Stimulus
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Product
True-Mode Stimulus
S96460B
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S96460B provides mismatch-corrected true-mode stimulus and enables accurate balanced measurements on 4-port E5080B vector network analyzers.
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Product
Stimulus Test Cell
HA7300
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The Stimulus Test Cell HA7300 is a test cell which provides an environment for high-speed, highly accurate temperature and pressure test of differential pressure sensors, utilizing Advantest’s unique temperature control unit with simultaneous temperature control for 8 devices, as well as a newly developed 2Port pressure controller and pressure application nozzle.
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Product
True-Mode Stimulus
S95460B
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S95460B provides mismatch-corrected true-mode stimulus and enables accurate balanced measurements on M980xA PXI vector network analyzers.
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Product
True-Mode Stimulus
S97460B
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S97460B provides mismatch-corrected true-mode stimulus and enables accurate balanced measurements on 4-port P50xxA vector network analyzer configurations.
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Product
ARINC HSI / ADI Test Fixture
TA-2000
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The TA-2000 test fixture is a combination panel that incorporates all the standard capabilities of the legacy CTS-11(ADI) and CTS-12(HSI) panels and much more. This panel is married to our model TA-1001 dual synchro transmitter/API panel thus allowing for local stimulus and alignment of the instruments synchros and resolvers. The panel provides for testing of both superflag(28v) and low level meters through a matrix of switching that will allow testing of all meters simultaneously or just individually. The low level meter drive circuit also incorporates an automatic mode that will continuously oscillate the L/R and Up/Dn pointers.
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Product
CXA-m PXIe Signal Analyzer
M9290A
Signal Analyzer
Deploy a smaller microwave footprint, no trade-off in precision: Rely on fully specified performance up to 26.5 GHz in 4 slots Optimize your balance between speed, sensitivity and accuracy with the choice to operate in swept or FFT modes Perform fast calibrated stimulus response measurement with full-band tracking generator Smooth the transition between R&D, manufacturing, and maintenance: CXA-m is code compatible with benchtop X-Series signal analyzers and ESA spectrum analyzers
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Product
RF Sources
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Textron Systems’ commercial RF Sources (RFS 340, SSI) provide an unmatched combination of frequency coverage, power range, signal fidelity and switching speed in either a two-slot VXI, 1U LXI®, or VME Synthetic Stimulus Instruments (SSI) format.
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Product
NI-5741, 16-Bit, 1 MS/s, 16-Channel Signal Generator Adapter Module for FlexRIO
782864-01
Signal Generator
The NI‑5741 provides simultaneously sampled analog output channels for signal generation. It also features single-ended, DC-coupled inputs and general-purpose digital input and output lines for system stimulus and control. The NI‑5741 is ideal for applications requiring high-channel density and the power of a user-programmable FPGA. Each channel has a user-configurable sample rate, and data is written directly from the FPGA. To use the NI‑5741, you must pair it with a compatible PXI FPGA Module for FlexRIO.
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Product
Modular Power
RFP DC High Power
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AMETEK Programmable Power, Inc.
ReFlex Power™ is a high density, modular programmable power system providing DC, AC and electronic load assets all under control of a single controller. It provides a reconfigurable, flexible platform ideal for ATE and production test environments where RFP™ can provide programmable stimulus and bias power as well as programmable loads for the device(s) under test. The EIA 4U high RFP™ mainframe can hold up to 12 single-slot modules or combinations of single, dual and triple slot wide modules to configure (or reconfigure) the system for the particular requirements at hand. The mainframe can support up to 6 kW of output power.
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Product
MEMS Handler
4664-IH
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The ULTRA P is a high performance production handler that provides thermal conditioning, full 6 DOF mechanical stimulus and an electrical ATE signal path for testing Micro-Electro-Mechanical Systems (MEMS) Accelerometers and Gyroscopes.
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Product
Modulation Distortion Up To 26.5 GHz
S930702B
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S930702B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 26.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930702B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Product
Stimulus Test Cell
HA7200
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The HA7200 enables these improvements by providing high-speed, high-accuracy temperature and pressure test for automotive sensor R&D and production. Advantest’s proprietary temperature control technology delivers an optimized test solution for high-spec pressure sensors across a broad range of temperatures, in the automotive industry and beyond.
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Product
Portable RF Signal Generator
ACE 5400
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The ACE 5400 portable RF signal generator has four carriers that can be activated individually or in any combination. Each frequency and amplitude is adjustable by the user. The ACE 5400's basic and straight forward performance is perfect for applications that require a precise, stable RF stimulus. Applications: Testing and aligning CATV return bands; Great for institutional networks.
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Product
Advanced Circuit Card Automated Test
ACCAT
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The ACCAT is designed to support diagnostic and acceptance test requirements across a wide spectrum of testing parameters. ACCAT provides a suite of core parametric test instruments, advanced GUI based software, Huntron Access Robotic probing and Huntron Analog Signature Analysis (ASA). ACCAT provides stimulus and asurement capabilities necessary for full functional and parametric testing of circuit card assemblies along with robotic guided probes for fault verification and debug. The Huntron ASA test is ideal for pretest or safe to power up procedures protecting the integrity of the test system.
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Product
14-bit 16 Concurrent Channel 65MSPS A/D board
AD14-65Mx16AVE
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14-bit 16-concurrent channel 65MSPS A/D board for demanding large-system uses, where signals on multiple time-aligned channels need to be observed with high SNR, such as RADAR, nuclear instrumentation, ultrasound, medical imaging, spectroscopy, communications systems, RF component and antenna testing and other critical applications. An on-board low-jitter LMX2581-based RF synthesizer allows any A/D sampling rate between 20MSPS and 65MSPS to be specified in software. A second on-board LMX2581 with synchronized reference can be optionally used to output four stimulus clocks on SMA connectors that can be vectored to any combination of 4 external transmitters, microwave pulse generators, laser modulators, and other devices.
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Product
Modular Power
RFP DC Load
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AMETEK Programmable Power, Inc.
ReFlex Power™ is a high density, modular programmable power system providing DC, AC and electronic load assets all under control of a single controller. It provides a reconfigurable, flexible platform ideal for ATE and production test environments where RFP™ can provide programmable stimulus and bias power as well as programmable loads for the device(s) under test. The EIA 4U high RFP™ mainframe can hold up to 12 single-slot modules or combinations of single, dual and triple slot wide modules to configure (or reconfigure) the system for the particular requirements at hand. The mainframe can support up to 6 kW of output power.
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Product
Platforms
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The use of switching systems to route instrumentation and stimulus signals to appropriate test points on a unit under test has a very crucial role to play in most electronics test systems. The sharing of test resources, connection of calibration references, load management, and many other functions are all managed by the switching system, the switching system acts as the interface between the unit under test (UUT) and the test equipment.
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Product
DC Automated Accelerated Reliability Test Station (AARTS)
DC-HTOL
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The DC Automated Accelerated Reliability Test Station (AARTS) systems are designed to maximize channel density. The first systems developed by Accel-RF (ARF) were intended for RF and DC stimulus to the Device Under Test (DUT). However, there are some applications in which RF stimulus is not required.
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Product
Portable Functional Near-Infrared Spectroscopy System For Research
LIGHTNIRS
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Shimadzu Portable functional Near-Infrared Spectroscopy (fNIRS) System for Research* Near infrared light, which readily diffuses easily through biological tissue, can be used to measure localized blood oxygenation levels of the brain to monitor where activity occurs in response to a task of stimulus. The portability of LIGHTNIRS allows visualizing brain function activity in real time in a more natural state than other methods. Consequently, it is being used in a wide range of applications including medical research, developmental psychology, education, cognitive science and engineering.
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Product
RF Automated Accelerated Reliability Test Station (AARTS)
RF-HTOL
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The RF Automated Accelerated Reliability Test Station (AARTS) systems are designed to stress devices with RF, DC, and thermal stimulus. The systems were designed from their inception to include RF stimulus - it was not added as an after-thought. Hence, the software and hardware are fully integrated and provide full-featured support.
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Product
Compact Tunable Laser Source with Continuous Sweep Mode, 1520nm to 1630nm
81940A
Laser Source
Keysight's 81940A high power compact tunable lasers enables optical device characterization at high power levels and measurement of nonlinear effects. It's improves the testing of all types of optical amplifiers and other active components as well as broadband passive optical components. As single slot plug-in modules for Keysight's 8163A/B, 8164A/B and 8166A/B mainframes, they are a flexible and cost effective stimulus for single channel and DWDM test applications. Each module covers a total wavelength range of 110 nm in the C+L-band.
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Product
Diagnostic Test System™
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The original Teseda system for bench-top stimulus, test pattern debug, validation, device failure mode stimulation in-situ with other Failure Analysis lab equipment such as an EMMI, etc.
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Product
Overview of features and functionality
NoiseCheck Software
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NoiseCheck is essentially SoundCheck without a stimulus editor, as it is designed for manufacturing the noise made by your product. It is a powerful piece of software, ideal for both R&D and production line acoustic measurements of fans, blowers, motors, gears, bearings, pumps and other electromechanical products.
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Product
Digital Stimulus Response PXI Card
GX5152 Series
PXI Card
The GX5152 Series are high speed, 6U PXI, digital I/O instruments. The GX5152 master controller has 32 I/O channels that supports test rates up to 50 MHz and vector depths up to 128 Mb per pin. The GX5153 slave offers the same timing characteristics and multiple I/O level configurations when used in conjunction with the GX5152. The GX5152 can control up to 15 GX5153 boards using the same timing and sequencer.
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Product
Resolver to Digital and Digital to Resolver Converter
DP-VME-5031
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DP-VME-5031 is a Resolver to Digital and Digital to Resolver Converter module. This module has four resolver to digital converters as measurement channels and six digital to resolver converters as stimulus channels.
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Product
200 MS/s Waveform Generator & Dual 50 MHz Pulse/ Timing Generator
3172
Pulse Generator
The Racal Instruments™ 3172, a 200 MS/s Waveform Generator and Dual 50 MHz Pulse and Timing Generator, combines multi-instrument density and highfrequency performance in a single-slot, C-sized VXIbus format.Waveform output in the range of 100 μHz to 30 MHz with 16-bit vertical resolution (12-bit vertical for 3171 emulation) and pulse output to 50 MHz make the 3172 a powerful solution to a variety of test stimulus requirements.
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Product
Arbitrary Waveform Generator
AWG70000B
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The AWG70000B Series Arbitrary Waveform Generator represents the cutting edge in sample rate, signal fidelity and waveform memory, making it ideal for design, testing and operations of complex components, systems and experiments. With up to sample rate of 50 GS/s and 10-bit vertical resolution, it delivers the industry's best signal stimulus solution for easy generation of ideal, distorted and “real-life” signals.
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Product
RFP DC Low Power
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AMETEK Programmable Power, Inc.
ReFlex Power™ is a high density, modular programmable power system providing DC, AC and electronic load assets all under control of a single controller. It provides a reconfigurable, flexible platform ideal for ATE and production test environments where RFP™ can provide programmable stimulus and bias power as well as programmable loads for the device(s) under test. The EIA 4U high RFP™ mainframe can hold up to 12 single-slot modules or combinations of single, dual and triple slot wide modules to configure (or reconfigure) the system for the particular requirements at hand. The mainframe can support up to 6 kW of output power.
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Product
Fault Diagnostics in Power-Off State
QT55
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Qmax Test Technologies Pvt. Ltd.
Signature Method of Testing is also known as VI Trace Characteristics, is a proven fault diagnostics technique in Power-Off state while testing a board. By applying known wave from signal with desired Voltage, Source impedance and Frequency of the stimulus signals, depending upon the test node and its characteristics, a Voltage (V) vs Current (I) graph is plotted and studied.
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Product
Characterization Platform
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This standalone integral software and hardware platform is capable of functioning as an independent single-channel or virtual multi-channel characterization test subsystem. The platform is USB controlled to provide temperature, RF-signal and bias-control to a device-under-test (DUT) for semiconductor performance measurement. When used in conjunction with Accel-RF's embedded Pulser-Card Assembly, the test device is capable of pulsed DC and RF stimulus.
