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Product
Test System
2000/DATS
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WesTest Engineering Corporation
The WesTest-2000/DATS features Teradyne's high performance Digital Test Instrument and state-of-the-art intrsuments from Agilent, Elgar and North Atlantic.
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Product
PCIe 2.0 Test Platform
PXP-100B
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The Teledyne LeCroy PXP-100B Test Platform provides a convenient means for testing PCIe 2.0 add-in cards with a self-contained portable and powered passive backplane. The PXP-100B provides power required for both cards under test, and an interposer can be used for connection to a protocol analyzer. As an alternative to an interposer, the PXP-100B includes two mid-bus probe footprints to allow connection to an analyzer via a mid-bus probe.
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Product
Smart Sensing Systems
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The Astronics Smart Aircraft System enables the gathering of information through sensor and IoT technology to help airlines gain the valuable insight needed to increase passenger satisfaction, improve operational efficiency, and lower costs.
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Product
Advanced SoC/Analog Test System
3650
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Chroma 3650 is an SoC tester with high throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses.
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Product
Test Fixture
16047E
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Perform impedance evaluation of lead type devices of up to 120 MHz; includes a guard and a shorting plate
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Product
Sound Level Test System
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In a world where precision and performance rule, measuring and controlling sound levels can be crucial to the success of your product or project. The team at Integrated Test & Measurement (ITM) have developed a customized solution that not only measures and collects sound-level data, but will help your team identify the specific components causing all that noise.
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Product
TD-SCDMA Analysis Using NI PXI RF Test Instruments
NI-RFmx TD-SCDMA
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The NI-RFmx TD-SCDMA personality is a highly optimized API for performing physical layer measurements on TD-SCDMA cellular standard signals. NI-RFmx TD-SCDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Product
PCIe 5.0 Test Platform
PXP-500A
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The Teledyne LeCroy PXP-500A Test Platform provides a convenient means for testing PCIe 5.0 cards with a self-contained portable and powered passive backplane. The PXP-500A provides power required for both cards under test.
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Product
Wafer Chip Inspection System
7940
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Chroma 7940 wafer chip inspection system is an automated inspection system for postdiced wafer chip inspection.
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Product
PXI Semiconductor/IC Test System
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A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196A
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The 16196A surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
Test Program Sets & Custom System Level Software
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WesTest Engineering Corporation
WesTest Engineering Corporation offers turnkey test solutions for the military and aerospace sectors. Our engineering capabilities present an unmatched ability to take customer test requirements and design, developand integrate Test Program Sets (TPS) with diagnostics to the component level. This is further supported by a full complement of documentation, from Test Requirements Documents, to TPS Flowcharts, to Test Reports.With 36 years’ experience and 1000+ TPSs in our history, the WesTest Engineering Staff remains as one of the top notch senior staff’s in the TPS sector today. Our leadership and program management have the historicalexperience to lead WesTest capability to meet the customer’s requirement.
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196B
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The 16196B surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results, reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement. Now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
Mezzanine System Carrier
MMS6245
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The MMS6245 gives you the ultimate flexibility in rugged embedded I/O by allowing you to customize the 64 user-configurable front panel signals with our patented Electrical Conversion Module (ECM) technology. This configurable XMC carrier can host up to four ECMs giving you the ability to customize I/O to your specific needs.
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Product
Test System
Tessy
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TESSY automates the whole unit test cycle including regression testing for your embedded software in C/C++ on different target systems. As an easy-to-install and easy to operate testing tool TESSY guides you through the unit test workflow from the project setup through the test design and execution to the result analysis and reporting. TESSY takes additionally care of the complete test organization as well as the test management, including requirements, coverage measurement, and traceability.
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Product
Memory Test System
T5511
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Offering Multi-functionality and Industry's Top Test Speed of 8Gbps.
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Product
Test Systems
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6TL’s speciality is simplifying the architecture of test systems, so that our customer’s Total Cost Of Ownership is drastically minimized. The technology that conveys our mission is called FastATE.FastATE technology is based on using intelligent modules to build test systems.
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Product
Radisys Management System
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The Radisys Management System is a carrier-grade management solution built to scale as your network evolves while maintaining high-performance levels.
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Product
Semi-Rigid Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131G
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The Keysight 85131G is a 53 cm (21 in) long1 semi-rigid cable with a 3.5 mm female2 to 3.5 mm male connector. Cable frequency range is dc to 26.5 GHz with a return loss of 16 dB or better. Insertion loss is 0.3 * sqrt (f) + 0.2 dB (where f is frequency is GHz) for the test port connector, and 1.8 dB at maximum frequency for the device connector. Phase stability of semi-rigid/flexible cables is characterized with a 90 degree bend using a 4 inch radius. Stability1 of the Keysight 85131G is 0.06 dB and phase is 0.16o * f + 0.5o (where f is frequency in GHz).
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Product
Design for Testability (DFT Test)
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Corelis can provide you with design consultation and an analysis of your design for boundary-scan testability. We will review your design and make specific recommendations that if implemented will improve the testability. We can also suggest improvements that will increase test coverage and allow boundary-scan to be implemented in a more cost-effective manner.This service also includes a DFT test coverage analysis that we recommend to do after schematic capture and before PCB layout. At this stage of product development, Corelis provides you with a comprehensive test coverage reports that identifies all of the boundary-scan nets and pins and classifies them as completely tested, partially tested, or not tested. The report also recommends where to add test points (pads) for physical “nails” access if additional test coverage is required.
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Product
ATE Test Systems
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Introducing the Procyon ATE System! When it comes to ATE Test Systems for a for low- to high-volume production, Intepro has the testing power you require to be successful. For more than three decades, Intepro Systems has designed, built and integrated power supply test equipment for the world’s largest and smallest power supply manufacturers.
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Product
Test System
MxDSRC™
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The MxDSRC Test System simulates systems in the vehicle that interact with the DSRC radio module to create tests closely replicating real-world scenarios. Its integrated approach allows the DSRC components, such as RF quality and protocol conformance, to be exercised with multiple system components. MxDSRC provides a powerful and easy-to-use framework for testing your DSRC system.
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Product
MirrorLink Test System
Catena 2210
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The Catena 2210 is a test tool with two USB Network Control Model ("NCM") devices. These devices create a bridge between two USB hosts. Validation testing is made possible by connecting a test control computer to the USB host being tested. Ethernet traffic from the test host is transferred through the Catena 2210 device to the control host, and vice versa.
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Product
Automated Testing System
PV-LIT
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Thermographic solutions ensure high quality of solar cells and modules.Usable for all types of solar cells and modules (silicon-based or thin-layered)Testing in laboratory and in-line in the course of the manufacturing processTesting of various solar cells and modules through contact and non-contact measurementCell-specific system configuration and determination of test criteria and kind of defects
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Product
Vibration Testing System
F Series
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Suited to durability tests for all industrial products such as aeronautical, automobile, electronic and precision equipment.
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Product
In-Line RF Test Platform
AR925
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This functional and RF test platform combines outstanding productivity with substantial equipment savings. The Faraday chamber of the fixture comes with an interchangeable cassette to minimize the testing cost of each new product
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Product
Pump Test System
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This automated test system evaluates a wide range of performance metrics for a cooling pump assembly. The LabVIEW based system programs the DUT then initiates a series of tests to check:Serial communication verificationMotor voltage & currentImpeller speed and flowAir and water temperaturesLeak and level sensor functions
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Product
Optics Test Systems
F Number Meter
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Optik Elektronik Gerätetechnik GmbH
The f-number of a camera lens is defined as the quotient of the focal length f' and the diameter of the entrance pupil. The f-number measuring device is a simple structure for the automatic, software-controlled measurement of the f-number of optical systems.
