Test Applications
See Also: Test Apps, Test Management Applications, Crowdsourced
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Product
Flexible Test Connectors
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Pin and socket sizes 22, 20, 16, 12 and 8 conform to MIL Spec dimensions. Whenever connector reliability is important, you’ll find NASA-approved FLEXCON test connectors. Applications include electronic, electrical and communications systems, computers, space vehicles, missiles, aircraft and other military equipment.
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Product
Real-time Spectrum Analyzers
SSA3000X-R
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The SIGLENT SSA3000X-R real-time spectrum analyzers are powerful and flexible tools for complex RF signal monitor and analysis. With a capability of 40 MHz analysis bandwidth and 7.2 µs 100% POI, the analyzer can provide multi-dimensions data displays, advanced triggering, and RF data capturing, to solve modern RF spectrum challenges, like hopping frequency, conflict channel, spectrum interference, etc. They also provide standard tracking generator for network analysis, optional wideband digital modulation analysis, and EMI pre-compliance test. Applications include broadcast monitoring/evaluation, cellular site, IoT, WiFi, Bluetooth surveying, research and development, education, production, and maintenance.
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Product
Force Gauge
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Shenzhen Graigar Technology Co.,Ltd.
A force gauge is a small measuring instrument used across all industries to measure the force during a push or pull test. Applications exist in research and development, laboratory, quality, production and field environment.
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Product
Probe Needles for Wafer Sort and Test Applications
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Advanced Probing Systems, Inc.
APS is the global leader in the manufacture of probe needles used in cantilevered probe cards. All probe needles used in wafer sort are manufactured according to customer specifications using stringent in-process quality assurance procedures.
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Product
Supernova
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SuperNova Test Application Framework is an innovative, fully integrated test environment that addresses world-class test deployment challenges by simplifying access to high-end test capabilities, reducing time spent on analysis and customizations, and quickly meeting the most different test deployment use cases.
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Product
Portable RF Signal Generator
ACE 5400
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The ACE 5400 portable RF signal generator has four carriers that can be activated individually or in any combination. Each frequency and amplitude is adjustable by the user. The ACE 5400's basic and straight forward performance is perfect for applications that require a precise, stable RF stimulus. Applications: Testing and aligning CATV return bands; Great for institutional networks.
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Product
Cobra Temperature Forcing System for ATE/SLT Test Applications
31000R
System
Cobra is the most advanced, compact,powerful temperature-forcing system on the market. Cobra is an adaptable solution to the ever-increasing thermal demands of post silicon validation and device characterization.
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Product
Test Applications
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We have a long and enviable reputation for supplying quality test applications to a wide range of industries covering many different technologies. Not only do we understand your test requirements, but we also try to make the software simple to use and support.
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Product
Multiprotocol P104Plus Interface Board for Embedded Applications or Avionics Test & Simulation Applications
EXC-4000P104plus
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The EXC-4000P104plus is a multiprotocol P104plus interface board for embedded applications or avionics test and simulation applications. Each board holds up to five independent modules. Two on-board modules use the MIL-STD-1553 communications protocol (M4K1553Px); another on-board module uses the ARINC-429 communications protocol; two additional detachable modules can be any one of the following types:M4K1553PxS (Single Function - RT validated) This module operates as a Bus Controller, Remote Terminal or a Bus Monitor. This module qualifies for airborne applications.M4K1553Px (Multi Function) This module operates as a Bus Controller, up to 32 Remote Terminals and as a Bus Monitor. Supports an Internal Concurrent Monitor in RT and BC/RT modes.M4K1553Px(S)-1760 Same as M4K1553Px(S) plus MIL-STD-1760 options.M4KMMSI Mini Munitions Store Interface module. Supports RT, BC/Concurrent-RT/Concurrent Monitor and Bus Monitor modes. Up to 8 hub ports EBR-1553 [10 Mbps 1553 protocol using RS-485 transceivers] and 1 monitor output.M4KH009 Based on our H009 family. This module operates as a Central Computer Complex (CCC) and/or up to 16 Peripheral Units (PUs) simultaneously, or as a Bus Monitor. In addition, a Concurrent Bus Monitor enables concurrent monitoring of the bus during CCC and PU simulation.M4K429RTx Based on our ARINC 429RxTx board. This module supports either five or ten ARINC 429 channels each of which can be configured in real time as a receive or transmit channel.M4K708 This module supports two channels of ARINC 708/453, each one selectable as either transmit or receive.M4KSerial This module supports up to 4 independent channels of serial communications, each of which can be selected as RS485, RS422 or RS232.M4KDiscrete This module supports 20 selectable input/open collector output discretes. The module supports TTL (0 to 5 volts) or avionics (0 to 32 volts) voltage levels.M4KCAN This module supports up to 6 independent channels of CAN 2.0B protocol with standard and extended message frames and message identifiers.
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Product
PCI Express PLL Test Application
N1081PLCA
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Keysight N1081PLCA PCI Express PLL Test Application designed to measure transmitter PLL bandwidth and peaking based on the PCI Express 5.0 TX PLL Specifications. Use N1081PLCA PCIe PLL test software to test, debug and characterize your PCIe designs.
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Product
Time Shift Test Java Applications w/in a WebLogic Managed Server
Time Machine Framework for WebLogic
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The Time Machine Framework for WebLogic provides a great set of features enabling time shift testing scenarios for Java applications deployed to Oracle WebLogic. This Framework enables customers to use Time Machine functionality to time shift test Java applications within a WebLogic managed server without the need to create a separate instance of the application server for testing other time related activities. The Framework allows customers to configure and automatically create different virtual clocks on managed servers within the WebLogic domain as well as the granularity to establish virtual clock rules for specific applications deployed to the managed server.
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Product
Mini OTDR
FiberPal OT-8700
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FiberPal OT-8700 series instruments, with power meter built-in, are new miniature, high performance optical time domain reflectometer which is designed as fiber troubleshooter for locating fiber connector, break and imperfections for access networks. It detects event locations along the optical fiber and displays the results on a 7” color LCD display. FiberPal OT-8700 series are light, reliable and easy to use, hence it is ideal for FTTX testing. The Application Software equipped is used for data analysis, processing and storage. With the USB Interface port, enabling FiberPal OT-8700 series to transfer test data to computer easily.
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Product
10G Ethernet/IP Network Infrastructure Testing Application
GENEM-X
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GENEM-X is a high-capacity network infrastructure testing software application for network equipment manufacturers, data centers, service provider telco cloud and 5G backhaul. It runs on Siama’s carrier-class PROVA-X hardware appliance. GENEM-X allows you to verify, monitor and troubleshoot Ethernet/IP network equipment and data center applications to ensure network services can accommodate the demands of your customers. Ideal for QA test, Service Providers migrating to a DevOps model can use GENEM to validate service turn-up and modifications in the production network. GENEM is equally at home in a lab environment. It bundles wire-rate traffic generation and analysis capabilities with a network emulator and packet capture/replay function in a single software license.
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Product
Electrical Testing
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Accolade Engineering Solutions
Accolade Engineering Solutions offers a variety of Electrical Testing Applications services. Contact us today to discuss your testing needs with someone who can provide you with the expert knowledge to determine the right testing solution for you.
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Product
Receiver Conformance Test Application for OIF-CEI 3.1
M809228CA
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M809228CA Perpetual, node-locked license (includes 12 months of support).
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Product
Prototyping & Test Consulting Services Solutions
test
Don’t cut corners on the path to quality. We are experts in Design for Test (DFT), Design for Manufacturing (DFM), agile development, prototyping and standards/best practices in many industries. Speak to our prototyping and consulting services experts to ensure you make the right decisions and investments at the start of your project.
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Product
Wafer-Level Parametric Test
test
Wafer-level reliability engineers need to reduce test time without sacrificing measurement quality and accuracy.
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Product
Generator/Analyzer for NFC/EMVCo Manufacturing Test
Micropross MP500 PT1-NFC
test
Support for ISO 14443 A/B, ISO 15693, MIFARE™, FeliCa™. Measurement correlation with NFC Forum and EMVCo certification test bench. Automated test executive with ready-to-run test sequences. Reader/Writer and Card Emulation modes, resonance frequency measurements supported on same antenna. Embedded analog measurements - LMA, field strength, S11, Q factor, waveform characteristics. Physical parameter/waveshape characteristic definition
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Product
Application Software for Electronic Test & Instrumentation
test
Application software provides configuration-based workflows for electronic test and instrumentation applications. Application software is part of the NI software portfolio.
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Product
NI Real-Time Test Cell Reference System
780590-35
test
VeriStand Full Development License with NI Standard Service , Include 1 Year SSP
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Product
Automated Aerospace and Defense Test
test
Obsolescence management, evolving RF requirements, and design for test (DFT) challenges every test organization in the aerospace and defense industry. Organizations are transitioning from rack-and-stack box instruments and closed-architecture automated test equipment (ATE) systems to smarter test systems built on a modular platform that scales to meet current and future needs.
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Product
Automated Test Equipment
test
These systems test semiconductor performance and quality with industry-leading precision and cost efficiency. Robust support for semiconductor design evaluation, volume production ramps, and yield improvement.
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Product
IOL & Power Cycling Test Systems
Test System
Our IOL & power cycling systems increase measurement quality and throughput and reduce testing costs on an open platform. The focus is on seamless monitoring and precise determination of all parameters of each DUT. In addition, the systems are equipped for the special requirements of wide-bandgap technology.
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Product
Isolated Digital I/O 60VDC, 150mA
OTP2 module no.186
Test Platform
The National Instruments PXI-6528, PCI-6528, and PXI-6529 Digital I/O Modules are isolated digital I/O interfaces for PCI and PXI. These modules can use inputs from NI 6528 and PXI 6529 devices to capture the status of sensors, actuators, and logic devices. NI 6528 devices have 24 SSR outputs for switching external devices with input currents up to 150 mA. The NI 6528 and PXI-6529 devices are suitable for a variety of applications, from automotive development and industrial factory automation to aerospace, laboratory research, and biomedical applications due to their high current handling capacity and isolation.
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Product
ARINC 818 Tester
Test Platform
iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces
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Product
Image Sensor Test System
IP750
Test System
Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
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Product
PCIe 2.0 Test Platform
PXP-100B
Test Platform
The Teledyne LeCroy PXP-100B Test Platform provides a convenient means for testing PCIe 2.0 add-in cards with a self-contained portable and powered passive backplane. The PXP-100B provides power required for both cards under test, and an interposer can be used for connection to a protocol analyzer. As an alternative to an interposer, the PXP-100B includes two mid-bus probe footprints to allow connection to an analyzer via a mid-bus probe.
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Product
2-Quadrant Source/Measure Unit for Functional Test, 20 V, 1 A or 6 V, 3 A, 20 W
N6782A
Functional Test
The Keysight N6782A is a source/measure unit (SMU) designed specifically for advanced functional testing of a device. The ability to modulate the output up to 100 kHz along with capability to source and sink current (2-quadrant operation) makes the N6782A a perfect fit for advanced functional test of a variety of devices such as DC/DC converters, power management units, power amplifiers, and power management ICs. The input stage of the DUT can be stimulated by the fast sourcing and waveform capabilities. While the output stage can be loaded down and measured with the electronic load capabilities, providing a total test solution.
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Product
SSD Test Systems
Test System
Enables Rapid SSD Development and Production Ramp with Flexible Test Solution In the high-growth and highly competitive SSD market, a test system that supports multiple protocols can eliminate the need for retooling and achieve faster transitions from one product version — or one product generation — to the next. Advantest SSD Test System allows manufacturers to rapidly grow their product portfolios while remaining adaptable to the many changing needs of the evolving SSD market. This tester improves users’ engineering efficiency with powerful, easy-to-use software tools and a revolutionary multi-protocol hardware architecture, enabling accelerated SSD product development and a faster time-to-manufacturing ramp.
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Product
Image Sensor Testing
IP750Ex-HD Family
Test System
The IP750EX-HD has been the test platform that has enabled the industry to manufacture high quality CCD and CMOS image sensors, and it is the most economical platform to meet the needs of newer technologies such as Time of Flight (ToF) sensors. When you use a smartphone, high performance digital still camera, or in-home security and surveillance system, these applications have image sensors most likely tested by Teradyne’s IP750ExHD.
