25 semiconductor manufacturers rely on Bruker metrology tools for front-end and back-end applications, including development of their next-generation thin films. Bruker commitment to innovation and technology leadership drives the continued release of new advancements in metrology, and has garnered numerous awards and industry recognition. In applications ranging from C-S thin films materials characterization to wafer substrate analysis and defect detection, Bruker’s systems provide simulation analysis and fit. HRXRD, XRR, WA-XRD, and XRDI measurement types are fully supported, enabling researchers, production engineers, and process developers unparalleled capabilities. Whether you are a semi and C-S fabricator, R&D center or academy, or an industry materials research facility, Bruker has a specifically designed solution for your metrology needs.
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Semiconductor Wafer Microscope Inspection System
MicroINSPECT
MicroINSPECT Semiconductor Wafer Defect Microscope Inspection System combines state-of-the-art robotics, intelligent microscopes and SITEview software to provide a flexible, easy-to-operate defect inspection platform for either micro or macro defect wafer inspection.
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Semiconductor Package Wind Tunnel
WT-100
Thermal Engineering Associates, Inc.
The WT-100 Forced Convection (Moving Air) Wind Tunnel is designed in accordance with the EIA/JEDEC JESD51-6 standard for thermal characterization of semiconductor packages and devices. The vertical design minimizes laboratory floor space requiements. Air is drawn in at the bottom and exhausts at the top. The test section is large enough to accommodate the largest JEDEC and SEMI thermal test boards. Air velocity can be adjusted over the range of 0.5 to 5 m/s; air velocity is monitored with an included hot-wire anemometer connected to a digital display. A Type-T thermocouple is mounted in the test section for monitoring the moving air temperature.
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LED Illumination
Semiconductor device that emits visible light when an electrical current passes through it.
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Ultrasound Transducers
Utilizing optical and semiconductor fabrication techniques, Imaginant manufactures the PureView PrecisionTM line of RoHS-compliant delay-line ultrasound transducers with center frequencies ranging from 50 MHz to 250 MHz (higher and lower transducer frequencies are also available). Imaginant's precision-manufacturing process produces transducers that exhibit high reliability and high uniformity from device to device. This manufacturing consistency enables uniform test system performance to be attained across multiple systems. Imaginant transducers are available in focused and flat-face models that can be produced with minimal-damping for applications requiring maximal sensitivity or with maximal-damping and high-bandwidth for applications requiring the highest-degree of temporal precision.
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Amplifiers
We have designed and manufactured amplifiers using all major semiconductor materials, LDMOS, GaN, GaAs, and InP, to produce narrow, wideband, and pulse, receive and transmit amplifiers from 1 MHz to 220 GHz and power levels from mW to over 10 kW.
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3.4 MP NVIDIA® Jetson Nano™ Camera
E-CAM30_CUNANO
e-CAM30_CUNANO is a 3.4 MP 2 lane MIPI CSI-2 custom lens camera board for NVIDIA® Jetson Nano™ developer Kit. This Jetson Nano camera is based on 1/3" AR0330 CMOS Image sensor from ON Semiconductor® with 2.2 µm pixel.
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GAS Testers
Shenzhen Noyafa Electronic CO.,LTD
Noyafa GAS Tester uses high-quality semiconductor sensors, which can effectively eliminate interference and accurately obtain the concentration of formaldehyde, TVOC, etc. within the measurement range, accurate to the thousandth. With more than ten years of professional testing background, well-known big brands are more at ease and assured to use.
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Metrology Systems
VIEW offers a full line of optical metrology systems for wafer, photomask, slider, MEMS, semiconductor package, HDD suspension, probe card, and micro-component process measurements.
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Marine Fuel Sulfur Analyzer
NEX QC MFA
Applied Rigaku Technologies, Inc
Specifically designed for marine fuel applications, the new Rigaku NEX QC MFA features an intuitive "icon-driven" touch screen interface for easy operation and a built-in printer for convenience. The shuttered 50 kV X-ray tube and Peltier cooled semiconductor detector deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability (50 kV), along with multiple automated X-ray tube filters, provides an analysis of sulfur (S), nickel (N), vanadium (V), iron (Fe) and zinc (Zn) ... all with low limits-of-detection (LOD).
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Semiconductor Testers
Designing and manufacturing scalable Automated Test Equipment (ATE) targeted at testing SOC, MCU, RF PA/FEM, Sensors/MEMS and Power and Analog devices
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X-Ray Inspection System
MXI Quadra 5
Quadra™ 5 is the X-ray inspection system of choice for sub micron applications such as PCB and semiconductor package inspection, counterfeit component screening and finished goods quality control.
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DUT Boards
RTI designs and manufactures DUT boards for many types of special purpose test equipment including: ESD test systems, special purpose functional testers, automated curve trace equipment, as well as standard semiconductor test equipment. All designs are performed in-house using PCB design software (Mentor PADS, CAM350) and 3D mechanical design software (Solid Edge) if required. PCB fabrication is sub-contracted to one of our long-time fabrication partners.
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The Lorlin© Impact Series
Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.. The automatic test system can be used in all test applications including incoming inspection, wafer probe, QC, engineering, production, final test, and high reliability. The system tests most all discrete semiconductors with reliable, accurate, and repeatable results.
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Semiconductor / FPD Inspection Microscope
MX61L
Motorized Microscope for 300mm dia. Wafer/17 inch Glass Substrate use Reflected/Transmitted Illumination.
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MPI Advanced Technologies & Accessories
MPI Advanced Semiconductor Test
MPI become very fast the truly innovation leader in the Advanced Semiconductor Tests market. By offering wide range of system’s accessories and unique advanced technologies, such as Automated Test over Multiple Temperatures ATMT™, NoiseShield™, PHC™, VCE™, mDrive™, MPI is offering variety of complete test solutions at highest value.
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Pattern Generator
PI-2005
As a test engineer or digital designer you must have state-of-the-art tools to test, characterize and verify your complex semiconductor devices and digital circuit boards. The PI-2005 Pattern Generator will generate a wide range of simple or complex digital patterns for any test application that requires a serial or parallel digital data stream. To meet the requirements of complex devices and digital circuits, the pattern generator can be configured from 16 to 64 output channels.
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3.4 MP Autofocus Liquid Lens NVIDIA® Jetson TX2/TX1 Camera Board
E-CAM31_TX2
e-CAM31_TX2 is a 3.4 Mega pixel 4-lane MIPI CSI-2 liquid lens Auto focus camera board for NVIDIA® Jetson TX2 developer kit and it is also compatible with NVIDIA® Jetson TX1 developer kit. This camera is based on 1/3 inch AR0330 CMOS Image sensor from ON Semiconductor® with 2.2 µm pixel and A-Pix™ technology and an integrated high performance image signal processor (ISP). This S-Mount (M12) liquid lens camera enables autofocus with no mechanical moving part like VCM (Voice Coil Motors) will increase the lifetime and has an ability to focus and refocus in a matter of milliseconds.
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Low Noise Amplifiers
RPG Low Noise Amplifiers are developed and manufactured using the most modern discrete components and thin film technologies, in order to cover the frequency range 50 to 350 GHz. With improved DC-supply and modern semiconductors these amplifiers not only deliver low noise performance but also broad operating bandwidth and gain flatness. These low-noise amplifiers are available as a standard product and on request as customized manufactured product.
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Elemental Analyzers for Carbon, Sulfur, Oxygen, Nitrogen and Hydrogen
HORIBA Scientific provides inorganic elemental analyzers for a wide range of applications based on the inert gas fusion technique and high frequency heating combustion in oxygen stream.The EMIA Series for Carbon and Sulfur analysis and EMGA Series for oxygen, nitrogen and hydrogen analysis strongly rely on HORIBA’s experience as a pioneer in Non-Dispersive Infrared (NDIR) technology. Both EMIA and EMGA designs meet all requirements for the metallurgical industry. These instruments also help scientists working in other application fields such as semiconductor, battery materials, ceramics and more.
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Test Handler
Test Handler is an equipment that automates the final testing of semiconductor devices. It handles device transportation, controls temperature during semiconductor testing, and sorts devices based on test results.
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Power Cycling Semiconductor Life Test System
ITC52300
The ITC52300 is designed for high-volume intermittent or steady-state operating life testing on Insulated Gate Bipolar Transistors (IGBTs), power MOSFETs, diodes, and other bipolar devices in a production environment. (The ITC52300 is an enhanced version of the ITC5230.)
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OEM DC Power System For Semiconductor
AMETEK Programmable Power, Inc.
*Single Package 6-Pack of 600W power supplies*Complete self-contained controller operates independently once pre-set*Capable of ramps and sequences*Capable of inter-channel dependent operation*DeviceNet Interface*Solid State polarity switching
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Mercury Probes
Materials Development Corporation
MERCURY PROBES are precision instruments that enable rapid, convenient, and non-destructive measurements of semiconductor samples by probing wafers with mercury to form contacts of well-defined area.
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Scanning Acoustic Microscope
Pulse2
This industry-leading scanning acoustic microscope provides a universal inspection tool for packaged semiconductor development, production and failure analysis. With the ability to detect air defects as thin 0.05 micron and spatially resolve defects down to 10 microns, the ECHO is perfect for bump detection, stacked die (3D packaging) inspection, complex flip chip inspection and more traditional plastic packages.
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IC/BGA Tester
Focus-2005
As a screening checker to detect defective devices(mainly electrostatic destruction)which are returned from fields before failure analysis process of IC/LC in the quality assurance division of semiconductor manufacture.As a screening checker to detect defective devices before acceptance inspection by IC/LSI expensive tester at semiconductor company(trading, manufacture)Short/Open checker for semiconductor sensor device.It is possible to measure two kinds of measurements which are constant voltage biased current measurement and constant current biased voltage measurement. User can set the threshold of 10 ranks. （auto measurement）Only device can be measured. It is also possible to fabricate the test fixture.Various devices can be measured by replacing the socket board.It is no need to generate complex test programs as reference values are calculated from good device.It can be expanded by adding multiplexer boards which are 128pins per one board.(MAX 2048pins)
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LED
Scientific Computing International
A light-emitting diode (LED) is a semiconductor device that emits light when current flows through it.
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Schottky Mixer and Detector Diodes
Macom Technology Solutions Holdings Inc.
Schottky diodes are majority carrier diodes formed by plating a layer of metal on a layer of doped semiconductor, which forms a rectifying junction. The type of metal and the type of dopant in the semiconductor determines the diode’s barrier height, which is a measure of the amount of energy required to force the diode into forward conduction. MACOM produces Si Schottky diodes as well as GaAs Schottky diodes for use as signal detectors or in frequency mixers.
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FluorOptic Fiber Optic Temperature Sensors
Advanced Energy’s Luxtron® Fiber Optic Temperature Sensors enable customer innovation in complex applications for a wide range of industries including semiconductor equipment, industrial, manufacturing, telecommunications, data center computing, and medical. Based on Fluoroptic® technology, each individual product can be configured for specific applications.
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I2C Isolators
Analog Devices’ family of isolated I2C isolators support a complete isolated I2C interface. This portfolio is based on our iCoupler® chip scale transformer technology. iCoupler is a magnetic isolation technology with functional, performance, size, and power consumption advantages compared to optocouplers. By integrating iCoupler channels with semiconductor circuitry, our technology enables a complete, isolated I2C interface with a small form factor. Our I2C isolators covers applications such as central office switching, networking, and power over Ethernet.
