CAT IV
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Product
2 Channel IV Analyzer / Source Monitor Unit
E5263A
Source Measure Unit
Keysight E5262A and E5263A 2ch IV Analyzers are the low cost solution for current-voltage characterization. The E5262A and E5263A support two channels of SMUs (Source/Monitor Units) for voltage/current sourcing and voltage/current measurement with the best in the class current measurement performance as low as 5 pA. The Easy EXPERT group+ GUI based characterization software is furnished and available on your PC to support all the tasks required in the characterization from the measurement setup to the data analysis. Powerful integration of SMU's versatile measurement capabilities and GUI based characterization software makes the E5262A and E5263A the best solutions for characterization and evaluation of two or three terminal devices such as materials and active/passive components with uncompromised measurement reliability and efficiency.
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Product
Solar Array IV Curve Simulation Softpanel
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Chroma Systems Solutions, Inc.
Easily program the I-V curve of the Solar Array Simulator with this test software as well as the I-V and P-V curves for real-time testing. See both dynamic and static MPPT efficiency and even simulate the IV Curve with shadows. The real world weather simulation function allows the user to simulate the irradiation intensity and temperature level from early morning to nightfall.
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Product
Automated I-V/AOI/EL and Sorting System
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OAI’s High Performance In-line Automated-I-V Testing, AOI/EL Inspection and Sorting/Binning System for Various Si Solar Cells. The 10000A-I-V System is a unique and reliable I-V testing, AOI/EL Inspection and Sorting / Binning system for testing of Mono, Multi-Si, C-HJT and other full Size (156mm x 156mm) and/or Cut-cell (156mm x 39mm or 156mm x 31.2mm or other custom sizes) Si Solar Cells.
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Product
Industrial Cat. NB1/Cat. M1 Wireless I/O Module
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NB-IoT is a new wireless I/O communication technology with low power consumption for wide area networks.
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Product
PV Analyzer I-V Curve Tracers
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The Solmetric line of PV Analyzer I-V curve tracers are widely used in Commissioning, Auditing, O&M, and Troubleshooting of PV systems.
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Product
LTE US Version - 4G, Cat.1, GNSS Tracker
Wio LTE
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Wio Tracker (Wireless Input Output) is an open source gateway which enable faster IoT GPS solutions. It is Arduino and Grove compatible development boards that helps you track nearly any moving thing on the planet and then upload that data wirelessly. The Wio LTE is the LTE version of Wio Tracker, so now we’ve got 2 versions of Wio Tracker and the LTE (4G) version will make some differences.
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Product
Solar Panel IV Tester
REOO GIV-20A2616
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REOO GIV-20A2616 Solar Panel IV Tester is designed for PV module manufacturing electrical inspection, enabling electrical performance verification and stable output measurement during production. Built for solar factories, it supports reliable module grading.
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Product
1500V 15A I-V Curve Tracer
I-V525w
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I-V525w allows field detection of I-V Curve an of the main characteristic parameters both of a single module and of strings of modules for PV installations up to a maximum of 1500V and 10A or 1000V and 15A. For measuring I-V Curve, I-V525w manages an internal database of the modules, which can be updated at any time by the user and comparison between the measured data with the rated values allows immediately evaluating whether the string or the module fulfills the efficiency parameters declared by the manufacturer.
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Product
IV Curve Tracer
IVCT
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In recent years, we have been developing a sophisticated IV curve tracer for PV modules including a maximum power point tracking (MPPT) function. The IV curve tracer is designed for operation with any market-available steady-state solar simulator. Through our web-based software design, the operator can supervise the test results from every computer in a company network. The software contains functions such as an irradiation sum counter that helps to check requirements stated in a stabilization test like they are defined in IEC 61215 (MQT 19). We have also included a correction function to correct the traced IV curves to standard test conditions (STC) when the user enters the required temperature coefficients. One of the most important features is the multi-IV curve tracing function, which enables the user to display more than 150 IV curves in one graph. This eases the analysis of the weakest cells in hot-spot tests, which are required in IEC 61730 (MST 22) and IEC 61215 (MQT 09).
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Product
Single Long Pulse Solar Simulator & I-V Test System
TriSOL SLPSS
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The OAI Test System for HIGH EFFICIENCY SOLAR CELLS overcomes the limitations of flash testing by providing a highly optimized pulse width and voltage sweep rate to match the cell’s dielectric response speed. As a result, the system produces extremely accurate measurements of solar cell efficiency leading to increased profitability.
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Product
IV Characteristics Measurement Device [
PECK2400-N
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Easy-to-use measurement software supports IV measurement (software + source meter + connection cable). Compatible with Windows 10. RS-232C connection (PC is optional). Works with NI GPIB. Simultaneous use with IPCE PEC-S20 D type is possible. There is only one operation panel. done on one screen.
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Product
Light I-V Testing for Solar Cells
FCT-650
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Advanced analysis of solar cells including light I-V and Suns-Voc data.
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Product
I-V Curve Measurement
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Our I-V curve analysers reliably deliver precise data – from laboratory equipment to fully automated test benches.
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Product
Solar Cell PL/EL/IV 3-in-1 Testing System
VS6841
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Industrial Vision Technology Pte Ltd.
This luminescence Analyzer integrates a Photoluminescence (PL), Electroluminescence (EL) , and I-V Measurement Technology, has a Device’s PL image, EL image, as well Device’s I-V characteristics in One system. It is being using to quantitatively map Minority-Carrier Lifetime, and to characterize the defect of silicon wafer & solar wafer, and measure the key parameters from solar cell I-V Curve. It is also a useful tool for scientist to develop other methodology & parameters that can be used as a promising technique for online material monitoring and process control.
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Product
IV Characteristics Measurement Device Software
Keithley 2400, 2401 and Keithley 2450
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*Windows 10, Windows 11 (Compatible) RS-232C (Keithley 2400, 2401), USB (Keithley 2450)*NI GPIB can also be used (optional)*IPCE PEC-S02 can be used simultaneously. operation panel. *Everything from condition setting to measurement can be done on one screen.
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Product
CAT III Digital Multimeter
82600
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Measures AC/DC voltage/current up to 600V and 10A, capacitance, diode, duty cycle, frequency, resistance, temperature and transistor. Includes 13 Functions and an operating temperature range between -40° to 1000°C. Features manual or auto shutdown after 15 minutes of inactivity, protection against overload at all ranges, data hold, low battery indicator and warning alarm. Also includes a LED flashlight for low light situations. Rubber outer case adds protection against drops and a stand bracket to hold meter at viewing angle and test probe holding clips.
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Product
1500V 15A I-V Curve Tracer
I-V500w
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I-V500w allows field detection of I-V Curve an of the main characteristic parameters both of a single module and of strings of modules for PV installations up to a maximum of 1500V and 10A or 1000V and 15A. For measuring I-V Curve, I-V500w manages an internal database of the modules, which can be updated at any time by the user and comparison between the measured data with the rated values allows immediately evaluating whether the string or the module fulfills the efficiency parameters declared by the manufacturer.
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Product
IV Tester System
PET-CC
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Application ■Mono crystalline silicon (Si) ■Multi crystalline silicon (mc-Si) ■Amorphous silicon (a-Si) ■Gallium arsenide (GaAs) ■Gallium indium arsenide (GaInAs)
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Product
IV Curve Tracer For High-Capacity PV Strings
PVPM1540X
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The PVPM1540X I-V curve tracer from PV-Engineering is a portable peak power measuring device for photovoltaic strings and arrays up to 1500 V / 40 A.
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Product
Pulsed IV
AURIGA 4850
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Pulsed IV (current-voltage) measurements have emerged as the preferred method of capturing current-voltage characteristics of active devices such as field effect (FETs) and bipolar junction (BJTs) transistors.
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Product
Flat Field and Imaging Gratings - Type IV
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HORIBA Scientific produces a wide range of holographic master gratings from which high precision replicas are manufactured.Type IV aberration-corrected flat field and imaging gratings are designed to focus a spectrum onto a plane surface, making them ideal for use with linear or 2-D array detectors.These gratings are produced with grooves that are neither equis-paced nor parallel, and are computer optimized to form near-perfect images of the entrance slit on the detector plane.
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Product
Quick I/V Measurement Software For PXIe SMU
PX0109A
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The PX0109A is an essential and powerful software tool to control the PXIe Precision SMU which makes it easy to quickly setup and perform current-voltage (IV) measurements and to display the measurement data in tables and graphs without the need to program.
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Product
Solar Cell I-V Characterization System
VS6825
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Industrial Vision Technology Pte Ltd.
The VS-6825A I-V test system is tailored for high-efficiency Solar cell production lines. It is able to eliminate the impact of HJT/IBC/TOPCON’s high capacitance characteristics on measurement results.
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Product
Light I-V Testing for Modules
FMT-500
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Advanced analysis of solar modules including light I-V and Suns-Voc data. Capability to accurately measure high-efficiency modules.
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Product
CB-37F-HVD, 37-pin ScrewTerminal Blk, UL rec.150V CAT II, Din Rail
779491-01
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37-Pin Female D-SUB to 37-Pin Female Screw Terminal, High Voltage Horizontal DIN Rail Terminal Block - The CB-37F-HVD features screw terminal connectivity for up to 37 I/O signals, 12 to 30 AWG. It has a female 37-pin D-SUB connector for connectivity to C Series I/O Modules and … data acquisition devices. The CB-37F-VHD is UL recognized. You can use the CB-37F-VHD with low-voltage or high-voltage products up to 150 V.
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Product
OPV/DSC/Perovskite IV measurement System
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King Design Industrial Co., Ltd.
The system can measurement the 3rd generation of solar cell IV performance. The system patent with eliminate capacity effect that can ensure the test repeatability coincidence.
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Product
Monochromator Gratings - Type IV
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HORIBA Scientific produces a wide range of holographic master gratings from which high precision replicas are manufactured.Using Type IV aberration-corrected monochromator gratings, a single concave grating disperses, collimates, and refocuses the light from the entrance slit onto the exit slit. Wavelength scanning is obtained through a simple rotation of the grating.The groove spacing of these gratings is computer-optimized to produce high quality images with a minimum of astigmatism and coma, even at large numerical apertures. Compared with Czerny-Turner monochromators (equipped with one plane grating, one collimating mirror and one focusing mirror), Type IV aberration-corrected monochromator gratings provide much better light collection efficiency and signal-to-noise ratio.
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Product
Precision I/V Source
MeasureReady™ 155
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The MeasureReady™ 155 Precision I/V source combines premium performance with unprecedented simplicity for materials scientists and engineers requiring a precise source of current and voltage. Low RMS noise: from 200 nV (10 mV)/7 pA (1 µA). Bipolar, 4-quadrant power source. DC and AC modes supported up to 100 kHz*. Full scale ranges from 10 mV to 100 V (1 μA to 100 mA). 0.001% programming resolution (from 100 nV/10 pA.
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Product
High Throughput 1 ns Pulsed IV Memory Test Solution
NX5730A
Test Platform
Precise and fast characterization of new memory, such as spin transfer torque magneto resistive random access memory (STT-MRAM) from DC to high-speed pulsed IV measurement on silicon wafers Apply accurate and high-speed pulsed voltages (down to 1 ns pulse) to magnetic tunnel junction (MTJ) for STT-MRAM and precisely measure the resistance of MTJ Perform all typical MTJ characterization tests in one solution10 to 100 times faster cycle test, such as a bit error rate test (BERT)Capture and visualize MTJ switching waveforms clearly during the writing pulse Dedicated solution with Keysight Technologies’ technical expertise
