DAQ Systems
Sense, log and store information.
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Product
Isolation Measurement System
DM-8000H
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*The input block, control block and display block are isolated with optical fiber cables. (DM-900A/AL, DM-910A/AL)*Frequency bandwidth: DC to 500MHz.*Simultaneous multi-channel measurement of many channels of different reference potentials. (2 to 24 channels) (DM-900A/AL)*Long-life battery drive. (The system can be driven by three batteries for about 12 hours) (DM-900A/AL, DM-910A/AL)*Measurement using long memory. (DM-900A/AL, DM-910A/AL)*Simultaneous measurements of the inverter's switching waveform and ON-voltage. (DM-910A/AL)
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Product
Systems for Pipe Location
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Here you will find an overview of SEWERIN cable location systems. Starting with locating technology such as fiber optic probes for locating non-metallic pipes, a system for acoustic locating of plastic pipes, to a multi-channel receiver for the localisation of water or gas pipes, telecommunications or power cables and other live or metallic supply lines.
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Product
Complete Systems
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Your expert for measurement and automation tasks. For measurement and automation tasks that have special requirements, Delphin delivers complete systems with options and functions to enable optimal adaptation to any application.
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Product
Thermal Imagers & Systems
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Advanced Energy’s turn-key thermal imagers and systems accurately measure temperature and use reliable infrared technology. These high-tech instruments can precisely determine the temperature and temperature distribution of small and fast-moving objects.
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Product
Etch System
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When it comes to clean etches, Veeco’s Ion Beam Etch (IBE) systems deliver with sharp control and minimal disruption. Using a focused argon ion beam, this subtractive technique etches nanoscale features with precision, making it a go-to for pattern transfer, layer removal, and surface refinement where edge definition matters most.
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Product
Electron Diffraction System
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Modern physics is the post-Newtonian conception of physics. It implies that classical descriptions of phenomena are lacking, and that an accurate, " Modern", description of nature requires theories to incorporate elements of quantum mechanics or relativity, or both. This section includes many of the most important experiments in physics, including e/m tubes, the Franck-Hertz experiment, and nuclear magnetic resonance (NMR)
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Product
Drop Test System
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HIACC Engineering & Services Pvt. Ltd.
HIACC's Drop Test System is a specialized, automated testing apparatus designed to simulate real-world handling and transportation hazards, determining the "drop bearing capacity" (durability) of products and their packaging.
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Product
EUV Lithography Systems
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Using extreme ultraviolet (EUV) light, our NXE and EXE systems deliver high-resolution lithography and make mass production of the world’s most advanced microchips possible
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Product
Comprehensive GCxGC System
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Shimadzu’s Comprehensive GC-MS (GCxGC-MS) System is suited for a variety of applications, including analysis of complex matrices such as a natural products that are hard analyze by conventional GC or GC-MS, and grouping analysis based on two-dimensional chromatograph patterns.
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Product
Serial-to-Daq Minibox
Model 2367
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* 2367 provides 32 digital I/O lines, 4 analog outputs, 6 analog inputs, 6 relay driver outputs and 4 temperature inputs.* Firmware supports ASCII command strings, Addressed commands for RS-485 networks and packet protocol. * Operates as a RS-232 as a RS-485 to Data Acquisition Module. * DB-25 connector has both RS-232 and RS-485 signals.* SCPI commands and IEEE 488.2 compatibility provide GPIB like operation over the serial link. * The 2367 is packaged in a CE approved Minibox™ metal case to minimize EMI/RFI. * 1 U high Rack Mounting Kit mountsone or two 4867s.* Plug-on Terminal Board simplifies wiring connections.* Includes Universal Power Adapter and 62-pin mating connector.
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Product
DCME Analysis System
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DCME Analysis System (SCL-DAS) is a software based application, which is designed to classify, process and decompressed the compressed signals transmitted over the satellite links.DCME Analysis System supports most of the commercially available DCMEs including PCM, ADPCM, DX-3000, DX-7000, DTX-600, DTX-360, DTX-240 (D,E,F,T), CELTIC-3G, OKI TC-2000 etc. While processing the compressed/normal E1 carrier, the SCL-DAS provides the processed intelligible output in the form of Voice and Fax along with Originating Point Country, Destination Point Country, Outgoing Number, Incoming Number etc.
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Product
EO/IR Surveillance Systems
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Multi-sensor systems for perimeter surveillance, security and force protection are available in a variety of lens and sensor combinations, and can be customized to meet any mobile or stationary mission requirement. These systems may be operated independently or in a fully integrated sensor network.
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Product
Satellite Geo-location System
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The Satellite Geolocation System is an accurate, fast, all-in-one solution for locating ground-to-satellite transmission sources.
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Product
Development System
FE-W7
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* Emulates Winbond W77xxx or W78xxx Microcontrollers * 125K Code Memory * Real-Time Emulation * Frequency up to fmax at 1.8V to 5.5V * Wide Supply Voltage Support * MS-Windows Debugger For C And Assembler * Emulation Headers for PLCC, QFP and DIP * Target Board and Programmer Included * Serially Linked to IBM PC at 115Kbaud
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Product
Tyre Inspection Systems
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The VLT tyre inspection system can check several tyre and wheel related items, such as tread depth and sideslip. All measurements are done very fast when the vehicle is on the roller brake tester.
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Product
Dynamic Torque Sensing System
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Advanced Telemetrics International
Are utilized in applications where conventional rotary torque transducers are not practical due to excessive shaft speeds, vibration, and dirty, oily environments.
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Product
Pressure Comparator (System F)
Type T
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AMETEK Sensors, Test & Calibration
Type T hydraulic comparator (System F) is a self-contained high volume pressure source capable of producing pressure up to 15 000 psi. It is ideal for testing gauges and setting hydraulic relief valves and pressure switches. Multiple models are available for hydraulic oil, water, or both.
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Product
Semiconductor Test System
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IST Information Scan Technology, Inc.
As power modules age, their performance degrades. Proper testing and maintenance of semiconductor devices used in power switching can ensure optimal performance and prevent down-time throughout a device’s lifecycle. The IST Model 8900 Series Discrete Semiconductor Test Systems allows you to effectively identify the percent of degradation in semiconductor devices by simulating the exact current and voltage of the parameters used by devices under real operating conditions.
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Product
Ion Beam Milling Systems
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When material specimen surfaces are prepared for SEM or incident light microscopy, the specimen usually undergoes multiple processes until the layer or surface to be analyzed is machined with precision. Leica Microsystems’ workflow solutions for solid state technology cover all steps required for demanding high-quality sample preparation.
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Product
Photonic Networks and Systems
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Fraunhofer Institute for Telecommunications
The Photonic Networks and Systems Division develops solutions for high-performance optical transmission systems for use in in-house, access, metro, long-distance and satellite communications networks. The researchers are focusing on increasing capacity as well as improving safety and energy efficiency. The department has the latest measurement technology, very well-equipped system laboratories, powerful simulation tools and the ability to carry out field tests.
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Product
Phase Locked Laser System
SolsTiS-Phase Locked
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The phase locked SolsTiS system is primarily designed for use in atom interferometry and quantum computing where Raman transitions are commonly used, although we can tailor the setup to other applications. The system provides extremely low phase noise and high output powers. Full control over the system is provided through our easy to use Ice Bloc user interface.
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Product
Flying Probe Test System
A8a
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The A8a test system provides the flexibility of flying probe testers while delivering high throughput testing for bare board printed circuit boards (PCBs). The target market for the A8a is the electrical test of tablet and PC motherboards and high density interconnect (HDI) products for smart phones. The A8a is designed for high productivity, reliability and test accuracy. To achieve high throughput the key feature of the A8a is a new dual shuttle system, which reduces the product exchange time to zero seconds in automation mode. In combination with the fast test speed of up to 140 measurements/second the A8a will give customers a competitive test solution for batches up to 5000 boards. A typical cycle time of a 4-up smart phone board is about 2 minutes.
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Product
Heat Cycling System
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Yangzhou Power Electric Co., Ltd
High current test systems are used to test the thermal stability of equipment and components. The test system induces a current in the test object causing it to heat up.The system can perform the heat cycle testing for power cables type test and pre-qualification test according to IEC 60840, and IEC 62067 etc. Based on pre-qualification test needs, test system is divided into two parts: test sample loop and simulation temperature loop.
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Product
Haptic Testing System
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The Air Ventilator Haptic Test System performs automatic functional tests on air ventilation components to measure the force necessary for the execution of movements in the different components of the part. The movements are performed by a 6-axis robot that forces the components of the part to follow the desired routes while storing data on the force expended. This particular machine tests movable fins and knurled wheels by performing four test motions on each fin and two on each wheel.
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Product
Battery Test Systems
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Low current model32 channel battery cycler (expandable up to 128 channels)No. of minimum channel : 16 channelsmax. voltage range : ±5Vmax. current range : ±10
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Product
System Testing
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TestOrigen Software Testing Services Pvt Ltd.
System testing is basically a sequence of various test performed to check the whole computer-based system. The key objective of system testing is to confirm the system level testing should meet the user’s viewpoint.
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Product
Real-time X-ray Inspection Systems
JewelBox Series
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JewelBox x-ray inspection systems feature ultra-high resolution, powerful microfocus x-ray tubes, five-axis, and positioners. The JewelBox Series is divided into three broad categories: JewelBox 70-T, JewelBox 90-T and Ultra Compact each of which can be customized for specific applications.
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Product
Decoking System
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Discover how our hydraulic decoking systems have transformed hydraulic decoking into an increasingly reliable, efficient and automated process.
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Product
Fiber Optic Test System
OPTOWERE-S100 (Fiber Optic Test System)
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The frame of FOTS system consists of the Main control part and the Slot mounting part. The Main control part is in charge of control and interface of the system and the Slot mounting part can hold up to maximum 8 slots, which are modularized according to each function and come out in five kinds. This integrated test system is designed to help manage the test and measurement related to optical communication and component. And the modular architecture of FOTS allows for customized configuration so that the slot of LD Driver, 2 channel VOA, 1 X 4 switch, WDM EDFA and C + L – Band ASE Source can be chosen according to user’s necessities. Main control part and each function module are run by effective and multi-functioned system control program in the base of high speed remote interface, GUI display and the discriminative high speed driving of module and system. This system can provide variety manufacturing and laboratory applications such as general quality test and reliability test of optical component and optical signal transmission test through efficient linkage with other system.
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Product
MPI SiPH Probe Systems
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MPI Advanced Semiconductor Test
MPI designed dedicated SiPH upgrades for its well known 200 and 300 mm probe systems, which includes:*Various options of high-precision fiber alignment systems for ultra-fast scanning routines*Multiple measurement capabilities for O-O, O-E, E-O and E-E device configuration*Integrated Z-sensing for detecting the fiber to wafer contact point*Crash protection when using two optical fiber arms*Wide temperature range from -50°C to 200°C*Optional dark box for testing in light tight environment*Extensive software package for supporting easy integration to operator’s test executive*Probe system compatibility: TS2000-IFE, TS2000-SE, TS3000, TS3000-SE, TS3500 and TS3500-SE
