Metrology
field of measurement.
See Also: Measurement, Instrumentation, Coordinate Measuring Machines
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Product
Calibration
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Get the precision calibration tools you need to maintain the accuracy of your process, electrical, temperature, pressure, and flow measuring instruments and equipment. In addition, our in-house metrology lab will precalibrate an instrument at time of order or recalibrate equipment already owned. Our NIST-traceable calibration services and repairs help you meet your quality, regulatory, and compliance needs.
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Product
kSA ICE
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The k-Space Integrated Control for Epitaxy system (ICE) is a modular in situ metrology tool designed for today’s MOCVD and MBE reactors. It combines kSA MOS, kSA BandiT and kSA RateRat Pro patented technologies along with an Emissivity Corrected Pyrometry (ECPR) module. The kSA ICE modular design allows the user to specify which modules will be used in their kSA ICE configuration.
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Product
Mid-end
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Growth in the advanced packaging market and the challenges raised by the various packaging types requires the highest level of inspection and metrology, ensuring high yields of each die as well as of the whole package.
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Product
High Precision Angular Position, Calibration and Geometry Inspection
GeoOrdinate
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Rotary Precision Instruments UK Ltd
Ultra precise rotary tables intended for fine inspection, metrology and test applications.The GeoOrdinate has been designed specifically for the inspection of large and heavy components and is fully compatible with any shop floor environment whilst maintaining world class accuracies more commonly seen in the standards laboratory.
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Product
SlipFinder
YIS and SF Series
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The YIS and SF Series metrology systems are designed for optical detection of wafer defects such as crystaldislocations, slip and other defects. The YIS-300HM (for 300 mm wafers) and YIS-200HM (for 200 mm wafers) utilizeMakyoh optics technology (Magic Mirror) and integrated robotic wafer handler provided by Hologenix.The SF300M and SF300N systems offer a low cost functionally equivalent alternative to the YIS series.
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Linear Metrology System
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The ZeroTouch® Linear Metrology System is a high-speed, non-contact linear inspection system ideal for measuring linear-shaped parts such as hip stems and aerospace blades faster than traditional methods.
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CMOS USB3 Cameras
CELERA One Series
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CELERA One camera series provide the same excellence in quality, flexibility and performances of CELERA cameras, with the only exception of a single USB3 interface, while keeping the original extremely reduced dimensions and rugged design that make CELERA One cameras suitable for most applications: automated optical inspection, high performance sorting systems, industrial metrology, microscopy, medical diagnostics and machine vision.
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Product
Reticle Manufacturing
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An error-free reticle (also known as a photomask or mask) represents a critical element in achieving high semiconductor device yields, since reticle defects or pattern placement errors can be replicated in many die on production wafers. Reticles are built upon blanks: substrates of quartz deposited with absorber films. KLA’s portfolio of reticle inspection, metrology and data analytics systems help blank, reticle and IC manufacturers identify reticle defects and pattern placement errors, thereby reducing yield risk.
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Product
Thermal Warpage Metrology Tool
AXP 2.0
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The TherMoiré® AXP 2.0 is a modular metrology solution that utilizes the shadow moiré measurement technique, combined with automated phase-stepping, to characterize out-of-plane displacement for samples up to 400 mm x 400 mm. With time-temperature profiling capability, the TherMoiré® AXP 2.0 captures a complete history of a sample’s behavior during a user-defined thermal profile.
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Product
High Precision Angular Positioning Calibration and Geometry Inspection
LabStandard
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Rotary Precision Instruments UK Ltd
Ultra precise rotary tables intended for fine inspection, metrology and test applications.Designed for horizontal and vertical applications with self-locking worm gearing and a high accuracy angular encoder ensures sensitivity and fine positioning for metrology and precision testing.
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Product
Ultrastable Microwaves
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Ultra-stable microwave sources are paramount for a broad range of applications, including precision metrology, deep space navigation, telecom and next generation wireless communication, as well as coherent radar. With the PMWG-1500 Menlo Systems offers a unique commercial solution for providing ultrastable microwaves in an all-in-one solution.
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Product
Digital Torque Meter Torsion Tester
HN-1E~20E
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Shenzhen Chuangxin Instruments Co., Ltd.
Digital Torque Meter is an intelligent metrologic instrument, which is designed for various torque test and calibration. It's mainly used for electic/manual torque drive, torque screwdrivers, bolt driver, tension wrench and other testers and products which refer to tightening force. It is widely applied in these industries, such as electrical manufacturing, machine manufacturing, car light industry, professional research and tests, and so on.
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3MS Automatic Measuring System
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With the accelerating of modern meteorology, various ground automatic weather stations have been widely applied. As a result, the need for metrological verification is soaring. However, the existing metrological verification standards, equipment and methods are barely enough to meet the current growing requirements. So systemizing metrological verification management and automating the detection will be the vital factor to solve the problem.
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Monolithic Laser Combiners & Precision Optics
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For more than 40 years, our vertically integrated in-house production teams have relied on collaborative interdisciplinary processes to drive product performance and manufacturability. And we back up everything we do with industry-leading metrology to ensure that the building blocks of our technology – fabrication, coating, and assembly – permanently align to your exacting specifications to deliver consistent, shipment-to-shipment product performance, even in the most demanding environments.
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Product
PANELMAP
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PANELMAP is a software package used to collect, edit, analyze and visualize measured physical parameters on rectangular semiconductor panels. PANELMAP can import data files from various metrology tools such as ellipsometers, thickness gauges and four point probes. The imported data can then be visualized or printed as line scans, contour plots, 2D or 3D plots or as a histogram.
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Product
Portable optical DO meter
ARO-PR
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The Portable optical DO meter makes use of the fast-response optical DO sensor RINKO, maintaining its high-speed response performance (99% response < 7sec). The meter probe is equipped with a temperature sensor close to the sensing foil, and the measurements are made by simply inserting the probe into a DO sample bottle (the calibration is carried out using the National Metrology Institute of Japan (NMIJ) certified traceable gases standards). Differently from galvanic electrode sensors, the instrument does not require water sample stirring or fixing reagents, since there is no oxygen consumption. Thus, the required time to estimate dissolved oxygen is considerably reduced. The display unit shows the output instantaneously, and you can check the measured values in real time.
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Product
Meter Test Equipment
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Signals & Systems India Private Limited
Our meter test equipment is a user-friendly and innovative device for energy meter calibration, built on the current technologies – Bluetooth & Android. The metrology sub-unit measures and communicates the parameters to an Android Tab via Bluetooth. All user interfaces – textual, graphical, and data entry are made available on the Android application, with innovative features. Being a portable device measuring the voltages and currents from the metering panel, the product ensures the safety of the test personnel by making use of wireless communication between the equipment – which is connected to the High Voltage- and the user interface – Tab.
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Product
Micrometers
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Is a device incorporating a calibrated screw widely used for accurate measurement of components in mechanical engineering and machining as well as most mechanical trades, along with other metrological instruments such as dial, vernier, and digital calipers.
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Product
100-Amp Current Calibrator And AC/DC Transconductance Amplifier
2555A
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World’s Leading Precision 100-Amp AC/DC Current Standard - For 30 years Valhalla Scientific’s design has proven rock-solid reliability in metrology labs worldwide. The 2555A is a calibration powerhouse with wide-ranging applications and unsurpassed quality.
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Product
Wavefront Measurement Systems Using the Shack-Hartmann Sensor
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Lumetrics has applied the ingenious Shack-Hartmann sensor to a range of wavefront measurement systems ideal for analyzing optics-related products and materials, from contact lenses to intraocular lenses to laser beam analysis, surface measurement, and phase parameters. While Shack-Hartmann technology may be widely adopted in the wavefront metrology industry, Lumetrics has applied the technology in unique ways and added industry-leading hardware and software features to our systems that offer you significant advantages over our competitors.
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Floor-Standing 3D Optical Profilometers
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High-precision, non-contact metrology systems designed for rapid, automated, large-area surface characterization in industrial and R&D settings.
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Product
Inspection System
Pixie
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3-D Metrology for automation. Pixie is a standard system for automated optical quality inspection. Pixie can be configured with 2 to 5 servo driven axis movement and the high-speed measurement capabilities make it suitable for inline and stand-alone solutions.
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Product
Express Analyzer
MAYA Express
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Lyncis Express Analyzer was developed to answer the need for fast and reliable material chemical composition analysis. The application is valued by the clients where modern agile manufacturing metrology being applied and quick assessment of material is necessary to adjust critical process parameters without waiting on the lab results.
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Optical Gaging Products
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Quality Vision International Inc.
OGP® pioneered multisensor measurement with vision, touch probe and laser sensors. For over 75 years, OGP has consistently led with a succession of innovative systems and sensors to tackle the most difficult measurement challenges, especially as it pertains to the medical industry. Multisensor metrology is a preferred quality control technology for manufacturers to develop, maintain, and improve the quality of medical devices.
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Product
G3 System
Dragonfly
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Unique 2D imaging technology provides fast, reliable inspection for sub-micron defects to meet today's R&D needs and tomorrow's production demands. Onto Innovation's patented Truebump® Technology combines multiple 3D metrology techniques to deliver accurate 100% bump height metrology and coplanarity.
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Product
Pulser Sensor, Sent Signal, CNEX/ATEX Certificates
SK-S
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Beijing SANKI Petroleum Technology Co., Ltd.
*convert the mechanical transmission signal of flow meter into electrical pulse signal* send the electrical pulse signal to main-board to realize the metrology function of the flow meter
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Product
Bottle Cap Torque Meter
HN-B
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Shenzhen Chuangxin Instruments Co., Ltd.
HN-B Series Cap Torque Meter is an intelligent metrologic instrument and is designed for detecting and calibrating the torsion of various caps. Installation of clamps is easy, rapid and its max diameter can reach 200mm.You can connect it to PC by USD output and transmit data for analysis and printing.
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Product
Line-Scan USB3 Cameras
NECTA Series
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NECTA cameras provide unrivaled scan speed and quick system integration.Ultra-fast acquisition rate, extremely reduced dimensions and rugged design make NECTA cameras suitable for the most demanding applications requiring automated visual inspection, industrial metrology, high performance sorting, spectrometry, and machine vision.
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Product
Horizontal Calibration Instruments (Lab)
Labconcept Nano
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The Labconcept Nano is a new reference in the field of dimensional metrology. It integrates 40 years of knowledge and continuous improvement. It is a remarkable instrument for all measuring tasks that require extremely high accuracy.
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Product
Dimensional Metrology
Stand-Alone Metrology Family
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Nova’s stand-alone metrology platforms are utilized to characterize critical dimensions such as width, shape and profile with high precision and accuracy and are used in multiple areas of the fab such as photolithography, etch, CMP and deposition in the most advanced technology nodes, across all semiconductor leading customers.
