Product

Accelerated Product Life Cycle

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Delserro Engineering Solutions

Delserro Engineering Solutions

Under normal conditions it may take years to gather failure data on the life cycle of new products. Through accelerated life testing the overall time to failure can be reduced to weeks by increasing the frequency of the field loads and by removing insignificant stress components. In addition, life cycle testing on a product can be reduced or accelerated dramatically by increasing the stress levels to higher than normal. Putting a product through Accelerated Life Testing can reduce test time from weeks to days while still achieving satisfactory results saving both time and money.

Product

Life Cycle Module Testing System

LCN

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Bitrode, Inc.

LCN - Bitrode, Inc.

Full featured test system for quality control and R&DLife Cycle Testing: Perform charge/discharge cycling of batteries or modules to obtain charge and discharge capacity, energy and DC internal resistanceAutomotive Battery TestingStarting, Lighting and Ignition (SLI) TestingTraction Battery Testing

Product

Multiport Electromechanical Coaxial Switch, DC to 40 GHz, SP4T

87104D

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Keysight Technologies

87104D - Keysight Technologies

The Keysight 87104D multiport switch improves signal accuracy in RF and microwave signal routing and testing applications. This high performance electromechanical switch provides unmatched isolation and a 0.03 dB insertion loss repeatability, which is warranted for the 5-million life cycle of the switch. The 87104D’s low insertion loss repeatability reduces sources of random errors in the measurement path, which improves measurement accuracy. The repeatability and reliability of this switch guarantee measurement accuracy and can cut the cost of ownership by reducing calibration cycles and increasing test system up time. Highly repeatable switching capability is made possible through Keysight's rigorous design and tight manufacturing specifications.

Product

Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Lead Free Probe

LFRE-1I35-7

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ECT

LFRE-1I35-7 - ECT

Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02

Product

Deluxe Durometer with Case

52-50546

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Longacre Racing Products, Inc.

52-50546 - Longacre Racing Products, Inc.

Tire hardness has a huge affect on your car's performance. A tire too hard won't bite and a tire too soft may wear quickly or even ball up. Also tire hardness changes during its life cycle. To run your best you must keep track of all your tire's hardnesses.

Product

Optical Balloon Theodolite

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F. W. Breithaupt & Sohn GmbH & Co.KG

F. W. Breithaupt & Sohn GmbH & Co.KG

*Robust instrument*Bright scope with wide field occular and fix focus*Magnification 16x (20x optional)*Field of view 55,6m/1000m (optional 27,8m)*Open finder sights*Double vertical circles (reading from both sides of the instrument)*Reading of circles 0,1°*Convenient targeting through friction-controlled by endless wormdrive screws*Accessories upon request like alarm clock, filters, tripod etc.*Long life cycle, full spare part availability*Made in Germany

Product

Test Pattern Generator Software

ScanExpress TPG

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Corelis, Inc.

ScanExpress TPG - Corelis, Inc.

To deliver a product meeting the highest standards of quality and reliability, design engineers and test engineers alike must maintain test capabilities throughout the entire product life cycle, from prototype to manufacturing. Automation in test generation is essential to ensure that tests keep up with the rapid development of modern products.The ScanExpress TPG™ Intelligent Test Pattern Generator Software provides a highly advanced, automated boundary-scan test design environment—perfect for quick and efficient creation of complete boundary-scan tests for all IEEE-1149.1 and IEEE-1149.6 compliant circuit boards.