Surface Contamination
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Product
Automated Monitoring of Airborne Molecular Contamination
AMC-Monitor T-1000
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The all-in-one analyzer for FOUP, fab and clean-room environment AMC monitoring in the semiconductor industry. The AMC-Monitor is a modular and flexible platform for airborne molecular contaminations (AMC) monitoring in semiconductor applications such as: FOUP analysis with a focus on VOC and condensables incl. full integration with Pfeiffer Vacuum APA 302 pod analyzer. Clean-room monitoring in fabrication plants.
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Product
Chemical Analysis + Surface Analysis
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Rocky Mountain Laboratories, Inc.
An independent surface chemistry and microanalysis laboratory to serve the needs of industrial, academic, and governmental clients. Our objective – to provide real-world solutions for industries with materials and process development needs – is as fundamental to our organization today as when we began. Over the years we have strived to adapt our services to the specific needs of these clients.
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Product
Surface Roughness
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Surface Roughness: these consist of a stylus attached to an arm which moves over the surface to record and measure the roughness over a specified distance, recording peak-to-valley average.
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Product
Surface Measurement Instrument
SMI
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Redefining speed and accuracy in non-contact metrology, the Optikos SMI is a high-speed surface topography instrument that characterizes spherical, toric, and aspheric surfaces. The SMI measures surface shape deviations of precision surfaces using wavefront analysis technology. Configured to measure such items as: micro-optics, ball lenses, and contact lens molds, the instrument allows users to easily measure aspheric and toric parts without the need for reference surfaces.
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Product
Surface And Subsurface EW System Tester
MS 1119
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CPCI Based BTA is used to test ECM System Processor (80386 & 8051) Boards. This system consists of a Single Board Computer (SBC), CPCI RS422 Communication and Bus Interface Board (CBI), CPCI Digital Input & Output (DIO) Board and CPCI Analog Input & Output (AIO) Board to provide the necessary input/output signals to/from the board to be tested.
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Product
Contamination Detection and Analysis
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Contamination testing, detection, analysis, troubleshooting and resolution expertise to minimise downtime, maintain customer confidence, for quality & safety
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Product
Inclined Surface Coefficient Of Friction
DRK138
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Shandong Drick Instruments Co., Ltd.
DRK138 Inclined Surface Coefficient Of Friction Tester is applied to testing the COF of film, paper, card board, sheet and so on. By testing the material’s frictional properties, the open performance of packages, packaging speed of packers and other indexes could be controlled to meet the requirements for production
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Product
Surface Measurement Instrumentts
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Analyze surfaces texture with nanometer precision is already a technological challenge, but TR Scan Premium is able to perform this task with unprecedented speed! The TR Scan Premium is used in workshops and laboratories worldwide. It is completely designed and manufactured in Switzerland by TRIMOS. The TR Scan is focusing on Digital Holographic Imaging Technology. Accuracy, speed, ease of use and modular construction make it ideal for all types of surface measurements.
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Product
Surface Profilers
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Taylor Hobson offers a world leading range surface form, surface finish and metrology solutions for 3D contour,ideal for the most demanding applications.
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Product
K Thermocouple Surface Probe
TP746
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Surface thermocouple Type “K” probe. Tolerance according to IEC 60584-2 standard.
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Product
Surface Profiler Measurement System
SP series
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SP series, high accuracy 3D surface profiler measurement system with white light interferometry.
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Product
Laser Doppler Surface Velocity Meter
LV-7000 series
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The LV-7000 series detects speed, uneven speed, distance, length of moving object or rotating object without contact. By contacting with 2 sensors, it enables to calculate difference in velocity/length between the two points in real time and output with 3,000 ppm of accuracy. The frequency response can be expanded up to 20 kHz, which achieves to understand phenomena and evaluate mechanical systems at high speed, efficiently, and accurately. It is useful for evaluation of motor control and behavior measurement, improving parts quality, and reducing loss of material.
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Product
Surface Texture And Contour Measuring Instruments/Systems
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We provide high performance, easy-to-use systems from highly efficient hybrid types that can measure the surface roughness and the contour in one trace, to portable types that can be used even on the production site.
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Product
In-Line Wafer Surface Defect Inspection
ALTO-SD-150/200
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ALTO-SD SERIES IS AN IN-LINE INSPECTION SYSTEM SUPPLYING HIGH THROUGHPUT, FULL SURFACE DEFECT INSPECTION FOR ALL KINDS OF WAFERS INCLUDING SILICON, QUARTZ, SAPPHIRE, COMPOUND AND MEMS WAFERS. HIGH-RESOLUTION CAMERA OPTICS PLUS LED ILLUMINATION GUARANTEE RELIABLE DETECTION OF ALL LOCAL DEFECTS. IT INSPECTS DEFECT SIZE OF 1~ 10 MICRONS, CONFIGURABLE INSPECTION RESOLUTION TO OPTIMIZE DEFECT SIZE VS. THROUGHPUT. THE SYSTEM COMBINES HIGH-PRECISION MEASUREMENT, POWERFUL DATA ANALYSIS AND USER-FRIENDLY OPERATIONS.
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Product
Surface Profile Gages
PosiTector® SPG
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Surface Profile Gages for Blasted Steel, Textured Coatings and Concrete Profile. Digital depth micrometer measures and records peak to valley surface profile heights.
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Product
K Thermocouple Surface Probe
TP777
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Surface thermocouple Type "K" probe. °C max: 200. Response time: 3 s.
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Product
Absolute Contamination Standards (ACS)
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The Absolute Contamination Standard (ACS) is used to calibrate instruments which size and detect particles on the surface of bare silicon wafers. Use ACS to characterize particles, before particles characterize products.
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Product
Skin Surface Probe
SST-1
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The SST-1 skin surface temperature probe for humans, to be taped on is re-useable and has a fast response time.
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Product
Surface Analysis
Innova-IRIS
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This provides researchers a perfect combination of chemical or crystallographic information at high spatial and spectral resolution with the most advanced atomic force microscopy characterization. The Innova-IRIS can be integrated with your choice of a leading Raman system to provide the best opaque sample TERS investigations available today. However you tailor your system, your application will benefit from Bruker exclusive, high-contrast IRIS TERS probes and the best tip preservation and lowest drift, guaranteeing that alignment is preserved even over the optical integration times necessary to interrogate weak Raman scatterers.
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Product
Surface Cleanliness Analyzer
Surface Analyst
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The Surface Analyst is a fast, easy, accurate, and non-destructive instrument that quantifies your level of surface preparation from the lab to the manufacturing floor. In 2 seconds, the Surface Analyst determines the surface cleanliness level by providing the contact angle measurement and a pass/fail result.
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Product
K Thermocouple Surface Probe
TP655
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Surface thermocouple Type “K” probe. Tolerance according to IEC 60584-2 standard.
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Product
Sapphire/SIC Wafer Flatness and Surface Appearance System
FM200
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Sapphire/SIC wafer flatness and surface appearance system provide a previous surface flatness testing solution, though non-contract lighting testing to record the whole information of the surface, rapid and fast measurement for various of surfaces, line and all kinds of surface information.
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Product
Surface Mount Reed Relays
Series 200
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Surface Mount Reed Relays. Wide range featuring dry or mercury wetted switches. Coaxial version for high speed digital or RF up to 6 GHz. 5, 12 or 24 volt coils with optional diode
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Product
Surface Roughness Meter
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Shenzhen Graigar Technology Co.,Ltd.
Surface Roughness Tester is powerful, accurate and easy to use. It is ideal for checking large components, structures, auditing batch prior to shipment and production line process control.
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Product
Concrete Surface Resistivity
Surf
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Giatec Surf™ is a laboratory test device for rapid, easy and accurate measurement of the surface electrical resistivity of concrete based on the four-probe (Wenner-Array) technique. The Surf™ patented technology automatically measures resistivity around the concrete specimen using four channels of 4-probe array (located at 90° from each other). The PC software generates the required reports according to the standard specifications.
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Product
Surface Mount Switches
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Dow-Key® Microwave offers PCB mounted, miniature electro-mechanical microwave switches. These switches are designed with an overall size of 0.75” x 0.75” x 0.58” and weight of 0.5 ounces for test and aerospace applications where small size, reduced weight, and less power consumption are critical.
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Product
Surface & Volume Resistivity Meter for Nonconductive Materials
Hiresta UX
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The new Hiresta-UX is a high performance meter for measuring the surface and volume resistivity of a wide variety of nonconductive materials. With an extended measurement range of 103 ~ 1014Ω, this meter is ideal for Production, Engineering, R&D and Quality Control. The new Hiresta-UX features powerful new algorithms that automatically choose the right voltage, which optimizes the surface and volume resistivity testing. This versatile, high performance resistivity meter includes a built-in switch box that can be mated with a J-Box (meets JIS K 6911 for surface & volume resistivity and is compatible with ASTM D 257) as an option. The Hiresta-UX can store up to 2,000 measurement results, which can be easily exported to a USB memory device.
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Product
Surface Roughness Tester Profilometer
TIME®3231
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Beijing TIME High Technology Ltd.
TIME® 323X series is advanced high-end surface roughness measuring instruments with wide testing range (±400µm) and high accuracy (tolerance±5%, repeatability 3%). Meanwhile, TIME® 323X surface roughness tester features with skidless/skid measurement, which means it can reach smaller and harder to reach parts than other conventional tools. Up to 55 paramenters for roughness, waviness and primary profile are supported. Apart from those features mentioned above, TIME®3231 is loaded with 90° measurement function.
