Gigabit Ethernet Test
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Product
80 DIOs, 8AIs, 8AOs JTAG Boundary Scan Resources Unit Expansion
YAV9JTAH
Test Fixture
80 DIOs8 Ais8 AOsCompatible with all JTAG vendors
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Product
Test Fixture
N1295A
Test Fixture
The Keysight N1295A Device/Component Test Fixture provides a low-cost solution to quickly and easily test packaged devices and components. For more advanced packaged testing needs, the Keysight 16442B Test Fixture provides more capabilities.
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Product
Memory Test System
T5833/T5833ES
Test System
T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
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Product
Test Port Cable, 1 Mm
11500J
Test Port Cable
The Keysight 11500J test port connector has a length of 16 cm and a frequency range of DC to 110 GHz. The 11500J integrates with the Keysight N5250A network analyzer and Keysight 8510XF network analyzer systems.
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Product
PXI Digital Test Instrument
PXIe-6943
Test Instrument
Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.This instrument is TPS-compatible with the legacy VXI digital test instrument from Astronics as well as other instrument vendors.
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Product
Memory Test System
T5851/T5851ES
Test System
The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.
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Product
Gigabit Ethernet Switch
VME-690
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Curtiss-Wright Defense Solutions
The VME-690 from Curtiss-Wright is a fully-featured Gigabit Ethernet Switch designed to provide a complete networking solution for VME systems.
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196C
Test Fixture
The 16196C surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
8FE Slim-Type Unmanaged Industrial Ethernet Switch
BB-ESW108-A
Ethernet Switch Module
8 x fast Ethernet ports with auto MDI/MDI-X, Supports 10/100 Mbps auto negotiation, Compact size with DIN rail and wall mount. Supports redundant 12~48 VDC or 10~24 VAC power input, Wide operating temperature range of -40 ~ 75°C, C1D2 for hazardous locations.
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Product
Net Series 1 Gigabit Ethernet
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The standard NET Series design uses rugged stainless steel connector bodies with a naval bronze engaging nut. The use of metal key and Acme threads on the mating interface allows for easy mating and un-mating of the connectors, no matter where they are located. In addition to the contact spacing, which is optimized for this application, one of the keys to achieving the 1 Gbit/s transmission rates is in the unique terminations for both the cable and bulkhead connectors. These cable terminations can be performed at a number of the Teledyne Oil & Gas worldwide manufacturing and support locations.
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Product
Scienlab Battery Test System – Pack Level, 220 KW
SL1730A
Test System
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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Product
8FE Unmanaged Ethernet Switch, ATEX/C1D2/IECEx, -40~75℃
EKI-5528I
Ethernet Switch Module
Communicates with SCADA software via Modbus/TCPCommunicates with NMS (Networking management system) via SNMPPort-based QoS for deterministic data transmission-40~75°C operating temperature range8.4~52.8 V DC wide-range power inputEMS level 3 protection for extreme outdoor environmentsIEEE 802.3az Energy Efficient Ethernet (EEE)Supports redundant 12~48V DC power input and P-Fail relayLoop detection
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Product
Gigabit Ethernet SFP Module
SFP-GMM-2K
Optical Transceiver
Hardened SFP/1250-ED, MM1310/LC 2km (also known as 808-38206) Industrial standard small form-factor pluggable (SFP) package, Provides digital diagnostics monitoring (DDM) functionality. Wide specifications and fiber types available, Comes with metal enclosure for EMI.
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Product
8FE+2G Combo Managed Ethernet Switch Support PROFINET, -40~75℃
EKI-5629CI-PN
Ethernet Switch Module
8 Fast Ethernet ports + 2 Gigabit Copper/SFP combo ports (EKI-5629C/I-PN)Entry-Level Managed SwitchIXM function enables fast deploymentProvides GSDML filesManagement: SNMP v1/v2c/v3, WEB, Standard MIB, Private MIBSupports Media Redundancy Protocol (Media Redundancy Client)
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Product
Spring Clip Fixture
16092A
Test Fixture
Use this test fixture with parallel electrodes for impedance evaluation of both lead and SMD components.
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Product
Gigabit Ethernet SFP Module
SFP-GTX
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SFP/10-1250, TX RJ-45 100m, -40~85℃ (also known as 808-39001) Support up to 1000Mbps Copper RJ-45 connector, Industrial standard small form-factor pluggable (SFP) package, Comes with metal enclosure for EMI.
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Product
1553 to Ethernet Converter
eNet-1553
Ethernet Interface
eNet is a small, rugged 1553 to Ethernet appliance/converter (~200 grams and about the size of a 4 stub coupler) and offers the same advanced BC, mRT and BM functions as our cards. In addition, eNet can provide an additional independent BM mode to auto bridge (transmit) 1553 messages on user defined IP/UDP packet header. The appliance can also auto-load setup images for fast auto start-up, which would be ideal for simple RT applications that wouldn’t even need an API interface (just a standard UDP interface – usually through simple socket programming).
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Product
8FE + 2FE/GE SFP Port Managed Industrial Ethernet Switch
EKI-5710E-2FI
Ethernet Switch Module
Redundancy: X-Ring Pro (ultra-high-speed recovery time, <20 ms), RSTP/STP (802.1w/1D), IXM function for fast deployment, Security Pack with 802.1X, ACL, RADIUS, TACACS+, MAB Authentication, SNMPv3, HTTPS, SSH, and SFTP. Management: SNMP v1/v2c/v3, WEB, Telnet, standard MIB, private MIB, Supports NMS for easy and visualized to monitor and manage network remotely.
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Product
Electronic Control Unit Functional Test
Functional Test
End-of-line tests are critical to ensure passenger safety in the era of smarter vehicles. A flexible test solution is needed to ensure extensive test coverage and high test throughput with a low total cost of ownership.
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Product
EBIRST 50-pin D-type To 2x8-pin Power D-type Adapter
93-005-236
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
CATR Benchtop Antenna Test System
ATS800B
Test System
Very compact far-field over-the-air (OTA) test system based on compact antenna test range (CATR) technologyUnrivaled quiet zone size within 0.8 m2 footprintState-of-the-art reflector ensuring a high quiet zone accuracyUnique benchtop CATR system supporting over 50 GHzIndirect far-field method (approved by 3GPP for 5G OTA testing)
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Product
Laser Diode Reliability Burn-In / Life-Test System
58602
Test System
Chroma 58602 is a high density, precision multi source measurement Unit (SMU) module with temperature control and exchangeable interface developed for burn-in, reliability and life test of optoelectronic components including laser diodes, VCSELs, VCSEL Arrays, silicon Photonics, photo-diodes and other similar components.
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Product
Mini LED Backlight Module Automatic Optical Test System
7661-K003
Test System
Chroma 7661-K003 Mini LED Backlight Module Automatic Optical Test System contains a 71803-2 2D color analyzer to measure chromaticity and brightness
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Product
Photonics Module Test System
58625
Test System
Chroma 58625 provides characterization testing for 3D sensing illumination devices. various test modules are combined for validation testing under precise temperature control.
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Product
16FE+4G SFP Managed Ethernet Switch
EKI-7720E-4F
Ethernet Switch Module
16 Fast Ethernet ports + 4 SFP ports, SFP socket for Easy and Flexible Fiber Expansion, Redundancy: X-Ring Pro (ultra high-speed recovery time < 20 ms), RSTP/STP (802.1w/1D). IXM function enables fast deployment
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Product
4-Module ICT System, I307x Series 6
E9903G
In-Circuit Test System
Test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides those improvements built upon a proven technology foundation. With time-tested software, hardware, and programmability, the Series 6 are fully backward compatible with previous systems, and they make highly repeatable measurements.
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Product
SSD Test Systems
Test System
Enables Rapid SSD Development and Production Ramp with Flexible Test Solution In the high-growth and highly competitive SSD market, a test system that supports multiple protocols can eliminate the need for retooling and achieve faster transitions from one product version — or one product generation — to the next. Advantest SSD Test System allows manufacturers to rapidly grow their product portfolios while remaining adaptable to the many changing needs of the evolving SSD market. This tester improves users’ engineering efficiency with powerful, easy-to-use software tools and a revolutionary multi-protocol hardware architecture, enabling accelerated SSD product development and a faster time-to-manufacturing ramp.
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Product
Gigabit Ethernet
CWDM SFP Transceivers
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CWDM transceiver modules are offered at wavelengths from 1470nm to 1610nm and include LC connectors. These SFPs are 100% compatible with Cisco equipment.
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Product
2-Port SFP Gigabit Base Ethernet Card With HSR/PRP
ECU-P1524PE-B
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PCIe or embedded module supporting dual 1000Mbps fiber connections, designed for high-availability networks.
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Product
EN50155 Managed Ethernet Switch
EKI-9512E-4GMW
Ethernet Switch Module
8 x M12 D-Coded 10/100 Mbps ports + 4 x M12 X-Coded 10/100/1000 Mbps Byapss ports, Complies with EN50155 & EN50121-3-2, Operating temperature: -40 ~ 75°C, Operating power input range: 16.8~137.5VDC, Supports X-Ring Pro for rapid and predictable convergence. Supports IXM for fast and easy maintenance, Supports N-Key for quick configuration and backup, M12 connector with IP67 rugged housing.
