Stimulus
-
Product
True-Mode Stimulus
S95460B
-
S95460B provides mismatch-corrected true-mode stimulus and enables accurate balanced measurements on M980xA PXI vector network analyzers.
-
Product
True-Mode Stimulus
S96460B
-
S96460B provides mismatch-corrected true-mode stimulus and enables accurate balanced measurements on 4-port E5080B vector network analyzers.
-
Product
Stimulus Test Cell
HA7200
-
The HA7200 enables these improvements by providing high-speed, high-accuracy temperature and pressure test for automotive sensor R&D and production. Advantest’s proprietary temperature control technology delivers an optimized test solution for high-spec pressure sensors across a broad range of temperatures, in the automotive industry and beyond.
-
Product
Stimulus Induced Fault Testing
SIFT
-
SIFT allows for the analysis of numerous stimuli to identify speed, fault, and parametric differences in silicon. The heart of the SIFT technique revolves around intentionally disturbing devices with external stimuli and comparing the test criteria to reference parts or timing/voltage sensitivities. Synchronous interfacing is possible to any tester without any wiring or program changes. The system can be based on either a motorized probe station or portable microscope stand for test head applications.
-
Product
True-Mode Stimulus
S93460B
-
The S93460B provides mismatch-corrected true-mode stimulus and enables accurate balanced measurements on 4-port PNA or PNA-X network analyzers.
-
Product
DC Bias and RF Stimulus Control Module
Quantum SMART Fixture
-
Accel-RF Corporation, the world leader in turnkey RF automated reliability test instruments, has "unplugged" the industry-leading RF SMART Fixture from their automated test platform and made it available for benchtop test. The NEW Quantum SMART Fixture is a programmable self-contained DC bias and RF stimulus control module capable of synchronizing sequenced independent pulsed-bias and pulsed-RF signals to a DUT or remote fixture. The signals are controlled from a user interface compatible with Accel-RF's LIFETEST software. The Quantum SMART fixture is capable of "active" temperature control and monitoring of a remote DUT through embedded firmware in the microprocessor
-
Product
USB Controlled Multi-Function DAQ For ATE Education And ATEasy Training
GT98901 Series
-
The GT98901 Demo board is a USB controlled, cost-effective, multi-function PCB assembly. The module is completely self-contained and includes an LCD display, measurement and stimulus resources, digital I/O, relays, and switches – all of which can be accessed and monitored via the USB port using a SCPI command set via a USBTMC interface which supports the USB488 protocol. Power for the board is provided via the USB interface, providing a totally self-contained assembly which can provide users with a simple yet complete vehicle that replicates many of the stimulus and measurement functions associated with ATE systems. When combined with Marvin Test Solutions' ATEasy® Test Executive and Test Development environment, the GT98901 is the ideal product for creating and supporting ATE training and education applications.
-
Product
CXA Signal Analyzer, Multi-touch, 9 kHz to 26.5 GHz
N9000B
Signal Analyzer
Master the essentials in signal characterization with the leading low-cost tool in signal analysis Perform cost-effective stimulus response measurements with the optional built-in tracking generator Add crucial functionality with X-Series measurement applications Enhance theory with practical skills when used with a training kit in your RF & microwave education lab
-
Product
MEMS Handler
4664-IH
-
The ULTRA P is a high performance production handler that provides thermal conditioning, full 6 DOF mechanical stimulus and an electrical ATE signal path for testing Micro-Electro-Mechanical Systems (MEMS) Accelerometers and Gyroscopes.
-
Product
Modulation Distortion Up To 53 GHz
S95070B
-
S95070B software enables fast and accurate active device modulation distortion characterization under modulated stimulus conditions up to 53 GHz. The wide dynamic range and vector error correction of the PXI VNA results in an extremely low residual EVM from the test setup, giving you a complete picture of your device’s performance without test system interference. S95070B software measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals through spectral correlation between the input and output spectrum, without doing demodulation. Integration with the PXI VNA’s measurement flexibility enables you to do quick modulation distortion measurements along with traditional VNA tests.
-
Product
Motion Simulator For Test Systems
Metis
-
METIS is a motion simulator for sensor and end system level testing. Configurable design allows you to create system you need! - 1-axis rate table for gyro testing - 2-axis unit for 6DOF accelerometer and gyroscope testing - 3-axis Gimbal system for simultaneus Yaw, Pitch and Roll stimulus.
-
Product
HV AC Hipot
-
The HV AC Hipot package is a hardware and software upgrade available for select Eclypse Analyzers. This package adds a High Voltage AC stimulus source CCA to the analyzer chassis and the HV AC Stimulus utility provides the software drives for ELITE to integrate AC Hipot into test programs.
-
Product
VXI Precision PLL Waveform Synthesizer
3152B
-
The Racal Instruments™ 3152B Waveform Synthesizer combines 250 MS/s waveform generation performance, versatility, and compact size into a single-slot VXIbus format.The 3152B is a greatly improved version of a fi eld-proven instrument ideal for VXI test stimulus generation. It replaces the 3152A which is standard on many military and commercial test platforms
-
Product
MEMS Optical Sensor Test
-
For optical sensor test Cohu offers a variety of solutions being driven by requirements for tri-temp, parallelism and stimulus spacing. Customized optical stimulus units are integrated into Cohu’s test handling systems. For light detector test, we implement different types of light sources, such as infrared, ambient- and colored light. We offer different solutions for 3D image sensors combining emitter and receiver tests of LiDAR, Time of Flight and Structured Light devices.
-
Product
Synchro To Digital & Digital To Synchro Converter
DP-cPCI-5031
-
DP-cPCI-5031 is a Resolver to Digital and Digital to Resolver converter module. This module has four S/R to Digital converters(measurement channels) and two Digital to S/R converter(stimulus channels). This module is programmable for simultaneous acquisition and generation of the Resolver signal.
-
Product
VXI Video Processor System
65VP1
Processing Module
NAI’s 65VP1 is a Video Processor System (VPS) on a VXI board. Capable of highly accurate video stimulus and measurements, this state-of-the-art instrument is the culmination of over three generations of Automatic Test Equipment (ATE) development programs. It provides increased functional density, and it reduces power consumption, size, and cost of the overall system. The 65VP1 is ideally suited for defense and commercial ATE programs, including television applications.
-
Product
CXA-m PXIe Signal Analyzer
M9290A
Signal Analyzer
Deploy a smaller microwave footprint, no trade-off in precision: Rely on fully specified performance up to 26.5 GHz in 4 slots Optimize your balance between speed, sensitivity and accuracy with the choice to operate in swept or FFT modes Perform fast calibrated stimulus response measurement with full-band tracking generator Smooth the transition between R&D, manufacturing, and maintenance: CXA-m is code compatible with benchtop X-Series signal analyzers and ESA spectrum analyzers
-
Product
PCI D/S, S/D, I/O & Comm Board
76CS3
Multifunction I/O
NAI’s 76CS3 is a PCI/PCIe multifunction I/O and communication board designed for applications requiring Digital-to-Synchro/Resolver (D/S) and Digital-to-LVDT/RVDT (DLV) stimulus output, as well as I/O and communication functions. This full-slot board contains five independent, function module slots. The board can be configured for 6 separate D/S channels, or for D/S in combination with I/O and communication modules. Using multiple DSPs, the enhanced motherboard enables higher processing power and dedicated pre-processing control for each module.
-
Product
DC Automated Accelerated Reliability Test Station (AARTS)
DC-HTOL
-
The DC Automated Accelerated Reliability Test Station (AARTS) systems are designed to maximize channel density. The first systems developed by Accel-RF (ARF) were intended for RF and DC stimulus to the Device Under Test (DUT). However, there are some applications in which RF stimulus is not required.
-
Product
Portable Functional Near-Infrared Spectroscopy System For Research
LIGHTNIRS
-
Shimadzu Portable functional Near-Infrared Spectroscopy (fNIRS) System for Research* Near infrared light, which readily diffuses easily through biological tissue, can be used to measure localized blood oxygenation levels of the brain to monitor where activity occurs in response to a task of stimulus. The portability of LIGHTNIRS allows visualizing brain function activity in real time in a more natural state than other methods. Consequently, it is being used in a wide range of applications including medical research, developmental psychology, education, cognitive science and engineering.
-
Product
Advanced Circuit Card Automated Test
ACCAT
-
The ACCAT is designed to support diagnostic and acceptance test requirements across a wide spectrum of testing parameters. ACCAT provides a suite of core parametric test instruments, advanced GUI based software, Huntron Access Robotic probing and Huntron Analog Signature Analysis (ASA). ACCAT provides stimulus and asurement capabilities necessary for full functional and parametric testing of circuit card assemblies along with robotic guided probes for fault verification and debug. The Huntron ASA test is ideal for pretest or safe to power up procedures protecting the integrity of the test system.
-
Product
JTAG Boundary-Scan I/O Modules
SCANIO Family
-
The Corelis family of SCANIO™ modules turn any IEEE standard 1149.1 boundary-scan controller into a powerful digital boundary-scan tester. The SCANIO family of products use boundary-scan gate arrays to add control and visibility to connectors, traces, and logic that can not be tested using traditional boundary-scan techniques.The SCANIO products, when combined with a boundary-scan controller, operate as a traditional “bed-of-nails” tester except access to the stimulus and response I/O’s is achieved via boundary-scan.
-
Product
Detector Test Bench
RTB 3000
-
The RTB 3000 Detector Test Bench from Santa Barbara Infrared (SBIR) is a flexible integrated IR detector test station for evaluation of single element detectors, linear arrays, and focal plane arrays. The RTB 3000 provides the radiometric stimulus necessary to perform accurate IR detector testing in both laboratory and production environments.
-
Product
200 MS/s Waveform Generator & Dual 50 MHz Pulse/ Timing Generator
3172
Pulse Generator
The Racal Instruments™ 3172, a 200 MS/s Waveform Generator and Dual 50 MHz Pulse and Timing Generator, combines multi-instrument density and highfrequency performance in a single-slot, C-sized VXIbus format.Waveform output in the range of 100 μHz to 30 MHz with 16-bit vertical resolution (12-bit vertical for 3171 emulation) and pulse output to 50 MHz make the 3172 a powerful solution to a variety of test stimulus requirements.
-
Product
Audio Test Software
-
1. Distortion free stimulus even the equalized stimulus.2. Unlimited channels acquisition and processing. (Hardware limited)3. Human correlated listening test(Bark Scale intensity chart). (Requires large memory)4. Hi Res intensity chart for buzz/pop detection. (Requires large memory)5. Auto equalization method with target dBSPL accuracy.6. TCP client for test framework integration.7. Easy limits and logs development.8. Easy logs visualization module.9. Auto waveform alignment and triggering.(Upto single point alignment accuracy)10. Easy regression testing via TCP client.11. Standard Magnitude, Phase, THD, THD+N, Rubb&Buzz, Pink Noise, Noise Tests.12. Unlimited calibrations and equalization for scaling to different products and stations.13. Lowest test system and test sequence development times.14. Requires minimal training and debugging.15. Automatically avoid Reference speaker play and stop pops.16. WMD/ASIO driver compatible sound cards supported.(B&K 3670 recommended)
-
Product
Resolver to Digital and Digital to Resolver Converter
DP-VME-5031
-
DP-VME-5031 is a Resolver to Digital and Digital to Resolver Converter module. This module has four resolver to digital converters as measurement channels and six digital to resolver converters as stimulus channels.
-
Product
Modulation Distortion Up To 8.5 GHz
S930700B
-
S930700B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 8.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930700B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
-
Product
Manufacturing Defects Analyzer
406A
-
The 406A is designed to target the highest number of assembly failures for the least amount of capital equipment cost, programming time, and maintenance costs. The precision Stimulus Measurement Unit provides AC/DC analog measurements that are accurate, stable, repeatable, and reliable.
-
Product
Thermal Sensitivity Tester
NTE-2A
-
The NTE-2A Thermal Probe is a sophisticated, non-invasive device for the clinical evaluation of neuropathy and the assessment of short fiber neurological function. Individual thresholds are compared to normals to statistical normals. These results provide an accurate means of tracking chronic changes in small fiber nerve function. It can be used for pain studies and in any application were a variable, accurately-controlled temperature stimulus is required. The NTE-2A is often used in conjunction with the Vibratron II to assess peripheral neuropathies.
-
Product
Digital Stimulus Response PXI Card
GX5152 Series
PXI Card
The GX5152 Series are high speed, 6U PXI, digital I/O instruments. The GX5152 master controller has 32 I/O channels that supports test rates up to 50 MHz and vector depths up to 128 Mb per pin. The GX5153 slave offers the same timing characteristics and multiple I/O level configurations when used in conjunction with the GX5152. The GX5152 can control up to 15 GX5153 boards using the same timing and sequencer.
