Kelvin Probes
Quantify changes in contact surface potential or work function difference of the Kelvin 'Junction' measuring the flow of charge from one material to another.
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Product
Kelvin Probes (F810) F81001S040L230S1
1006621
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The Kelvin Probes (F810) F81001S040L230S1 is a highly specialized coaxial probe designed to deliver exceptional performance in a variety of demanding technical applications. With a pitch of 2.54 mm and a temperature range from -45°C to +100°C, this probe ensures reliable operation under extreme conditions. Constructed with high-quality materials such as beryllium copper and bronze, the probe's plating consists of gold and silver to enhance electrical conductivity and durability. This combination makes it an excellent choice for precise measurements in both laboratory and field settings.
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Product
Ultra-High Vacuum Scanning Kelvin Probe
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Our Ultra-high Vacuum Scanning Kelvin Probes (UHVSKP2020 and UHVSKP5050) give the user full access to work function (Φ) and contact potential difference (CPD) measurements under vacuum with the ability to scan a sample area of 20 x 20mm or 50 x 50mm respectively. Each system comes with the UHV head unit, tip amplifier (located at the mounting port), digital control unit and host PC with dedicated software. The tip can be retracted 100mm from the sample and approaches normal to the sample. The associated digital electronic unit powers the head unit and provides an interface between the head unit and the data acquisition system. The system comes with a complete user manual, which includes an introduction to work function measurements and a detailed description of the system software, including examples. The work function resolution of the Ultra-High Vacuum Scanning Kelvin Probes is 1-3 meV.
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Product
Kelvin Probes (F835) F83512B0004G120
1028542
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The Kelvin Probes (F835) model F83512B0004G120 is engineered for precision in performance and reliability. This coaxial probe design features a compact pitch of 3.50 mm (138 mil), allowing for impeccable connectivity in tight spaces while maintaining a temperature range from -45°C to +100°C. The probe has been meticulously constructed to support continuous current usage of up to 10 A, with an impressive low typical contact resistance of just 20 mOhm, making it suitable for high-performance applications in demanding environments.
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Product
Scanning Kelvin Probe
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Our large range of Scanning Kelvin Probes gives the user full access to 2D and 3D work function plots of samples ranging in size from 50 mm to 350 mm. With work function resolution of 1 - 3 meV, and the spatial resolution of the Probe tip diameter (0.05 mm with the SKP5050 model), the Scanning Kelvin Probe gives reliable, repeatable measurements for work function, contact potential difference and Volta potential.
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Product
Test Contactor/Probe Head
Hydra
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Engineered for excellence and efficiency, Hydra™ spring probe series offers precision, reliability, and standardized semiconductor test interface.Designed to be best-in-class at a competitive price point, Hydra is optimized to maximize your operational efficiency. Hydra is built to withstand demanding high-volume manufacturing test environments with its robust and durable design.With a common test-height, Hydra offers the ability to mix and match power, RF, and Kelvin probes within the same test socket. In addition, Hydra streamlines inventory management with fewer probe part numbers to manage and shorter lead times.
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Kelvin Probe Systems
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Kelvin probe measures the work function difference between the tip and the sample when in thermoequilibrium state (a), and measures the electrical potential when the sample is illuminated (b), which is the sum of the difference in workfunction and internal/external-applied voltages.
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Product
Specialist Test Probes
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High Current Test Probes, Ultra-high Current Test Probes,Kelvin Test Probes, High Frequency Test Probes, Switching Test Probes
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Product
Kelvin Clip Set
11062A
Accessory Kit
Create custom Kelvin probes for 4-wire resistance measurements; set contains only the two gold-plated clips
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Product
F83500B0014G070
1156346
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The F83500B0014G070 order code 1156346 is a sophisticated Kelvin probe designed for precise measurements over a wide temperature range of -45°C to +100°C. With a fine pitch of 3.50 mm (138 mil), this probe achieves remarkable performance in both electrical and mechanical specifications. It can handle a continuous current of up to 10.00 A with a typical contact resistance as low as 20.00 mOhm, making it ideal for low-resistance applications. Additionally, the impedance of 50.00 ohms and operational frequency of up to 2.00 GHz emphasize its capability for high-frequency applications, ensuring reliable measurements in demanding conditions.
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Product
Kelvin Probe (F832) F83216S0023L650
1052948
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The Kelvin Probes (F832) F83216S0023L650 represent a high-performance solution designed to meet the demanding requirements of precision electrical measurements in various environments. With a reliable temperature range of -45°C to +200°C, these coaxial probes can handle extreme conditions while maintaining accuracy. The design features a pitch of 5.50 mm, ensuring optimal signal delivery while minimizing contact resistance, which is typical at just 60 mOhm for the continuous current of 6A. This makes them ideal for applications requiring frequent and reliable connectivity.
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Product
Ultra-High Vacuum
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KP Technology offer a range of Kelvin Probes that work under ultra-high vacuum conditions, choose from single-point or scanning probes to add to your existing vacuum chamber, customize the UHV corner cube or consider the newest addition to the range, the Ф4 ultra-high vacuum scanning Kelvin Probe system.
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Product
Ultra-High Vacuum Ф4 Scanning Kelvin Probe
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The Ф4 Ultra-high Vacuum Scanning Kelvin Probe system gives the user full access to work function measurements under vacuum with the ability to alter the temperature from 77 K to 860 K. The Kelvin Probe measurement has resolution of 1 - 3 meV for a 2 mm tip on a conducting sample. The sample is mounted on a plate that is located on a motorized (x, y, z) translator attached to a stainless-steel vacuum chamber. Phi 4 also comes with a photoemission spectroscopy system with a tuneable source (3.4 - 7.0 eV). The deep ultra-violet (DUV) light spot measures approximately 3 x 4 mm. Absolute work function measurements can be obtained with this system in the range of 4.0 - 6.5 eV with an accuracy of 0.05 - 0.1 eV.
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Product
Scanning Kelvin Probe Microscope
VS-SKP
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The Kelvin Probe experiment uses a nondestructive method to determine the relative work function difference between the probe and the sample. Work function describes the energy required to liberate an electron from the surface of a conductor; electrochemists often interpret this as the difference from an electrode’s Fermi Level, average energy of electrons, and that of vacuum.
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Multi-Test Resistivity Measurement System
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Sheet resistance mapping of thin films with a collinear 4-point probe, Temperature co-efficient of resistance (TCR) of thin films with collinear 4-point probe, Precision temperature co-efficient of resistance (TCR) with 2-point Kelvin probes and precision surface temperature probe, resistor testing with 2-point Kelvin probes,Precision resistor testing with a Kelvin probe card, temperature co-efficient of resistance resistor test (TCR), and Standard TCR test of multiple resistors with Kelvin probes or a probe card.
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Product
Kelvin Probe Set
11059A
Accessory Kit
Reduce ground-related errors and contact resistance through gold-plated flat tweezers and special gripping surfaces
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Product
Kelvin Test Contactor/Probe Head
Gemini
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At 3.22 mm test height, the Gemini™ Kelvin test contactor is an excellent all-around spring probe with low inductance, high bandwidth, and excellent current-carrying capacity. The device under test (DUT) side tip design accurately maintains its 100 µm spacing for the life of the probe. Customers report typical probe life of 500 k to 800 k package insertions, or over 2M touchdowns at wafer-level test. The offset tip allows manageable board layout with a board-side spacing of 0.4 mm.Gemini Kelvin probes and contactors provide a first-rate solution that effortlessly makes reliable, true Kelvin contact for high-volume final test of both singulated packages and wafer-level devices. Gemini Kelvin is an ideal solution for devices such as power controllers, A-D and D-A converters, power amplifiers and audio and video circuits.
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temperature Measurement
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Educated Design & Development, Inc.
Up to 8 resistance reading channels, 4-wire methodUp to 12 temperature reading chanels, use of Type K, 24 AWG, Teflon thermocouplesIn the Box:8 - data cable (Cat5e) to connect the isolation modules to the Resistance Reading Channels8 - Isolation Module connected between the HOT-30 and EUT (Equipment Under Test) to isolate high voltage8 - Banana Jack Sets (2 red, 2 black), to replace Kelvin Leads in tight places8 - Kelvin Probe Set12 - 72 inch K Type Thermocouple1 - USB2.0 Type A (standard) to Type B USB cable
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Product
Ultra-High Vacuum Kelvin Probe
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Our Ultra-high Vacuum Kelvin Probes give the user full access to work function and contact potential difference (CPD) measurements under vacuum. Each system comes with a high-quality, manual, or motorized translator that enables reliable and accurate tip-to-sample positioning, and the unrivalled tracking system always holds the tip separation constant during the measurement. Even under vacuum, the work function resolution is 1 - 3 meV.
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Single-Point Kelvin Probe
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Our Single-Point Kelvin Probe system (KP020) is the introductory system in the KP Technology product family. The off-null signal detection method allows high-quality measurements of the Work Function/Fermi Level of materials.
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Relative Humidity Kelvin Probe
RHC
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The Relative Humidity Kelvin Probe (RHC) systems are the ideal solution for monitoring samples in a controlled atmosphere for contact potential difference (CPD)/work function (Φ) measurements.
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Controlled Atmosphere
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KP Technology offer a range of Kelvin Probes that work in a controlled environment including automatic control of relative humidity within the Kelvin Probe housing and integrated nitrogen atmosphere control.
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Ambient Single Point Kelvin Probe System
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This single point Kelvin Probe System operates under ambient conditions and is small enough to be placed in a customized glowth box. The probe head operates with an oscillating membrane and can be easily exchanged. The preamplifier is integrated inside the probe head.
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Product
Kelvin Probes H810KB
1008053
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The H810KB, also referred to as the Kelvin Probes (F810), is a specialized device designed for precision applications in electrical measurements. Its robust construction and meticulous engineering ensure reliable performance across various scenarios. With a pitch of 2.54 mm and a continuous current rating of 3.00 A, this tool is ideally suited for applications requiring accurately gauged electrical connections and measurements.
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H832
1000788
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The H832 Kelvin Probes are advanced measuring instruments designed for precision and reliability, making them an essential tool for both professionals and enthusiasts in various scientific and engineering applications. With their unique design and technical specifications, these probes ensure accurate measurements, allowing for efficient data collection and analysis. The model, recognized by its order code 1000788, exhibits compatibility with a range of accessories, enhancing the usability and versatility of the probes in diverse settings.
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Kelvin Test Contactor/Probe HEad
cPython
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cPython™ Kelvin contactors and probe heads provide superior electrical and thermal performance with significant cost savings. This makes cPython Kelvin ideal for lab and high-volume production test of analog and mixed signal integrated circuits – for applications such as power control, A-D and D-A converters, audio, video, power amplifiers, photonics, optical MEMS and sensors.cPython Kelvin probes are electrically isolated and mechanically independent force and sense paths for true Kelvin contact for taking accurate measurements, even under high current conditions. These robust probes provide hundreds of thousands of insertions or touchdowns, and a bandwidth up to 26 GHz.
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Product
High 2.90 (82.20) - 12.60 (357.00) Switch Probe
TSP100-F180-3
Switch Probe
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 20Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 197Full Travel (mm): 5.00Recommended Travel (mil): 157Recommended Travel (mm): 4.00Overall Length (mil): 1,990Overall Length (mm): 50.60Switch Point (mil): 59Switch Point (mm): 1.50
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30 GHz Differential Probe with 2.92mm Interface
DH30-2.92MM
Differential Probe
Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
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Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Bias Ball Probe
POGO-1Z-7-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
