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Process Monitoring
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Tool and Process Monitoring
BK MIKRO
BK Mikro is typically used as a broken tool detection system but can also be used for many other applications such as object inspection, position recognition and checking for part defects. The selection of the scanner and controller for broken tool detection systems is mainly application based. Follow the links below to explore specific models or contact us with application questions about our broken tool detection systems.
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Radiation And Process Monitoring Systems
ProTK
Monitoring of the main steam line for leakages in a PWR nuclear power plant with a wide-range gamma ionization chamber.
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Process Monitoring and Control Systems
ComoNeo and ComoScout
Consistent digitization increases product quality and cost-effectiveness in injection molding production. The ComoNeo and ComoScout process monitoring system ensure that both newcomers and experienced users can monitor and control their processes precisely and efficiently.
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100 amu CIS Analyzer
CIS200
Stanford Research Systems, Inc.
With better than 1 ppm detection limit, direct sampling at mTorr pressure, and a user-friendly Windows software package, the CIS systems will satisfy your most demanding applications. On-line process monitoring and control, verification of process gas purity at the point of use, high-vacuum residual gas analysis, and process equipment leak checking are some of the areas where these systems will prove indispensable
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Dissolved Ozone Instruments
Teledyne Advanced Pollution Instrumentation
For measuring dissolved ozone concentrations in water a microprocessor controlled instrument can be used for automatic and continuous measurement by means of an disinfectant sensor. All of our instruments are designed meet the rigorous demands of ambient air quality, stack, or industrial process gas monitoring.
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Process Visualization
LaserLinc offers a variety of software interfaces for enhanced process monitoring, display, control, and reporting.
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100 amu CIS Analyzer
CIS300
Stanford Research Systems, Inc.
With better than 1 ppm detection limit, direct sampling at mTorr pressure, and a user-friendly Windows software package, the CIS systems will satisfy your most demanding applications. On-line process monitoring and control, verification of process gas purity at the point of use, high-vacuum residual gas analysis, and process equipment leak checking are some of the areas where these systems will prove indispensable
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Process Automation Controllers
As innovators in programmable control, communication protocols, embedded analytics, and gateway technology, MKS has the critical building blocks and experience to deliver the latest technologies for distributed automation control and process monitoring to our customers, personalized for their exact requirements. We offer a complete Automation Platform solution along with a suite of Automation Control hardware and software configurable modules that allow semiconductor and other industrial manufacturing customers to better automate their processes through computer-controlled automation and seamlessly integrate with existing MKS products to provide a complete solution. Our expertise in control technology enables manufacturers worldwide to operate with greater productivity and streamlined efficiency. MKS works closely with our customers to provide proven, real time solutions that save time and money, reduce inefficiencies and enable faster implementation.
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Process And Chamber Monitoring Software & Systems
MKS process and monitoring solutions feature real-time, web-enabled, hardware, software, and systems to support a variety of tools and processes. These solutions improve performance and yield while reducing tool damage and false alarms.
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MiniVap On-Line
MINIVAP ON-LINE is a process monitoring analyzer for the determination of the vapor pressure of gasoline, crude oil, LPG and NPG. Also, the vapor-liquid ratio (LVR) of gasoline can be measured. The measuring principle is identical to the worldwide used laboratory instruments MINIVAP and therefore the MINIVAP ON-LINE produces equivalent results.
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IR Temperature Sensor with GigE (Manual Focus)
FLIR A35
The FLIR A35 is a thermal imaging temperature sensor for condition monitoring, process control/quality assurance, and fire prevention applications. The A35 integrates seamlessly into existing systems, offering comprehensive visual temperature monitoring. As part of the Ax5-Series, the A35 is among the only thermal imaging temperature sensors on the market to provide temperature linear output through GenICam™ compliant software.
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Metrology
KLA’s metrology systems address a range of chip and substrate manufacturing applications, including verification of design manufacturability, new process characterization and high volume manufacturing process monitoring. By providing precise measurement of pattern dimensions, film thicknesses, layer-to-layer alignment, pattern placement, surface topography and electro-optical properties, our comprehensive set of metrology systems allows chip manufacturers to maintain tight control of their processes for improved device performance and yield.
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Construction Management Company In USA
The process of monitoring construction projects throughout the design, preconstruction, procurement, and owner-occupancy stages is building construction management. Ensured quality and cost-saving with minimized risk are offered by coordination among experienced engineers, construction managers, and BIM consultants. Tejjy Inc. is a construction management firm in USA that strategically plans, budgets (cost and material estimation), and organizes project optimization. Our design-build framework adopts the latest BIM automation trends in Construction for a greater transparency and collaborative approach to AEC services.
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Data Loggers
Temperature and humidity data loggers are designed for use in specific applications, such as pharmaceutical and life science cold chain distribution, fresh produce distribution, process monitoring, environmental monitoring and autoclave temperature data logging. Each device is programmable and can be re-programmed and used for many years.
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NIR Systems
NIR spectroscopy is a proven analytical method guaranteeing reliable and efficient process monitoring and control in a wide range of process applications.
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Wireless Sensor Tags & Interfaces
NFC and UHF RFID sensor tags offer a highly integrated solution for remote sensor data logging. The tags conform to the specifications of the NFC/ISO15693 as well as the UHF RFID standards. Featuring on-chip temperature sensing and the exclusive cool-Log™ technology, these sensor tags enable innovative and cost-sensitive solutions in food and pharmaceutical cold-chain management, industrial process control, remote monitoring and healthcare applications. NFiC™ ICs from ams lower the barriers to NFC integration in electronic devices thanks to their small footprint, high data rate, flexible data transfer modes, fully passive NFC tag emulation and advanced energy harvesting. NFC/HF interface tags are best suited to demanding consumer and industrial applications such as zero-power device configuration and set-up, feature-rich contactless cards for payment and authentication, smart toys and connected cars.
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PMAC 3000 Process Monitor and Control instrument
90424
The PMAC 3000 is a multi-functional Process Monitor and Control instrument, designed to operate with Sensor Developments Inc. Auto-ID sensors. Model 90424 has been enhanced to support quadrature encoders. This functionality is supported via Auto-ID and third party sensor programming. For easy verification, the encoder version will show the extension “E” when the software version number is displayed at power up.
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Automated Thermostat Test System
*Transport mechanism moves thermostats to various temperature controlled locations.*Continuously monitored process status*PC controlled transport and measurements*Operator is shielded from 200 - 210 degree F hot water insertion baths*LabVIEW® test/process language
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Limit Alarms
Process limit alarms monitor sensor or process current input signals and trip a relay output if the input exceeds a user-defined hi/lo setpoint limit. Select from AC-, DC, and loop-powered models. Configuration is easy with Windows software, push-buttons, switches, or pots for settings depending on the series.
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Pneumatic Transmitter
Indicating pneumatic transmitter assists in the coordination of key functional areas within facilities. Transmitting data efficiently and accurately, it ensures operating economies and safety. A good product for process control and monitoring.
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Converter
156
The single channel 156 converter is designed for the control of an optek AF56 / AS56 optical sensor or probe for process monitoring. Range settings and configurable alarms add flexibility in the process control. Analogue signals can be passed e.g., to PLC.
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BOMBARDING A.C. MILLIAMPERES METER
A Bombarding A.C. Milliamperes Meter is one of the four instruments essential for proper luminous tube processing. This instrument monitors the level of bombarder current in milliamperes that is generated by the bombarder, through the tube being processed. It is necessary to accurately monitor the current for the tubing and electrode sizes used to ensure that the right amount is applied at the appropriate time. To do otherwise may cause damage to the electrodes, fluorescent coating inside the tube and adversely affect the glass structure.
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Substrate Manufacturing
KLA’s substrate manufacturing portfolio includes defect inspection and review, metrology and data management systems that help substrate manufacturers manage quality throughout the wafer fabrication process. Specialized wafer inspection and review tools assess wafer surface quality and detect, count and bin defects during production and as a critical part of outgoing wafer qualification. Wafer geometry systems ensure the wafer shape is extremely flat and uniform in thickness, with precisely controlled wafer shape topography. Data analysis and management systems proactively identify substrate fabrication process excursions that can lead to yield loss. KLA’s substrate manufacturing systems support process development, production monitoring and final quality check of a broad range of substrate types and sizes including silicon, prime silicon, SOI, sapphire, glass, GaAs, SiC, GaN, InP, GaSb, Ge, LiTaO3, LiNBO3, and epitaxial wafers.
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Transmittance Dust Measuring Devices
Maintaining a clear sightline even when dust concentrations are highTransmittance dust measuring devices transmit light through the entire duct. With this type of measurement, light attenuation indicates the concentration of dust inside the duct. These measuring devices are specially designed for medium to high dust concentrations and large duct diameters. Consequently, they are equally suited to emission and process monitoring as they are to hall monitoring applications.
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Firmware for High-speed Communication
OP-FW12GA
OP-FW12GA is the firmware to increase the speed of monitoring test of bit synchronous communication (such as HDLC/SDLC/X.25, or CC-Link communication), SPI communication, Profibus-DP (field bus known for high-speed communication), UART (asynchronous communication, which is commonly used). By processing great part of monitoring processes by FPGA, it unfailingly captures communication data with time stamps of a microsecond rate. The interface supports RS-232C/RS-422/RS-485/TTL.
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SpectraTrend HT
Hunter Associates Laboratory, Inc.
SpectraTrend HT supports implementation of today’s Total Quality Management programs such as LQM, PAT, Six Sigma, DMAIC, and others that share a common goal of producing consistent product quality and reducing waste. SpectraTrend HT utilization can facilitate continuous monitoring of product Height to enhance Good Manufacturing Practices (GMPs) within their enterprise, reduce risk of color quality variation and associated costs through real-time process color monitoring and enhance consistency and predictability of their quality assurance approach.
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100 amu CIS Analyzer
CIS100
Stanford Research Systems, Inc.
With better than 1 ppm detection limit, direct sampling at mTorr pressure, and a user-friendly Windows software package, the CIS systems will satisfy your most demanding applications. On-line process monitoring and control, verification of process gas purity at the point of use, high-vacuum residual gas analysis, and process equipment leak checking are some of the areas where these systems will prove indispensable
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Nitrogen Compounds Analyzers
TML produces a wide range of analyzers for the measurement of Nitrogen compounds, including those that measure 'True NO2'. All T Series analyzers offer two front-panel USB ports, an advanced touch screen full color display, customizable user interface with predictive maintenance alerts, one-touch real-time graphing, and multiple language support. All of our analyzers are designed meet the rigorous demands of ambient air quality, stack, or industrial process gas monitoring.
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Vacuum Process And Chamber Environment Monitors
Our process monitors are innovative in-situ process monitoring instruments that are fully integrated, application-specific packages, including component residual gas analyzers (RGAs), analytical equipment, and control software. Process mass spectrometers are used in varied applications, including; Semiconductor, Thin Film (CVD, Etch, PVD and degas), pharmaceutical lyophylization and bulk gas purity monitoring.
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Carbon Compounds Analyzers
TML's Carbon compound analyzers utilize Gas Filter Correlation combined with reliable NDIR (non-dispersed infrared) technology to produce very stable and accurate gas measurements. All T Series analyzers offer two front-panel USB ports, an advanced touch screen full color display, customizable user interface with predictive maintenance alerts, one-touch real-time graphing, and multiple language support. All of our analyzers are designed meet the rigorous demands of ambient air quality, stack, or industrial process gas monitoring.
