Geometry
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Product
UltraScan PRO Spectrophotometer.
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Hunter Associates Laboratory, Inc.
The D65 illumination source is calibrated in the ultraviolet region for the accurate measurement of whitening agents. UltraScan PRO has an extended wavelength range into the near infrared and near ultraviolet that permits the measurement of camouflage materials and UV blockers. The system uses diffuse/8° geometry with automated specular component inclusion/exclusion. It also features three sizes of sample measurement areas with automated lens change. The UltraScan PRO includes EasyMatch QC software and an electronic record keeping version that is 21 CFR 11 compliant is available.
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Product
3D-IC Solution
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Consumer demand for increased bandwidth and low power in smaller form factor has forced design teams to pursue design and manufacturing alternatives to single system-on-chip (SoC) approaches. Moving to advanced geometries like 20nm/14nm is a natural progression; however, it has its own cost, yield, manufacturing, and IP reuse challenges.
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Product
Human Radiation Spectrometers
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Human radiation spectrometer is designed for express control and measurement of the activity of 137 Cs and 134 Cs gamma-emitting radionuclides in the human body, as well as for assessing the internal radiation dose (“sitting in a chair” geometry).
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Product
Fiber Geometry System
FG500
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The FG500 is a fiber geometry system that measures the physical dimensions of the fiber including core, cladding, and coating diameter, non-circularity, and eccentricity. The FG500 is designed to produce accurate measurements quickly and with confidence.
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Product
UltraScan VIS Spectrophotometer
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Hunter Associates Laboratory, Inc.
The UltraScan VIS easily measures both reflected and transmitted color as well as transmission haze and meets CIE, ASTM and USP guidelines for accurate color measurement. UltraScan VIS uses diffuse/8° geometry with automated specular component inclusion/exclusion. For transmission measurement, the use of a robust CIE-conforming sphere instrument (TTRAN Total Transmission mode) effectively negates the effects of minor scattering typically found in transparent samples.
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Product
Lithography Systems
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When it comes to shaping what a chip can do, lithography systems lead the way by transferring intricate circuit designs onto substrates with unmatched precision. From prototyping to high-volume manufacturing, these tools define the geometry of modern microchips, as well performance.
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Product
Standard Pattern Generator Board
BL-PG315-01
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The MicroImage PG315 pattern generator is designed for simple size and geometry reference applications. The PG315 will overlay one of five standard patterns including a centered cross line, a centered cross hair, a centered target style symbol, a dot grid (cross dot) array, a hatch grid (crosshatch) array.
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Product
PAL Standard Pattern Generator
PG315P
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The MicroImage PG315 pattern generator is designed for simple size and geometry reference applications. The PG315 will overlay one of five standard patterns including a centered cross line, a centered cross hair, a centered target style symbol, a dot grid (cross dot) array, a hatch grid (crosshatch) array.
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Product
Screw Side Action Tensile Grips
2710-100 Series
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The Instron screw side-action tensile grips are precision mechanical grips engineered for tensile testing across a broad spectrum of specimen materials (e.g. metals, plastics, textiles, thin foils) and geometries. Their dual-acting screw mechanism delivers concentric clamping and allows for adjustments to accommodate varying specimen thicknesses or unique components — ensuring reliable load alignment. With quick, tool-free jaw face changes and a wide assortment of interchangeable jaw face types (smooth-ground, serrated, rubber-coated, etc.), these grips offer flexibility in test setup.
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Product
SANA Mini Portable Interferometer
CA3005
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CA3005 SANA mini is a portable, non contact fiber endface interferometer for single fiber connector. This interferometer has a high performance while the size of the instrument is incredible small. SANA mini need only a USB link to work without any external power supplies. It can test the geometry parameters of single fiber connectors such as radius of curvature, apex offset and fiber height. The data and report are generated in excel format and it is very helpful for management and analysis. SANA mini is a suitable interferometer for field usage.
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Product
RANGER-ULTRA
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The RANGER-ULTRA is an airborne laser scanner with an impressive combination of weight, range, accuracy and pulse rate. It is equipped with a unique forward and rear looking FOV designed to minimize laser shadowing and provide geometry on complex vertical structures on a single pass. With its wide field of view of 100 degrees and an extremely fast pulse repetition rate of up to 1.8 MHz, the RANGER-ULTRA is perfectly suited for high point density corridor mapping applications such as power line, railway track and pipeline inspection.
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Product
Rotman Lens Designer
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Rotman Lens Designer (RLD) is a software tool for the design, synthesis, and analysis of Rotman Lenses and their variants. It is based on Geometrical Optics combined with the classical Rotman Lens design equations. It is intended for rapid development and analysis of Rotman Lenses given several physical and electrical input parameters. RLD generates the proper lens contours, transmission line geometry, absorptive port (dummy port) geometry, provides an approximate analysis of performance, and generates geometry files for import into Remcom's XFdtd® for further analysis and fabrication.
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Product
Hybrid Photon Counting Detectors
MYTHEN2 Series
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MYTHEN2 detectors guarantee noise-free performance, maximum resolution, and outstanding signal-to-noise ratios for an extended energy range from 4 to 40 keV. These systems include two module sizes: 1K with 1280 strips, and 1D with 640 strips. Their compact size, symmetrical sensor position, and DCS4 control unit make the MYTHEN2 series suitable for any diffractometer geometry — from portable instruments to large systems.
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Product
LED Test Production System
Lumere-LC
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Evolusys Technologies Sdn. Bhd.
Lumere LC is a LED test and measurement system for various parameters of LED light. It is economical, its geometry conforms with CIE-Publication 127, and the test program is easy to configure and adjust. Main application is in the production of LEDs.
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Product
Substrate Manufacturing
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KLA’s substrate manufacturing portfolio includes defect inspection and review, metrology and data management systems that help substrate manufacturers manage quality throughout the wafer fabrication process. Specialized wafer inspection and review tools assess wafer surface quality and detect, count and bin defects during production and as a critical part of outgoing wafer qualification. Wafer geometry systems ensure the wafer shape is extremely flat and uniform in thickness, with precisely controlled wafer shape topography. Data analysis and management systems proactively identify substrate fabrication process excursions that can lead to yield loss. KLA’s substrate manufacturing systems support process development, production monitoring and final quality check of a broad range of substrate types and sizes including silicon, prime silicon, SOI, sapphire, glass, GaAs, SiC, GaN, InP, GaSb, Ge, LiTaO3, LiNBO3, and epitaxial wafers.
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Product
ICP-MS spectrometers (ICP MASS)
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SPECTRO Analytical Instruments GmbH
SPECTRO MS is a double-focusing sector field ICP MS (ICP mass spectrometer) based on a Mattauch-Herzog geometry with a newly developed ion optic and pioneering detector technology. It is the only ICP MS instrument available on the market today that is capable of simultaneously measuring the complete mass range used for inorganic mass spectrometry from 6Li to 238U with a permanent ion beam going to the detector.
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Product
Vibration Analysis
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The vibration analysis software WaveImage includes a full set of methods providing an accurate and detailed overview of your vibration measurement data. This gives you a clear understanding of the cause-and-effect relationships between specific excitations and their vibrational response. Create a simple geometry model of your structure and link your multi-channel measurement data to the points in the geometry where the data was recorded. Then visualize the dynamic deformation of the structure under specific operating conditions with a detailed animation.
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Product
Front-end
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With geometries getting smaller, macro inspection becomes both more challenging and crucial for defect-free and high-yield wafer manufacturing. The variety of defects calls for detection optimization, fast screening and categorization of the high volume manufacturing environment, while maintaining high throughput.
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Product
TDR Structural Health Monitoring
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Material Sensing & Instrumentation
MSI Time-Domain-Reflectometry (TDR) Structural-Health Monitoring probes the structural health of a composite part by propagating a fast electrical pulse along a distributed linear sensor which has been fabricated directly in the laminate. The sensor is formed from the native graphite fibers already used in composite manufacture, and constitutes zero defect. Fibers are patterned into a microwave waveguide geometry, or transmission line, and interrogated by a rapid pulse as shown below. Structural faults along the line cause distortions in waveguide geometry, producing reflected pulses similar to radar. Cracking, delamination, disbonds, moisture penetration, marcelling, and strain are all detected by propagation delay, for sensor lengths up to several meters.
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Product
Portable Spectrophotometers
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Hunter Associates Laboratory, Inc.
Measure on the go—including samples on plant production floors, in storage areas, shipping departments, or virtually anywhere that’s convenient. Our portable spectrophotometer are available in Directional 45°/0° and Diffuse d/8° geometries.
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Product
Optical CMM Systems
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Our OmniLux metrology system is highly versatile and provides unparalleled levels of 3D CMM capture for component measurement in seconds. This high precision non contact, metrology system is extremely versatile because it measures components of any geometry and of any material. Geometries possible include: spheres, asphere, cylinder, internal bore, cone/taper, step height or freeform in any material such as polished or rough metals or ceramics and polymers. The Omnilux is fast and accurate because, unlike direct contact sensors, the use of optical sensors means that the whole surface can be analysed while the object is suspended in space, ensuring that no damage comes to delicate surfaces. Our easy-to-use software interface, developed from years of experience enables the operator to effortlessly control the system. Rich data analysis, automation and export of results for the immediate generation of reports as well as a compact footprint means OmniLux is the leading solution for production or R&D environments where reducing cycle times is critical to sustainable success.
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Product
Fully Automatic Colorimeter
DRK103C
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Shandong Drick Instruments Co., Ltd.
(1)5 inch TFT color LCD touch screen, the operation is more humanized, new users can be mastered in a short period of time using the method.(2)Simulation of D65 lighting lighting, using CIE1964 complementary color system and CIE1976 (L*a*b*) color space color difference formula.(3)The motherboard brand new design, using the latest technology, CPU uses 32 bits ARM processor,improve the processing speed, the calculated data is more accurate and rapid electromechanical integration design, abandon cumbersome testing process of the artificial hand wheel is rotated, the real implementation of the test program, a determination of the accurate and efficient.(4)Using d/o lighting and observation geometry, diffuse ball diameter 150mm, diameter of the testing hole is 25mm.(5) A light absorber, eliminate the effect of specular reflection.(6)Add printer and imported thermal printer, without the use of ink and color, no noise when working, fast printing speed.(7) Reference sample can be physical, but also for data,? Can store up to ten only memory reference information.(8) Has the memory function, even if the long-term shutdown loss of power, memory zeroing, calibration, standard sample and a reference sample values of the useful information is not lost.(9) Equipped with a standard RS232 interface, can communicate with computer software.
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Product
Circular Helmholtz Coils
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Helmholtz-Coils are especially designed to generate precisely defined magnetic fields from DC to the upper end of the audio frequency range and beyond. The generated fields are in a strongly linear relation to the coil current. The field- strength can be calculated exactly by analytical (or numerical) methods, based on the coils' geometry, the number of turns and the coil current.
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Product
Correlation Analysis
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EDM Modal Correlation Analysis allows the user to correlate two modal models; EMA and/or FEA models. Comparing the experimental data with that acquired through finite element analysis helps in validating the test results. Users can import the geometry model and mode shape data from FEA or EMA software.
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Product
SANA 2 Interferometer
CA3004
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SANA 2 fiber endface interferometer is a type of cost-efficient non-contact test instrument with excellent performance. It is able to measure the fiber endface geometry parameters such as radius of curvature, apex offset, fbre height and polishing angle of APC connector.
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Product
WATOM
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Wafer edge and notch profile measurementThe use of smaller and smaller patterns in the semiconductor industry calls for increasingly advanced materials of extremely high quality. In response to the steady improvements in the quality of wafers, KoCoS Automation has developed WATOM, a wafer edge and notch profile measurement tool which heralds a new era of extremely precise wafer geometry measurement.WATOM supports quality assurance throughout the wafer manufacturing process, starting at the very beginning and continuing on through to wafer reclaim.The WATOM Edge and Notch Wafer Geometry Analyser sets the worldwide benchmark for the quality assurance of geometrical measurements in semiconductor wafer manufacturing, combining the highest quality standards with top-class service. These high-precision, laser-based edge profile measurement tools are specially designed for optimum integration in manufacturing lines within the semiconductor industry.
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Product
CMM (Coordinate Measuring Machine) Solutions
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A device that measures the geometry of physical objects by sensing discrete points on the surface of the object with a probe.
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Product
XRD System
SmartLab®
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SmartLab includes as standard Rigaku's patented Cross Beam Optical™ (CBO) technology. CBO technology uses simultaneously mounted, simultaneously aligned optical components for both focusing (Bragg-Brentano) and parallel beam diffractometer geometries. Users can switch between the two geometries without the need to remove, replace, or realign optical components.
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Product
Rotating Machinery
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Synchronize rotating machinery data with a corresponding RPM signal to understand the RPM-dependant vibrational behavior of your measurement object. The package includes Order Analysis for performance optimization of your rotating machinery. Create your structure's geometry with just a few clicks to animate the structure's vibration behaviour. This offers the very unique possibility of an Order Operating Deflection Shape (ODS) analysis.
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Product
Straightness Measurement Kit
55283A
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The Keysight 55283A Straightness Measurement Kit, used with the Keysight 5530 Laser Calibration System, makes straightness, squareness and parallelism measurements to identify geometry errors that seriously degrade machine tool performance. These measurements allow documentation, analysis and diagnosis of machine tool travel and parallel axes of motion.
