Test Applications
See Also: Test Apps, Test Management Applications, Crowdsourced
-
Product
Structural Testing Application Examples Using EDM Modal
-
Illustrated below are some customer applications in varying industries who are using the hardware and software by Crystal Instruments to analyze and understand the structural properties of their test specimen(s). Analyzing the modal characteristics namely natural frequencies, damping and mode shapes of the test unit further helps in improving the design to enhance the mechanical behavior of the test unit.
-
Product
DDR5 Receiver Conformance and Characterization Test Application
M80885RCA
-
DDR5 Receiver Conformance and Characterization Test Application.
-
Product
Self Test Application Adapter and Software
OTP2-Modul-Nr210
-
In order for the system to carry out a self-test, it requires a suitable adapter and software that is tailored to the test system. A self-test is often very helpful and recommended if a system has not been used for a long time or also to see whether the test system is working properly with the specified parameters.
-
Product
Receiver Conformance Test Application for IEEE 802.3ck
M8091CKCA
-
Designed to assist and simplify the stress signal calibration used for testing the inputs of IEEE 802.3ck Draft 3.3 chip-to-chip (C2C) and chip-to-module (C2M) electrical interfaces using Keysight M8040A 64Gbaud Higher Performance BERT or an M8050A 120Gbd High-Performance BERT together with Keysight Digital Communication Analyzer (DCA) Oscilloscope or Infiniium UXR real-time Oscilloscope.
-
Product
Power Meters & Power Sensors
-
Keysight’s power meters and power sensors measure the power of RF and microwave signals accurately with sensors of various types (CW, average, and peak and average), covering numerous frequencies and power ranges. We offer a wide selection of power meters and power sensors for nearly all application needs — wireless communications, radar pulse measurements, component test, and more. Applications include testing the output power of communication base-station transmitters, radar system equipment, wireless devices, and much more.
-
Product
Supernova
-
SuperNova Test Application Framework is an innovative, fully integrated test environment that addresses world-class test deployment challenges by simplifying access to high-end test capabilities, reducing time spent on analysis and customizations, and quickly meeting the most different test deployment use cases.
-
Product
Multiprotocol P104Plus Interface Board for Embedded Applications or Avionics Test & Simulation Applications
EXC-4000P104plus
-
The EXC-4000P104plus is a multiprotocol P104plus interface board for embedded applications or avionics test and simulation applications. Each board holds up to five independent modules. Two on-board modules use the MIL-STD-1553 communications protocol (M4K1553Px); another on-board module uses the ARINC-429 communications protocol; two additional detachable modules can be any one of the following types:M4K1553PxS (Single Function - RT validated) This module operates as a Bus Controller, Remote Terminal or a Bus Monitor. This module qualifies for airborne applications.M4K1553Px (Multi Function) This module operates as a Bus Controller, up to 32 Remote Terminals and as a Bus Monitor. Supports an Internal Concurrent Monitor in RT and BC/RT modes.M4K1553Px(S)-1760 Same as M4K1553Px(S) plus MIL-STD-1760 options.M4KMMSI Mini Munitions Store Interface module. Supports RT, BC/Concurrent-RT/Concurrent Monitor and Bus Monitor modes. Up to 8 hub ports EBR-1553 [10 Mbps 1553 protocol using RS-485 transceivers] and 1 monitor output.M4KH009 Based on our H009 family. This module operates as a Central Computer Complex (CCC) and/or up to 16 Peripheral Units (PUs) simultaneously, or as a Bus Monitor. In addition, a Concurrent Bus Monitor enables concurrent monitoring of the bus during CCC and PU simulation.M4K429RTx Based on our ARINC 429RxTx board. This module supports either five or ten ARINC 429 channels each of which can be configured in real time as a receive or transmit channel.M4K708 This module supports two channels of ARINC 708/453, each one selectable as either transmit or receive.M4KSerial This module supports up to 4 independent channels of serial communications, each of which can be selected as RS485, RS422 or RS232.M4KDiscrete This module supports 20 selectable input/open collector output discretes. The module supports TTL (0 to 5 volts) or avionics (0 to 32 volts) voltage levels.M4KCAN This module supports up to 6 independent channels of CAN 2.0B protocol with standard and extended message frames and message identifiers.
-
Product
Precision Flying Probe Platforms For Automated Test Applications
-
Flying Probe technology is used to automate the testing of printed circuit boards (PCB) that would otherwise have to be tested manually. Adding a Huntron Access Prober to your test procedure will significantly decrease test times therefore increasing productivity.Access Probers can accurately place a probe on test points with high accuracy achieved using micro-stepping motors and linear laser encoders. Probing the smallest surface mounted devices is possible. Huntron Access Probers can automate your unique test process using the standard probe or by adding a custom probe of your design. Huntron offers three Flying Probe system configurations based on PCB size and test head requirements.
-
Product
Electrical Receiver Conformance Test Application for OIF-CEI 4.0
M809256CB
-
OIF-CEI 4.0 receiver test application for OIF-CEI 56G very short reach, medium reach, and long reach PAM4.
-
Product
Electrical Receiver Conformance Test Application for IEEE 802.3bs/ cd
M8091BSCA
-
IEEE 802.3bs receiver test application for 200GAUI-4 and 400GAUI-8, covering chip-to-module, chip-to-chip, backplane, and copper cable interconnects.
-
Product
Automated Test Equipment
test
These systems test semiconductor performance and quality with industry-leading precision and cost efficiency. Robust support for semiconductor design evaluation, volume production ramps, and yield improvement.
-
Product
Time Shift Test Java Applications w/in a WebLogic Managed Server
Time Machine Framework for WebLogic
-
The Time Machine Framework for WebLogic provides a great set of features enabling time shift testing scenarios for Java applications deployed to Oracle WebLogic. This Framework enables customers to use Time Machine functionality to time shift test Java applications within a WebLogic managed server without the need to create a separate instance of the application server for testing other time related activities. The Framework allows customers to configure and automatically create different virtual clocks on managed servers within the WebLogic domain as well as the granularity to establish virtual clock rules for specific applications deployed to the managed server.
-
Product
EFT Module for Teststand
test
The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.
-
Product
Wafer-Level Parametric Test
test
Wafer-level reliability engineers need to reduce test time without sacrificing measurement quality and accuracy.
-
Product
Test Workflow Standard
test
Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
-
Product
Mobile Application Testing
-
Mobile Application testing involves the testing of applications in mobile devices. The applications are tested for functionality, performance, usability, etc.
-
Product
Infotainment Test for Automotive Applications
test
Multimedia operating interfaces are complex control and display devices for functions such as entertainment, telephony, on-board computers and vehicle settings. The functional test of such complex control units and their networking within the vehicle architecture presents a particular challenge in every phase of the product design process.
-
Product
Prototyping & Test Consulting Services Solutions
test
Don’t cut corners on the path to quality. We are experts in Design for Test (DFT), Design for Manufacturing (DFM), agile development, prototyping and standards/best practices in many industries. Speak to our prototyping and consulting services experts to ensure you make the right decisions and investments at the start of your project.
-
Product
Explosive Test Site Range Instrumentation
test
Firesets, CDU’s EDU’s, Delay generators, firing panels, and custom instruments. Fiber-optic and computer-control options.
-
Product
Sealed Beam Bulb Testing System
H710019SSL
Test Platform
EOL test for manufacturing of bulbs with LED for applications requiring to ensure watertightness: vehicles, marine, swimming pools, operating rooms, classified areas (Ex Zone), etc. The test system checks in a short time all the light and electrical characteristics of the bulb. A high precision Micro Leakage Meter also checks that there are no leaks between the environment and the inside of the bulb. The test results are recorded on the PC and can be printed on a quality control label attached to each unit.
-
Product
Scienlab Combined Battery Test Solution
SL1133A
test
Solution for testing battery cells with an output power up to ±3 kW and a voltage range up to 6 V.
-
Product
Functional Test Fixtures
Test Fixture
Reliable connections to device under test (DUT) test points are essential for robust functional test. Bloomy provides rugged fixtures and cable sets (ITAs) built for thousands and thousands of cycles in manufacturing environments. With the industry’s best mass interconnects and internal electronic keying, our fixtures are easy to change out and are automatically recognized by the test system.
-
Product
Standardize Production Test Software For PCBAs And Electronic Devices
test
The vast majority of test project man-hours are spent on software development, so the choices that teams make in software tools and architecture have significant impact on deployment schedules. Standardizing software across a team or organization increases both efficiency and proficiency, lowering the risk of missed deadlines and improving test quality and reliability. Test software must:
-
Product
Universal Function Test System for Industrial Electronics
Test System
General functional test system based on LXI instrumentation for high mix / low to medium volume manufacturing. DUTs are tested which are mainly used as communication and measurement modules in power plant technology, grid management and electrical drives.The system has a Virginia Panel adapter interface to which various desk adapters can be docked, including automated contacting of the DUTs. A camera for the verification of light emitting diodes on the test object is integrated in the adapter interface.
-
Product
Automated Compliance and Device Characterization Tests
N5990A
Test Platform
The Keysight N5990A test automation software platform is the most powerful tool for serial and multi-lane gigabit testing. It is the unique universal platform for testing a wide range of digital buses such as PCI Express, USB, HDMI or MIPI. The same graphical user interface and operating principles are used for all applications. This boosts productivity, especially when testing devices which support multiple digital buses. The N5990A can be tailored to your individual test needs with the flexible test sequenzer and controls all instruments needed for your tests. The configurable database interface of the N5990A test automation platform enables the convenient storage of all test results. A web interface allows an effective and easy operation. Custom calibration and test procedures can be implemented easily with User Programming.
-
Product
Safety Compliance Test System
EN 60601
Test System
Test system for electrical safety compliance testing of medical products in accordance with EN 60601-1, 3rd edition.The system is equipped with three test fixtures which are connected in parallel order to reduce the number of setup tasks for different variants in the course of day-to-day manufacturing processes. Its purpose is to test medical products, e. g. patient monitors, which are employed at hospitals to monitor heartbeat and oxygen saturation.Based on the integrated electrical safety tester by Associated Research, in combination with an AC power source and a switching matrix, it is possible to fully automate tests like for instance AC/DC high-voltage tests, insulation resistance measurements, earth connection tests and leakage current measurements.The required occupational safety is provided by a high-voltage safety hood in accordance with EN 501191. The entire safety technology, as well as the control PC, is mounted in an aluminum-profile cart.
-
Product
SMD Array Type LCR Test Fixture
16034H
Test Fixture
The 16034H is designed for impedance evaluations of array-type SMD.The minimum SMD size that this fixture is adapted to evaluate is 1.6(L)x0.8(W)[mm]. Since the tip of the measurement electrodes are very thin and the device holder is extremely flat, the device can be shifted and the measurement electrodes can contact each of the elements of the array-type component.
-
Product
RF-Antenna Communication Links Functional Test
Functional Test
The application encompasses functional tests of very large quantities of automotive antenna amplifiers, plus parallelization of tests by implementing several test stations in a rotary indexing table. The DUTs are inserted manually and after final assembly, they are loaded into the rotary table; this requires manual triggering by the operator.
-
Product
JTAG Functional Test
JFT
Functional Test
JFT comprises a series of software modules that support boundary-scan test and programming activities under Python, National Instruments LabVIEW and Microsoft .NET framework. Using JFT users can create JTAG/boundary-scan test application scripts, VIs or programs for PCB assemblies and systems that control individual driver/sensor pins, groups of pins declared as variables or register bits. These applications are typically used to test logic devices or mixed signal clusters and can also be transformed into re-usable test 'modules'. Pairing JFT with JTAG CoreCommander emulative test modules gives an effective, low-cost system for performing tests through embedded device peripherals (ADCs, Memory Controllers etc..)
-
Product
Advanced SoC/Analog Test System
3650
Test System
Chroma 3650 is an SoC tester with high throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses.
