I-V-Curve
See Also: Photoluminescence
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Product
Multi-functional High-speed I-V Measurement System
“Rakit”
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Rakit is a maintenance device to measure current and voltage characteristics string by string, to grasp solar system characteristics, abnormal data, etc. The device comprising of I-V tracer, pyranometer, thermocouple, data logger, and "I-V data analyzer," the multi-functional analyzing software, provides accurate analysis report quickly. The I-V data analyzer is compatible with the following I-V tracers:
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Product
Automated I-V/AOI/EL and Sorting System
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OAI’s High Performance In-line Automated-I-V Testing, AOI/EL Inspection and Sorting/Binning System for Various Si Solar Cells. The 10000A-I-V System is a unique and reliable I-V testing, AOI/EL Inspection and Sorting / Binning system for testing of Mono, Multi-Si, C-HJT and other full Size (156mm x 156mm) and/or Cut-cell (156mm x 39mm or 156mm x 31.2mm or other custom sizes) Si Solar Cells.
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Product
OPV/DSC/Perovskite IV measurement System
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King Design Industrial Co., Ltd.
The system can measurement the 3rd generation of solar cell IV performance. The system patent with eliminate capacity effect that can ensure the test repeatability coincidence.
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Product
Semiconductor Curve Tracer
CS-8000 Series
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The CS-8000 series are equipped with a high-voltage source of up to 5 kV and a high-current source of 2 kA. It features Pulse output, Gate pattern, and very small current measurement capabilities, and it supports the design evaluation of wideband-gap semiconductors such as SiC and GaN.
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Product
Solar Cell PL/EL/IV 3-in-1 Testing System
VS6841
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Industrial Vision Technology Pte Ltd.
This luminescence Analyzer integrates a Photoluminescence (PL), Electroluminescence (EL) , and I-V Measurement Technology, has a Device’s PL image, EL image, as well Device’s I-V characteristics in One system. It is being using to quantitatively map Minority-Carrier Lifetime, and to characterize the defect of silicon wafer & solar wafer, and measure the key parameters from solar cell I-V Curve. It is also a useful tool for scientist to develop other methodology & parameters that can be used as a promising technique for online material monitoring and process control.
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Product
Power Device Analyzer / Curve Tracer
B1505A
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The Keysight B1505A Power Device Analyzer / Curve Tracer is the only single box solution available with the capability to characterize high power devices from the sub-picoamp level up to 10 kV and 1500 A. These capabilities allow evaluation of novel new device such as IGBT and materials such as GaN and SiC. The B1505A supports a variety of modules: high voltage SMU (HVSMU), high current SMU (HCSMU), ultra high current (UHC) module, ultra high voltage (UHV) module and high voltage medium current (HVMC) module. The B1505A also supports: high-power SMU (1 A/200 V), medium-power SMU (100 mA/100 V) ,medium-current SMU (1 A/30V pulsed, 100 mA/30V DC) and a multi-frequency capacitance measurement unit (1 kHz 5 MHz). Its ten-slot modular mainframe allows you to configure the B1505A to suit your measurement needs.
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Product
PVPM1540X IV Curve Tracer For High-Capacity PV Strings
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Product
Flat Field and Imaging Gratings - Type IV
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HORIBA Scientific produces a wide range of holographic master gratings from which high precision replicas are manufactured.Type IV aberration-corrected flat field and imaging gratings are designed to focus a spectrum onto a plane surface, making them ideal for use with linear or 2-D array detectors.These gratings are produced with grooves that are neither equis-paced nor parallel, and are computer optimized to form near-perfect images of the entrance slit on the detector plane.
