Atomic Force Microscopes
Nanometer size probe which scans for surface deflections.
See Also: AFM, Microscopes
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Product
Automated Multispectral Microscop
VideometerMic
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The VideometerMic is an automated multispectral microscope incorporating a multispectral scanner head mounted in an xyz-stage for auto-focusing and scanning of samples of size up to 30 mm x 30 mm.
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Atomic Spectroscopy Software
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The range of Agilent atomic spectroscopy software, available with and without compliance solutions, includes SpectrAA, MP Expert, ICP Expert and ICP-MS MassHunter software.
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Inverted Microscope Platform
Axio Observer
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In life sciences research you come up against new challenges every day. That’s why you want a flexible microscope system that can be tailored to your needs. ZEISS Axio Observer is your inverse platform for demanding multimodal imaging of living and fixed specimens. Combine Axio Observer with a wealth of technologies and refine it to support your experiments precisely.
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Product
Metallurgical Microscope
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Offering you a complete choice of products which include dg classic trinocular metallurgical microscope, dg victory trinocular metallurgical microscope, dmi classic trinocular metallurgical microscope, dmi excel binocular metallurgical microscope, dmi optima trinocular metallurgical microscope and dmi prime trinocular metallurgical microscope.
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3-Component Quartz Force Links
261 Series
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Three-component force links eliminate the preload requirement of 3-component quartz force ring sensors, and offers a convenient, 4-screw hole mounting plate on each side end the sensor. Quartz 3-component force links are constructed by installing a 3-component force ring sensor, under preload, between two mounting plates.
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Electron Microscope Analyzer
QUANTAX EDS for TEM
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Long standing expertise in EDS ensures the configuration of the best solution for your specific microscope (STEM, TEM or SEM) thanks to slim-line detector design and geometrical optimization for each microscope pole piece and EDS flange type
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Product
Roll Force Measurement
Millmate
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ABB’s Millmate roll force system is the perfect choice for measuring roll force in both hot rolling and cold rolling mills, thereby achieving correct roll gap settings and force distribution.The system is proven to be exceptionally robust and resilient to high forces as well as aggressive mill agents. The load cells are calibration free, can withstand overloads up to 7 times the nominal force, and have an impressive life length. The load cells come in different sizes from 0.1MN up to 60MN.
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Product
Pedal Force Load Cells
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Pedal Effort Sensors are designed to measure load applied to the brake, accelerator, and clutch pedals during acceleration, deceleration, and transmission shift events. The units are compact and light weight, making them easy to install and remove.
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Product
Scanning Electrochemical Microscope
VS-SECM (DC And AC)
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The SECM integrates a positioning system, a bipotentiostat, and an ultramicroelectrode probe or tip. The positioning system moves the probe close to the surface of the sample, within the local imaging zone. The bipotentiostat can polarize the probe only (feedback mode) or the sample and the probe independently (generator-collector mode), while measuring the resulting current(s). The probe is specially designed to have a specific tapered polish (per the RG ratio) and active radius below 100 microns. The positioning system scans the probe and charts position with measured electrochemical parameters, creating a data map of local current.
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Product
Stereo Zoom Trinocular Microscope
SPZV-50E
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SPZV-50E Stereo Zoom Trinocular Microscope 6.7x to 50x, max 200x with optional lenses on stand PLED with 60 eco friendly LED lights with dimmer. Attach any C or C/S mount camera to the trinocular port to view images on a monitor. Focus mount has coarse and fine focusing for precise control. Large 200 x 284mm base. Compact footprint helps save bench space. ESD Safe coating protects sensitive components from electrostatic discharge.
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Atomic Absorption Spectroscopy Consumables
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Since the atomic absorption spectrophotometer was first launched in 1968, Shimadzu Corporation has remained at the forefront of the world inorganic analysis industry. Shimadzu still maintains an overwhelming market share with highly-regarded products that are selected as the market standard throughout the world. The extensive product range incorporates fully automatic general-purpose systems, a simple and low-cost AA instrument, and a dedicated soil and plant analyzer. They all share great ease-of-use, high functionality, and excellent reliability. Choose Shimadzu to dramatically enhance the productivity and reliability of your laboratory. Shimadzu products will meet all your demands.
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Video Stereo Microscope
BVM-20105
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High-resolution CCD sensor, built-in analog/digital converter, analog and digital signal directly display on the screen, can also simultaneously display on TV and computer through corresponding interfaces; taking photo and video through software; simple operation, reducing user's fatigue and injury.
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Product
Crimp Force Monitor
638007950
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The crimp force monitor measures the force signature of a crimped terminal and compares it to a reference crimp. Depending on the limits programmed, the measurement will pass, fail, or be suspect.
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Product
Scanning Electron Microscope
Verios G4 XHR SEM
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The Thermo Scientific™ Verios G4 scanning electron microscope (SEM) provides sub-nanometer resolution from 1 to 30 kV and enhanced contrast needed for precise measurements on materials in advanced semiconductor manufacturing and materials science applications, without compromising the high throughput, analytical capabilities, sample flexibility and ease of traditional Scanning Electron Microscope (SEM).
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Product
Microscope
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Instrument that produces enlarged images of small objects, allowing the observer an exceedingly close view of minute structures at a scale convenient for examination and analysis.
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Quartz Impact Force Sensors
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Impact-style sensors are specifically designed for impact force measurements. The sensor is typically mounted in a free-standing manner with the installed impact cap directed toward the oncoming object with which it will collide.
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Product
Electron Microscope Analyzer
QUANTAX FlatQUAD
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QUANTAX FlatQUAD is the EDS microanalysis system based on the revolutionary XFlash® FlatQUAD. This annular four-channel silicon drift detector is inserted between SEM pole piece and sample, achieving maximum solid angle in EDS.
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OEM Microscope Components for Integration
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The performance of your microscope optics directly affects the final quality of your products. Olympus OEM components seamlessly integrate into large systems to provide the exceptional optical quality you need to deliver a high-quality final product.
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Carton Force Analyser
CFA
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By measuring the stiffness of the substrate and crease bending resistance the user can optimise cartons for faster running and packaging speeds. The instrument allows individual creases to be analysed identifying problem areas in packaging design or manufacture. Industry research indicates that the packaging speeds of pre-glued skillets is governed by the energy required to open creases. The Hanatek CFA is the first instrument to isolate and accurately measure this key parameter The instrument measures: Bending resistance, bending moment, board stiffness, crease recovery stiffness, crease folding force, crease opening force.
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Product
Force Tensiometers
Sigma 700/701
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The outstanding versatility of Sigma 700 and 701 force tensiometers makes them suitable for research and development, industrial quality control, routine measurements as well as academic research. Both instruments are computer controlled and have a high level of automation.
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Product
Force Sensors
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Piezoelectric force sensors, respectively piezoelectric force transducers or load cells, are perfectly suited for the precise measurement of compressive and tensile forces, both in highly dynamic applications and in quasi-static processes. In universities and industry, for basic research or quality assurance: exact data is always essential in order to measure force characteristics and make processes more cost-effective. Thanks to their rugged design, piezoelectric force sensors from Kistler keep precise track of quasi-static and highly dynamic force processes, even when conditions are difficult. Our force sensors can also handle simultaneous measurements of multiple orthogonal force components.
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Product
Push Pull Force Gauges
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Used in rubber plastic, textiles, waterproof materials, wire and cable, metal materials tensile, compression, bending, cutting and mechanical propertie test, increase the affix to do bending test, it is scientific research institues, universities and colleges,industrial and mining enterprises, the technical supervision and inspeciton arbitration of the department idea test equipment.
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Force Gauges
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SHIMPO offers a range of digital and mechanical force gauges to suite every application from low capacities (0.5 lbs) to high capacities (1,000 lbs). Our gauge's features range from simple, no output models to highly sophisticated units that provide memory, statistics and data output. Our gauges are known for their strong construction and highly accurate measurements.
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Digital Force Gauge
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*Compact and light weight*3-way power supply*Display hold function is equipped*Easy zero adjustment function*Automatic recognition of the type of sensor*Judgment function (Hi&Low) is equipped
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Product
Multiphoton Laser Scanning Microscope
FVMPE-RS
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The Olympus FVMPE-RS multiphoton imaging system is purpose-built for deep imaging in biological tissue, aimed at revealing both detail and dynamics. Innovative features for efficient delivery and detection of photons in scattering media enable high signal-to-noise ratio acquisition. This translates to bright images with precise details — even from deep within the specimen. High sensitivity is matched with high-speed imaging to capture rapid in vivo responses. For advanced applications, dual-wavelength excitation extending to 1300 nm is available. Independent control of visible or multiphoton laser light stimulation and the ability to synchronize with patch clamp data are also possible.
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Scanning Acoustic Microscope
Echo
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The ECHO scanning acoustic microscope is a nondestructive ultrasonic flaw detector designed to simplify testing, increase yield and maximize productivity in the lab or on the production floor.
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Grips and Fixtures for Force Gauges
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AMETEK Sensors, Test & Calibration
We supply a range of grips and fixtures for the Chatillon force gauges. Below you will find a selection of our most popular grips and fixtures. If you cannot find what you are looking for, please contact us for a presentation of our full range.
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Electromagnetic Force Micro Tester
Micro-Servo
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This is a multi-functional fatigue testing machine suitable for specimens, structures and full-sized parts. It is an overhead actuator type with a broad test space, so it is ideal for various types of environmental tests, such as those in corrosion tanks or constant temperature tanks.
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Digital Microscope Accessories
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Variety of extra accessories , such as macro lenses, remote control consoles, illuminations, image/video capture, software, stands and stages are available for Inspectis digital microscopes.
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Upright Microscopes
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ACCU-SCOPE upright microscopes deliver top quality optics for bright, crisp images. Sometimes referred to as compound microscopes, our upright microscopes are favorites across a wide range of laboratories including clinical, veterinary, pharmaceutical, research, university, and education. Some of the disciplines utilizing our upright microscopes include pathology, hematology, microbiology, cytology and histology. ACCU-SCOPE upright microscopes offer a selection of magnifications from ultra-low (e.g. 2X) to high power oil immersion (e.g. 100X). Our microscopes have a variety of options and accessories to perfectly fit your application including ergonomic viewing heads, trinocular heads for camera attachment, and an assortment of objectives. Common contrast methods used with our microscopes include brightfield, phase contrast, darkfield, Differential Interference Contrast (DIC) and fluorescence.
