Test Connectors
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Product
6TL22 Off-Line Testing Platform
H71002200
Test Platform
Learn about our Build to print service for Test Platforms. The 6TL22 Platform is a perfect base for the conception of a real modular Automatic Test Equipment for low to mid manufacturing volumes.A system designed around the 6TL22 is simple, easy to maintain and cost effective. The rack is prepared for the direct integration of the three platform based receivers from Virginia Panel, the S6, G12 and G12X.
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Product
96-Pin Micro-D Connector Block, Male With Screwlocks
44-965-096-M
Connector Block
This connector block provides a simple method of connecting to high density 96-Pin SCSI Style Micro-D connectors. The screw terminals accept wires up to 20 AWG and use a rising cage screw clamp mechanism to minimize risk of copper strand breakage. The metal shell includes an internal insulation barrier under the carrier board.
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Product
RF-Antenna Communication Links Functional Test
Functional Test
The application encompasses functional tests of very large quantities of automotive antenna amplifiers, plus parallelization of tests by implementing several test stations in a rotary indexing table. The DUTs are inserted manually and after final assembly, they are loaded into the rotary table; this requires manual triggering by the operator.
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Product
Automotive Electronics Functional Test System
TS-5020
Functional Test
The Keysight TS-5020 Automotive Functional Test System is a low cost, scalable test system designed with “just-enough-test” concept for medium complexity electronic control modules, such TPMS, RKE and body electronic modules
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Product
Test Fixture
N1295A
Test Fixture
The Keysight N1295A Device/Component Test Fixture provides a low-cost solution to quickly and easily test packaged devices and components. For more advanced packaged testing needs, the Keysight 16442B Test Fixture provides more capabilities.
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Product
Advanced SoC/Analog Test System
3650
Test System
Chroma 3650 is an SoC tester with high throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses.
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Product
NI's Wireless Connectivity Functional Test Solution
Functional Test
The proliferation of wireless functionality in electronic devices is pressuring test developers to deliver more complex testers within shrinking project schedules. Evolving standards and the integration of multiple wireless technologies into new product designs mean developers must prioritize measurement speed and quality to maintain throughput and yield targets. For a solution to meet these sorts of demands, it must:
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Product
68-Pin SCSI Micro-D Conn Block DIN
40-966-068-F
Connector Block
Suitable for mounting on DIN Rails this connector block provides a simple method of connecting to 68-Pin SCSI Style Micro D connectors. The screw terminals use a rising cage clamp mechanism to minimize risk of copper strand breakage. The metal shell includes an internal insulation barrier under the carrier board.
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Product
37-Pin D-Type Connector Block
92-965-037-F
Connector Block
This connector block provides a simple method of connecting to 37-Pin D-Type connectors. The screw terminals use a rising cage clamp mechanism to minimize risk of copper strand breakage. PTFE cables are recommended for use with this connector block to maximise copper cross-sectional area and insulation properties.
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Product
200-Pin LFH Connector Block, Female
B200LFR-2F-5B
Connector Block
Suitable for use on the front of PXI modules this connector block provides a simple method of connecting to high density 200-Pin LFH connectors. The screw terminals use a rising cage screw clamp mechanism to minimize risk of copper strand breakage. PTFE cables are recommended for use with this connector block to maximise copper cross sectional area and insulation properties.
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Product
Laser Diode Burn-in Reliability Test System
58604
Test System
The Chroma 58604 is a high density, multi-function, and temperature controlled module for laser diode burn-in and lifetime tests. Each module has up to 256 SMU channels which can source current and measure voltage in various control modes as described below.
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Product
25-Pin D-Type Male Right Angled PCB
40-963-025-RM
D-Sub PCB-Mount Connector
Accessory allows a user to create their own PCB based termination solution mounted directly on the front of the product or on the end of a cable. Interfacing PCBs should be designed with suitable clearances for the voltage the application requires. 25-Pin Female connectors can be directly mated to a corresponding Pickering Switching Module while Male versions can be used to interface to a Female cable assembly termination.
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Product
25-Pin D-Type Female Connector Block
92-965-025-F
Connector Block
This connector block provides a simple method of connecting to 25-Pin D-Type connectors. The screw terminals use a rising cage clamp mechanism to minimize risk of copper strand breakage. PTFE cables are recommended for use with this connector block to maximize copper cross-sectional area and insulation properties.
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Product
37-Pin D-Type Male Connector Block
40-965-037-M
Connector Block
Suitable for use on the front of modules this connector block provides a simple method of connecting to 37-Pin D-Type connectors. The screw terminals use a rising cage clamp mechanism to minimize risk of copper strand breakage. When the product is used without a backshell users should make their own cable strain relief arrangements and ensure appropriate electrical safety precautions are observed.
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Product
JTAG Functional Test
JFT
Functional Test
JFT comprises a series of software modules that support boundary-scan test and programming activities under Python, National Instruments LabVIEW and Microsoft .NET framework. Using JFT users can create JTAG/boundary-scan test application scripts, VIs or programs for PCB assemblies and systems that control individual driver/sensor pins, groups of pins declared as variables or register bits. These applications are typically used to test logic devices or mixed signal clusters and can also be transformed into re-usable test 'modules'. Pairing JFT with JTAG CoreCommander emulative test modules gives an effective, low-cost system for performing tests through embedded device peripherals (ADCs, Memory Controllers etc..)
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Product
SMD Array Type LCR Test Fixture
16034H
Test Fixture
The 16034H is designed for impedance evaluations of array-type SMD.The minimum SMD size that this fixture is adapted to evaluate is 1.6(L)x0.8(W)[mm]. Since the tip of the measurement electrodes are very thin and the device holder is extremely flat, the device can be shifted and the measurement electrodes can contact each of the elements of the array-type component.
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Product
EMI Test System
TS9975
Test System
The R&S®TS9975 is the base system for conducted and radiated EMI measurements. Due to its modular design, it covers a wide range of applications and can be very easily adapted to the measurement task at hand. Any configuration is possible – from conducted measurements and the small precompliance system with a compact test cell to the accredited test system for large equipment under test. Combinations of different applications or incremental expansion are easily possible.
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Product
NFC Conformance Test System
T3111S
Test System
The T3111S RIDER NFC Conformance Test System is the Keysight solution for RF Analog and Digital Protocol testing of NFC, EMV and ISO devices. The Test System is based on the Keysight T1141A NFC Test Set and it is complemented by the Keysight's or FIME's robots for accurate and repeatability RF testing. Selected 3rd party positioning robots can also be supported.
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Product
Modular Functional Testing Platform
OTP2
Test Platform
Functional testing is an important part of product development and manufacturing and is used to ensure quality, performance and reliability from launch to end of life. A modern, future-proof functional test system must meet many criteria in order to meet the ever-growing demands of the industry. The OTP 2 open test platform developed by LXinstruments meets the following requirements for a dynamic and highly competitive market.
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Product
SoC Test Systems
Test System
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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Product
Additional Products: 96 Pin 1.27mm Pitch Micro-D Connector Blocks
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The connector blocks below are not compatible with Pickering products, however, are offered for developing a connection solution for use with other products.
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Product
Radio Frequency, Communications, & Navigation Test Systems
Test System
Reduce testing time and costs with the Astronics radio test sets for use in military, avionics, and civil security industries.Available in commercial and military grades, these integrated test systems make it easy to develop test program sets and leverage them securely and instantly across all deployed testers at the factory, depot, and operational levels.
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Product
20-Pin GMCT Male Connector, 16A, Panel Mount, Solder Bucket
40-963-020-16A-M
GMCT Male Connector
The 40-963-020-16A-M connector is designed to allow users to directly terminate a cable with soldered connections. It is supplied with removable solder bucket contacts suitable for wires up to 14 AWG. Included is the screwlocks/fixing screws and male solder bucket contacts.
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Product
Faraday Chamber for RF w/Exchangeable Cassettes 340x350mm RCV 9025 for 6TL36
AN133
Test Fixture
The Faraday Chamber is an add-on for the 6TL36 test handler. This kit is installed into the 6TL36 in the same way a normal test fixture would be installed, being the only difference the fact that different products to be tested will, from that moment on, only need an additional exchangeable cassettes to be tested.
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Product
50-Pin D-Type Female Connector Block
92-965-050-F
Connector Block
This connector block provides a simple method of connecting to 50-Pin D-Type connectors. The screw terminals use a rising cage clamp mechanism to minimize risk of copper strand breakage. PTFE cables are recommended for use with this connector block to maximise copper cross-sectional area and insulation properties.
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Product
200-Pin LFH PCI Connector Block, Male
50-965-200-M
Connector Block
Suitable for use on the front of PCI modules this connector block provides a simple method of connecting to high density 200-Pin LFH connectors. The screw terminals use a rising cage screw clamp mechanism to minimize risk of copper strand breakage. PTFE cables are recommended for use with this connector block to maximise copper cross sectional area and insulation properties.
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Product
37-Pin D-Type Male Solder Pin HV
40-960-037-MHV
D-Sub Male Connector
This connector is designed to allow users to directly terminate cables with soldered connections.
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Product
Functional Test for Engineering Lab
Spectrum BT
Functional Test
Designed to meet the needs of product engineering labs, production lines, test development centers, and repair depots, the Spectrum BT is a configurable and scalable functional test system. This focused system solves typical functional test coverage challenges throughout the defense/aerospace product life cycle—and it’s upgradable as test requirements evolve.
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Product
EOL RF Functional Test
AS652
Test Platform
With this RF test platform, integrable according to the specific needs of the product, we cover a very wide range of test needs with manual feeding.Ergonomics have been fully observed in the design, including the option of servo adjustment of the working height according to the operator.
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Product
Mini In-Circuit Test System
U9403A
In-Circuit Test System
The Keysight Mini ICT is a true in-circuit test unit in the rack that can be used standalone or integrated. It comes with a full set of Keysight ICT test features, from VTEP vectorless test, Cover-Extend Technology, to digital library tests and boundary scan. The unmuxed per-pin programmable digital engine makes test development really flexible and easy, especially in a situation when device conditioning is needed in functional test.
