Process Controllers
See Also: Process Control
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Product
Photometric converter
HC 4000
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Dedicated to optek turbidity sensors the HC4000 provides high precision signal processing combined with flexible configuration of the measurement setup. Several scales, like FTU or EBC can be selected to display the photometric signal in common units with product and process control.
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Product
PCI Express PMC Carrier
TPCE260
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The TPCE260 is a standard height PCI Express Revision 1.1 compatible module that provides one slot for a single-width PMC module used to build modular, flexible and cost effective I/O solutions for all kinds of applications like process control, medical systems, telecommunication and traffic control.
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Product
Trend Tracker Software
Data Collection
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Electronic Systems of Wisconsin, Inc.
ESW recognizes that our test systems provide vital information our customers need to control and understand their process. We have developed our Trend Tracker Software to aid customers with total process control of their line. This software is designed to use information that the tester is gathering on every part tested. Information from all parts tested are stored by part number or other designator. Trend Tracker screens are simple and easy to navigate using drop down menus for each test to select the desired test data to view on the graphs. Once a test is selected, the Test Readings Graph and Histogram are updated automatically. These graphs show a graphic representation of the readings obtained for the selected test.
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Product
Camera Endpoint Monitor based on Real Time Laser Interferometry
LEM Series
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Our Real Time Interferometric Process Monitor provides high precision detection of film thickness and trench depth during the etching/deposition process.Depending on applications, LEM camera includes a 670 or 905 or 980 nm laser and when mounted on any dry etch/deposition process chamber with a direct top view of the wafer this generates a small laser spot on the sample surface.Interference occurs when monochromatic light hits the sample surface, resulting in different optical path lengths due to film thickness and height variations in the film.This allows the etch/deposition rate and thus thickness to be monitored in real time, also fringes counting or more complex analysis, providing enhanced process control Endpoint for a wide variety of processes. Additionally interfaces can be detected by their change in reflectivity.
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Product
Game And Profile Measurement Systems
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MFF markets Gap and Profile measurement systems. From the innovative GapGun Edge Break that uses a portable laser measurement system to bring precision to the shop floor, to the Gap Gun Pro that represents the simplest yet most technologically advanced and reliable thing that can arise from a development matured through years of daily use in the process control phases.
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Product
Panel PCs
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The Senses panel PC range is our own brand of entry-level to high performance panel PCs. These systems provide affordable and reliable quality flat panel PCs and are used in Human Machine Interface (HMI), SCADA, process control, factory automation, building control and home automation applications.
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Product
System
SpecMetrix
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SpecMetrix systems by Sensory Analytics were designed from the ground up to precisely measure the absolute thickness of just about any coating on any substrate. All our systems are flexible for use in virtually any manufacturing environment. They provide coating thickness data of unprecedented accuracy—helping manufacturers reduce costs by optimizing coating process control and product quality. Our systems are easily configured to measure webs, coils, flat sheets, small samples or finished parts.
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Product
Elemental Analyzers
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Bruker manufactures instruments for elemental analysis from 100% down to the sub-ppb trace level. Easy-to-use solution packages help customers in process and quality control to meet industry norms and standards including ASTM, DIN, ISO and FDA. Highest analytical accuracy and precision enable academic research from lab to field.
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Product
Stylus Profilers
Dektak
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Bruker's Dektak® stylus profilometers are the culmination of over five decades of proprietary technology advances. They provide repeatable, reliable, and accurate measurements — from traditional step height measurements and 2D roughness surface characterization to advanced 3D mapping and film stress analyses. With over 10,000 systems installed around the world, Dektak surface profilers have been widely accepted as the gold standard for measuring thin film thickness, stress, surface roughness and form in diverse applications areas from academic research to semiconductor process control.
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Product
Meters For Contact Angle And Surface Tension + Semiconductor Technology, Micro Scriber
SURFTENS HL Automatic
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Optik Elektronik Gerätetechnik GmbH
Fully automatic contact angle meter for silicon wafers up to 12 inch The contact angle measuring system SURFTENS HL automatic is designed for use in semiconductor industry and research, in particular for process control of wafer coating and in the photolithographic process.
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Product
Conventional Extractive System
ML660
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The Teledyne ML®660 conventional extractive system is designed to extract and condition hot, wet stack gas for a dry basis measurement of any combination of SO2, NOx, CO, CO2, and O2. This system can be configured specifically for 40CFR60, 40CFR63, 40CFR75 compliance, and process control applications.
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Product
Inline Wafer Testing
IL-800
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Pre-process elimination of low-quality wafers using measured lifetime, trapping, and resistivity. Process control and optimization at dopant diffusion and nitride deposition steps.
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Product
Ultra Fast Line Sensors
µsprint
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With an unparalleled scanning rate, the µsprint sensors are the ideal tool for quality and process control with high throughput rates and precise measurements. As a standalone solution for laboratories, with machine safety enclosure for industrial production environments, or as an OEM solution – the μsprint technology can be inegrated flexibly everywhere.
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Product
Industrial PC
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Get the dependability and precision you need for process control, data acquisition and more with Omron's advanced industrial PC offering.
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Product
PCIe-7842, Virtex-5 LX50 FPGA, 200 kS/s Multifunction Reconfigurable I/O Device
781101-01
Multifunction Reconfigurable I/O
Virtex-5 LX50 FPGA, 200 kS/s Multifunction Reconfigurable I/O Device - The PCIe‑7842 features a user-programmable FPGA for high-performance onboard processing and direct control over I/O signals for complete flexibility of system timing and synchronization. You can customize these devices with the LabVIEW FPGA Module to develop applications requiring precise timing and control such as hardware‑in‑the‑loop testing, custom protocol communication, sensor simulation, and high-speed control. The PCIe‑7842 features a dedicated A/D converter per channel for independent timing and triggering. This design offers specialized functionality such as multirate sampling and individual channel triggering, which are outside the capabilities of typical DAQ hardware.
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Product
PCIe-7846, Kintex-7 160T FPGA, 500 kS/s Multifunction Reconfigurable I/O Device
786456-01
Multifunction Reconfigurable I/O
PCIe, Kintex-7 160T FPGA, 500 kS/s Multifunction Reconfigurable I/O Device - The PCIe-7846 features a user-programmable FPGA for high-performance onboard processing and direct control over I/O signals to ensure complete flexibility of system timing and synchronization. You can customize these devices with the LabVIEW FPGA Module to develop applications requiring precise timing and control such as hardware-in-the-loop testing, custom protocol communication, sensor simulation, and high-speed control. The PCIe-7846 features a dedicated analog-to-digital converter per channel for independent timing and triggering. This device offers specialized functionality such as multirate sampling and individual channel triggering, which are outside the capabilities of typical data acquisition hardware.
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Product
CHOPIN Technologies
Mixolab 2
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The Mixolab 2 automated analyzer is used to measure the rheological characteristics of dough during mixing, as well as the quality of starch and protein to enhance the quality of baked goods and for improved manufacturing process control.
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Product
DFM (Deep and Fast Modulated) generators up to 280 GHz
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Insight Product Company offers DFM (Deep and Fast Modulated) mm-wave sources at frequencies from 30 to 280 GHz. DFM generators are designed to go swiftly from the generation to the non-generation mode and back. This process controlled by the external TTL signal. ON/OFF switch time is approximately 2 nanoseconds.
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Product
Piezo Vacuum Gauge
HVG-2020A
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Gas Composition Independent!The HVG-2020A vacuum gauge from Teledyne Hastings is a media-isolated, gas composition independent, piezoresistive instrument that provides accurate pressure measurement throughout the rough vacuum region.The HVG-2020A is easy to install, and the optional display provides the users with several different views, or modes of operation. The HVG-2020A is very flexible and can provide both analog and digital output to easily integrate into process control. A wide variety of linear analog output signals may be selected. This makes the HVG-2020A an excellent choice to replace more expensive capacitance manometers. Digital output can include RS232 and RS485 via a small jack on the top of the instrument. A USB connection is also available on many models which makes connection and operation very easy. Free Windows data acquisition software for data logging is available for the HVG-2020A.
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Product
Handheld Spectrometer
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United Power Research Technology Corporation
The design concept of UPRtek handheld spectrometer is 『All in One - One in All 』, it is mainly focus on lightweight and intuitive design, you may use it standalone, no computer connection needed and check the measurement data immediately. You can also process wireless control measurement through the application of smart devices. In addition, SD card storage function may help you to use the measurement data freely such like process big data analysis on uSpectrum PC software. UPRtek wishes to provide a handheld spectrometer with high flexibility for different kind of places, different use purposes and different usage scenarios to help you work more efficiently.
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Product
Small Spot Advanced EDXRF Spectrometer
NEX DE VS
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Applied Rigaku Technologies, Inc
Specially designed and engineered for heavy industrial use, whether on the plant floor or in remote field environments, the superior analytical power, flexibility, and ease-of-use of the NEX DE VS adds to its broad appeal for an ever-expanding range of applications, including exploration, research, RoHS inspection, and education, as well as industrial and production monitoring applications. Whether the need is basic quality control (QC) or its more sophisticated variants — such as analytical quality control (AQC), quality assurance (QA) or statistical process control like Six Sigma — the NEX DE VS is the reliable choice for routine elemental analysis.
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Product
Electronic Equipment Testing System
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The task set forth the need to create a special universal software core, the main tasks of which are the provision of measurement and control processes, as well as the interaction of software components intended for collection, visualization, mathematical processing and documenting of data. For each stand, specific program modules were additionally developed according to test methods specific products. The overall modular architecture of the system makes it easy to supplement and correct test algorithms.
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Product
XRF analysis
X-Supreme8000
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XRF analysis (X-ray fluorescence) with the highly flexible and powerful energy-dispersive X-ray fluorescence (EDXRF) spectrometer X-Supreme8000 for quality assurance and process control requirements across a diverse range of industries.
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Product
Contaminometer
Conttest
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Microtronic Microelectronic Vertriebs GmbH
Ionic contaminants can have a major negative impact on the reliability of assemblies. It therefore makes sense to check the assemblies for ionic contamination in the development stage and in the manufacturing process.The devices of the ConTTest series measure ionic pollution in accordance with international standards. The high-precision measuring system was designed to serve as a process control in production and to be used as a laboratory instrument in development and research.
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Product
Color Sensor
AF16-F
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High precision sensor for direct installation into pipelines measuring VIS or NIR light absorption of various liquid samples. Wavelength and optical path length can individually configured to meet the process control requirements with the highest accuracy.
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Product
PXIe-5644, 6 GHz, 80 MHz Bandwidth, RF PXI Vector Signal Transceiver
782376-01
Vector Signal Transceiver
6 GHz, 80 MHz Bandwidth, RF PXI Vector Signal Transceiver—The PXIe‑5644 combines a vector signal generator and vector signal analyzer with FPGA-based real-time signal processing and control into a single device, also known as a VST. Because of this software-designed approach, the PXIe‑5644 features the flexibility of a software defined radio architecture with RF instrument class performance.
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Product
Bi-Directional Differential-TTL I/O PXI Card
GX5641 Series
Digital I/O
The GX5641 is a 3U PXI instrument card that can be used for general data acquisition, process control, Automatic Test Equipment (ATE), functional test, and factory automation applications. The GX5641 consists of 64 bi-directional TTL-differential I/O channels. Each channel has two ports (TTL and differential) which can be individually set to operate in either conversion or static I/O modes.
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Product
PXI-7854, Virtex-5 LX110 FPGA, 750 kS/s PXI Multifunction Reconfigurable I/O Module
780342-01
Multifunction Reconfigurable I/O
Virtex-5 LX110 FPGA, 750 kS/s PXI Multifunction Reconfigurable I/O Module—The PXI‑7854 features a user-programmable FPGA for high-performance onboard processing and direct control over I/O signals to ensure complete flexibility of system timing and synchronization. You can customize these devices with the LabVIEW FPGA Module to develop applications requiring precise timing and control such as hardware‑in‑the‑loop testing, custom protocol communication, sensor simulation, and high-speed control. The PXI‑7854 features a dedicated A/D converter (ADC) per channel for independent timing and triggering. This design offers specialized functionality such as multirate sampling and individual channel triggering, which are outside the capabilities of typical data acquisition hardware.
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Product
Plastic InspectionSystems
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With the plastic inspection systems, you achieve a 100 % inspection rate for your manufactured products, thus ensuring high product quality and lower manufacturing costs. Reacting quickly to faults also reduces the number of rejects. It is possible to provide reliable and objective fault detection that is broken down by the fault types. Because the inspection results are calculated and displayed immediately, they can be used for process control and optimization. Furthermore, a subsequent statistical evaluation of the production process is provided.
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Product
Indicating Instruments
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In continuous level measurement, the filling height in a vessel is repeatedly detected. The measured value is further processed, e.g. as a 4 … 20 mA signal in a PLC or process control system. Indication of the measured value directly on site is also frequently requested.
