Code Analysis
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Product
Pro Antenna Analysis Software
MININEC
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MININEC Pro is an antenna analysis program for Windows and Macintosh computers. Any type of antenna may be analyzed. The physical design of the antenna is entered (such as the lengths of wires and elements). For a given frequency, the feedpoint impedance is calculated, along with theoretical efficiency.
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Product
Counterfeit Analysis / Screening Services
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DPACI perform counterfeit part analysis on all types of electrical, electronic, and electromechanical (EEE) components. Our suspect counterfeit analysis task groups include source identification, manufacturer validation, external visual inspection, mechanical inspection, electrical test, X-Ray, in-depth internal visual and materials analysis. With one of the largest databases of test reports for EEE components, we can offer similar historical data for correlation with images, test data, certifications and reports.
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Product
Solmetric Certified Shade Analysis Training
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The premier shade analysis training certificate from the solar industry’s expert in shade
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Product
Air Quality Analysis
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Ambient Gas Monitoring: We offer a variety of analyzers for the ambient monitoring of the criteria pollutant gases, including CO, NOX, SO2, and others such as CH4 and CO2. Source Gas Monitoring (Emissions Monitoring): Experience reliable measurement in your process for emissions compliance every time.Ambient Particulate Monitoring: Experience our monitoring technology and gain the power to do more than just inform.Emissions Calibrators: For continuous monitoring of mercury in exhaust stacks, waste incinerators, and cement kilns, or multi-gas models to control the calibration of gas concentrations.
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Product
Elemental Analysis Instruments
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Chongqing TOP Oil Purifier Co., LTD
Your product description goes here.
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Product
Real-Time Analysis up to 255 MHz, Basic Detection, Multi-touch
N9041B-RT1
Signal Analyzer
See, capture, and understand elusive signals as short as 17.17 s with 100% POI and a complete set of advanced triggers, up to 110 GHz View signal dynamics with integrated real-time displays Maximize your investment by adding RTSA at a fraction of the cost of a dedicated solution Easily integrate the 89600 VSA software and thoroughly analyze complex signals Industry-leading 3 year warranty Every spec verified, adjustments included Lock in support & peak performance from the start
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Product
Destructive Physical Analysis (DPA)
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Is the process of disassembling, testing, and inspecting a component for the purpose of determining conformance with applicable design and process requirements. This process of sample testing is used to ensure that a high reliability component or device is fabricated to the required standards. Destructive Physical Analysis is also used effectively to discover process defects for troublesome production lot problems.
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Product
Real-Time Analysis, 85 MHz, Basic Detection, Multi-touch
N9020B-RT1
Signal Analyzer
See, capture, and understand elusive signals as short as 17.3 s with 100% POI and a complete set of advanced triggers View signal dynamics with integrated real-time displays Maximize your investment by adding RTSA at a fraction of the cost of a dedicated solution Easily integrate the 89600 software and thoroughly analyze complex signals Industry-leading 3 year warranty Every spec verified, adjustments included Lock in support & peak performance from the start
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Product
Stack Analysis Tool
GNATstack
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GNATstack is a software analysis tool that enables Ada/C/C++ software development teams to accurately predict the maximum size of the memory stack required to host an embedded software application. GNAT Pro add-on.
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Product
Data Analysis
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Power Monitoring and Diagnostic Technology Ltd.
PMDT Engineers are always available to review your test samples and to provide guidance to users in the field. Our PD experts have the ability to accurately analyze various types of field test data based on PRPD/PRPS spectrums, waveforms and audio files collected during a field test.
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Product
Terahertz Coating Thickness Analysis
TeraCota
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TeraView presents a film thickness gauge designed for the automotive industry. The sensor can determine the individual thickness of multiple paint layers on both metallic and non-metallic substrates and offers significant benefits over existing techniques.
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Product
STDF Test Data Analysis Tool
DataView
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DataView is a low‐cost test data analysis tool that is used by test and product engineers to perform characterization of integrated circuit devices. DataView reads in industry standard STDF or ATDF files and can produce reports, histograms, and wafer maps in multiple formats including Excel. DataView is ideal for the test or product engineer who needs a fast and simple tool to analyze characterization data.
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Product
Thermal Analysis Instruments
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Typically measure heat flow, weight loss, dimension change, or mechanical properties as a function of temperature.
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Product
MultiGas™ TFS™ Gas Monitor For Multi-Compound Gas Analysis
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The MultiGas™ TFS™ Monitor is an online, multi-compound, trace gas monitoring system in a stand-alone 19-inch rack enclosure. It uses an innovative tunable filter spectroscopy technology enabling high selectivity and stability measurement. Low detection limit (sub-ppm levels for most gases) is achieved through the use of high throughput optics coupled with a long-path gas cell and a high sensitivity detector.
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Product
Gas Analysis
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Accurate measurement of gases and their concentrations is critical in many applications, and often poses a major challenge. Sensors' experience with different measurement principles, including NDIR, NDUV, and thermal conductivity, along with the ability to provide special combinations of these techniques within our products, enables us to tackle these challenges. In addition, our experience goes into every detail of our gas analyzers, ensuring reliable results, even under harsh conditions. Our skilled team of experts is happy to assist you in finding the optimized solution for your measurement requirements, with either off-the-shelf components or a customized solution.
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Product
Electronics Failure Analysis System
Sentris
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Due to the continued decrease in integrated circuit feature size and supply voltages, detecting and locating the miniscule amount of heat generated by failure sites has become increasingly difficult. Sentris pinpoints low-level infrared thermal emissions from IC faults such as short circuits and leakage current.
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Product
Source/Measure Unit for Battery Drain Analysis, Multiple Ranges, 80 W, Double-wide
N6785A
Source Measure Unit
The N6785A is a source/measure unit (SMU) designed specifically for battery drain analysis of large mobile, battery-powered devices up to 20 V, up to 8 A, up to 80 W.
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Product
Inductively Coupled Plasma Spectroscopy (ICP-OES/MS), ICP Analysis Services
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ICP-OES measures the light emitted at element-specific characteristic wavelengths from thermally excited analyte ions . This light emitted is separated and measured in a spectrometer, yielding an intensity measurement that can be converted to an elemental concentration by comparison with calibration standards. ICP-MS (ICP-Mass Spec) measures the masses of the element ions generated by the high temperature argon plasma. The ions created in the plasma are separated by their mass to charge ratios, enabling the identifcation and quantitation of unknown materials. ICP-MS offers extremely high sensitivity (i.e. low detection limits) for a wide range of elements
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Product
Dynamic Particle Image Analysis System
iSpect DIA-10
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Shimadzu's iSpect DIA-10 Dynamic Image Analyzer combines particle size and image analysis technology to offer complete particle characterization. It can perform particle imaging, size analysis, and foreign object detection, and obtain size distributions and number concentration, in as little as two minutes.
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Product
Time Frequency Analysis Function
OS-0527
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This function can evaluate transient phenomena that were difficult to capture by FFT analysis, and display clearly time change of the frequency component while maintaining its frequency resolution . The OS-0527 is equipped with STFT (Short Time Fourier Transform) and Wavelet transform.
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Product
Tracking Analysis Software
DS-0322
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This software enables tracking analysis with high-speed (calculation speed: approx. at 20ms/4-ch), high-resolution (1000 blocks max.) and high-accuracy (more than 100dB dynamic range). It can plot rotation-tracking diagram during calculation, and also can set and plot the diagram of intended order or frequency after the calculation. *DS-0321 series FFT analysis software is required.
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Product
Pattern Region of Interest Analysis System
PRIAS
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PRIAS is a synergistic new imaging technique to visualize microstructure and provide exciting new views of your materials. PRIAS enables users to quickly characterize materials without requiring full EBSD pattern indexing. Through a novel use of the EBSD camera, PRIAS provides as many as 25 positional electron detectors to allow unprecedented flexibility in image collection and visualization. Applications of PRIAS include traditional EBSD materials such as metals, ceramics, semiconductors, and minerals as well as new analysis of plastics and glasses.
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Product
Analysis Application for E84
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GCI's industry leading E84 diagnostic software is a powerful, Windows-based graphical analysis application that can upload and analyze data from GCI's E84 Handheld Tester, E84 DLD, and RJ-11 Optical Transceiver products. The E84 Analysis Application can also display the signals of a live material handoff in real-time when connected to GCI's E84 DLD or RJ-11 Optical Transceiver.
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Product
Embedded Analysis Software for the 2000 X-Series
D2000GENB
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Test and debug I²C, SPI, RS232/422/485/UART designs with triggering, decoding, and pass / fail mask limit testing.
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Product
Surface Analysis
Innova-IRIS
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This provides researchers a perfect combination of chemical or crystallographic information at high spatial and spectral resolution with the most advanced atomic force microscopy characterization. The Innova-IRIS can be integrated with your choice of a leading Raman system to provide the best opaque sample TERS investigations available today. However you tailor your system, your application will benefit from Bruker exclusive, high-contrast IRIS TERS probes and the best tip preservation and lowest drift, guaranteeing that alignment is preserved even over the optical integration times necessary to interrogate weak Raman scatterers.
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Product
Enhanced Time-Domain Analysis With TDR
S95011B
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This application enables the analyzer to perform enhanced time domain analysis for high-speed data applications. All functionality of the S95010B are included (TDR/TDT mode). In addition, the S95011B enables more detailed measurements and evaluations, such as eye-diagram / mask modes, without adding PLTS software. Jitter and emphasis / equalization capabilities enable simulation of real-world signals and environment. The S95011B covers up to 53 GHz bandwidth. Full calibration is available and the automatic deskew ensures easy removal of fixture and probe effects. To get the best accuracy, mechanical calibration kits or ECal with DC option (i.e., N469xD or N4433D with Option 0DC) are recommended.
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Product
ChromSquare GC×GC Software For Comprehensive Chromatography Data Analysis
ChromSquare
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ChromSquare GC/GC is data analysis software for comprehensive gas chromatography (GC/GC). ChromSquare provides easier, more reliable analysis of information obtained from GCxGC analysis, enabling everything from qualitative to quantitative analysis. This software is a product of cooperative research with a group headed by Professor Mondello at the University of Messina (Italy). This group implements cutting-edge research in the field of comprehensive 2D chromatography.
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Product
Signal Analysis
Harmonic Distortion Analysis
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The software is used for automatic measurement of the harmonic distortion factor and voltage r.m.s. of signals coming to the input channels of FFT spectrum analyzers. Adjustment to the frequency of the main component is performed automatically. The program is based on the measurement of the voltage r.m.s. of higher components by an external or internal reference signal.
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Product
PCIe Exerciser & PCIe LTSSM Exerciser with L1 Substate Analysis
U4305B
Protocol Exerciser
Supports 2.5 GT/s (Gen1), 5.0 GT/s (Gen2) and 8.0 GT/s (Gen3) speeds Link width support x1 through x16 lanes Standard PCIe half-size card form factor to fit into most platforms Emulate Root Complex (RC) or Add-In-Card (AIC)
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Product
Individual UPC Bar Code Standards
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The UPC Verification Calibration standards are a unique set of symbols that assures an exact and reliable primary bar code standard exists for UPC codes based on ANSI X3.182/ISO 15416 methodology. These standards assures that manufactures of verification equipment, scanners, QC labs and end users now have an accurate basis for checking the measurement capabilities of their equipment. These standards are intended as a fundamental calibration tool for an QC program, providing a continuous scale from best to worse case characteristics of each parameter. With complete NIST traceable data supplied, it is ideally suited to those requiring traceability, such as ISO certification. Each symbol is individually calibrated to ANSI X3.182/ISO 15416 standards using a custom built microdensitometer. These cards are supplied calibrated for use with a 6 mil scan aperture and 660nm wavelength. (calibration wit other aperture sizes or wavelengths is available)
