Beam
a shaft of directed energy.
See Also: Shaft, Beam Analyzers, Beam Load Cells, Beam Profilers, Beam Sensors, Beam Splitters, Electron Beam, E-Beam, Laser Beam, Focused Ion Beam, Laser Beam Analyzers, Laser Beam Profilers
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Product
15% Beam Splitter
10725C
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The 10725C 15% beam splitter, designed for beam diameters of 9 mm or less, reflects 15% of the total incoming laser beam and transmits 85% straight through. This optic is without housing and requires a user-supplied mount.
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Product
50% Beam Splitter
10725A
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The 10725A 50% beam splitter, designed for beam diameters of 9 mm or less, divides the beam into equal parts. It transmits one part straight through, and bends the other part at a 90-degree angle. This optic is without housing and requires a user-supplied mount.
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Beam Probes
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The CO2 Laser Beam Probes are hand-held plates designed to simplify the alignment of IR optical systems. They display the laser beam as a dark image on a fluorescent background using the same UV-excited, thermal-sensitive surfaces developed for Macken Instruments'' Thermal Image Plates.
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Economical Bending Beam Load Cells
EBB SERIES
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The EBB Series is a economical low capacity bending beam load cell suitable for use in a variety of industrial and OEM force measurement and weighing applications. It is made of an aluminum alloy and comes in 1, 2, 5 and 10 kilogram ranges.
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Product
Sealed Beam Bulb Testing System
H710019SSL
Test Platform
EOL test for manufacturing of bulbs with LED for applications requiring to ensure watertightness: vehicles, marine, swimming pools, operating rooms, classified areas (Ex Zone), etc. The test system checks in a short time all the light and electrical characteristics of the bulb. A high precision Micro Leakage Meter also checks that there are no leaks between the environment and the inside of the bulb. The test results are recorded on the PC and can be printed on a quality control label attached to each unit.
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Beam and Singlepoint Load Cells
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We have trimmed all the non-essential fat off these load cells, however you can be sure that nothing has been trimmed from the actual load cells, they are precision tested and certified to meet all the exacting requirements on the downloadable technical specifications shown below.
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Product
Beam Characterization
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Thorlabs offers a wide range of products that can be used for beam characterization. Properties such as intensity, degree of collimation, power, wavefront shape, and spectral properties can be measured.
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Product
33% Beam Splitter
10700A
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The Keysight 10700A beam splitter is designed for beam diameters of 6 mm or less. It reflects one third of the total incoming laser beam, and transmits two thirds. It includes a housing for standard mounting.
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Product
Entry Level Beam Profiling
BeamMic®
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BeamMic is simplified set of measurement tools for the entry level beam analysis user. The camera-based beam profiling system consists of a camera and analysis software. Often times, this system will need to be used with beam attenuation or beam sizing accessories, depending on your laser application. BeamMic includes a complete set of high-accuracy measurements, and features a rich graphical interface. For the laser technician, this entry-level software will easily help you quickly become familiar with the many benefits of beam profiling.
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Product
Electron Beam Lithography System
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Spot type Electron Beam Lithography System JBX-8100FS achieved high throughput, small footprint and electric power saving.
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Product
Beam Load Cell
EST-70
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Technopark Automation & Control
The EST-70 Shear Beam Load Cell is commonly used on platform, hopper weighing and pallet weighing applications. It is low cost and available in capacities from 500 kg to 2000 kg.
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Product
Bending Beam Load Cell
EST-7
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Technopark Automation & Control
The EST-7 is a Bending Beam Load Cell suitable for use on lower capacity weigh hoppers, filling machines, packaging machines and conveyor belt scales. This load cell is available in capacities from 10 kg to 200 kg.
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Product
Specialized Beam Profiler Systems
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DataRay offers specialized beam profiler systems. These systems offer solutions for complex applications. The large beam profiling system is suitable for beams up to 200 mm image area, and the line laser profiling system provides for direct measurement of line lasers up to 200 mm in length.
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Product
Compact Type 4 Safety Beam Sensor
ST4
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Panasonic Industrial Devices Sales Company of America
Panasonic's concept of connecting 6 sets of Sensor heads to 1 Controller in series offers maximum flexibility to solve a wide range of safety applications. Just configure exactly the number of Sensor heads and controllers required to protect the area in question, e.g. small openings or irregularly shaped spaces impractical for Safety Light Curtains. A beam interruption indicator is incorporated in both the emitter and receiver to indicate operation and assist with beam alignment.
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Large Aperture Beam Profilers
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Modern laser applications seldom require large beam profiling, combined with high resolution. The BeamOn HR 1" is the perfect solution enabling both relatively large beam characterization, with a high resolution detector of 20 MP. By implementing a diffuser to present the beam to a smaller detector via dedicated optics, one of the largest beam profilers of 60 mm is offered, i.e BeamOn LA U3. Even further than that, for collimated beams the Laser Analyzing Telescope offers an input aperture of 100 mm combined with high resolution, attitude and divergence measurement of the laser beam.
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Economical Single Point Bending Beam Load Cells
ESP SERIES
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The ESP Series is a economical, high accurate single point bending beam load cell. It is ideal for OEM applications such as electronic scales and weighing machines. The single point bending beam design is highly resistant to eccentric loading allowing direct mounting to the scale base and weighing platform. The ESP Series features a moisture proof sealant.
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Carbon Fibre Beam Gauge
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Designed to measure both internal and external diameters and lengths, the high modulus carbon fibre beam is stiff, lightweight and has an extremely low co-efficient of thermal expansion (CTE). Suitable for measuring high accuracy diameters and lengths up to 4000mm+.
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Ion Beam System
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Veeco's unmatched Ion Beam know-how delivers proven etch and deposition performance enabling the data storage and MEMS markets for decades.
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Camera Based Beam Propagation Analyzer: M2
BeamSquared
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The BeamSquared® system is a compact and fully automated tool for measuring the propagation characteristics of CW and pulsed laser systems from the UV to NIR to Telecom wavelengths. Users can also measure wavelengths above 1.8 microns, including CO2 and terahertz in manual mode (a bench set-up; without the automated optical train) with a Pyrocam IV or IIIHR. Our longer optical train and patented Ultracal™ Calibration makes BeamSquared the most accurate product on the market and is ISO 11146 compliant. Its operational robustness and reliability ensures continuous use applications in industry, science, research and development.
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Beam Position Detectors
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We offer a wide range of laser beam position detectors for optical alignment including Quadrant Cell Photoreceivers, PSDs, and Thermopile Position Sensors. Please see our Beam Position Sensor Guide for more information.
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Product
Shear Beam Load Cell
SB-1.0
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The Shear Beam Load Cell SB-1.0 is a single point weighing device, suitable for use in multiple applications.
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Product
Beam Lead PIN Diodes
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The SemiGen SBL 2000 series Beam Lead PIN Diodes feature fast switching speeds at both low capacitance and resistance. Beam Lead PIN Diodes have high levels of mechanical strength and stability during assembly. These diodes are suitable for microstrip or stripline circuits as well as circuits requiring high isolation from a series of mounted diodes such as multi-throw switches, phase shifters, attenuators and modulators.
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Product
Laser Beam Positioning
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Under the trade name of SpotOn we offer a wide variety of computerized position measurement systems.This is a family of cost-effective and versatile solutions to numerous industrial and laboratory applications.Among the measurement applications, are:Measure laser power and centration or displacementAlign beams and QC of optical systemsMeasure target rotation and displacementMonitor vibration, deflection and motion
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UV-Vis Double Beam Research Spectrophotometer
UVD-3500
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The high- performance blazed holographic grating and the optimized CT-type Monochromator reduce stray light, and widen the photometric range. Wavelength range: 190 nm – 900 nm. Spectral bandwidth: 0.1, 0.2, 0.5nm, 1.0nm, 2.0nm, and 5.0 nm.(UVD-3500).
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Spectro UV-Vis Dual Beam PC Scanning Spectrophotometer
UVS-2800
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Spectro UV-Vis Split Beam PC is a precise scanning Spectrophotometer with a new design of 8 microprocessor automatic 2 row cell holder that moves noiseless with a special membrane. This Split Beam Spectro has a dual detector and a very accurate system.
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Automated Laser Beam Quality Measurement System
Beamage-M2
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Large Apertures: The only M2 system on the market equipped with a complete set of 50mm optics. Also, the sensor is 11.3 x 11.3 mm. Simple Alignment: Two beam-steering mirrors are included for quick and easy alignment of your laser into the system. The internal mirrors are factory-aligned and the pre-set height also simplifies the alignment.Available Fall '17
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Multiple Light Beam Safety Devices
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Leuze electronic GmbH + Co. KG
The multiple light beam safety devices of the MLD 300 (type 2) and MLD 500 (type 4) series are used for access guarding at machines and systems. The devices are available as 2-, 3- and 4-beam transmitter-receiver systems for large operating ranges up to 70 m and as cost-efficient 2- and 3-beam transceiver systems for operating ranges up to 8 m.
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Laser Diode Collimators, 520nm - 785nm, Elliptical Beam
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The Optoelectronics Company Ltd
Custom lasing wavelengths and power options are available. Both standard and custom configurations provide OEMs, end-users and systems integrators with complete, cost-effective laser solutions.
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Focused Ion Beam Scanning Electron Microscopes
FIB-SEMs
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Combine imaging and analytical performance of a high resolution field emission scanning electron microscope (FE-SEM) with the processing ability of a next-generation focused ion beam (FIB).
