Test Programming
Consulting companies that provide/develop complete testing solutions or specific software capabilities or tools, and even end-product operation and maintenance training. Using a combination of original and generic capabilities, they save time, resources, and costs of the production company. (teradyne.com)
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Product
Test & Programming Software
ScanExpress
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The ScanExpress Family of boundary-scan software offers a fully integrated development environment that includes boundary-scan and at-speed functional test program generation, test program execution with advanced pin level diagnostics, interactive boundary-scan debugging, and in-System Programming (ISP) of devices such as Flash memory, serial EEPROMs, CPLDd, and FPGAs.
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Product
In-Circuit Test Programming Services
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Acculogic offers in-circuit / ATE test programming services for the most widely used Automated Test Equipment / platforms, in our state of the art test development laboratories. Staffed by a highly skilled team of engineers with an impressive track record in providing test solutions to customers in a variety of industries.
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Product
Test Programming LabVIEW
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With LabVIEW, National Instruments provides an industry standard for developing a test environment.Our employees have many years of experience in many areas of this development environment.
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Product
Test Programming
TestAssistant II
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From a front-end graphical user interface to a back-end relational database, TestAssistant II organizes and maintains everything necessary for testing. Tester interfaces, wires, connectors, adapter cables, and other complex sub-assemblies are graphically represented.
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Product
Software for the Development and Implementation of Test Programs using IEEE 1641
newWaveX Suite
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We Have a unique suite of tools to support the development and implementation of test programs created using IEEE 1641 to define the signals and tests. These include the entry-level version of newWaveX (newWaveX–Lite), the development versions of newWaveX (newWaveX–SD and newWaveX–PD) and the complete integrated development environment for IEEE 1641, SigBase. These tools provide everything necessary to work with IEEE 1641, from creating simple signals through to implementing and managing a complete 1641 test environment. All of our 1641 tools are commercial off-the-shelf (COTS) items that may be used stand-alone or integrated into a complete test development environment. newWaveX products may be integrated with third party test executives and associated software.newWaveX is an intuitive user-friendly suite of products that does not require specialist training for users to acquire the skills to develop 1641 programs. Completing the IEEE 1641 User/Developer training course (which uses newWaveX Signal Development for the hands-on element), together with the associated 1 day newWaveX–SD User/Developer training course, provides complete information for the newWaveX user. Further support is provided for users of newWaveX packages under the maintenance agreements for those products.
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Product
Professional ATLAS WorkStation
PAWS Developer's Studio
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We can provide and fully support PAWS (Professional ATLAS WorkStation), the leading ATLAS development system used by most of the US and European military ATLAS based ATS. The PAWS suite includes full development systems as well as runtime only versions for executing previously developed TPS on an installed base of workshop systems.PAWS Developer's Studio gives you the power to compile, modify, debug, document, and simulate the operation of ATLAS test programs in a modern Windows environment. It offers the visual development capabilities prevalent in the marketplace today specifically tailored for ATLAS TPS development. A full range of the most commonly used ATLAS subsets is supported. A PAWS Toolkit can modify the ATLAS subset to meet the particular ATE (Test Station) configuration. Its output is ready to be executed on the associated debugging PAWS run time system.
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Product
Pulse Adapter
CV30P650
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Frothingham Electronics Corporation
The CV30 P650 test station is currently the highest voltage pulser in a series of exponential pulse generators that can be connected to our FEC200E tester. This gives you all the versatility of the proven FEC200 with the addition of high power exponential pulses. The CV30 P650 pulse adapter can produce a maximum current of 100A at up to 600V using exponential pulses up the 10/1000 waveform. The pulser is rated at 30KW from 300V to 650V. Voltage compliance at 100A is 600V. The station can also include all of the usual FEC200 tests in the same test program.
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Product
Test Executive & Development Studio
ATEasy
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ATEasy is a test executive and a rapid application development framework for functional test, ATE, data acquisition, process control, and instrumentation systems. ATEasy provides all the necessary tools to develop, deploy and maintain software components - including instrument drivers, test programs, and user interfaces, as well as a complete and customizable test executive. It is designed to support and simplify ATE system applications with long product life cycles. With ATEasy, test applications are faster to generate and easier to maintain.
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Product
Touch Screen Controller
EZT-570i
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The EZT-570i Touch Screen Controller offers a 7" (18mm) or optional 10" (25 mm) touch screen and the latest in test chamber programming for ease of use . The controller comes standard with data logging, data file access via memory stick or PC, Ethernet control and monitoring, alarm notification via email or phone text message, data file backup, full system security, online help & voice assistance in multiple languages and more.
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Product
Image Sensor Test System
IP750
Test System
Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
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Product
Universal A/V Tester
Tester
This tester was built for our client with the specific requirement that specific UUTs can be added to the system by our client. We handled developing test software for the first 2 UUTs utilizing an open programming structure that allowed programming modules to be strung together to create test programs for any additional UUT that our client wants to add in the future.
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Product
PLD ISP Feature, GTE 10.00p
K8220A
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The PLD ISP feature allows the test developer engineer to specify a configuration bitstream file in VCL digital test file, much like programming a Flash memory device. The PLD ISP feature supports multiple PLD configuration data formats are supported including. Serial Vector Format (SVF), Standard Test And Programming Language (STAPL), Jam, Jam Byte Code (JBC) object files.
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Product
TestCentre
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ARC has experience with complex, commercially available test executives that are available for high volume production needs. Often times, when you don’t need the horsepower of a full featured executive, you are left with creating a specifically defined test program or crafting your own test sequencer. Rather than go down this path and spending your time on architecture, TestCentre brings a simple, yet elegant solution to this all-common problem. Used in many of ARC’s standard test stations, the robust, sequence based architecture of TestCentre, allows you to focus on the testing task at hand. While having some of the more advanced features found in high-end test executives, TestCentre, when mixed with RF analyzers and PXI based test solutions are a great, low cost solution to help solve your everyday testing requirements. Along with TestCentre and an ARC supplied rack-based test platform, your test challenges can be solved in doing circuit card testing, assembly/module level testing, or depot repair troubleshooting tasks.
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Product
Military Communications Test
Test Platform
Astronics testers for military radios and wireless communications systems help you keep your most critical communications up and running smoothly. Write test program sets once and deploy them instantaneously everywhere – whether your test set is in the factory, at the depot, or in operation.
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Product
Drop-In Functional Test Fixtures
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Circuit Check’s drop-in base fixture and replaceable personalized plates are the ideal solution where production volumes are lower and the need to change from one fixture and test program to another occurs quickly. Interchangeable test fixture drop-ins enable the same test system to be quickly reconfigured with different tooling and probe patterns for different products. This maximizes equipment re-use, while minimizing the cost for each new test. With Circuit Check’s base fixture and drop-ins, the wiring and test electronics are not disturbed, thus ensuring configuration consistency each time the system is re-tooled.
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Product
Embedded JTAG Solutions
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The multifunctional JTAG platform enables testing and programming of microprocessors, microchips and other highly complex components (e.g., FPGA, µBGA or CSP) using integrated boundary scan architectures.
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Product
Open Networking
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We are committed to the ever changing world of Data Communication and Storage Networks. As the industry moves forward into Open Networking, we are keeping pace. Working closely with various Open Network organizations such as the Open Compute Project (OCP) and the Open Platform for NFV (OPNFV), we are leveraging years of experience of effecting positive change in the industry and creating robust test programs to enable markets.
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Product
Program Development for Multisite Test
IG-XL
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Teradyne’s award winning IG-XL software transforms test program development for the FLEX, UltraFLEX and J750 family of testers. Its powerful, yet easy-to-use, graphical environment lets engineers rapidly develop fully functional test programs, cutting program development and debugging time. Designed to address multisite complexity, IG-XL can convert single site test programs to multisite automatically, speeding time to market and reducing cost of test. With IG-XL, test engineers focus on actual testing, not writing code for the tester.
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Product
Test Program Modules
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The BRAT Test Program developed will provide functional validation of an assembly based on customer supplied documentation. This does not include hardware (e.g., Interface Test Adaptors), documentation (e.g., technical orders), travel or travel related per diem, or site verification test or installation.
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Product
Test Fixture Kits
Test Fixture
More then ten years of experience in special, customized engineering and manufacturing brought us to the highest level of creating reliable, flexible and robust Test Fixtures. Currently our HQ is located in Vecsés, Hungary together with our R&D. Equip Group has Test Fixture Kit manufacturing plant in Serbia, focusing on supplying competitive, high – quality and high – volume products for the global market.With more then 180 employees, Equip – Test is able to offer our customers turnkey solutions in fixturing with test program generation. No matter if you have a simple or complex, high-density PCB (Printed Circuit Boards), or if you have DUT (Device Under Test) already assembled into metal or plastic housing, we can offer you a very stable technical solution.
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Product
Spectrum Analyzer Modular AFM AXIe
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The software and hardware complex "Modular Spectrum Analyzer AFM AXIe" for the analysis of RF signals with a frequency of up to 10 GHz is intended for use in automated testing programs, research in the frequency domain of periodic signals in the RF and microwave ranges, as well as for analyzing the parameters of signals with analog modulation (AM, World Cup, FM).
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Product
HV AC Hipot
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The HV AC Hipot package is a hardware and software upgrade available for select Eclypse Analyzers. This package adds a High Voltage AC stimulus source CCA to the analyzer chassis and the HV AC Stimulus utility provides the software drives for ELITE to integrate AC Hipot into test programs.
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Product
FPGA Testing
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Silicon Turnkey Solution, Inc.
The secret to our success in the FPGA testing field is the STS hammer file, a proprietary test methodology based on our experience testing thousands of unique FPGA designs. The hammer file is designed to program the FPGA to its maximum combination and block configuration and then tests the completely programmed FPGA for full dynamic, DC and at-speed AC performance. Power and transient tests are also conducted under worst-case populated configurations. Application-specific usage configurations are also used to assist in generating the worst-case electrical specification limits at worst-case environmental use.
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Product
IPv6 Testing and Certification
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Our IPv6 testing services prove interoperability and functionality for IPv6 networks. Our testing includes coverage for IPv6 Host and Router, CE Router, IPv6 Applications and Network Protection Products. We offer ISO/IEC 17025 accredited testing for both the USGv6 and IPv6 Ready Logo test programs. In addition, customers may license our custom test tool IOL INTACT® for pretesting and internal validation.
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Product
ICT Software: Interactive Developmetn Encironment ICT ICE & ICT Sequencer
ICT IDE and Sequencer
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The ICT software consists of two parts, the interactive development environment ICT IDE and the ICT sequencer. The IDE provides a graphical user interface for convenient creation and testing of these test sequences and allows:- Convenient management of hardware resources via topology editor- Support of several independent embedded testers for parallel test execution- Editing sequences in a text or table editor- Error highlighting during sequencing- Sequence execution (also single step) directly on a selected DUT- Debugging (single step)- Loop execution via sequences, or single steps- Optimization function with regard to waiting time and integration with Shmoo plot- detailed results output within tables as well as various results diagrams- Pin-Finder function to support adapter wiring- Automatic test program generation is available via Aster Testway
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Product
JTAG Boundary-Scan Controller
NetUSB-1149.1/SE
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8-TAP USB 2.0 and LAN Based JTAG Controller. The NetUSB-1149.1/SE is an advanced 8-TAP USB 2.0 and LAN-based JTAG/boundary-scan controller that can be used in the testing and/or in-system programming (ISP) of devices, boards, or systems compliant with the IEEE-1149.1 standard.
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Product
Avionics Communications Test
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Astronics communications test sets for aircraft keep your radio, wireless, and navigation communications running at peak performance. Write test program sets once and deploy them instantaneously everywhere – whether your test set is in the factory, at the depot, or in facility operation.Deployed globally for nearly 20 years, Astronics communications testers deliver the dependability you require to ensure critical communications safety and security.
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Product
Data Logging and Analysis With Tecap
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Tecap provides such a tool for simple online overview. This tool is useful to analyse the stability of the developed test program. It is easily to recognize if the program shows the expected repetitive accuracy.
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Product
Software
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Our range of pcb test software covers your requirements in the entire production process: from preparation of CAD files to test program generation and quality assurance.
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Digital Test Instruments
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High-performance VXI and PXI instruments for digital functional test. Teradyne’s Di-Series and eDigital-Series digital test instruments address technologies such as low voltage differential signaling (LVDS), while maintaining full capability to support legacy test requirements. In addition to excellent reliability, these instruments reduce test system footprint, programming and support effort, and overall cost-of-ownership.
