IV
measure of current flow as a function of voltage.
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Product
Pulsed IV Systems
AM3200-Series
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AMCAD Engineering has created professional, industry-proven pulsing technology for both standalone IV-testing (Pulsed IV, PIV) as well as pulsed-bias load pull (Pulsed Load Pull, PLP) and high-voltage power semiconductor applications. Systems come equipped with a mainframe controller which includes integrated power supplies. Input and output pulser modules (probes, pulsers) are selected for specific applications and are available in bipolar ±25V/1A and high-voltage 250V/30A models.
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Product
IV Tester System
PET-CC
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Application ■Mono crystalline silicon (Si) ■Multi crystalline silicon (mc-Si) ■Amorphous silicon (a-Si) ■Gallium arsenide (GaAs) ■Gallium indium arsenide (GaInAs)
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Product
IV Characteristics Measurement Device [
PECK2400-N
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Easy-to-use measurement software supports IV measurement (software + source meter + connection cable). Compatible with Windows 10. RS-232C connection (PC is optional). Works with NI GPIB. Simultaneous use with IPCE PEC-S20 D type is possible. There is only one operation panel. done on one screen.
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Product
Pulsed IV
AURIGA 4850
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Pulsed IV (current-voltage) measurements have emerged as the preferred method of capturing current-voltage characteristics of active devices such as field effect (FETs) and bipolar junction (BJTs) transistors.
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Product
High Throughput 1 ns Pulsed IV Memory Test Solution
NX5730A
Test Platform
Precise and fast characterization of new memory, such as spin transfer torque magneto resistive random access memory (STT-MRAM) from DC to high-speed pulsed IV measurement on silicon wafers Apply accurate and high-speed pulsed voltages (down to 1 ns pulse) to magnetic tunnel junction (MTJ) for STT-MRAM and precisely measure the resistance of MTJ Perform all typical MTJ characterization tests in one solution10 to 100 times faster cycle test, such as a bit error rate test (BERT)Capture and visualize MTJ switching waveforms clearly during the writing pulse Dedicated solution with Keysight Technologies’ technical expertise
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Product
IND CAT IV TRMS Clamp Meter with Temperature
ACD-3300
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This CAT IV rated ACD-3300 IND Clamp On Tester is ideal for industrial applications and utilities that require an extra level of safety. Including True-rms sensing for accuracy, this clamp on meter’s extra large jaws can clamp on to those wide diameter wires making taking measurements in industrial environments simple.
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Product
IND AC/DC CAT IV TRMS Clamp Meter
ACDC-3400
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The Amprobe ACDC-3400 clamp multimeter is CAT IV rated to add an extra level of safety for high voltage, industrial or utility testing applications. It is an AC/DC current clamp meter and a voltage meter all in one.
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Product
PathWave IV Curve Measurement Software
PW9251A
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The PW9251A PathWave IV Curve Measurement software helps to control Keysight SMUs for easy test setup and to perform IV measurements without any programming.
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Product
Triple Alarm CAT IV Non-Contact Voltage Detector with Flashlight
FLIR VP50-2
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The FLIR VP50-2 is a durable, CAT IV-rated non-contact voltage detector featuring light, vibration, and beeper feedback alarms and a powerful LED flashlight. Use the VP50-2 to reliably check if an AC circuit is live before beginning work; detect voltage on exposed conducting parts or through insulation; identify live wires within electrical panels, switches, and outlets; or trace live wires and map circuits. With an ergonomic and drop-tested design, the FLIR VP50-2 is the right choice for professionals performing field troubleshooting and verification of electrical installations within residential, commercial, and industrial buildings.
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Product
Ferroelectric Test System
LCII
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Precision LC II is an affordable Ferroelectric Tester for research labs. This system offers 5Khz at 9.9V and also comes in a built in 10V, 30V, 100V, and 200V option. This unit can also be expanded to 10kV for bulk ceramic testing. Vision Software is provided with the LCII Test System. Vision uniquely allows the user to construct complex or simple programs with any number of tests to characterize all aspects of the sample in one execution while keeping track of the measurement results and the history of the sample being tested. Tasks such as Hysteresis, I/V, C/V, PUND, Waveform, Magnetoelectrics, Piezoelectrics are just a few features to choose from.
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Product
Solar Array IV Curve Simulation Softpanel
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Chroma Systems Solutions, Inc.
Easily program the I-V curve of the Solar Array Simulator with this test software as well as the I-V and P-V curves for real-time testing. See both dynamic and static MPPT efficiency and even simulate the IV Curve with shadows. The real world weather simulation function allows the user to simulate the irradiation intensity and temperature level from early morning to nightfall.
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Product
PXIe-4147, 4-Channel, ±8 V, 3 A Precision PXIe Source Measure Unit
786888-01
Source Measure Unit
PXIe, 4-Channel, ±8 V, 3 A Precision PXI Source Measure Unit - The PXIe-4147 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote four-wire sensing for accurate measurements. The sample rate of the PXIe-4147 can reduce measurement times, capture transient device characteristics, and help you perform current-voltage (I-V) characterization of devices-under-test (DUTs). With a high-speed sequencing engine, you can synchronize SMUs with each other or with other instruments such as switches or high-speed digital test modules. Additionally, you can tune the PXIe-4147 response to any load to achieve optimum responses with maximum stability and minimum transients using SourceAdapt technology.
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Product
High-Power Low-Loss Pulsed Bias Tees
MBT series
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The MBT-series of bias tees is based on Maury's patented broadband capacitor (US Patent 9,614,267) which simultaneously enables the industry's widest bandwidth, lowest insertion loss and lowest return loss in a coaxial bias tee up to 18 GHz. In addition, its unique design makes it ideal for pulsed applications, including pulsed IV and pulsed load pull characterization, without distorting the voltage and current waveforms.
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Product
Reference Cells
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Reference cell is used for measuring and setting the intensity of solar simulators for one sun (or other user desired) intensity condition. They are also used to calibrate the IV Measurement system photo-detector intensity to match the measured ISC to calibrated ISC.
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Product
Engineering Design & Development
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TPSA has over 20 years of experience in Engineering Design & Software Development including:Hardware & Software DesignOTPS Acquisition SupportSystems Installation & SupportAircraft Modification/CertificationEngineering Studies & AnalysesFunctional & Systems TestingIndependent Verification & Validation (IV & V)Test Program Set EngineeringReliability & Maintainability (R&M)Engineering Drawings & DataConfiguration Data ManagementReverse EngineeringRequirements AnalysisSupport Equipment (SE)Aircraft Launch & Recovery Engineering (ALRE)Engineering Change Proposal (ECP) ReviewTechnology Insertion (TI)PDR, CDR, FAT, Techeval, OSV Support
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Product
Semiconductor Device Parameter Analyzer/Semiconductor Characterization System Mainframe
B1500A
Analyzer
Current-voltage (IV) measurement capabilities of spot, sweep, sampling and pulse measurement in the range of 0.1 fA - 1 A / 0.5 V - 200 VAC capacitance measurement in multi frequency from 1 kHz to 5 MHz and Quasi-Static Capacitance-Voltage (QS-CV) measurement capabilitiesAdvanced pulsed IV and ultra-fast IV measurement capability from minimum 5 ns sampling interval (200 MSa/s)Up to 40 V high voltage pulse forcing for non-volatile memory evaluation
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Product
Ultra Pure Vacuum Switch (longbody, NEMA 4)
W117LV
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The W117LV NEMA IV Rated Ultra Pure Stainless Steel Vacuum Switches have all welded stainless steel interiors which are Helium leak checked to pass 4 x 10-9 Std cc/sec. These are the weather-proof, liquid-resistant version of the W117V suitable for outside applications or in areas of condensing humidity.
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Product
High-Resolution Precision SMU (10 FA, 210 V)
PZ2110A
Source Measure Unit
The Keysight PZ2110A is a precision source / measure unit (SMU) that expands precise measurements from conventional static measurements and pulsed measurements, to fast dynamic measurements. It is ideal for a wide variety of current versus voltage (IV) measurement tasks that require both high resolution and accuracy. The PZ2110A can accurately perform characterization, parametric tests, and reliability tests of semiconductors, active / passive components, and general electronic devices.
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Product
Oscilloscope: 1.5 GHz, 4 Analog Channels
DSOX4154G
Oscilloscope
12.1-inch display, capacitive touch screen technology, InfiniiScan Zone touch triggering, 1-million-waveforms/sec update rate, MegaZoom IV smart memory technology, and standard segmented memory
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Product
PXI-4132, 100 V, 2 W Precision PXI Source Measure Unit
780558-01
Source Measure Unit
±100 V, 10 pA Precision PXI Source Measure Unit—The PXI-4132 is a programmable, high-precision source measure unit (SMU). It has a single isolated SMU channel that offers a four-quadrant output that incorporates remote (4-wire) sense as well as external guarding. With its high measurement resolution integrated guarding, the PXI-4132 is ideal for high-accuracy leakage measurements on integrated circuits, discrete components, PCBs, and cables. You can also perform high-speed I-V measurements on a variety of components including diodes and organic LEDs using the onboard hardware sequencing engine. In addition, you can synchronize multiple PXI-4132 modules using the PXI backplane to provide high-speed I-V measurements on transistors and more complex devices.
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Product
3.5 Digit Handheld Clamp Meters
U1210 Series
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Measurements of electrical distribution cables can be challenging and risky. For cables up to 2 inches in diameter, the Keysight U1210 Series (U1211A, U1212A, U1213A) handheld amp clamp meters (also known as clamp-on ammeters) enable high-current measurements without breaking the circuit. Plus, they provide an extra layer of protection with CAT IV 600 V and CAT III 1000 V safety ratings and include full digital multimeter (DMM) measurement features.
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Product
OPV/DSC/Perovskite IV measurement System
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King Design Industrial Co., Ltd.
The system can measurement the 3rd generation of solar cell IV performance. The system patent with eliminate capacity effect that can ensure the test repeatability coincidence.
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Product
Precision Source / Measure Unit (2 Ch, 10 FA)
B2912B
Source Measure Unit
The Keysight B2912B precision source / measure unit (SMU) is a 2-channel, compact, and cost-effective benchtop SMU with the capability to source and measure both voltage and current. It easily measures current versus voltage (I/V) with high accuracy. The 4-quadrant source and measurement capabilities enable taking I/V measurements without configuring multiple instruments.
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Product
PMC Module
PMC-CIV-COM-ISO
PMC Module
User Programmable AlteraCyclone IV FPGA 484 BGA:• Stand alone possibility• Single wide PMC Module• 20 LVDS,2 RS-422,1 RS-232• Optional User clock oscillator
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Product
PV Analyzer I-V Curve Tracers
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The Solmetric line of PV Analyzer I-V curve tracers are widely used in Commissioning, Auditing, O&M, and Troubleshooting of PV systems.
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Product
Automated I-V/AOI/EL and Sorting System
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OAI’s High Performance In-line Automated-I-V Testing, AOI/EL Inspection and Sorting/Binning System for Various Si Solar Cells. The 10000A-I-V System is a unique and reliable I-V testing, AOI/EL Inspection and Sorting / Binning system for testing of Mono, Multi-Si, C-HJT and other full Size (156mm x 156mm) and/or Cut-cell (156mm x 39mm or 156mm x 31.2mm or other custom sizes) Si Solar Cells.
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Product
Real-Time Clock & Interrupt Module
RCIM IV
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The Real-Time Clock & Interrupt Module (RCIM IV) is a multifunction card designed for time-critical applications on Concurrent Real-Time’s iHawk™ multiprocessing systems. The RCIM provides key functionality for single system as well as multiple system applications.
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Product
LIV – High-power Laser Diode Testing
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An important aspect of the development and manufacture of laser diodes is the so-called laser diode characterization, or laser IV curve. By applying increasing current to the laser diode so it that emits light, the optical output is measured together with the voltage drop across the diode element. The resulting LIV curve reveals important clues about the quality of manufacture and the performance of the laser diode, enabling a pass/fail decision to be met.
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Product
3 Phase Meter - Anti-Clockwise
135012
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IEC 1010 Rating: 1000V Cat III/600V Cat IV Double/Reinforced InsulationFeatures: For Use In The Installation and Operation Of 3 Phase Equipment.
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Product
SolarIV Series Solar Cell Current Voltage Measurement System
SlarIV
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SolarIV IntroductionOne of the key measurements needed for photovoltaic devices in the measurement of their I-V characteristics. Through measuring the I-V curves the user can determine physical performances of devices such as photo-electric conversion efficiency, fill factors and so on. Such data is important for reliable work in research and quality inspection. ZOLIX supply the SolarIV system and the most perfect, professional technical support.
