-
Product
Device Characterization
-
Probe systems for device characterization must be particularly flexible because many different measurements often must be performed; DC, IV/CV, Capacitance, HF, 1/f, temperature and more. The modular architecture of the PS4L product line is ideal for these broad requirements.
-
Product
Bench & Characterization Boards
-
Engineer, Design, Fabricate & Assemble Custom Boards for:*Device Characterization and Verification*Bench Testing*Failure Analysis*General Laboratory Use
-
Product
Display Test & Characterization Solutions
-
The Gamma Scientific line of display measurement solutions leverages the company’s renowned competencies in developing high-sensitivity spectroradiometer-based equipment. Our range of NIST traceable solutions include handheld and portable instruments, laboratory equipment, and fully automated production inspection systems. With over 50 years of experience in the industry, you won’t find another company with the level of combined knowledge and expertise as the team at Gamma Scientific.
-
Product
Fan Characterization Module
FCM-100
-
Advanced Thermal Solutions, Inc.
The FCM-100 Fan Characterization Module is a specialized unit designed to test and characterize fans of various sizes and performance outputs. Using the FCM-100 Module in conjunction with pressure measurement equipment (such as the PTM-1000) and velocity measurement equipment (such as the eATVS); it is possible to develop fan curves (P vs. Flow rate) that can be used to verify fan manufacturer data or to characterize fans of unknown performance.
-
Product
Arbitrary Load-Control Device Characterization
S94522B
-
The S94522B Arbitrary Load Control Device Characterization application. Ideal for bare transistor compact modeling. Generate Keysight’s DynaFET compact model or use large signal waveform data to generate models.
-
Product
Characterization Of VCSEL Arrays Including Polarization Analysis
-
Konica Minolta Sensing Americas, Inc
Laser diodes are becoming indispensable in a multitude of everyday and industrial applications, thereby expediting new applications and technologies. These include: facial and gesture recognition in consumer electronics, LiDAR (light detection and ranging) in the car and material processing with high-performance diode lasers.
-
Product
Antenna Characterization
-
Radiometrics Midwest Corporation
Radiometrics Open Area Test Site and 10 Meter Anechoic chamber provide ideal test sites for antenna characterization.
-
Product
Automated Compliance and Device Characterization Tests
N5990A
Test Platform
The Keysight N5990A test automation software platform is the most powerful tool for serial and multi-lane gigabit testing. It is the unique universal platform for testing a wide range of digital buses such as PCI Express, USB, HDMI or MIPI. The same graphical user interface and operating principles are used for all applications. This boosts productivity, especially when testing devices which support multiple digital buses. The N5990A can be tailored to your individual test needs with the flexible test sequenzer and controls all instruments needed for your tests. The configurable database interface of the N5990A test automation platform enables the convenient storage of all test results. A web interface allows an effective and easy operation. Custom calibration and test procedures can be implemented easily with User Programming.
-
Product
Device Characterization Software with Test Automation
14565B
-
The Keysight 14565B device characterization software is designed for easy evaluation of portable battery powered device (like 3G handsets, PDA, WLAN, and Bluetooth enable devices) current profiles to ensure long operating life of devices.
-
Product
Characterization System
System 7700
-
Whether your application is characterizing a massive mosaic of CCDs for the next great observatory, designing a faster FLIR for a weapons-guidance system, or production-testing a CMOS image sensor for a digital camera, Pulse Instruments can supply you with a fully-integrated test system that allows you to focus on your your device, not on your test system.
-
Product
Laser Diode Characterization Systems
-
Artifex Engineering GmbH & Co. KG
The LIV100 and LIV120 employ digitally programmable analogue end stages for flexible and accurate current control. A wide range of current end stages are available with maximum currents of 250mA for low power and telecom lasers or up to 1200A for high power laser bars. Custom units are available with even more current!
-
Product
Material Characterization Products
MeasureReady®
-
Unique real-time sampling architecture for synchronous sourcing and measuring.
-
Product
Characterization Platform
-
This standalone integral software and hardware platform is capable of functioning as an independent single-channel or virtual multi-channel characterization test subsystem. The platform is USB controlled to provide temperature, RF-signal and bias-control to a device-under-test (DUT) for semiconductor performance measurement. When used in conjunction with Accel-RF's embedded Pulser-Card Assembly, the test device is capable of pulsed DC and RF stimulus.
-
Product
Material Characterization Services
-
Accolade Engineering Solutions
As the direction of materials science continues towards studying the basis of properties on smaller and smaller scales, different techniques are used to quantify material characteristics and tendencies. Measuring mechanical properties of materials on smaller scales, like thin films, cannot be done using conventional hardness testing.
-
Product
Image Sensor Characterization Systems
-
Image Sensor QE and Spectral Responsivity Characterization
-
Product
Process & Material Characterization System
TriboLab CMP
-
Bruker’s TriboLab CMP Process and Material Characterization System has been designed from the ground up specifically for reliable, flexible, and cost-effective bench characterization of waferpolishing processes. Small R&D-scale specialty system for CMP. Reproduces full-scale wafer polishing process conditions without downtime on production equipment. Provides unmatched measurement repeatability and detail. Allows testing on small coupons for substantial cost savings over whole-wafer testing.
-
Product
DDR5 Receiver Conformance and Characterization Test Application
M80885RCA
-
DDR5 Receiver Conformance and Characterization Test Application.
-
Product
Laser Diode Characterization Testing
-
The Yelo Laser Diode Characterization system performs automated characterization of a laser device. The system will allow the operator to load a single packaged Laser device into a TEC controlled fixture mount. Each test station (LIV, Spectrum, Far Field/Beam Divergence) will then automatically align with the Laser Device in a sequential order and perform the automated tests required of each station.
-
Product
Automated Distortion Characterization and Information System
ADCS
-
Matrix Test Equipment Incorporated
The Automated Distortion Characterization and Information System (ADCS) is an extension of the Matrix equipment control software that automatically makes RF measurements selected from the following: Cross Modulation (XMOD), Composite Triple Beat (CTB), Composite Second Order (CSO), Carrier to Noise (C/N), Discrete Second Order, Discrete Third Order Distortion. Measurements are made, and the test results and a profile describing the test conditions are saved in a database for later retrieval or reporting.
-
Product
Laser Diode Characterization System
58620
System
The Chroma 58620 Laser Diode Characterization Station is a state-of-the-art full turnkey system specially designed for laser diode testing. Features range from macro inspection of the facet or aperture active area to a full suite of electro-optical parametic tests.
-
Product
HV-Test System for Capacitor Packages
-
The system is used to characterize the leakage currents of capacitor packages. LXinstruments implemented a project-specific PCBA for the required HV switching. The measurement technology consists of Keithley source meters and USB based devices. The DUT adaptation with safety technology was realized in cooperation with ATX.
-
Product
High-resolution Spectrometer
HR4000
-
Our next-generation high-resolution spectrometer is a novel combination of optics and electronics that is ideal for applications such as characterizing lasers, measuring gas absorbance, and determining atomic emission lines.
-
Product
Display Measurement Systems
DTS Series
-
Instrument Systems Optische Messtechnik GmbH
Characterization of emissive, transmissive, reflective, and transflective displaysViewing-angle-dependent analysis of illuminance, contrast, color, and derived parametersDetermination of the electro-optical transfer function: analysis of luminance, contrast, and color depending on electrical driving conditionsMeasurement of transient properties, such as switching times, flicker, and modulation
-
Product
Bit Error Ratio Testers
M8000 Series
-
Simplified time-efficient testing is essential when you are developing next-generation computer, consumer, or communication devices. The Keysight M8000 Series is the highly integrated BER test solution for physical layer characterization, validation, and compliance testing. With support for a wide range of data rates and standards, the M8000 Series provides accurate, reliable results that accelerate your insight into the performance margins of high-speed digital devices.
-
Product
Hydrogen Analyzer
H‑500
-
Determination of hydrogen using the heat extraction method is a special requirement for the characterization of steel, steel alloys, copper and other metals. ELTRA’s H-500 is designed for the rapid and accurate determination of hydrogen in these materials. The H-500 analyzer uses the heat extraction technique and is equipped with a resistance furnace with quartz tube. The temperature can be set up to 1000 °C in steps of 1 °C. The usual working range of the H-500 is about 900° to 1000° C.
-
Product
64 Gbaud High-performance BERT
M8040A
Bit Error Rate Tester (BERT)
The Keysight M8040A is a highly integrated BERT for physical layer characterization and compliance testing. With support for PAM-4 and NRZ signals and data rates up to 64 Gbaud (corresponds to 128 Gbit/s) it covers all flavors of 200 and 400 GbE standards.
-
Product
Scatterometers / Thin Film Metrology Systems
OptiPrime Series
-
The n&k OptiPrime series are automated metrology systems used to fully characterize and monitor Thin Film and OCD applications for both current and next generation IC processes.
-
Product
PXIe-6548, 200 MHz, 32-Channel PXI Digital Waveform Instrument
781012-03
Digital Waveform
PXIe, 200 MHz, 32-Channel PXI Digital Waveform Instrument—The PXIe‑6548 is a digital waveform generator and analyzer for interfacing and basic characterization test with 32 single-ended digital pins. The device is capable of sampling digital waveforms at up to 200 MHz and interfacing with user-programmable voltage levels that have a 100 mV resolution. The PXI‑6548 also features advanced synchronization capabilities for building integrated mixed-signal test systems, hardware comparison for bit-error test, and per-bank digital timing features.
-
Product
Component Test Stands
-
As your specialist for measurement and testing technology, imc designs and manufactures test stands perfectly matching requirements for a complete range of components: whether for servomotors, pumps, brakes or valves – according to your wishes, imc component test stands can quickly and precisely test for perfect operation, verify lifetime, determine energy efficiency, and much more. Thanks to the modern software imc STUDIO, test objects can be tested for complex and wide-ranging scenarios.Test stand solutions from imc are characterized by their flexibility, short set-up times and productive test processes.As a manufacturer of measurement and test technology, it is second nature to us that imc test stands deliver reproducible and verifiable results and ensure productive test processes. Furthermore, we place enormous value not only on first-class technical features for imc test stands, but also on meeting the economic demands of our customers.
-
Product
Battery Simulator
G5.BAS
-
The G5.BAS series is bidirectional regenerative. It was developed specifically for the simulation of energy storage devices and batteries and is suitable for use in laboratories and on test benches. The modular and finely graded G5.BAS series is characterized by highly dynamic response times and a wide current-voltage range with an auto-ranging factor 3.
