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Product
RunCore Embedded PATA “Elite Series” SSD
2.5"PATA/IDE SSD
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RunCore Innovation Technology Co. Ltd.
2.5” PATA SSD incorporates advanced flash controller and NAND flash memory technology to deliver a state-of-the-art, non-volatile mass storage device. It supports capacity from 32GB to 128GB. 2.5” PATA Plus SSD contains the cache size of up to 64MB with maximum transfer rate as high as 95MB/s. Furthermore, its characteristics of low power consumption and anti-vibration are obvious.
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Product
Memory Test System
T5833/T5833ES
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T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
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Product
Universal Automated Programming System
4900
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The 4900 is powered by the newest BPM 9th generation technology, which delivers the fastest programming speeds in the industry for MCU’s, eMMC HS400, NAND, NOR and Serial Flash devices. BPM 9th generation technology produces 200 MHz signals, allowing each byte of data to transfer in up to 2.5 ns. Up to 9 times faster than competing programmers. 3D Vision option inspects BGA, CSP, QFP, TSOP, SOIC and J-Lead devices for coplanarity, bent lead, pitch, width, diameter, standoff and XY errors.
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Product
Logic Gates
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Analog Devices logic gate products offer logic functions such as AND, NAND, OR, and NOR, and include both –3.3 V and +3.3 V single supply options. Our products feature low power consumption, fast rise and fall times, differential and single-ended operation, and support high data rates up to 45 Gbps in an RoHS compliant package.
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Product
Multibus Ethernet Card
MS 1750
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- Processor: LPC3250 processor with ARM 9 core running at 266 MHz- SDRAM Memory: DDR2 256 MB (scalable to 512 MB)- Flash Memory: NAND flash 512 MB- Display & Graphics: Programmable color LCD controller supports up to a TFT interface- Touch screen: Integrated touch screen controller- Network Support: 10/100 Base-T Ethernet PHY- PC Interface: One USB 2.0 high-speed On-the-Go interface- Multibus Interface- Serial Interfaces: Up to four external UARTs- CAN 2.0B controller- Three I2C ports- Three SPI ports- GPIO: Programmable I/O depending on peripheral requirements
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Product
SSD
MSATA SSD (iSLC) 3IE4 Series
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Innodisk mSATA 3IE4 is SATA III 6.0 Gb/s flash-based disk, which adopts the latest Marvell NAND controller with Innodisk’s exclusive L³ FW architecture. The upgraded L³ FW architecture, combining Innodik signature 4K mapping algorithm L² FW architecture with powerful LDPC technology, makes 3IE4 series have outstanding high IOPS, better data integrity, and extended lifespan by reducing the occurrence of bad block numbers. Built-in thermal sensor and iData Guard ensure data integrity and reliability of mSATA 3IE4 for industrial applications.
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Product
6U I7 PXI Controller
GX7927 Series
Controller
The GX7927 is a Single Board Computer (SBC) that features the high performance, highly integrated Core i7 processor platform from Intel. Core i7 offers an integrated graphics and memory controller plus dual core processing, operating at speeds up to 2.53 GHz. Coupled with the Mobile Intel QM57 Express Chipset, the GX7927 provides an unmatched level of I/O bandwidth for both onboard and off-board functions. The module is supplied with 4 GB of DDR3 SDRAM and 16 GB of NAND Flash memory. Both standard and extended temperture operation range versions are available.
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Product
Memory Test System
T5221
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The T5521 is a memory test system that supports wafer test and wafer burn-in test of non-volatile memory devices such as NAND flash, housed within a multi-wafer prober to reduce test floor footprint.
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Product
M.2 SATA3 RunCore Embedded SATA3 “Elite Series” SSD
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RunCore Innovation Technology Co. Ltd.
M.2 SATA3 utilizes high-performance SATAIII SSD controller and NAND flash, with or with no DRAM buffer to support power failure mechanism. This series SSD compliant with Serial ATA Revision 2.6/3.1 specification, compatible with 6.0Gbps, 3.0Gbps and 1.5Gbps interface rate and support Native Command Queuing (NCQ) up to 32 commands. As a standard SATA drive, it can support mainstream OS, such as Windows/Linux/Unix/Solaris/ Mac OS and so on.
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Product
SSD
M.2 SSD (iSLC)
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Innodisk M.2 (S42) 3IE4 is characterized by L3 architecture with the latest SATA III (6.0GHz) Marvell NAND controller. Innodisk’s exclusive L3 architecture is L2 architecture multiplied LDPC (Low-Density Parity Check). L2 (Long Life) architecture is a 4K mapping algorithm that reduces WAF and features a real-time wear-leveling algorithm to provide high performance and prolong lifespan with exceptional reliability.
