Atomic Force Microscopes
Nanometer size probe which scans for surface deflections.
See Also: AFM, Microscopes
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OEM Microscope Components for Integration
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The performance of your microscope optics directly affects the final quality of your products. Olympus OEM components seamlessly integrate into large systems to provide the exceptional optical quality you need to deliver a high-quality final product.
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Atomic Absorption Spectrometer
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Atomic absorption spectroscopy (AAS) determines the presence of metals in liquid samples. Metals include Fe, Cu, Al, Pb, Ca, Zn, Cd and many more. It also measures the concentrations of metals in the samples. Typical concentrations range in the low mg/L range.
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Coercive Force Meter
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The meter is mainly used in measuring the coercive force of magnetic components of relays and the mechanical energy meter compensation films, which is the essential instrument of manufacturers who are producing the relays and the energy meters, etc.
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Sauter Force Gauges
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Force gauges provide a quick and reliable way to obtain a measure of force in tension and compression. DMV UK offer a comprehensive range of mechanical and digital force gauges with selectable units and peak force capture with capacities from 2 N to 100,000 N. All gauges are supplied with standard accessories, a 2 year warranty, and can be used for force testing in hand held or test stand applications.
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Force Gauges
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A digital force gauge, often called a push pull force gauge or tension and compression force gauge, is used in material testing, quality control and assurance, research, development, product testing, laboratory and educational applications. PCE Instruments' (PCE) digital force gauge products are the benchmark of quality and performance. PCE digital force gauge devices provide measurements in kilograms (kg), grams (g), ounces (oz), pounds (lbs) and Newtons (N) of force (f), depending on the force gauge model. Most PCE digital force gauge products are handheld, portable devices that also can be used with a universal test stand. There are several different force gauge products available online in the PCE web shop.
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Temperature Controlled Microscope Stages
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Your product descripThere are various version options for this stage, including pressure, vacuum, electrical sample measurement and sample holders to mount the stage vertically in IR or xray spectrometers.tion goes here.
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Rapid Automated Modular Microscope
RAMM
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Applied Scientific Instrumentation
*Featuring automated high-speed XY stages, precision piezo & motorized Z focusing, and a wide range of scanning options.*Configurable with infinity-corrected optics, dichroic filter cubes, multi-wavelength excitation and emission filterwheels, shutters, and detectors including cameras and photomultipliers.*Auto-focus, focus stabilization, tracker, and robotic specimen loader available.*Arrangement provides a solid platform for high throughput screening, genetic sequencing, experimental research, and much more.*Designed for flexible cost-effective OEM development using high quality high MTBF components to reduce cost and increase customer satisfaction.
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High Force DMA
DMA 3200
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The DMA 3200 combines decades of cutting-edge fatigue and world-leading Dynamic Mechanical Analysis technologies into a unique and highly versatile testing platform. The patented, frictionless Electroforce® motor technology, superior mechanical design, efficient environmental control, and wide variety of clamping systems deliver superior data accuracy for the broadest range of applications.
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Monocular Microscopes
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ACCU-SCOPE monocular microscopes use high-quality optics for bright, crisp images. Possibly the iconic and most recognized example of microscopes, monocular microscopes are compound microscopes with the outstanding feature of a single eyetube and eyepiece. Our monocular microscopes are durable and portable, making them favorites across a wide range of laboratories and educational environments including high schools, environmental science, and veterinary settings. ACCU-SCOPE monocular microscopes come with a standard selection of 4x, 10x and 40x DIN objectives (“DIN” is an international standard for type of thread and focal length). Depending on the series, 60x dry or 100x oil immersion objectives are available.
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Economical Load and Force Measurement
ELF
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Tekscan's ELF force and load measurement system matches the market's need for an inexpensive load and force measurement system with Tekscan's ability to deliver innovative load and force measurement solutions. The system consists of data acquisition hardware, software, and FlexiForce B201 sensors.
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Multiphoton Laser Scanning Microscope
FVMPE-RS
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The Olympus FVMPE-RS multiphoton imaging system is purpose-built for deep imaging in biological tissue, aimed at revealing both detail and dynamics. Innovative features for efficient delivery and detection of photons in scattering media enable high signal-to-noise ratio acquisition. This translates to bright images with precise details — even from deep within the specimen. High sensitivity is matched with high-speed imaging to capture rapid in vivo responses. For advanced applications, dual-wavelength excitation extending to 1300 nm is available. Independent control of visible or multiphoton laser light stimulation and the ability to synchronize with patch clamp data are also possible.
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Stereo and Zoom Microscopes
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Generate three-dimensional and laterally precise images. With Stereo Microscope you observe large samples such as leafs and tissues or inspect rough material surfaces. Upgrade your microscope flexibly with different digital cameras and benefit from various types of illumination techniques.
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Force, Materials & Torque
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Physical Property Testers Group
We are specialists in force, materials and torque testing solutions for quality control in production line environments and research and development laboratories.
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Heating Microscope
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Heating microscopy is a non-contact technique that, based upon an advanced image analysis of a specimen subjected to a thermal treatment reproducing industrial firing conditions, identifies several characteristic shapes and related temperatures key to the optimization of manufacturing processes in ceramics, metals, and alloys.
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Wafer Cathodoluminescence Microscope
Säntis 300
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Attolight’s Quantitative CL-SEM offers “No Compromise” large field fast scanning simultaneous acquisition of SEM images, hyperspectral CL maps, and optical spectra. Smaller diameter wafers, or miscellaneously shaped substrates are manually loaded on intermediary 300mm susceptors subsequently handled automatically by the tool.
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Scanning Probe Microscope
SPM-9700HT
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Making the Unknown Visible Scanning probe microscope (SPM) is a generic term for microscopes that scan sample surfaces with an extremely sharp probe to observe their three-dimensional image or local properties at high magnifications. The SPM-9700HT takes high-throughput observations to the next level.
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Scanning Probe Microscopes
attoMICROSCOPY
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The mission to create scientific impact has kept attocube at the frontier of cutting edge research instrumentation. Decades of combined experience in all relevant fields, an excellent team, and close cooperations with some of the world’s leading research institutes have evolved into a broad portfolio of high-end cryogenic scanning probe microscopes.
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Force Gauges
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SHIMPO offers a range of digital and mechanical force gauges to suite every application from low capacities (0.5 lbs) to high capacities (1,000 lbs). Our gauge's features range from simple, no output models to highly sophisticated units that provide memory, statistics and data output. Our gauges are known for their strong construction and highly accurate measurements.
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Clamping Force Tester
KRD102
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KRD102 series clamping force tester is an indispensable test method for improving products into high-quality fields. It is suitable for research, development, quality control and manufacturing of electronics, electromechanical, optoelectronic, automotive, toy, packaging and other industries. It can simulate the situation that the goods in the container are clamped when they are transported from the container to the warehouse. Whether the goods are damaged due to the clamping, so as to evaluate the anti- clamping ability of the packaging.
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Infrared Microscope
DDR200/300 NIR
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The McBain DDR200 NIR (for 200mm) and DDR300 NIR (for 300mm) provide high-speed defect detection and precision measurement on wafers and other parts. These cost-efficient systems offer unique advantages for both production and process development use, providing an optimum near-infrared (900-1700nm) solution when both subsurface defect detection and dimensional metrology are required.
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Acoustic Microscope
AMI D9650
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Specifically designed to serve as a general purpose tool for failure analysis, process development, material characterization and low volume production inspection, the capabilities of the D9650 are truly unmatched. Representing the latest in C-SAM acoustic micro imaging, the D9650 delivers the unrivaled accuracy and robustness that you would expect from Nordson Test & Inspection instruments, plus improved electronics and software that raises the performance level for laboratory acoustic microscopes.
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Modular Infinity Microscope
MIM
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Applied Scientific Instrumentation
ASI Modular Microscope components consist of tube lenses along with adapters and accessories that either are primarily used in the collimated light space or adapters that are to be used on the image side. Collimated light adapters use the 38mm diameter C60-RING system to connect components. Focus-side adapters attached to lens tubes with either a 30mm diameter coupling to the I.D. of the C60-TUBE, or with a 50mm coupling on the O.D. of the lens tube.
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Temperature Controlled Microscope Stage
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Linkham Scientific Instruments
Specialists in temperature controlled microscopy, Linkam Scientific Instruments, announce the launch of their Optical DSC450 which enables simultaneous visualization of thermal processes for improved materials characterisation. The Optical DSC450 enables the user to measure glass transitions and melting behaviour of a wide range of substances whilst accurately controlling temperature from -196 °C to 450 °C. The atmosphere of the stage can also be purged with gas as required by the user. A new feature which will increase the characterisation capabilities of the DSC system is to combine it with imaging capability. The new LINK Digital Imaging module enables additional information to be obtained by correlating optical changes such as colour with temperature. The new TASC analysis tool takes this further. TASC (Thermal Analysis by Surface Characterisation) is a new image analysis capability which enables structural changes in samples to be tracked and quantified optically. It has the unique ability to measure local transition temperatures allowing different points on a sample to be identified. The new DSC system is great tool to use in research and quality control to measure quantitative values for glass transitions, melting peaks and sample purity and, when combined with TASC, even sample homogeneity.
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Sensor Products: Weld Force Gage
90061
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Model 90061 is a self-contained, portable measurement system which allows auditing of the pinch force generated between the electrodes of resistance spot welders. Resistance welding uses a pair of electrodes to clamp two base metals firmly together prior to and during application of electrical current. Poorly clamped parts result in a defective joint. A correctly clamped assembly aids in reducing the resistance in the joint and allows the current flow to properly heat the base metals to weld the part.
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Scanning Electron Microscope
Verios G4 XHR SEM
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The Thermo Scientific™ Verios G4 scanning electron microscope (SEM) provides sub-nanometer resolution from 1 to 30 kV and enhanced contrast needed for precise measurements on materials in advanced semiconductor manufacturing and materials science applications, without compromising the high throughput, analytical capabilities, sample flexibility and ease of traditional Scanning Electron Microscope (SEM).
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Hand-held Fiber Inspection Microscopes
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The WL-C series hand-held fiber microscopes use coaxial illumination to provide users with maximum detail. It easily can detect the finest scratches and contamination, making it ideal for critically inspecting polish quality.
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Glow Discharge Atomic Emission Spectrometer
GDS900
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LECO's Glow Discharge Spectrometer (GDS) offers you state-of-the-art technology designed specifically for routine elemental determination in most conductive ferrous and nonferrous materials. The GDS900 features improved performance, stability, accuracy, and precision in steel, iron (including as-cast), aluminum, copper, zinc, nickel, cobalt, tungsten, and titanium materials, while featuring our user-friendly Cornerstone® brand software to help streamline your analysis.
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Ultraviolet Microscope
UVM-1
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The UVM-1™ is a UV microscope that also can image in the visible and NIR. This UV-visible-NIR microscope embodies both advanced optics for cutting edge UV, color and NIR imaging and visualization. The system is a flexible design, very easy to use and very durable. It is designed with cutting edge CRAIC optics for the highest image quality and to give years of service.
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Microscopic Four-Point Probes
M4PP
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CAPRES M4PP Microscopic Four-Point Probes have an electrode pitch three orders of magnitude smaller than conventional four-point probes, and are fabricated using silicon micro-fabrication technology.
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Force Transducers
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Metra Meß- und Frequenztechnik Radebeul GmbH & Co. KG
Piezoelectric force transducers are suited for the measurement of tensile and compression force.
