Protection Relay Test
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Product
Wafer-Level Parametric Test
test
Wafer-level reliability engineers need to reduce test time without sacrificing measurement quality and accuracy.
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Product
Ultra High Density 4mm Reed Relays
120-1-A-12/1
Reed Relay
Single Pole Reed Relays0.5 Amp switchingVery high packing densityStacking on 4mm x 4mm pitch1 Form A12 V Coil
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Product
LXI Reed Relay Matrix - Dual 64x8 Plugin, Direct Y Access, 6 Analog Buses
65-223-001
Reed Relay
The range includes four plug-in models covering matrices of up to 1,536x4 in increments of 128 (model 65-221), 768x8 in increments of 64 (model 65-223), 384x16 in increments of 32 (model 65-225), and 192x32 in increments of 32 (model 65-227). Users can specify as many or as few plug-in modules (up to six) required and can field upgrade the chassis to extend the matrix when necessary. Another important feature is that over 1,500 relays can be closed simultaneously for specific conditions for parametric testing.
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Product
PXI/PXIe RF Switch, Hex SPDT, 3GHz, 75Ω, MCX
40-830A-106
Relay
The 40-830A-106 (PXI) and 42-830A-106 (PXIe) are 75Ω RF switches with 6 separate SPDT relays slot. They have been designed to exhibit low insertion loss and VSWR through the use of modern RF relay technology at an affordable cost. The switch banks have been carefully designed to ensure excellent and repeatable RF characteristics to frequencies of 3GHz with each path having a nominally equal insertion loss.
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Product
Test Port Adapter Set, 3.5 Mm To 3.5 Mm
85130D
Test Port Adapter
The Keysight 85130D test port adapter protects the test set port from being directly connected to the device under test. These adapters have a special rugged female connector that connects to the network analyzer test port. This special connector does not mate with a standard male connector but converts the rugged test set port to a connection that will mate with the device under test. This set contains a 3.5 mm to PSC-3.5 mm male adapter and a 3.5 mm to PSC-3.5 mm female adapter. The frequency range for these adapters is dc to 26.5 GHz with a return loss of 28 dB or better.
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Product
PXI/PXIe Microwave Relay, Dual SPDT, 110 GHz, 50 Ω, SMA-1.0, External Termination, Latching
42-781A-922-LA
Relay
Externally terminated switches have the advantage that the terminations can be removed and replaced with higher power RF loads. This also allows alternative configurations such as terminated 4-port bypass (1 termination removed) and 5-port DP3T (both terminations removed). See the datasheet for diagrams of these configurations.
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Product
32-Ch SPDT 2A-240VAC 24VDC Switching
YAV90133
Relay
32 relays, 5A Switching 5A 250Vac. Up to 1250VA 28 Relays SPST Mux. 1 a 4 relays CAN Control (or Ethernet with Ethernet to CAN Gateway) Drivers dll & VIs available
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Product
Functional Test Trainer System
QT65
Functional Test
Qmax Test Technologies Pvt. Ltd.
Functional Test Trainer system, is a test system which can perform various Power- On functional tests of digital devices(ssl/MSI/LSIs and analog devices in the out- circuit and in-E conditions. Unified Library of vast number of devices to effectively test devices in in-circuit as well as out of circuit conditions.
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Product
High Temperature Component Test Fixture
16194A
Test Fixture
Measure both axial/radial leaded devices and SMD within the temperature range from -55 to +200°C.
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Product
32 Mechanical SPDT Reed Relay
CPCI-Relay32
Reed Relay
32 reed relays• Fast switching• Single pole DoubleThrow• Read back register• Normally Open• Independent relaydrivers• Software libraries anddrivers for WinNTand Linux
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Product
PXI/PXIe High Density Reed Relay Module, 75xSPST
40-140B-121
Reed Relay
The 40-140B-121 (PXI) and 42-140B-121 (PXIe) are 75xSPST general purpose switching modules. They are part of a range of high density relay modules using ruthenium reeds available in 50x, 75x and 100x Normally Open SPST configurations. Connections are made via a front panel 200-pin female connector.
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Product
Test Handler
M4872
Test Handler
Improve Efficiency in High-Volume Manufacturing and Device Characterization.
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Product
Massively Parallel Parametric Test System
P9001A
In-Circuit Test System
The highest throughput parallel parametric test solution. 100-pin parallel measurement capability and faster single parameter measurement than Keysight 4080. Good data correlation with Keysight 4080. New per-pin parametric test unit module with all basic measurement function (voltage, current, capacitance, pulse, frequency). Easy development of parallel test plan. Easy migration from 4080 environment. Proven in 1st-tier logic foundries and memory companies.
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Product
Semi-Rigid Cable Set, 3.5 Mm (Test Port) To 3.5 Mm
85131D
Test Port Cable
The Keysight 85131D is an 53 cm (21 in) long1 semi-rigid cable set composed of a 3.5 mm female2 to PSC-3.5 mm female connector and a 3.5 mm female2 to 3.5 mm male connector. Cable frequency range is dc to 26.5 GHz with a return loss of 16 dB or better. Insertion loss is 0.3 * sqrt(f) + 0.2 dB, where f is frequency in GHz, for the test port connector and 1.8 dB at maximum frequency for the device connector. Phase stability of semi-rigid/flexible cables is specified with a 90 degree bend using a 4 to 3 inch radius. Stability1 of the Keysight 85131D is less than 0.06 dB and phase is 0.16 * f + 0.5, where f is frequency in GHz.
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Product
6TL08 Benchtop Test Platform
H710008
Test Platform
The 6TL-08 base platform was designed to cover the most common testing and in-system programming (ISP) needs with a reduced initial budget. The system includes a robust manual linear push mechanism allowing a low-cost fixture strategy thanks to the exchangeable cassettesThe platform enclosure features an 8-Slot fixture receiver, compatible with VPC 90 Series Mass Interconnect Module, as well as 6TL intelligent YAVModules (YAV90MMU &YAV90059), with room for fast ISP devices, optional PXI chassis and various power supplies. A removable back panel allows easy placement of custom connectors or test auxiliary circuitry.
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Product
Test Lead, BNC Connector To BNC Connector Board
16048A
Test Port Cable
Extend the measurement port with a four-terminal-pair configuration that enables the attachment of user-fabricated test fixtures.
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Product
SIMRC - 16 x Uncommitted Reed Relay, SPST
1010-R-16-1-5/1D
Reed Relay
Our small format embedded switching (SIM relay) cards offer a choice of switching configurations using low cost industry standard SIM connectors. They free the designer from the detail of routing complex switching circuits, you may select from a wide range of cards using the built in RS-232 and I2C interfaces. These low-cost embedded switching cards are intended to be mounted on to a simple motherboard. They may be used to construct very high density switching networks. SIM based switching cards also allow for very simple in-field maintenance.
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Product
In-Circuit Test System Calibrations
Test System
Regular calibration is essential to ensure accuracy and reliability in testing. Forwessun offers precise calibration services tailored to your test systems, verifying that all components meet industry standards. Our calibration services maintain peak accuracy and compliance, so you can be confident in your system’s performance for any testing application. Choose from one-off calibrations or scheduled service contracts to meet your needs.- HP3070 - Agilent- Keysight - GenRad- Teradyne
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Product
8-CH Relay Outputs & 8-CH Isolated DI PCI Cards
PCI-7250/7251
Relay
ADLINK's PCI-7250/7251 provide 4-CH SPDT (Form C) & 4-CH SPST (Form A) relay outputs and 8-CH isolated digital inputs. The status of each relay output is represented by an onboard LED. When the relay is in SET condition, its corresponding LED will turn ON, and on the contrary, it is OFF. All digital input channels are nonpolarity, optically isolated, and may be set to use RC filter or not. The devices are suitable for collecting digital inputs in noisy environments. The PCI-7251 is an 8-CH relay outputs and 8-CH isolated DI extension card of the PCI-7250. All the I/O functions of PCI-7251 are the same as those of the PCI-7250. The PCI-7251 has to be connected with PCI-7250 and the bus interface is controlled by the PCI-7250. Up to three PCI-7251 cards can be connected to one PCI-7250, therefore, expanding the PCI-7250's DIO from 8 DIO to maximum 32 DIO.
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Product
Memory Test System
T5230
Test System
T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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Product
PXI 1A Fault Insertion Switch 22-Channel
40-195-001
Relay
The 40-195 is a 22 Channel Fault Insertion Switch, primarily designed for the simulation of fault conditions in automotive & avionics applications involving the reliability testing of safety critical controllers. It is designed to be able to insert different fault conditions on pairs of signals between the test fixture and the equipment under test: Open-Circuit, Short-Circuit between signal pairs, Short-Circuit between signal pairs and user applied fault conditions e.g. Power or GND. Relays in-line with the signal paths allow open circuit conditions to be simulated on either side or both sides of a signal pair. Relays between each channel pair enable adjacent signals to be shorted, and relays between signal paths and the "Fault" connection allow the application of external user applied fault conditions.
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Product
Scienlab Battery Test System - Cell Level
SL1007A
Test System
The SL1007A Scienlab Battery Test System – Cell Level enables you to accurately and productively test battery cells for automotive and industrial applications. The bidirectional power supply charges and discharges your cells under test with very high efficiency.
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Product
NFC Conformance Test System
T3111S
Test System
The T3111S RIDER NFC Conformance Test System is the Keysight solution for RF Analog and Digital Protocol testing of NFC, EMV and ISO devices. The Test System is based on the Keysight T1141A NFC Test Set and it is complemented by the Keysight's or FIME's robots for accurate and repeatability RF testing. Selected 3rd party positioning robots can also be supported.
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Product
Test System
UltraFLEX
Test System
The UltraFLEX test system delivers the power and precision you need for complex SoC devices built for mobile applications, networking, storage or high-end processing. Choose UltraFLEX when your device mix and throughput goals demand the highest speed, precision, coverage and site count.
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Product
PXI General Purpose 2A Relay Module 16xSPDT, 78 D-sub
40-131-101
Relay
Low cost, general purpose electromechanical relay cards suitable for use where reed relay based switching cards do not have sufficient voltage or current carrying capability. Applications include switching of medium power AC and DC loads or slave switching larger relays, contactors or solenoids. Connections are made to the card via a front panel mounted 50 or 78 pin D-Type connector plug.
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Product
Combination Board Functional Test System
QT 4256 ATE
Functional Test
Qmax Test Technologies Pvt. Ltd.
QT 4256 ATE is a combination Board Functional Test System , a main frame Automated Test Equipment (ATE) which can be configured up to maximum of 1280 Bi-directional digital channels ideal for testing circuit card assemblies of high level of complexity and whether it is a legacy or new generation PCB.
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Product
NI-9482, 4-Channel, SPST Relay, 60 VDC (1 A)/250 VAC (1.5 A) C Series Relay Output Module
782999-01
Relay Output Module
The NI‑9482 directly connects to a wide array of industrial devices such as motors, actuators, and DC devices. Each channel provides access to an electromechanical relay for switching signals up to 60 VDC (1 A) or 250 Vrms (1.5 A), features channel‑to‑channel isolation, and has a LED that indicates the status. The shock and vibration rating for the NI‑9482 is limited compared with other CompactDAQ and CompactRIO modules because of the mechanical relays on the module.
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Product
Test Systems
Test System
Ball Systems delivers best-in-class automated testing systems, software programming, integrated manufacturing systems, and industrial engineered solutions. Our team has former corporate test engineers, quality assurance engineers, industrial engineers, and test managers who have decades of experience to assist customers in meeting their automated test challenges by offering:
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Product
PXI/PXIe Microwave Relay, Single SPDT, 18GHz, 50Ω, SMA, External Termination
40-781A-121
Relay
The 40-781A-121 (PXI) and 42-781A-121 (PXIe) are single SPDT 18GHz microwave relay modules with external terminations. The 40/42-781A range is available with one or two SPDT switches capable of switching frequencies up to 50GHz in 50Ω. They are available with either internal or external terminations and connections are via front panel mounted high quality SMA, SMA 2.9 or SMA 2.4 connectors.
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Product
Component Test Systems
Test System
These products include test peripherals used with test systems, such as interfaces that connect semiconductor devices with test systems, and handlers that transport semiconductors to the test system. System-level test equipment and software are also included in this category.
