Fine Pitch
Fine Pitch Probes range from 0.25 mm to 0.50 mm pitch. They are suitable for sockets and contactors with high pin count.
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Product
Fine Pitch & Interface Solutions
1147211
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Fine Pitch & Interface Solutions by FEINMETALL represent the pinnacle of reliability and precision in electronic component testing. With a focus on fine pitch probes available in various pitch sizes from 0.11 mm to over 0.50 mm, these solutions cater to a wide range of applications. The experience gained over more than 60 years in test engineering ensures that FEINMETALL constantly meets the high demands of the high-tech industry, providing tailored solutions for board tests, wire harness checks, and high-current applications.
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Product
Fine Pitch Probes (300µm - 500µm) FP350D2901B021G020L076
1114002
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The Fine Pitch Probes (300µm - 500µm) model FP350D2901B021G020L076 is designed for precision applications requiring high reliability and performance in the soldering process. With an advanced double plunger design, these probes demonstrate exceptional durability and efficiency, suited for working with pitch sizes as small as 0.50 mm. The temperature range of -45°C to +150°C ensures versatility across various environments, making these probes critical for both industrial and lab settings.
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Product
Fine Pitch Probe FP510S01S036L050L203
1003758
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The FP510S01S036L050L203 fine pitch probe is engineered for high-precision applications, particularly suited for continuous use within temperature ranges of -45°C to +100°C. This robust design boasts a fine pitch of 0.70 mm (28 mil), making it ideal for advanced interfacing with miniature electronic components. The probe is part of the FP-S family, well-regarded for its reliability and performance in electronic testing environments.
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Fine Pitch Probes (< 300µm) FP260D0301B014G025L072
1023003
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The Fine Pitch Probes (FP260D0301B014G025L072) are designed for precision and reliability in various electronic applications. This specific model features a double plunger probe design that allows for a pitch of 0.35 mm, making it suitable for ultra-fine pitch connections in dense electronic configurations. It operates effectively within a temperature range from -45°C to +150°C, ensuring stability across environments. The robust construction includes beryllium copper for the plunger material and incorporates gold plating, enhancing conductivity and durability.
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Product
Narrow (Fine) Pitch Connectors
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Panasonic Industrial Devices Sales Company of America
Panasonic’s industry leading “tough contact” design provides customers with the reliability that is required when developing the latest computer or wearable device. Our Narrow (Fine) Pitch Connectors line-up includes both Board-to-Board and Board-to-FPC options. Backed by our staff of technical engineers, Panasonic offers a full “hands on” solution from designing-in assistance to manufacturing. Discover how Panasonic Narrow Pitch Connectors can elevate your applications.
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Product
Fine Pitch Stencil Printer
MC110
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MC110 SMT stencil printer offers quick and easy setup via tooling hole or edge mounting for both single and double-sided boards. Exceptional build quality, with a heavy-duty cast aluminum base, ensures stability and repeatability.
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Fine Pitch Probes (< 300µm) FP200DF7111B020G015L045
1024610
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The Fine Pitch Probes FP200DF7111B020G015L045 provide an ideal solution for various applications requiring precision and reliability. Engineered with a double plunger probe design, this model is particularly well-suited for environments where performance under temperature extremes is essential, operating effectively between -45°C and +120°C. It combines advanced engineering with robust materials, making it versatile for high-frequency applications, with a frequency handling capability of up to 18.80 GHz.
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Fine Pitch Probes (300µm - 500µm) FP380D0301B025G023L032
1127923
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The Fine Pitch Probes (300µm - 500µm) FP380D0301B025G023L032, also known by the order code 1127923, are engineered with precision for high performance in various electronic testing applications. Featuring a double plunger probe design from the FP-D family, these probes are designed to meet rigorous standards for accuracy and reliability. With a pitch of 0.50 mm (20 mil), they offer superior electrical connectivity and durability, functioning optimally across a temperature range of -45°C to +120°C. The probes maintain a continuous current of 1.40 A with a typical contact resistance of 100 mOhm, achieving peak frequency performance at 29.30 GHz.
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Product
100-Pin Micro-D Connector, Male, Ribbon Cable, 2-56 UNC Screwlocks, Metal Shell
C100SMR-1CR-6A
Ribbon Cable
This accessory is designed to allow users to directly terminate a cable to the connector. It is difficult to terminate cable to the 100-Pin SCSI Style Micro-D connector because of the high density and fine pitch. Pickering Interfaces recommends the use of purchased cable assemblies for applications where most or all of the contacts are in use.
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Fine Pitch Probes (> 500 Μm) FP510D0101B035G050L166
1001356
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The Fine Pitch Probes FP510D0101B035G050L166 are designed with precision and reliability at the forefront, making them an essential choice for companies requiring high-performance testing solutions. Engineered with a double plunger probe design, these probes feature a pitch of 0.70 mm (28 mil), allowing for meticulous connections in tight configurations. The probes operate efficiently across a wide temperature range from -45°C to +100°C, ensuring adaptability in various environmental conditions.
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Product
CMOS Image Sensor
CIS
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CMOS Image Sensors (CIS) allow multiple camera functions in mobile devices, automobiles and security systems. Nidec SV Probe provides both standard and advanced versions of our CIS cards employing a wide variety of materials ensuring a durable cost-saving solution that can meet the fine pitch and multi-dut challenges of these devices. Other features and benefits include: • Proprietary AC™ Alloy Probes • Reduced Damage Under the Pad • High Frequency Capability • Better Alignment StabilityOur advanced CIS card, the Multiplexer™, is offered specifically for high density and high parallel applications. The Multiplexer™ is built with cantilever needles held into place on one side and shorter AC™ probes on the other which leads to a more stable electrical characterization over other CIS probe card options.Contact your Nidec SV Probe Representative so we can help you find the right CIS product for your testing needs.
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Test Contactor/WLCSP Probe Head
ACE
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ACE™ test sockets offer optimal RF performance for fine pitch FBGA, QFN and wafer-level packages for Power Amplifiers, RF switches and mobile communications. Supporting pitches down to 0.4 mm, ACE features an innovative design that provides superior performance, improved yields and power efficiency.ACE probe heads deliver exceptional electrical performance, both DC and RF. Manufactured from HyperCore™ base material, a proprietary material of Cohu’s Everett Charles Technologies, ACE probes have the electrical properties of BeCu with the non-oxidizing properties of a precious metal. The short signal path, sharp tips, and large contact area between plungers provide high current conductance and reliable contact with less force.
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Product
Switch Probes (Normally Open (NO)) F88617K500U350SM
1004292
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The Switch Probes F88617K500U350SM, identified by the MPN 1004292, is an exemplary addition to the F886-NO family of basic contact probes, designed to meet rigorous standards in precision and reliability. This probe features a finely calibrated pitch of 3.50 mm, enabling it to operate effectively within a temperature range of -45°C to +100°C. The unique design incorporates a preload of 130 cN and a spring force of 350 cN, ensuring that it responds with the necessary sensitivity while maintaining durability across various applications.
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Fine Pitch Connector Test
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C.C.P. Contact Probes Co., LTD.
Our Ceramic/Aluminum sockets have a lifetime of up to 30,000 cycles.
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Contact Probes
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Rika Denshi Group Contact Probes - specialty probes including fine pitch testing, high frequency testing, high temperature testing, kelvin test, and high current test, as well as standard probes for 0.4mm-, 0.5mm-, 0.65mm-, 0.8mm-, and 1.0mm pitch.
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Fine Pitch Probes FP800D2901B050G025L057
1130428
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The Fine Pitch Probes FP800D2901B050G025L057 are engineered for precision applications requiring outstanding reliability and performance across various temperature ranges. Designed within the FP-D family, these double plunger probes are optimal for tight pitch applications, featuring a pitch measurement of 1.00 mm / 39 mils, and are capable of operating effectively from -45°C to +200°C. Their compact design, with an overall length of 5.70 mm and a projection height of just 1.10 mm, makes them suitable for use in high-density electronic assemblies where space is a critical factor.In terms of electrical performance, the FP800D2901B050G025L057 probes can handle a continuous current of up to 3.50 A, while maintaining a minimal typical contact resistance of 55 mOhm. Moreover, they are designed to perform at frequencies of up to 7.10 GHz, ensuring high-speed data integrity for demanding applications. Mechanically, these probes exhibit a preload of 10.00 cN with a maximum travel capability of 0.85 mm, ensuring optimal contact while minimizing wear. Crafted from high-quality materials, the probes feature beryllium copper plungers with gold plating, ensuring both excellent conductivity and resistance to corrosion, thereby enhancing their lifespan and reliability in various environments.
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Product
Fine Pitch Probe (> 500 Μm) FP580D2903B030G060L059HS1
1025408
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The Fine Pitch Probes model FP580D2903B030G060L059HS1 is a double plunger probe designed specifically for high-precision applications. This model features a pitch of 0.75 mm (30 mil) and operates effectively within a temperature range of -45°C to +200°C, making it suitable for challenging environments. The unique HS1 designation indicates an additional layer of functionality, providing users with enhanced performance characteristics, particularly in high-density interconnect applications.
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68-Pin VHDCI Connector, Slimline - Male, Solder
C068VMR-6SB-6A
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This slimline version of the VHDCI connector is designed to allow users to directly terminate a cable with soldered connections to the 68 Way VHDCI connector. It is difficult to terminate cable to the 68 pin VHDCI because of the high density and fine pitch. Pickering Interfaces recommends the use of purchased cable assemblies for applications where most or all of the contacts are in use.
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Fine Pitch Probes (300µm - 500µm) FP380S01B027L050L203
1003134
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The Fine Pitch Probes (300µm - 500µm) FP380S01B027L050L203 is an advanced probing solution designed for high-precision tasks in a variety of applications. Designed with a pitch of 0.50 mm, or 20 mil, these probes can operate efficiently within a temperature range of -45°C to +100°C, making them suitable for demanding environments. The smart engineering behind the FP-S family of probes ensures reliable performance with a maximum continuous current handling capacity of 1.00 A and a typical contact resistance of merely 250.00 mOhms, which makes them ideal for applications requiring minimal electrical interference and consistent signal integrity.
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Product
CAM/TRAC Test Kits
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The Camtrac (registered trademark) series test fixtures provides ‘Z’ axis motion that reduces probe side loading typically seen with Clamshell type test fixtures. This not only extend the life of the probes, but additionally, provide better probing accuracy, especially on fine pitch test centers. Camtrac fixtures are available with the most widely used interfaces in the test industry.
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Product
Fine Pitch Probes (300µm - 500µm) FP380D1111B027L050L243
1003137
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The Fine Pitch Probes (300µm - 500µm) FP380D1111B027L050L243 represent a significant advancement in precision probing technology, designed to meet the stringent requirements of modern electronics testing. This innovative double plunger probe falls within the FP-D family, featuring a compact pitch of 0.50 mm (20 mils) which is essential for accessing densely packed circuitry. Capable of operating in temperatures ranging from -45°C to +100°C, these probes provide versatility and reliability under varying conditions.
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Product
In-Circuit Tester Integration
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The benefits of boundary-scan are noticed in all phases of a product life cycle. By coupling the power of Corelis boundary-scan tools with an In-Circuit Tester (ICT), a complete, integrated solution is available that offers the best advantages of both technologies.Boundary-scan operates as the perfect companion to ICT. Boundary-scan is capable of testing areas of printed circuit board assemblies that are difficult to access due to physical space constraints and loss of physical access, which is often due to fine pitch components such as Ball Grid Array (BGA) devices. Conversely, the ICT is able to check the non-boundary-scan compatible portion of the unit under test (UUT) such as analog.
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Fine Pitch Spring Probes
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For MARATHON series, we have ultra-fine spring probes with high quality for small lot order and in short lead time. We have product range from probe outer diameter 0.11mm.
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Automated Bare Board Tester with Built-In Camera
QTOUCH2404C
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Qmax Test Technologies Pvt. Ltd.
Qtouch2404C – Automated Bare Board Tester with in-built camera is designed to make automatic image capturing and probing of bare PCBs. It is designed to move on X,Y,Z directions making it possible to probe every test point. Flying Probe Tester is designed for testing high density fine pitched Single Sided / Double Sided and Multilayer PCBs for continuity and isolation using moving probes fixture –less technology.
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Step Probe (F732SP) F73216B1025G150SP1
1009392
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The Step Probes F732SP (Order Code: 1009392) offers an advanced solution for precise electrical connectivity and performance. Designed for a temperature range of -45°C to +100°C, these probes feature a finely tuned pitch of 2.54 mm (100 mil) to ensure compatibility with a wide array of applications. Their compact size does not compromise on power, as they support continuous currents up to 5 A and exhibit a typical contact resistance of just 20 mΩ, making them ideal for high-performance electronic tasks where reliability is paramount.
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Fine Pitch Test Probes
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Micro probes allow very fine pitch testing ranging from 0.13mm to 0.35mm pitchLow Resistance, Low inductance, High FrequencyWide selection of plating options to optimize contact challenges and maximize probe lifeTri-temp applications – 55°C to 155°C
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Product
Fine Pitch Probe ( < 300µm) FP280DF2901P019U010L033
1120799
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The Fine Pitch Probes ( < 300µm) FP280DF2901P019U010L033 are expertly designed components that deliver exceptional performance in various soldering applications. These probes feature a double plunger design within the FP-DF family, ensuring reliable connections and precise measurements even at extreme temperatures ranging from -45°C to +150°C. With a pitch of just 0.35 mm (14 mils), they are ideal for micro-electronic assemblies where space is critical.
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General Purpose Probes
General Purpose Probe
*High current*Fine pitch*Long travel*Mounting options
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Product
FP510D0101S036L050L243
1005083
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The FP510D0101S036L050L243, designated with order code 1005083, is a high-performance Double Plunger Probe that excels in precision applications requiring substantial reliability. Designed within the FP-D family, this probe features a fine pitch of 0.70 mm (28 mil), making it a suitable choice for intricate electronic testing scenarios. It operates effectively within a temperature range of -45°C to +100°C, accommodating diverse operational environments while maintaining exceptional performance.
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Double Plunger Probe FP650D0301B035G030L057
1131068
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The FP650D0301B035G030L057 is a precision Double Plunger Probe from the FP-D family, designed for applications requiring exceptional accuracy and reliability. With a fine pitch of 0.80 mm (31 mil), this probe excels in environments demanding exacting standards. Its operational temperature range spans from -45°C to +150°C, making it suitable for diverse applications under varying thermal conditions. Crafted from high-quality materials such as beryllium copper for the plunger and bronze for the barrel, this probe is engineered for longevity and durability, enhanced by a gold plating that ensures superior conductivity and resistance to corrosion.
