Push Pull Force
stength necessary to press on and extract.
See Also: Force, Compression, Crimp Force, Pull Force, Pull off Force, Peeling, Tension, Gravity, Electrical, Magnetic
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Product
Force Measurement
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Using state-of-the-art technology, ABB provides purpose built solutions for your force and dimension measurement needs, making it possible for your production output to accurately match the most varying and demanding requirements.
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Product
Atomic Force Microscope
HDM Series
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The task of identifying nanoscale defects is a very time consuming process for engineers working with media and flat substrates. Park NX-HDM is an atomic force microscopy system that speeds up the defect review process by an order of magnitude through automated defect identification, scanning and analysis. Park NX-HDM links directly with a wide range of optical inspection tools, thus significantly increasing the automatic defect review throughput. In addition, Park NX-HDM provides accurate sub-angstrom surface roughness measurements, scan after scan. Park NX-HDM, together with its industry's lowest noise floor, and its unique True Non-Contact™ technology, it is the most accurate AFM for surface roughness measurement in the market.
