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Failure
See Also: Destructive
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DGN Advanced Reporting Feature, GTE 10.00p
K8223A
The Basic Diagnostics levels is the main troubleshooting tool used by all users to check the hardware configuration, and verify and isolate hardware failures. Some Diagnostic tests require that a Pin Verification Fixture be installed on the system.
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Remote Antenna Switch
RATPak System
This switch is designed to give you reliable performance even at veryhigh power and SWR levels. This indeed should be the last antennaswitch you should have to purchase. It is also designed so that in caseof a failure of a relay or other device, it can be easily disassembled and repaired. This is not the least expensive switch on the market but we believe you will appreciate the quality that went into its design.
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Backend Test For Packaging Devices
Power MOSFETs need a lot of different tests. We understand backend test, and have over 80% of our installations used in this application, operational 24hrs every day delivering fully tested and QA approved products at throughput rates up to 20kuph. Backend test, for power devices in particular, has a diverse, but well-established list of technical demands to detect both failures and failure mechanisms.
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Advanced Thermal Imaging Camera
FLIR E96
The FLIR E96 is our first pistol-grip camera with 640 × 480 thermal resolution so inspectors can survey high-voltage, hazardous targets safely and quickly diagnose electrical and mechanical failures. Interchangeable AutoCal™ lenses offer complete coverage of near and distant targets, with the laser distance meter ensuring the crisp focus needed for accurate temperature measurement. The onboard FLIR Inspection Route runs pre-planned routes to help inspectors stay organized when surveying large or multiple locations. FLIR Ignite provides automatic uploading of E96 images directly from the camera to the cloud for easy, secure storage and sharing.
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kSA Emissometer
The kSA Emissometer is designed to quickly and easily generate high-resolution diffuse and specular reflectance and total emissivity maps of MOCVD carriers. Carrier emissivity variation means temperature non-uniformity, which can lead to reduced device yield and possibly complete growth run failure. With the kSA Emissometer, emissivity changes can be tracked to determine carrier end-of-life, without wasting growth runs. The kSA Emissometer also detects unwanted residual deposits after baking, and easily identifies carrier surface defects, scratches, microcracks and pits that are not visible to the eye.
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IPMI Card
AX93338
IPMI specification is an Intel® lead standard. The AX93338 follows IPMI 2.0 spec. System administrators can remotely monitor system health and manage the system using Web page or KVM. The AX93338 operates independently operating system allowing administrators to manage system remotely even the device failure.
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E-DRIV® Brushless Electric Screwdrivers
HF-Series
The brushless electric torque screwdriver is built for precision torque control. The electric screwdriver ensures quality and reduces overall assembly failures. These durable power tools feature a Swiss Maxon brushless motor design, which reduces the common maintenance costs associated brush type electric screwdrivers. With almost no expendable parts and simple design, the brushless screwdriver life cycle is extended and maintains a clean working environment. The screwdriver requires less maintenance and part replacement and provides consistently reliable performance. Using a quality brushless electric screwdriver makes a safer world through accuracy and precision.
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Data Reduction
Data reduction systems with or without time history recording to throughput disc are frequently used in critical aerospace testing applications where complete measurements of a high number of channels are required for post-test and possible failure analysis. The m+p VibControl data reduction system configurations are tailored to the specific needs of high-performance measurement applications requiring hundreds or thousands of input channels.
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Leakage Current Monitor
LCM500
The Doble LCM500 Leakage Current Monitor can measure condition while a surge arrester is still in service, measuring the quality of the metal oxide blocks and helping manage the risk of failure.
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Failure Analysis
A partial list of our state of the art test equipment, applicable to these testing disciplines, will include the following: Two Scanning Electron Microscopes with EDS (SEM/EDS) Three Differential Scanning Calorimeters (DSC) Three Thermogravimetric Analyzers (TGA) Three Thermo Mechanical Analyzers (TMA) One Dynamic Mechanical Analyzer (DMA) Two Real-Time Fluoroscopic X-ray Systems, including a Microfocus System One Fourier Transform Infrared Microscope (FTIR) (capable of identifying a single particle of an unknown material) Two Ion Chromatographs (IC) (capable of identifying ionic impurities in ppm)
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Scanning Acoustic Microscope
Pulse2
This industry-leading scanning acoustic microscope provides a universal inspection tool for packaged semiconductor development, production and failure analysis. With the ability to detect air defects as thin 0.05 micron and spatially resolve defects down to 10 microns, the ECHO is perfect for bump detection, stacked die (3D packaging) inspection, complex flip chip inspection and more traditional plastic packages.
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Tower Light Monitor
1750-TLM
Designed with the Broadcaster in mind the 1750-TLM provides built in flexibility to simplify even the most complicated installations. It can even alarm for single bulb failures on towers with Beacons and Obstruction lights on a single circuit. Status oututs eliminate the worry of operator interpretation and provide definitive Good-Bad indications for the operator and your logging equipment. Don’t let tower light failures expose you to increased liability, the 1750-TLM is compatible with most existing control equipment and may well provide your best return on investment this year!
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Current Differential and Overcurrent Relay
SEL-387
Schweitzer Engineering Laboratories, Inc.
Protect and control any two-, three-, or four-winding power transformer with the SEL-387, which provides thermal and through-fault monitoring, and with SELogic Control Equations, can detect breaker failure.
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IC/BGA Tester
Focus-2005
As a screening checker to detect defective devices(mainly electrostatic destruction)which are returned from fields before failure analysis process of IC/LC in the quality assurance division of semiconductor manufacture.As a screening checker to detect defective devices before acceptance inspection by IC/LSI expensive tester at semiconductor company(trading, manufacture)Short/Open checker for semiconductor sensor device.It is possible to measure two kinds of measurements which are constant voltage biased current measurement and constant current biased voltage measurement. User can set the threshold of 10 ranks. （auto measurement）Only device can be measured. It is also possible to fabricate the test fixture.Various devices can be measured by replacing the socket board.It is no need to generate complex test programs as reference values are calculated from good device.It can be expanded by adding multiplexer boards which are 128pins per one board.(MAX 2048pins)
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Industrial Automation Solutions
LXinstruments FCT systems for industrial electronics assemblies are particularly suited for applications with a large variant diversity for medium volume sizes. They are used for testing utility electronics as well as for drive control and grid management systems. We have also implemented systems for functional test, repair and calibration of decentralized PLC I/O assemblies.Since early failures in the field often lead to enormous costs, we not only provide functional test systems, but also burn-in systems for simultaneous testing of many assemblies in a climate chamber. Due to the modular structure of our software, it is possible to establish a logical separation between the definition of the climatic profile to be executed and the actual test sequence, during which the different electrical tests are processed. Connections to HALT/HASS systems can also be established without problems.
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Space-Qualified Products
Teledyne RF & Microwave has a rich history with more than 40 years of space heritage without any in-flight failures. We serve the commercial, scientific, military, and government communities with best-of-breed space solutions. As one of the first companies receiving MIL-PRF-38534 Class K certification, Teledyne earned the space community's trust by commercializing and supporting the industry's most comprehensive line of space-qualified products, from components to solid-state power amplifiers to integrated microwave assemblies.
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Chloride Ion Test Kit for Abrasives
134A
Contamination can build up, particularly if the blast media is recycled several times. Using the Elcometer 134A Chloride Ion Test in the field will accurately identify contamination and prevent costly surface-related failures.
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Battery Pack/Module Test Solution
Regenerative battery energy dischargeEnergy savingEnvironment protectionLow heat generateChannels paralleled for higher currentsCharge / discharge mode (CC, CV, CP) Constant current Constant voltage Constant powerDriving cycle simulationHigh precision measurement accuracyFast current conversionSmooth current without over shootTesting data analysis functionData recovery protection (after power failure)Independent protection of multi-channelBMS data recordingThermal chamber control integration
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Falling Dart Impact Tester
FDI-01
Jinan Leading Instruments Co., Ltd.
FDI-01 Falling Dart Impact Testeris applicable in the impact result and energy measurement of the falling dartfrom a certain height against plastic films and sheets with a thickness less than1mm, whichwould result in 50% tested specimen failure.
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Debugger
Most cores for the embedded market provide access to on-chip debug features via a debug port. TRACE32 tools connect to this to control the core, access the data being processed by the core and provide developers with debugging over the embedded device: start, stop, step control; reading and writing memory and registers; setting breakpoints; tracking values of variables and so on. This means developers can diagnose software failures and memory corruption issues and correct the system to make it perform as expected.
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Inspection Microscope
Z-NIR
The McBain Z-NIR Near Infrared Inspection System is best-in-class for wafer-to-wafer and die-to-die alignment measurement and verification. This unique tool has been sold into many industries with various applications including sub-surface wafer and die inspection for cracks and bond integrity, MEMS, wafer bonding, 3-D chip stacking, failure analysis, process development, tool verification, part characterization, environmental testing and more.
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FTIR Spectrometers
FTIR spectroscopy is used to quickly and definitively identify compounds such as compounded plastics, blends, fillers, paints, rubbers, coatings, resins, and adhesives. It can be applied across all phases of the product lifecycle including design, manufacture, and failure analysis.
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Very High Density Fiber Tap
Flex Tap VHD
Keysight Network Applications and Security
Flex Tap VHD is a modular, very high density fiber tap available, offering up to 36 taps in a 19 inch 1U space, to reduce IT costs while helping ensure availability of security and business critical applications. Network taps (test access points) are a key part of the access layer of a visibility architecture because they are an unobtrusive way to capture monitoring data. They offer comprehensive traffic visibility for network monitoring and security tools that do not introduce points of failure in the network. Ixia has a large variety of network taps on the market today, offering speeds from 1Gbps to 100Gbps, single and multi-mode, as well as different fiber types and support for Cisco bidirectional (BiDi) transceivers.
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Accelerated Product Life Cycle
Delserro Engineering Solutions
Under normal conditions it may take years to gather failure data on the life cycle of new products. Through accelerated life testing the overall time to failure can be reduced to weeks by increasing the frequency of the field loads and by removing insignificant stress components. In addition, life cycle testing on a product can be reduced or accelerated dramatically by increasing the stress levels to higher than normal. Putting a product through Accelerated Life Testing can reduce test time from weeks to days while still achieving satisfactory results saving both time and money.
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Heavy Duty Dynamometers
MD-7500-HD
Today’s Fleet Managers are faced with many challenges – most important of which is maintaining a healthy bottom line. With fuel costs at an all-time high, these challenges have become increasing difficult. Fleets being transitioned from fossil fuels to electric propulsion also face challenges with durability and range to make sure routes can be completed on time each and every day. To help combat these problems and others facing fleet managers today, Mustang Dynamometer offers the MD-7500-HD Series Chassis Dynamometer – which features the most advanced diagnostic capabilities in the industry. The MD-7500-HD is designed to simulate the driving conditions that fleet vehicles encounter on the road every day in a safe and controlled shop floor environment so that critical engine and drivetrain systems can be evaluated to insure vehicles are performing properly and at maximum efficiency. What’s more, the MD-7500-HD offers several levels of testing capabilities in a modular, compact package and with capabilities that can be upgraded in the future as your needs change. Every vehicle in your fleet can now be tested and validated before and after a repair to ensure proper diagnosis and repairs have been performed. In addition to testing repaired vehicles, the MD-7500-HD can be used to test vehicles on a regular basis as a preventative maintenance measure which decreases unexpected breakdowns and allows fleet management to control fuel costs while reducing repair costs. Periodic testing keeps fuel consumption to a minimum and helps technicians identify suspect components before they fail. A proactive approach to Fleet Service can prevent unexpected engine and or drive-train failure which saves organizations thousands of dollars in lost fair revenues. At the heart of the MD-7500-HD is a set of three air-cooled eddy current power absorbers. Each absorber, or brake, can hold up to 600-hp (total power of 1,800-hp) – more than enough to simulate a fully loaded transit bus. As the systems PAU’s (brakes) are air-cooled, no water is required to or from the device – eliminating the high cost of water consumption and/or the cost of an expensive water recovery system – which can sometimes exceed the cost of the dynamometer system itself. Mustang is the only company that offers a Universal Fleet Test Bed without water supply requirements. AC Motors can be added to simulate regeneration and validate range for organizations that have transitioned to carbon free electric propulsion. The 7500 is the best solution for fleet managers looking to improve their bottom line and offer disruption-free public transportation.
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SuperHeater Overheat Protection
SHOP
The SuperHeater Overheat Protection (SHOP) system is a proprietary technology that helps mitigate the risk of superheater tube failure due to short-term overheat during boiler start-ups. SHOP assists operators in the management of boiler start-ups by enabling the detection of superheater tube clear events (TCE’s).
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Predictive Vibration Monitor Solutions
VMU
Vibration Monitor Units (VMUs) from Astronics employ proven vibration analysis to predict the failure of fans and other rotating equipment on passenger and cargo aircraft. Accurate prediction allows maintenance to intervene before a failure can occur, eliminating the resulting smoke or smoke smell event that can result in costly flight delays, diversions, emergency landings, or cancellations.
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Radar solution for structural integrity in underground mining
OndoSense radar sensors help prevent structural failure in mines by continuously monitoring, for example, deformations and stresses in the tunnel structure. The highly precise, reliable sensors detect even the smallest structural changes with an accuracy of up to 20 μm.
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Scanning Electron Microscope (SEM)
Prisma E
Prisma E scanning electron microscope (SEM) combines a wide array of imaging and analytical modalities with new advanced automation to offer the most complete solution of any instrument in its class. It is ideal for industrial R&D, quality control, and failure analysis applications that require high resolution, sample flexibility and an easy-to-use operator interface. Prisma E succeeds the highly successful Quanta SEM.
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Solid-State Drives
With standard SATA interface (7+15 pin connector). It delivers extremely high performance up to 520MB/S read and 440MB/S write through the SATAIII 6.0Gbps interface Half Slim SATA SSD positioned at bigger capacity solution with supporting extended operating temperature, Power Failure Protection and Secure Erase, could satisfy the high-performance and special functions requirements from the compact space design applications in embedded systems, industrial and military field.Make An Inquiry
