Defect
other than specified, imperfection .
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Product
Software
Interface Analysis
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Surface-mount components warp during the reflow process, and the area where they attach also changes shape during assembly. This interface between components is where solder, paste, and gaps created due to thermal expansion combine to create 100% good products, or defects such as Head-in-Pillow, Shorts, and Opens. Fully understanding that critical interface between surfaces is more important than ever.
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Product
Review System
RV-3000
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Reduces surface inspection device review time and contributes to greater inspection efficiency! This system uses address information for defects detected by surface inspection equipment to acquire images of defects with a high level of magnification, and categorizes defect types.
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Product
Semiconductor
DieMark
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DieMark Inking Systems are available in Electric and Pneumatic models and utilize convenient, disposable DieMark Ink Cartridges to streamline and optimize the process of marking defective die. With models available for nearly every test platform and configuration, Xandex inking systems are in operation daily in every corner of the world where wafer sort is performed.
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Product
Infrared Microscope
DDR200 & DDR300
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The McBain DDR200 and DDR300 for 200mm and 300mm wafer defect detection and review are unmatched in value and features in this special application and price category. The systems offer significant and unique advantages for both production and engineering use, and provide an ideal solution when both defect detection and dimensional metrology are required.
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Product
Ultrasonic Imaging System
USPC 3010
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Ingenieurbüro Dr. Hillger Ultrasonic-Techniques
Detects internal defects in new materials and metals. The wide frequency range up to 35 MHz enables highestresolution. A-, C-, and D-scans can be recorded. The imaging in B-scans is an option.
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Product
T8090 Dual Absolute Leak Tester
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The Dual Absolute.The new Dual Absolute technology makes it possible to eliminate the disadvantages of a classic differential system, improve its advantages and renew an industry that has been standing still for decades. Thanks to the new Dual Absolute technology, ForTest has combined the simplicity of a classic absolute decay system with the precision and sensitivity of a differential system, bringing leak testing instruments to a level never seen before.The new algorithms and measurement hardware eliminate typical defects in a differential system, such as differences in stabilization between the test part and the reference sample.The new range of instruments is able to work in 3 different ways: Pure Differential, Dual Absolute and Central Zero.The new Dual Absolute technology is so powerful and reliable that ForTest has decided to stop developing the classic differential system.
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Product
3D Sensor (Shiny Surfaces)
reflectCONTROL
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reflectCONTROL is designed specifically to meet the high quality requirements that ensure high quality for shiny surfaces. The system based on deflectometry projects a striped pattern onto the measurement object. Defects on the surface cause deviations from the striped pattern which are recorded by cameras and evaluated by software.
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Product
Automated Control System for Veneer Edge Gluing Line
Vikat
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The automated veneer splicing line control system is designed to identify defective veneer areas, control the scrap trimming, bonding of suitable areas and the formation of output sheets of a given size.
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Product
Frequency Conversion Rotating Magnetic Fla
MT-2XCF
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MITECH MT-2XCF rechargeable frequency conversion rotating magnetic flaw detector is based on principle that the leakage magnetic field can absorb the magnetic powder. Make use of magnetic yoke magnetized the workpiece of ferromagnetic material. If there has defects it will produce leakage magnetic field that will adsorb magnetic powder. We could detect the flaw by observing the density of adsorption magnetic powder. It adopts large capacity lithium battery. By the inverter and the phase shifted signal processor to provide power for the detector, it solves the shortcomings of traditional magnetic particle detector relying on the 220V power supply. It has low power consumption and can continuous work for more than 6 hours. And the battery can be charged when the detector is on and off. Especially suitable for the field testing. It can choose the current frequency according to the flaw depth with unique frequency conversion communication design, that improve the detection sensitivity. It’s widely used in aircraft manufacturing, boiler and pressure vessels and other fields. It is a necessary professional precision instrument of quality control, in-service safety monitoring and life assessment.
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Product
Inspection System for Die Casting
X-eye 7000BS
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Appropriate for medium•large size component inspection and detecting surface structure and defects(inside voids and cracks etc).Due to high-energy, high-power Micro-focus X-ray Open Tube, maintenance cost's reduced significantly and enables long-term use with only replacing consumables.Customization is available with selecting main parts by customers depends on their needs for size and material.
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Product
In-Process Test OTDR
8000i
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The 8000i In-Process Test OTDR is the most recent addition to Photon Kinetics' family of innovative solutions for optical fiber cable testing. The 8000i's "cable test optimization" provides the balance of OTDR dynamic range and dead zone performance that's proven to be most effective for accurate characterization of typical fiber cable lengths. Dynamic range has been maximized to reduce measurement time, while resolution has been tuned to ensure that typical cabled fiber defects are detected. The 8000i delivers this optimized measurement capability at a more economical price than our full featured, final QC 8000 OTDR, which makes it a perfect fit for "in-process" testing on ribbonizing or loose tube production lines.
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Product
Defect Isolation
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*Traverse through the physical design to trace nets and vias down to the defect location*Utilizes industry standard LEF/DEF design files, scan-based test information, tester fail logs and diagnostic reports to determine and isolate the physical defect location*Enables the user to leverage their diagnostic experience to determine the root cause of the defect*Interactive layout viewer displays scan chains, mapped mismatches of scan cells, layers, nets and subnets with search capabilities(component, net, cell)*Physical XY coordinates are always displayed for components and nets to guide the user through the design to quickly identify suspect sites for FA using techniques like Emission, OBIRCH, LIVA, TIVA, or FIB
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Product
Network Emulator
KMAX
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The KMAX network emulator helps network engineers test and measure performance in order to identify and remove defects. Network emulators turn well behaved development and test networks into the kind of slow, congested, and less-than-reliable services encountered on the internet. In addition, unlike the real internet, network emulators allow the operator to control these conditions so that products and apps can be subjected to controlled and repeatable tests, by routing selected packets through a series of impairment nodes.
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Product
Vibration Testers
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Analyzes vibration patterns within mechanical systems or individual components and structures to identify defects and evaluate the test object's overall condition.
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Product
MicroPhase I LRP - Dual Phase Voltage Detector / Phase Comparator
MP1-02P
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Hachmann Innovative Elektronik
MicroPhase I LRP is an easily operated phase comparator, dual voltage detector and maintenance tester. Its automatic, thorough self-test ensures reliable function. The permanently enabled interface-testers warn against defect interfaces. Thanks to the "LRP-switch" the threshold value can be lowered from 2,5 µA (HR, MR, LR and LRM) to 1,0 µA (LRP).
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Product
Automated Optical Inspection (AOI)
TR7700 SIII
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TR7700 SIII is the newest generation of TRI's AOI solutions, delivering precise multi-phase inspection at full speed. By combining an ultra-fast camera, intelligent auto conveyor, and new GUI, the TR7700 SIII offers a powerful and easy to use AOI solution with fast programming, optimized board loading, production line integration and support for offline programming. TRI's new color algorithm combined with multiple lighting phases increase defect coverage and help deliver highly accurate inspection results with a minimum of false calls.
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Product
Thermal Shock Chambers
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We provide a large selection of thermal shock chambers to accommodate various types of product testing. Thermal Shock Chambers perform tailored environmental stress screening of component and board electronic assemblies. Our unique chamber design transfers product between two extreme temperature-controlled chambers, passing equal volumes of high velocity conditioned air over the product and resulting in rapid product temperature changes. The induced thermal stresses can reveal hidden manufacturing defects in electronic sub-assemblies and other components by the expansion and contraction of critical parts.
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Product
Environmental Stress Screening (ESS) Chamber
ESS
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Developed to help electronics manufacturers detect product defects and production flaws, Environmental Stress Screening (ESS) forces infancy product failures that would otherwise occur after final assembly and product delivery. ESS’s goal is to improve profitability by eliminating defective products. ESS Systems can meet individual performance needs, product loading, and throughput requirements. Thermotron has the experience to provide the best solution for ESS testing at your company.
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Product
Pinhole Detection
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ElektroPhysik Dr. Steingroever GmbH & Co. KG
A pinhole detector checks coatings by means of electrical voltage. Microscopically small defects (>20µm) can then be detected in the coating of a surface. Even minimal defects in surface coatings can have fatal consequences so careful testing with the right pinhole detector is vital. Urgent action is required when just the smallest defect is found during pinhole detection of surface coatings. Minimal defects in the coating are sufficient to cause major damage. The PoroTest 7 pinhole detector from ElektroPhysik is an indispensable aid in the search for pores, cracks and other defects in non-conductive coatings on conductive base materials – go to the technical data.
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Product
Cross Sections and Metallography
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Rocky Mountain Laboratories, Inc.
Cross sections are prepared by mounting samples in epoxy and then grinding and polishing the mount for imaging in the optical microscope or Scanning Electron Microscopy (SEM). Valuable information from cross sectioning can include: film thicknesses, inclusions, corrosion thickness, dimensional verification, and subsurface defects. Metallographic cross sections are typically etched to reveal the microstructure. Microstructural analysis can provide information about heat treatment history, corrosion susceptibility, as well as undesirable microconstituents.
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Product
Quick Change Probes For Weld Seam Testing (ASTM)
SONOSCAN Q
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In addition to angle beam probes according to european standards (EN), we offer probes with quick-change wedges for ultrasonic weld seam inspection as well as various wedges for the american market. Quick-change probes are used wherever access to the inspection object is difficult to reach with the larger AWS transducers. The relatively small, round elements also offer better defect resolution.
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Product
RFID Label Inspection System
Eurotech RFID FS
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The Eurotech RFID FS RFID accurately rewinds rolls of RFID labels and validates their receptivity by running them through the Voyantic Tagsurance RFID inspection system. The unit allows stopping at a predetermined editing spot for the removal and replacement of the defective piece, as well as indicating defective labels by a mark printed by an inkjet system integrated with the machine. Adjustment of the closed loop tension control system can be made through adjusting the parameters on the software that control the servo motor control system. This gives the customer a virtual infinite range with which to wind their labels without cracking the inlay or antenna. As well accurate web adjustment and guidance is provided with a web guide system complete with an ultrasonic sensor. The Eurotech RFID FS RFID label inspection system is equipped with the Voyantic Tagsurance for testing the performance of RFID tags. This is done by verifying that the tag responds to commands on its whole operational frequency range, which means testing the tag on multiple frequencies, also outside the RFID reader frequency. Accurate power output combined with the Voyantic Snoop Pro antenna, optimized for testing tags inline at high speed, allows defining precise acceptance criteria and achieving stable quality.
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Product
Transistor-Level Defect Simulator
Tessent DefectSim
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Tessent DefectSim is a transistor-level defect simulator for analog, mixed-signal (AMS), and non-scan digital circuits. It measures defect coverage and defect tolerance. Tessent DefectSim is perfect for both high-volume and high-reliability ICs. Tessent DefectSim replaces manual test coverage assessment in AMS circuits needed to meet quality standards such as ISO 26262 and provides objective data to guide improvements in DFT. Tessent DefectSim dramatically reduces SPICE simulation time compared to simulating every potential defect.
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Product
Terahertz imaging cameras
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The detectors are fabricated with a GaAs high-mobility heterostructure in the standard semiconductor cycle using conventional optical lithography. The imaging sensor is manufactured on a single wafer. That process ensures high homogeneity and reproducibility of the plasmonic detector parameters (pixel-to-pixel deviation responsivity is within a 20- percent range). Each detector unit has a room-temperature responsivity up to 50 kV/W with read-out circuitry and noise-equivalent power of 1 nW/\sqrt{\rm{Hz}} in the frequency range 10 GHz — 1 THz. The detection mechanism is based on excitation of plasma oscillations in a two-dimensional electron system with subsequent rectification. The rectification takes place on special defects made in the electron system.
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Product
Chip Inspection System
GEN3000T
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GEN3000T is an inspection system that performs automatic inspection of individual semiconductor chips.This revolutionary chip surface inspection system was achieved by combining the chip handling technology cultivated by Toray with the inspection algorithm used in the "INSPECTRA®" wafer defect inspection system.
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Product
Bench PIM Testing
iBA Series
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Passive Intermodulation (PIM) occurs when multiple RF signals encounter defects in materials or workmanship in an RF path. These defects behave like a mixer causing noise to be generated at mathematical combinations of the original carrier frequencies. PIM interference that falls in the receive band of a wireless system elevates the noise floor resulting in high dropped call rates, call blocking, slow data transmission speeds and decreased system capacity. Kaelus is the industry leader in Passive Intermodulation test solutions. Since 1996 Kaelus has supplied RF equipment manufacturers around the world with precision IEC compliant test equipment to perform this critical test. From initial product design through high-volume manufacturing, Kaelus offers a wide range of PIM test solutions that enable equipment manufacturers to quickly and confidently verify the performance of their products.
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Product
Contactless Lifetime Measurement and Inhomogenities Device
MWR-2S-3I
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Lifetime determination is based on measuring photoconductivity decay after pulse light photo-exciting with usage of reflected microwave as probe.Simultaneous IR light transmission gives possibility to detect any inhomogenity insidesilicon brick and made 3D image of defects.
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Product
Industrial Tester
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Ensures products, materials, or systems meet quality, safety, and performance standards by performing tests like voltage checks, mechanical stress tests, or functional simulations, using specialized equipment or manual methods to identify defects and ensure reliability in manufacturing, construction, and technology sectors, often for electrical, data, or material integrity.
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Product
Automated Optical Inspection Solutions
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Adjustable criteria for different process application or modelFlexible algorithms programming editor for mono-crystalline and multi-crystalline silicon solar cellsMultiple interface to communicate with manufacturing equipment or information systemVarious defects inspection capability from multilayer LED lighting designFlexible design that can be easily integrated to your in-line printing system and sorting system
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Product
Photomask Stations
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Fast, sensitive, economic, off-line photomask defect review. Our 300 series photomask inspection and review stations use long working-distance microscopy and a unique four-way lighting system to greatly speed up location and identification of micron- and submicron-sized defects
