Defect
other than specified, imperfection .
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Product
Defect Isolation
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*Traverse through the physical design to trace nets and vias down to the defect location*Utilizes industry standard LEF/DEF design files, scan-based test information, tester fail logs and diagnostic reports to determine and isolate the physical defect location*Enables the user to leverage their diagnostic experience to determine the root cause of the defect*Interactive layout viewer displays scan chains, mapped mismatches of scan cells, layers, nets and subnets with search capabilities(component, net, cell)*Physical XY coordinates are always displayed for components and nets to guide the user through the design to quickly identify suspect sites for FA using techniques like Emission, OBIRCH, LIVA, TIVA, or FIB
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Product
Defect Inspection Systems
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Candela® defect inspection systems detect and classify a wide range of critical defects on compound semiconductor substrates (GaN, GaAs, InP, sapphire, SiC, etc.) and hard disk drives, with high sensitivity at production throughputs.
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Product
Counterfeit Defect Coverage Tool
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The SAE Counterfeit Defect Coverage Tool is a dynamic, web-based application that supplements SAE Standard AS6171 authored by the SAE G-19A Test Laboratory Standards Development Committee. It provides potential test sequences for the identification of counterfeit electrical, electronic, and electromechanical (EEE) parts along a range of risk levels and EEE part types. Allowing users to compare alternative test sequences as a function of resources needed to implement those tests, the SAE CDC Tool is appropriate for those ordering counterfeit detection tests as well as those performing the tests.
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Product
Large Surface Defect Gauge
4D InSpec® XL Surface Defect Gauge
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The 4D InSpec XL Surface Defect Gauge expands 4D Technology’s 4D InSpec product line—they’re the first handheld, precision instruments for 3D non-contact surface defect measurement.
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Product
Wafer Defect observing instrument
HS-WDI
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Application■Semiconductor wafer■Solar wafer■Solar Cell■Thin-film Cell
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Product
Auto Macro Wafer Defect Inspection
EagleView
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EagleView automated macro defect semiconductor wafer inspection system provides industry leading throughput, defect detection accuracy, and wafer classification for semiconductor manufacturing. EagleView systems have inspected over 100 million semiconductor wafers worldwide. The EagleView macro defect inspection tool resolves many of the problems and pitfalls of manual and micro wafer inspection by automating and standardizing semiconductor wafer inspection processes while creating complete images of every wafer in the cassette. Unlike manual micro defect wafer inspection, EagleView’s automated wafer inspection is always consistent, tireless, reliable, and fast. EagleView helps find macro defects while there’s still time to take corrective action.
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Product
Defect Inspection and Review
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KLA’s defect inspection and review systems cover the full range of yield applications within the chip and wafer manufacturing environments, including incoming process tool qualification, wafer qualification, research and development, and tool, process and line monitoring. Patterned and unpatterned wafer defect inspection and review systems find, identify and classify particles and pattern defects on the front surface, back surface and edge of the wafer. This information allows engineers to detect, resolve and monitor critical yield excursions, resulting in faster yield ramp and higher production yield.
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Product
Defect Inspection System
NovusEdge
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The NovusEdge System provides high sensitivity inspection for the edge and backside of bare unpatterned wafers for current and advanced nodes. Multiple modules can be configured on the same automation platform for increased throughput while maintaining a small footprint for an improved cost of ownership.
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Product
Semiconductor Wafer Defect Inspection Management Software
ProcessGuard
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Microtronic ProcessGUARD Software is the desktop client for the EagleView auto macro wafer defect inspection system. ProcessGUARD is a high volume, high speed semiconductor wafer defect inspection management solution that provides an easy-to-use, customizable and extensible platform and interface to automate your fabs defect inspection process. ProcessGUARD is feature rich (see below) and its newest releases include complete wafer randomization software, a user-defined defect library, and an integrated trainer and knowledge base.
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Product
Luminescence Defect Inspection System
INSPECTRA® PL Series
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This system uses luminescent images created using photoluminescence (PL) to perform high-speed, high-sensitivity automatic inspection for crystal defects, cracks, and luminescence defects which cannot be detected with conventional visible light surface inspection!
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Product
Rotor Balancer
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Static and Dynamic Balancing of Rotating MachinesBalanced rotors are essential for the smooth operation of rotating machinery. Unbalance will create high vibrations, reducing machine life and causing material defects. Our single and dual-plane balancing tool is a great tool to eliminate unbalance on-site reducing long down times.
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Product
TorqueLab® Torque Analyzer
LTT-Series
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The torque analyzer is designed for calibrating tools, joint testing, auditing and measuring torque. Torque tools go out of calibration with use. To maintain consistent accuracy, torque tools must be checked periodically for wear or defective parts. A power or hand torque tool is a measuring tool that must be properly calibrated and maintained. The LTT-Series is an advanced torque testing and documentation solution. Using a quality torque tester makes a safer world through accuracy and precision. Controlling torque is essential for companies to ensure their product’s quality, safety and reliability isn’t compromised.
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Product
ClicManage
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ClicManage is an easy to use and seamless test management solution that improves test productivity by managing requirements, releases, test plans, milestones and defects with reduced maintenance effort. It helps in building a strong foundation for your QA practice by providing visibility to better maneuver testing via one easy-to-use planning, delegating, tracking and reporting hub. Moreover, ClicManage can be interfaced with any third party defect tracking tools along with our proprietary ClicBug.
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Product
MPI Sorter Series
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MPI’s Sorter Series are improving production efficiency and yields for market sectors related to LED chip, package production, discrete device handling, and IC substrate manufacturing. Deploying MPI’s Pick & Place technology, the Sorter Line offers dedicated sorting and defect inspection solutions particularly suited for GaN, GaAs, Vertical LED Chip, Flip Chip, and Laser Diode applications. With a proven heritage of and market-advanced technologies, MPI offers competitive and differentiated solutions that are scalable and cost-effective.
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Product
Infrared Microscope
DDR200/300 NIR
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The McBain DDR200 NIR (for 200mm) and DDR300 NIR (for 300mm) provide high-speed defect detection and precision measurement on wafers and other parts. These cost-efficient systems offer unique advantages for both production and process development use, providing an optimum near-infrared (900-1700nm) solution when both subsurface defect detection and dimensional metrology are required.
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Product
Destructive Physical Analysis (DPA)
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Is the process of disassembling, testing, and inspecting a component for the purpose of determining conformance with applicable design and process requirements. This process of sample testing is used to ensure that a high reliability component or device is fabricated to the required standards. Destructive Physical Analysis is also used effectively to discover process defects for troublesome production lot problems.
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Product
Inspection System
X-eye 7000B
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Appropriate for the inspection of medium•large size components and detection of surface structure and defects (inside voids and cracks etc).Due to high-energy, high-power Micro-focus X-ray Open Tube, maintenance cost's significantly reduced and long-term use possible with only replacing consumables.Customization is available with selecting main parts by customers depends on their needs for size and material.
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Product
Wiring Analyzers for Cables, Wire Harnesses, Backplanes
CableEye M2Z, M3Z, M4
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With our cable testers and harness testers, find defective or miswired cables instantly before they damage equipment or waste valuable technician time. CableEye® all-in-one test and cable management systems have a unique, patented graphic wiring display to visually pinpoint problems when wiring errors are detected, and offer under a second pass/fail testing for production environments. Quickly locate intermittent connections and identify their position in the cable.
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Product
Multi-Channel Automotive Noise Finder
7633A
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Peaceful Thriving Enterprise Co Ltd
Multi-Channel automotive noise finder is a portable equipment to diagnose the defect of the vehicle. When the generator is running, it can detect the impact and vibration due to the defect and failure of bearing, gear, valve, crank, cylinder, gear box, and vehicle body…etc. With this equipment, the repairer can clearly locate which part of the machine cause the noise and how serious is it; even though the repairer operates the equipment in a very noisy environment.
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Product
Constant Acceleration Tester-Arm Type
KRD31 series
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KRD31 series constant acceleration tester are used to test articles under extreme acceleration conditions based on standard like MIL-STD-810F, MIL-STD-202 and IEC68-2-7. It is most suitable for testing electronic components or devices. Under high g effect on microcircuits, to check adaptability and reliability of wiring and the internal structures. It may expose mechanical and structural defects that are not found with vibration and shock tests.
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Product
SDT Checker Range
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With a focused solution for every problem, the Checker range makes ultrasound available to everyone. Choose the right tool for the right job and perform fast troubleshooting inspections. As a first defense against breakdown, Checkers identify defects quick and early, allowing for deeper analysis and trending with an SDT200, SDT270 or SDT340.
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Product
IC/BGA Tester
Focus-2005
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As a screening checker to detect defective devices(mainly electrostatic destruction)which are returned from fields before failure analysis process of IC/LC in the quality assurance division of semiconductor manufacture.As a screening checker to detect defective devices before acceptance inspection by IC/LSI expensive tester at semiconductor company(trading, manufacture)Short/Open checker for semiconductor sensor device.It is possible to measure two kinds of measurements which are constant voltage biased current measurement and constant current biased voltage measurement. User can set the threshold of 10 ranks. （auto measurement）Only device can be measured. It is also possible to fabricate the test fixture.Various devices can be measured by replacing the socket board.It is no need to generate complex test programs as reference values are calculated from good device.It can be expanded by adding multiplexer boards which are 128pins per one board.(MAX 2048pins)
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Product
Magnetic Particle Inspection
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Is an inspection method used to identify defects on the surface of ferromagnetic materials by running a magnetic current through it.
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Product
Ultrasonic Flaw Detector
MFD550B
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Based on ultrasonic principle, digital ultrasonic flaw detector MFD550B can test, orient, evaluate and diagnose various flaws such as crack, lard, air hole in workpiece’s interior swiftly and accurately without any destruction. With full digital 640X480 TFT LCD display, it show the defect clearly under the dim light and strong sunlight environment. 0-9999mm measuring range can meet the requirement for general defect inspection in manufacturing industry, metallurgical industry, metal processing industry, chemical industry and so on. Low power design with large capacity and high performance lithium ion battery module，it can work more than 10 hours continuously. Full English master-slave menu, emphasizing on user experience, collecting shortcut keys, digital shuttle rotary wheel, cross menu three operating ways inone body, customers with different habits can operate it freely. With comprehensive performance self-checking function, it can automatically generate test reports and support for many languages. With high cost performance, it is the smart choice for the practical economic model of ultrasonic testingequipment.
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Product
Data Analytics
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KLA’s data analytics systems centralize and analyze the data produced by inspection, metrology and process systems. Using advanced data analysis, modeling and visualization capabilities, our comprehensive suite of data analytics products support applications such as run-time process control, defect excursion identification, wafer and reticle dispositioning, scanner and process corrections, and defect classification. By providing chip and wafer manufacturers with relevant root cause information, our data management and analysis systems accelerate yield learning rates and reduce production risk.
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Product
Dual Voltage Detector / Maintenance Tester
MicroPhase I
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Hachmann Innovative Elektronik
MicroPhase I is an easily operated phase comparator, dual voltage detector and maintenance tester. Its automatic, thorough self-test ensures reliable function. The permanently enabled interface-testers warn against defect interfaces. The integrated "Universal Phase Comparator" compares two different interface signals, even if they are of different interface type or voltage. A unique error control avoids switching errors caused by erratic or unfeasible phase comparison.
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Product
Analysis
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External appearance due to non-destructive semiconductor · X-ray fluoroscopic observation, SAT observation, electrical operation confirmation, ESD fracture analysis, plastic opening observation of Chip, search for abnormal portions by EMS / OBIRCH, package (PKG) analysis, Please do not hesitate to contact us anything related to semiconductor analysis, such as observation by polishing / parallel polishing (ball and bump observation etc.), peeling observation of defective part, analysis of foreign matter by EDX · FT - IR etc.
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Product
Soldering Inspection Video Microscope
MS-1000
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The MS-1000 is a highly portable microscope for exclusive use with BGA, CSP, and QFP. It is highly efficient in inspecting portions which cannot be inspected by the X-ray inspection method.Specifically, it is efficient for inspecting the following conditions: fillets of soldered balls, melted condition of soldered parts, cracks, defective soldering, etc.
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Product
Surge Tester
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They are designed to detect quality defects in the insulation between winding turns, ensuring the reliability and performance of electrical components.
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Product
Photomask Stations
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Fast, sensitive, economic, off-line photomask defect review. Our 300 series photomask inspection and review stations use long working-distance microscopy and a unique four-way lighting system to greatly speed up location and identification of micron- and submicron-sized defects
