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Hyphenated Technology
Evolved Gas Analysis (EGA) solutions couple two or more analytical technologies to greatly increase the power of analyses and save precious time by acquiring more information from a single run, creating a powerful and easy-to-use platform for materials characterization. EGA Hyphenation is a powerful tool in the analysis and identification of complex mixtures, both known and unknown, including identifying harmful chemicals in soil, quantitating components in polymers, determining leachables that may contaminate a product's packaging, identifying phthalates in PVC samples and more.
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IndiRAM CTR With Quantum Characterizer
The IndiRAM CTR Raman/PL system with Quantum Emitter Microscope is a multi-purpose system capable of performing Quantum Emitter Characterization, Raman, Photoluminescence as well as Optical Emission Spectroscopy. The system consists of a Pulse Laser along with a single photon counting module (SPCM), a Pulse Synchronization unit, Motorized Scanning stage and a research grade microscope (Upright or Inverted) for TCSPC measurements. Along with these, it also contains a High throughput Spectrometer with a TE Cooled CCD and an optics box assembly to perform Raman/PL and OES Spectroscopy and Microscopy. obtained after the multiple set of experiments gives the lifetime function.
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Metrology Solutions for Semiconductors
Bruker Semiconductor develops, manufactures, markets, and supports metrology solutions for thin films, which are based on novel, rapid, non-contacting and non-destructive X-ray technology. With Bruker’s acquisition of Jordan Valley Semiconductors, a name synonymous with unparalleled worldwide customer service and support, 75% of the world's top 25 semiconductor manufacturers rely on Bruker metrology tools for front-end and back-end applications, including development of their next-generation thin films. Bruker commitment to innovation and technology leadership drives the continued release of new advancements in metrology, and has garnered numerous awards and industry recognition. In applications ranging from C-S thin films materials characterization to wafer substrate analysis and defect detection, Bruker’s systems provide simulation analysis and fit. HRXRD, XRR, WA-XRD, and XRDI measurement types are fully supported, enabling researchers, production engineers, and process developers unparalleled capabilities. Whether you are a semi and C-S fabricator, R&D center or academy, or an industry materials research facility, Bruker has a specifically designed solution for your metrology needs.
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High Voltage 50 Ω Pulse Generator
TLP-12010A
High Power Pulse Instruments GmbH
The high-current TLP/HMM test system TLP-12010A offers advanced features intended for the characterization of semiconductor devices, discrete components, such as TVS, varistors, capacitors, gas tubes, circuits and systems in the high power time domain. It includes high current I-V characteristics inpulsed operation mode, turn-on/off transient characteristics of the device, breakdown effects, charge recovery effects e.g. reverse recovery, Safe-Operating-Area (SOA) and ESD measurements in general.
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Photonics Module Test System
58625
Chroma 58625 provides characterization testing for 3D sensing illumination devices. various test modules are combined for validation testing under precise temperature control.
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Semiconductor Package Wind Tunnel
WT-100
Thermal Engineering Associates, Inc.
The WT-100 Forced Convection (Moving Air) Wind Tunnel is designed in accordance with the EIA/JEDEC JESD51-6 standard for thermal characterization of semiconductor packages and devices. The vertical design minimizes laboratory floor space requiements. Air is drawn in at the bottom and exhausts at the top. The test section is large enough to accommodate the largest JEDEC and SEMI thermal test boards. Air velocity can be adjusted over the range of 0.5 to 5 m/s; air velocity is monitored with an included hot-wire anemometer connected to a digital display. A Type-T thermocouple is mounted in the test section for monitoring the moving air temperature.
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High Voltage Optically Isolated Probe, 700 MHz Bandwidth. Includes soft-carrying case.
DL07-ISO
The DL-ISO enables highest confidence in GaN and SiC device characterization with highest accuracy, best signal fidelity, and comprehensive connectivity.
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USB Data Communications Multiplexers
These USB multiplexers are ideal for the testing of multiple devices that use USB interfaces, allowing the test system to select one target device from many. The design is bi-directional to permit use as a multiplexer or de-multiplexer with no impact on performance and uses long lifetime electro-mechanical relays characterized for use in data communications systems.
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Material Characterization Products
MeasureReady®
Unique real-time sampling architecture for synchronous sourcing and measuring.
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Sensor Technology
Power Monitoring and Diagnostic Technology Ltd.
PMDT is the only manufacturer to utilize all 5 types of online partial discharge sensor technology. Using multiple sensing methods ensures that PD activity is always discovered, located, and characterized. PMDT's handheld PDetector and PDStar units have more capability than the high-end diagnostic equipment of the past. The small handheld, battery powered unit can completely perform the test and analysis without the need of a PC. PDetector, PDStar, and PDiagnostic instruments feature high-resolution phase-resolved analysis of PD signals (PRPD and PRPS) in real time, so you get your test results instantly!
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High-Performance Computers
EnsembleSeries™
Our high-performance compute blades are characterized by their compute power and density achieved by embedding the most contemporary processors, including Scalable Intel® Xeon® datacenter processors.
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Photochemical Pollution Monitoring System
Are large-scale air quality models that simulate the changes of pollutant concentrations in the atmosphere using a set of mathematical equations characterizing the chemical and physical processes in the atmosphere.
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Laser Source
TW3109
Techwin(China) Industry Co., Ltd
can provide 1 to 4 output wavelengths to meet specific requirements, including the 650nm red source and the 1310/1550nm wavelengths for single mode fiber or the 850/1300nm wavelengths for multimode fiber, as well as other wavelengths according to customer needs. Together with the TW3208 optical power meter, it is a perfect solution for the fiber optic network characterization.
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SATA 3 Receiver Test Automation Software
N5991ST3A
The N5991ST3A is the latest receiver test automation software for bit error ratio testers, allowing you to test, debug and characterize SATA devices and hosts.
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Cell Isolation & Analysis
Life's complexity originates in cells, spanning cellular structure, genetic diversity, gene expression, and complex tissue formation. Serving as the fundamental unit, cells form the foundation of all biology. Characterization of cells, their processes and interactions can provide insights into areas like medicine, symbiosis, and biological diversity. Bio-Rad supports these inquiries, offering innovative technologies for your cell biology research.
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LED Tester add-on to MicRed Products' T3STer
TERALED®
TERALED provides combined thermal and radiometric/photometric characterization of high-power LEDs. The system can be used as a stand-alone optical measurement system for LEDs, or as an add-on to Mentor Graphics - MicReD Products' T3Ster equipment.
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Pattern Generator
PI-2005
As a test engineer or digital designer you must have state-of-the-art tools to test, characterize and verify your complex semiconductor devices and digital circuit boards. The PI-2005 Pattern Generator will generate a wide range of simple or complex digital patterns for any test application that requires a serial or parallel digital data stream. To meet the requirements of complex devices and digital circuits, the pattern generator can be configured from 16 to 64 output channels.
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Reflection/Transmission Spectrophotometry
FilmTek 3000 PAR-SE
Scientific Computing International
Engineered to meet the needs of any advanced thin film measurement application, excelling at material characterization on both transparent and non-transparent substrates. Combines spectroscopic ellipsometry, DUV multi-angle polarized reflectometry, and transmission measurement with a wide spectral range to meet the most challenging of measurement demands in both R&D and production. Patented parabolic mirror technology allows for a small spot size down to 50µm, ideal for direct measurement of product wafers and patterned films.
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Magnet Testing
Helmholtz Coils
A coil arrangement consisting of two coils with the same radius or edge length is called a Helmholtz coil. At the correct distance, these coils are arranged in parallel on the same axis and current flows through them in the same direction. Their magnetic field is then characterized by a large homogeneous area in the center of the coil, which is freely accessible for experiments and measurement tasks. Helmholtz coils can have a circular or square geometric shape.
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Phase Noise Analyzers
The phase noise analyzer portfolio from Rohde & Schwarz offers an affordable, mid-range solution with high sensitivity and fast measurements as well as high-end ultra-high-sensitivity solutions with advanced measurements modes. Ideal for phase noise analysis and VCO tests, the industry-leading solutions enable two-path phase noise analysis with real-time cross correlation and fast VCO characterization with built-in low-noise DC sources. Additionally, high-end signal and spectrum analysis can be added into a single box.
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PXI Semiconductor/IC Test System
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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X-ray Diffraction (XRD) Instruments
X-ray diffraction (XRD) is one of the most important non-destructive tools to analyze all kinds of matter—ranging from fluids, to powders and crystals. From research to production and engineering, XRD is an indispensable method for materials characterization and quality control. Rigaku has developed a range of diffractometers, in co-operation with academic and industrial users, which provide the most technically advanced, versatile and cost-effective diffraction solutions available today.
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Optical Multiport Power Meter
N7745C
Keysight's popular N7745A optical power meters with eight power-sensor channels provide increased throughput and operational efficiency to meet today's challenges in manufacturing. Designed for characterizing optical multiport components, these optical power meters offer industry-leading solutions for device connectivity, high-speed measurement data acquisition and fast data transfer for post-processing. The multiport power meter enables fast measurement solutions for all multiport devices; for example multiplexers, PON splitters, wavelength selective switches (WSS) and ROADMs, as well as compact setups for simultaneous testing of multiple single-port devices.
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CG-MALS
Calypso II
Label-free, immobilization-free characterization of protein-protein and other macromolecular interactions with composition-gradient multi-angle light scattering.
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Fiber Optic Sensor Systems
Fraunhofer Institute for Telecommunications
Fiber-optic and photonic measuring systems open up innovative measuring and control technology concepts for a wide variety of applications. They play a major role in optimizing energy efficiency and are important technological innovation drivers for new and future-oriented markets.In the Department of Fiber Optic Sensor Systems of the Fraunhofer Heinrich Hertz Institute, the focus of application-oriented research is on the development of a new generation of photonic sensors. These are characterized by extreme miniaturization, high network and communication capability as well as extremely low power consumption or even a self-sufficient power supply.In the Department of Fiber Optic Sensor Systems at the Fraunhofer Heinrich Hertz Institute is focused applied research on the development of a new generation of photonic sensors. These are characterized by extreme miniaturization, high network and communication skills as well as an extremely low power consumption, or even a self-sufficient energy supply.
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InfiniiVision Oscilloscopes
3000T X-Series
100 MHz - 1 GHz, DSO and MSO models Speed testing with simplified operation and documentation enabled by the 8.5-inch capacitive touch screen Isolate signals in seconds with exclusive Zone Touch Triggering See the most signal detail with 1,000,000 wfms/s update rateQuickly modulate and characterize signals with built-in WaveGen 20 MHz ARB, 3-digit voltmeter and 8-digit frequency counter & totalizer options Decode serial busses faster with hardware-based serial analysis options Protect your investment with full upgradeability
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SAM Premium Line
PVA TePla Analytical Systems GmbH
The SAM Premium Line combines acoustic microscopy and optical microscopy. It enables the scanner to be combined with both an inversion as well as a reflected-light microscope. The technology used in the SAM Premium Line is based on a core platform that employs the latest production and research technology. The individual systems are characterized by high throughput, high flexibility and a wide scanning range. They can be expanded to suit customer requirements and specified for the most diverse applications.
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SSD
M.2 SSD (iSLC)
Innodisk M.2 (S42) 3IE4 is characterized by L3 architecture with the latest SATA III (6.0GHz) Marvell NAND controller. Innodisk’s exclusive L3 architecture is L2 architecture multiplied LDPC (Low-Density Parity Check). L2 (Long Life) architecture is a 4K mapping algorithm that reduces WAF and features a real-time wear-leveling algorithm to provide high performance and prolong lifespan with exceptional reliability.
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Hardness Testers
The QATM hardness tester portfolio covers all standard test methods, such as Vickers, Brinell, Knoop & Rockwell, as well as a wide test load range. The entire hardness tester range is characterized by technological innovation, precise measuring instruments and maximum comfort due to automation and advanced interfaces.
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Custom Systems
With our custom VNA your ATE works as one software system running on a single computer. We can customize the analyzer module to fit in your system, provide extra frequency range coverage as compared to our standard VNA models should you need it in your specific application or characterize the expected performance outside the frequency limits of our standard VNAs.
