Backplane Test
-
Product
6U VPX Power Backplanes
-
VPX is a broadly defined technology utilizing the latest in a variety of switch fabric technologies in 3U and 6U format blades. Open VPX is the architecture framework that defines system level VPX interoperability for multi-vendor, multi-module, integrated system environments.
-
Product
13-slot ATX-supported PICMG 1.3 Bus Passive Backplane
FAB112
-
*Designed for PICMG 1.3 SBC*Compatible with the AX61400, AX6145, and AX6156LE chassis*Supports one PICMG 1.3 CPU card slot, one PCIe x4 slot, one PCIe x16 slot, and ten 32bit/33MHz PCI slots
-
Product
cPCI Backplanes
-
CompactPCI bus is compatible, in terms of electrical specification, with the PC world’s PCI bus. The mechanical specifications were adapted to the commonly used Euro-board plug in systems for 19" racks.
-
Product
Backplane Twinax Connectors
-
We have taken the standard housing configuration of the P1 & P3 mounting dimensions while incorporating true differential pair contacts within the P1 & P3 dimensional constraints. P1 connector housing contains 21 position true differential pair blind mate contacts allowing board designers to carry high density differential pair signals from the LRU via motherboard to daughter-card plug in modules with a single connector P1 type housing.
-
Product
At-Speed Non-Intrusive Functional Testing
ScanExpress JET
Functional Test
Functional circuit board testing presents many challenges that are often costly and time consuming. Most functional tests need to be customized for each design, limiting reusability. This results in software engineers vying for time between development code and test code. Even when functional tests become available, the diagnostic details are often inadequate to give clear visibility on a given problem.ScanExpress JET is a tool designed to overcome these challenges by automating the functional test generation process on CPU–based IEEE-1149.1 compliant circuit boards. Coined JTAG Embedded Test, JET is the preferred method for at-speed, non-intrusive functional testing.
-
Product
CompactPCI 3U Backplanes
-
COMTEL Electronics offer a large variety of CompactPCI 3U Backplanes, 2 – 14 slots 32 bit 33/66Mhz, fully compliancy with PICMG 2.0 Rev 3.0 Specs. & Hot Swap compliant per PICMG 2.1 R2.0 Spec.
-
Product
Automated Aerospace and Defense Test
test
Obsolescence management, evolving RF requirements, and design for test (DFT) challenges every test organization in the aerospace and defense industry. Organizations are transitioning from rack-and-stack box instruments and closed-architecture automated test equipment (ATE) systems to smarter test systems built on a modular platform that scales to meet current and future needs.
-
Product
VXI Backplanes
-
VXI is a prime example of the old saying, “if it isn’t broken, don’t fix it.” Since the late 1980’s, VXI has been a trusted standard in the world of testing solutions as a more compact and robust predecessor of the GPIB standard. Arising initially to soothe the need for a more compact and integral open testing standard, VXI is still as necessary and impactful as it was more than 30 years ago.
-
Product
5-slot ATX-supported PICMG 1.3 Bus Passive Backplane
FAB105
-
The FAB105 features a PICMG 1.3 CPU card slot, one PCI Express x16 slot, three 32bit/33MHz PCI slots, and built in a 24-pin ATX power connector and 8-pin connector for thermal detected board. The FAB105 is perfect fit for AXIOMTEK's SHB100 and SHB110, which are built around the PICMG 1.3 form factor. The FAB105 is compatible with the AX60501 chassis.
-
Product
Flying Prober Test System
QTOUCH1404C
Test System
Qmax Test Technologies Pvt. Ltd.
The Prober Test System is capable of movement in XYZ directions with fixed angle (θ) and dual probe heads (further expandable up to 4 ) . The system has in-built high resolution Vision Camera for easy monitoring of probe needle contact. The prober supports automatic fiduciary recognition. The system has built –in linear encoders to achieve higher precision.
-
-
Product
W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
test
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
-
Product
3U VPX Power Backplanes
-
VPX is a broadly defined technology utilizing the latest in a variety of switch fabric technologies in 3U and 6U format blades. Open VPX is the architecture framework that defines system level VPX interoperability for multi-vendor, multi-module, integrated system environments.
-
Product
Photonics Module Test System
58625
Test System
Chroma 58625 provides characterization testing for 3D sensing illumination devices. various test modules are combined for validation testing under precise temperature control.
-
Product
High Throughput 1 ns Pulsed IV Memory Test Solution
NX5730A
Test Platform
Precise and fast characterization of new memory, such as spin transfer torque magneto resistive random access memory (STT-MRAM) from DC to high-speed pulsed IV measurement on silicon wafers Apply accurate and high-speed pulsed voltages (down to 1 ns pulse) to magnetic tunnel junction (MTJ) for STT-MRAM and precisely measure the resistance of MTJ Perform all typical MTJ characterization tests in one solution10 to 100 times faster cycle test, such as a bit error rate test (BERT)Capture and visualize MTJ switching waveforms clearly during the writing pulse Dedicated solution with Keysight Technologies’ technical expertise
-
Product
13-slot ATX-supported PICMG Bus Passive Backplane
ATX6022/13L
-
*1 PICMG, 4 PCI and 8 ISA*Compatible with AX61400, AX6145, and AX6156LE*Supports both AT and ATX power supply
-
Product
VPX / Open VPX Backplanes
-
VPX is a broadly defined technology utilizing the latest in a variety of switch fabric technologies in 3U and 6U format blades. Open VPX is the architecture framework that defines system level VPX interoperability for multi-vendor, multi-module, integrated system environments.
-
Product
Analog Backplanes
MSXB 030
-
Analog Backplanes provide expansion slots to accommodate compatible analog external boards. Analog Backplanes are passive, and connect all signals in each of the expansion slots in parallel. All expansion slots are identical
-
Product
Faraday Chamber for RF w/Exchangeable Cassettes 340x350mm RCV 9025 for 6TL36
AN133
Test Fixture
The Faraday Chamber is an add-on for the 6TL36 test handler. This kit is installed into the 6TL36 in the same way a normal test fixture would be installed, being the only difference the fact that different products to be tested will, from that moment on, only need an additional exchangeable cassettes to be tested.
-
Product
High-Performance Gaming Platform with Backplane Architecture
ADi-SC2X
Gaming Platform
- High performance, high-end gaming platform with backplane architecture for easy maintenance- Superior, highly scalable CPU/GPU performance- Advanced security feature set and software solutions- Highly flexible system configurations that are fully in line with real project requirements- Lower costs: due to implementation of socket-type Intel® CPUs- Flexible maintenance and upgrade: slot-in machine construction, socket-type CPU support- Flexible maintenance and upgrade: slot-in machine construction, socket-type CPU support- Full-scale customization: GDDR5, V-BIOS, video ports, I/O ports, etc.- High integration: FPGA & logging controller onboard
-
Product
3U OpenVPX VITA 66-67 Backplanes
-
VPX is a broadly defined technology utilizing the latest in a variety of switch fabric technologies in 3U and 6U format blades. Open VPX is the architecture framework that defines system level VPX interoperability for multi-vendor, multi-module, integrated system environments.
-
Product
Function Test and In-Circuit Test
CT350
-
ICT test points: max 2736 CAD Data import Automatic program generator Powerful debugging tools Test coverage analysis Paperless repair station Logging- and statistic functions Full graphical functions Panel and multisite tests Fast adapter exchange High Pin Count-Interface On table optional usable shelf part.
-
Product
Test Sockets
-
socket design as per customer specificationsquick + easy socket changehigh-performance spring probesdesigned for high frequency up to 16 GHz-55C/-67F to 150C/302F temperature rangemanual/automatic application optionssmall socket footprintone socket base for each insert (3x3 to 9x9 QFN)one-click switch from engineering to production socket modedevice dependent standard socket frame with changeable insertmore than 500,000 compression cyclesKelvin test applicabilitytool-free insert + actuator exchanges0.3 mm minimum lead pitchQFP extender available
-
Product
Microwave Testing
120
-
The MODEL 120 PICOPROBE® sets new standards in microwave probing performance. Benefiting from coaxial techniques, which have inherent low loss and low dispersion characteristics, the Model 120 Picoprobe®, achieves an insertion loss of less than 1.75 db (typical) and a return loss of greater than 15 db (max.) over its frequency range.
-
Product
Motor Testing
-
Electronic Systems of Wisconsin, Inc.
ESW's Motor Test Systems come fully equipped with the latest industry features based on your testing needs. The on-screen display in our testers make it easy to read, track, and record your motor information during the testing process. We realize this importance and want to make sure you never have to worry about losing key information ever again. Performance and reliability are important, so we make sure you will have full confidence of every motor you test, whether you place it in your product or send out the door to your customer. ESW's design team works closely with you to determine the tests you need, in order to make a system that will meet all your testing needs. See the slideshow below to see some of our Motor Testers.
-
Product
Memory Test System
T5230
Test System
T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
-
Product
Test Switches
Series FT
-
An industry standard for CT & VT isolationfor instrument transformer and connected device testing.Up to 10 poles; Numerous configurations availableTypically mounted on switchgear and relay panels10 pole test plug available; UL and cUL recognized.
-
Product
Universal Test System
LEON System
Test System
A universal ICT, FCT, ISP and Boundary Scan platform.Based on the ABex platform, which directly integrates Konrad analog bus technology and PXI/PXIe in one chassis, the LEON platform can be configured to solve various test challenges. Due to this architecture only one system provides the complete test flow combining ICT, ISP, Boundary Scan and FCT.Various form factors and configurations allow a perfect combination between cost, speed and test coverage. The modular architecture provides the possibility to reconfigure or upgrade the systems based on your test needs.The LEON System software provides a powerful development and test execution environment which directly supports NI TestStand. All systems and components could be integrated into third party software using supplied APIs.
-
Product
Functional Testing
-
Interface Testingevaluation of correct system module interaction Smoke Testinginitial testing process to check whether software is ready for further testingSystem Testingconducted on a complete, integrated system to evaluate the system's compliance with its specified requirements Integration Testingperformed to test units of code to verify interaction between various software components and detect interface defectsRegression Testingtesting to ensure changes made are not impacting previously working functionality Acceptance Testingperformed to make sure the software handles required tasks in real-world scenarios, according to specifications
-
Product
Test Equipment
-
Southern Photonics designed and manufactured all the test equipment currently being manufactured by Coherent Solutions, as well as equipment for non-telecoms applications. This includes FBG strain interrogators, optical pulse phase analysers, OSNR meters, optical power meters, optical spectrum analysers, optical gas sensors… you get the idea. All test equipment we build is robust and easy to use. The picture shows some of what we can do – anything from prototype benchtop test gear (as in the combination ASE source and laser combiner on top of the stack) to field test equipment (the portable fast OSA on the bottom).
