Device Characterization
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Product
Cobra Temperature Forcing System for ATE/SLT Test Applications
31000R
System
Cobra is the most advanced, compact,powerful temperature-forcing system on the market. Cobra is an adaptable solution to the ever-increasing thermal demands of post silicon validation and device characterization.
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Product
Modulation Distortion Up To 53 GHz
S95070B
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S95070B software enables fast and accurate active device modulation distortion characterization under modulated stimulus conditions up to 53 GHz. The wide dynamic range and vector error correction of the PXI VNA results in an extremely low residual EVM from the test setup, giving you a complete picture of your device’s performance without test system interference. S95070B software measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals through spectral correlation between the input and output spectrum, without doing demodulation. Integration with the PXI VNA’s measurement flexibility enables you to do quick modulation distortion measurements along with traditional VNA tests.
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Product
Manual Tuners / Impedance Tuners
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Maury manual tuners are based on precision slide screw technology that utilizes broadband slab line transmission structure and passive probes to create impedances for devices. The probes are designed to be very close to onequarter wavelength in the linear dimension at the mid-band of each range. Since each tuner has two probes, this results in improved matching characteristics for each unit. Another key feature of this series of tuners is the inclusion of a LCD position readout of the carriage position on those units operating below 18 GHz. Higher frequency tuners utilize a micrometer carriage drive. The positional repeatability and high matching range of these tuners make them ideally suited for use as a variable impedance source in applications like device characterization. Such measurements depend upon the ability of the tuner to establish impedances out near the edge of the Smith chart and to reproduce the electrical characteristics as a function of mechanical position. The tuners in this series are also easy to use due to the nearly independent electrical results of the mechanical motions. The depth of penetration of the probe into the transmission line determines the magnitude of the reflection, while the position of the probe along the line determines the phase. While there is some interaction, the effects are almost independent of each other. https://www.maurymw.com/images/mw-rf/mst982e35.jpg
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Product
Deep Access RF Probes
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GigaTest Microwave Probes are perfect for device characterization and modeling. GigaTest Probes have a high tolerance allowing them to land repeatedly and take high-quality data.
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Product
Arbitrary Load-Control Device Characterization
S94522B
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The S94522B Arbitrary Load Control Device Characterization application. Ideal for bare transistor compact modeling. Generate Keysight’s DynaFET compact model or use large signal waveform data to generate models.
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Product
PXIe-5652, 6.6 GHz RF Analog Signal Generator
781217-01
Signal Module
PXIe, 6.6 GHz, PXI RF Analog Signal Generator—The PXIe‑5652 features continuous-wave generation capabilities with FM, 2‑FSK, or OOK modulation. It uses direct digital synthesis (DDS) for high-resolution frequency hopping or phase-continuous sweeping for fixture and device characterization applications. The PXIe‑5652 is ideal for clocking nonstandard sample rates, such as WCDMA signals at baseband or intermediate frequency (IF). With these versatile signal generators, you can perform analog and digital modulation through the onboard DDS circuit, which gives you frequency modulation and frequency-shift keying for applications such as bit error rate test, antenna testing, or even keyless entry. You can also perform amplitude modulation using on-off keying.
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Product
Modulation Distortion Up To 125 GHz
S930712B
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S930712B enables fast and accurate active device modulation distortion characterization under modulated stimulus conditions up to 125 GHz. The wide dynamic range and vector error correction of the PNA-X results in an extremely low residual EVM of the test setup, delivering you a complete picture of your device’s performance without test system interference. S93072B measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Product
ThermalAir Series Temperature Forcing System
ThermalAir TA-3000A
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The ThermalAir TA-3000 high capacity thermal air stream system is used for temperature testing, fast thermal cycling, and device temperature characterization of components, hybrids, modules, PCBs, and other electronic and non-electronic assemblies at precise temperature from -65°C to +225°C. Compact! Plus Performance!
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Product
PXI Vector Component Analyzer, 100 kHz to 32 GHz
M9816AS
Vector Component Analyzer
The PXI vector component analyzer enables complex multiport device characterization with continuous wave and modulated signal measurements.
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Product
PXI Vector Component Analyzer, 100 kHz to 26.5 GHz
M9815AS
Vector Component Analyzer
The PXI vector component analyzer (VCA) enables complex multiport device characterization with continuous wave (CW) and modulated signal measurements.
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Product
Keithley Automated Characterization Suite Software
ACS
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Keithley’s Automated Characterization Suite (ACS) is a flexible, interactive software test environment designed for device characterization, parametric test, reliability test, and even simple functional tests. ACS supports a wide array of Keithley instrumentation and systems, hardware configurations, and test settings, from a few bench-top instruments for use in a QA lab to fully integrated and automated rack-based parametric testers. With ACS, users are ready and able to perform tests quickly without the need for programming knowledge.
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Product
Active Device Characterization Solution Up To 43.5 GHz For 5G
N5244BM
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The N5244BM provides the N5244B 43.5 GHz PNA-X network analyzer, application software and accessories for active device characterization up to 43.5 GHz for 5G applications.
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Product
Economy Mechanical Calibration Kit, DC To 26.5 GHz, 3.5 Mm
85052D
Mechanical Calibration Kit
The Keysight 85052D economy mechanical calibration kit contains precision standard devices to characterize the systematic errors of Keysight network analyzers in the 3.5 mm interface. This kit also contains adapters to change the gender of the test port and a torque wrench for proper connection. Connector gauges may be ordered separately.
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Product
PXI Vector Component Analyzer, 100 kHz to 53 GHz
M9818AS
Vector Component Analyzer
The PXI vector component analyzer enables complex multiport device characterization with continuous wave and modulated signal measurements.
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Product
Dynamic Power Device Analyzer/Double Pulse Tester
PD1500A
Power Device Analyzer
As an off-the-shelf measurement solution, the PD1500A delivers reliable, repeatable measurements of wide-bandgap semiconductors. The platform ensures user safety and protection of the system’s measurement hardware.
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Product
USRP-2955, 10 MHz to 6 GHz, 80 MHz Bandwidth, GPS-Disciplined OCXO, Reconfigurable USRP Software Defined Radio Device
785264-01
Software Defined Radio Device
The USRP-2955 provides an integrated hardware and software solution for rapidly prototyping high-performance wireless receiver systems. It is designed for over-the-air signal acquisition and analysis. It features a two-stage superheterodyne architecture with four independent receiver channels and shares local oscillators for phase-coherent operation. It also offers a Kintex-7 FPGA programmable with the LabVIEW FPGA Module. With these features, the USRP-2955 has the RF and processing performance for applications such as spectrum monitoring, direction finding, signals intelligence, wideband recording, and radar prototyping. The USRP-2955 is equipped with a GPS-disciplined 10 MHz oven-controlled crystal oscillator (OCXO) Reference Clock, which improves frequency accuracy and synchronization.
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Product
Slide Screw Tuners
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Slide screw tuners are particularly suited to establishing impedances for device characterization, or for any other application requiring a precisely repeatable mismatch condition. This is due to the precision with which a specific matching condition can be repeated if the tuner has calibrated position indicators.
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Product
Semiconductor Device Parameter Analyzer/Semiconductor Characterization System Mainframe
B1500A
Analyzer
Current-voltage (IV) measurement capabilities of spot, sweep, sampling and pulse measurement in the range of 0.1 fA - 1 A / 0.5 V - 200 VAC capacitance measurement in multi frequency from 1 kHz to 5 MHz and Quasi-Static Capacitance-Voltage (QS-CV) measurement capabilitiesAdvanced pulsed IV and ultra-fast IV measurement capability from minimum 5 ns sampling interval (200 MSa/s)Up to 40 V high voltage pulse forcing for non-volatile memory evaluation
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Product
Material Characterization Products
MeasureReady®
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Unique real-time sampling architecture for synchronous sourcing and measuring.
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Product
Antenna Characterization
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Radiometrics Midwest Corporation
Radiometrics Open Area Test Site and 10 Meter Anechoic chamber provide ideal test sites for antenna characterization.
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Product
Laser Diode Characterization Systems
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Artifex Engineering GmbH & Co. KG
The LIV100 and LIV120 employ digitally programmable analogue end stages for flexible and accurate current control. A wide range of current end stages are available with maximum currents of 250mA for low power and telecom lasers or up to 1200A for high power laser bars. Custom units are available with even more current!
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Product
Characterization Platform
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This standalone integral software and hardware platform is capable of functioning as an independent single-channel or virtual multi-channel characterization test subsystem. The platform is USB controlled to provide temperature, RF-signal and bias-control to a device-under-test (DUT) for semiconductor performance measurement. When used in conjunction with Accel-RF's embedded Pulser-Card Assembly, the test device is capable of pulsed DC and RF stimulus.
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Product
Microwave Cavity Characterization
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Material Sensing & Instrumentation
Microwave cavity characterization complements TDR Dielectric Spectroscopy in low-loss materials, providing high-resolution permittivity and loss data at specific single frequencies. Since measurements do not change significantly with frequency in low-loss materials (Kramer-Kronig relation) cavity measurement at select frequencies provides a full characterization across the RF/microwave range.
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Product
Fan Characterization Module
FCM-100
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Advanced Thermal Solutions, Inc.
The FCM-100 Fan Characterization Module is a specialized unit designed to test and characterize fans of various sizes and performance outputs. Using the FCM-100 Module in conjunction with pressure measurement equipment (such as the PTM-1000) and velocity measurement equipment (such as the eATVS); it is possible to develop fan curves (P vs. Flow rate) that can be used to verify fan manufacturer data or to characterize fans of unknown performance.
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Product
Solutions for Nondestructive Characterization of Elastic
Sonelastic
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Sonelastic® is a line of solutions for nondestructive characterization of elastic modulus and damping of materials by the natural frequencies obtained by impulse excitation technique.
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Product
Device Connectivity
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The ability of electronic devices to link and exchange data with each other, users, or the internet using wired or wireless technologies, forming networks that enable functions like remote monitoring, automation, and seamless data sharing, crucial for the Internet of Things (IoT) and smart systems.
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Product
Diagnosis Device
CANtouch
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The CANtouch is a battery operated handheld diagnosis device for physical and logical CAN bus analysis. With its modern touch control it allows an intuitive and efficient handling without an additional computer.
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Product
BAW Devices
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Teledyne RF & Microwave has been producing Bulk Acoustic Wave (BAW) delay devices since the early 1960’s. Over the years,Teledyne has constantly improved BAW technology and is currently the world’s only supplier of microwave bulk acoustic wave delay devices. Markets for BAW devices include instrumentation and radar altimeters and are available in connectorized, pin and surface mount configurations.BAW devices operate as low as 300 MHz and as high as 17 GHz, usually in sub-bands of around 10%. Depending on the delay and frequency of operation the insertion loss is in the range 30 dB to 90 dB.
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Product
Multi-Measurement-Device
PXM(e)7810 PXI/PXIe
Matrix Switch Module
The PXM Multi-Measurement-Device devices combine the functionalities of a digitizer, a multimeter, a timer/counter and a highly flexible trigger matrix in one PXI or PXIe device.
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Product
Display Test & Characterization Solutions
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The Gamma Scientific line of display measurement solutions leverages the company’s renowned competencies in developing high-sensitivity spectroradiometer-based equipment. Our range of NIST traceable solutions include handheld and portable instruments, laboratory equipment, and fully automated production inspection systems. With over 50 years of experience in the industry, you won’t find another company with the level of combined knowledge and expertise as the team at Gamma Scientific.
