X-ray Diffraction
crystalline interference pattern of X-rays to determine atomic and molecular structure of a crystal.
-
Product
A Compact X-ray Inspection System, The MedaScope™ Desktop
-
A compact X-ray machine weighing only 55 pounds, the MedaScope Desktop is easy to carry and can be set up rapidly. Glenbrook’s MedaScope Desktop is a portable, compact manual system for real-time, magnified x-ray screening of packaged devices including medical devices, electronics, and cables.
-
Product
Nano-focus X-ray Inspection System
X-eye NF120
-
Nano-focus Tube of 400 nano resolution is installed which is specialized for Semiconductor Packaging, Wafer Level Packaging(WLP) requiring detection of Sub-micron defects.Able to trace and inspect defected area precisely by precise movement of axis with Anti-vibration table.Tomography is available if 3D CT module is added and Wafer Bump Automatic Inspection is available from loading to inspection with wafer handler systems.
-
Product
Scanning X-Ray Detectors
Shad-o-Scan
-
Shad-o-Scan is a family of scanning X-ray detectors specifically designed for the challenging requirements of high-performance industrial and scientific X-ray applications. Industry-leading TDI CCD performance enables the ultimate sensitivity and highest resolution in the industry, and ensures long detector lifetime in even the harshest radiation environments.
-
Product
X-Ray Inspection System
TruView™ Cube
-
The Perfect Solution for a Powerful Small Form Factor X-ray Inspection System. The all new TruView™ Cube X-Ray Inspection System is a fully motorized radiography system developed to meet the stringent requirements of electronics assembly and component inspection. Ideal for applications where space is premium, the the TruView™ Cube X-Ray sits comfortably on your laboratory bench.
-
Product
Electrodeless Z-Pinch™Soft X-Ray (SXR) Source
EQ-10SXR
-
Is a compact, easy-to-use, reliable and cost-effective SXR light source system, based on Energetiq’s unique Electrodeless Z-pinch™ technology using Nitrogen gas.
-
Product
Electron Backscatter Diffraction (EBSD) Camera
Velocity™
-
high-speed EBSD mapping with the highest indexing performance on real-world materials. Velocity™ EBSD camera combines indexing speeds greater than 3,000 indexed points per second with indexing success rates of 99% or better. At these speeds, the Velocity™ uses 120 x 120 pixel EBSD patterns for improved band detection. This image resolution, combined with proven EDAX triplet indexing routines, provides orientation precision values of less than 0.1°.
-
Product
X-ray Fluorescence
-
XRF analysis – one of the best analytical techniques to perform elemental analysis in all kinds of samples, no matter if liquids, solids or loose powders must be analyzed.
-
Product
X-ray inspection system for BLU, LED Long bar products
X-eye 9000LED
-
X-ray Tube100kV / 200uAMin. Resolution5µmTable Size1,500mm X 500 mmDetectorFlat Panel Detector (High sensitivity)Dimension3,620(W) x 1,065(D) x 1,590(H)mm / 850kg
-
Product
X-ray Fluorescence Measuring Instrument
FISCHERSCOPE® X-RAY XDAL®
-
Universal instrument for automated measuring of thin and very thin layers < 0.05 μm and for material analysis in the ppm range.
-
Product
X-ray Fluorescence Measuring system
FISCHERSCOPE® X-RAY 4000 Series
-
Inline measuring with maximum endurance. Robust inline device for measuring on solid strips, punched grids with measuring structures from a few millimeters up to coated membranes or solid strips up to one meter wide.
-
Product
X-ray Windows
-
X-ray devices have become ubiquitous in the marketplace. The X-ray device market is divided into Portable and Stationary product types. The Market is also divided by technologies like Analog, Computed Radiography (CR) and Digital Radiography (DR). The Digital Radiography market is further segmented into Flat Panel Detectors (FPD) and High Density Line Scan Solid State Detector. The applications include at a minimum; Medical, Non-Destructive Testing, and Security Detection has driven the rapid spread of X-ray instruments including a myriad of handheld devices.
-
Product
X-ray Photoelectron Spectroscopy Analysis (XPS Analysis)
-
Rocky Mountain Laboratories, Inc.
X-ray photoelectron spectroscopy (XPS Analysis) also called Electron Spectroscopy for Chemical Analysis (ESCA) is a chemical surface analysis method. XPS measures the chemical composition of the outermost 100 Å of a sample. Measurements can be made at greater depths by ion sputter etching to remove surface layers.
-
Product
Energy Dispersive X-ray Fluorescence Spectrometer
EDX-7000/8000/8100
-
One EDX over all others The EDX-7000/8000/8100 offers a high level af accuracy and speed in analyzing elements contained in various samples.
-
Product
Imaging X-Ray Photoelectron Spectrometer
AXIS Supra+
-
X-ray photoelectron spectroscopy (XPS) is unique in providing quantitative elemental and chemical state information from the uppermost 10 nm of a materials surface. The AXIS Supra+ (also known as Kratos Ultra 2+ in Japan) is a market leading X-ray photoelectron spectrometer combining state-of-the-art spectroscopic and imaging capabilities with the highest level of automation currently available. Unrivalled large area spectroscopic performance allows photoelectron spectra to be acquired from all types of materials including metals, semi-conductors and insulators. Fast, high spatial resolution XPS imaging reveals the lateral distribution of surface chemistry and aids further characterisation with selected small area analysis.
-
Product
X-ray Fluorescence Measuring Instrument
FISCHERSCOPE® X-RAY XDLM®
-
Universal instrument for inspection of small parts and small structures, measuring of light metals, hard coatings and thin electroplated parts.
-
Product
X5C Compact X-Ray Inspection
-
Designed with packed convenience food, ready meals and small packaged goods in mind, the X5C is LOMA's smallest X-ray system available, with a machine length of 1000 mm and offers excellent Critical Control Point (CCP) protection in the smallest footprint possible - and manufactured under LOMA's Designed to Survive philosophy to provide one of the toughest systems on the market.
-
Product
X-ray Inspection System
RTX-113HV
-
Precision X-ray Inspection for BGAs, QFNs, LEDs, sensors, medical devices, and other packaged devices.
-
Product
High Performance Fluorescent X-ray (XRF) Coating Thickness Gauge
FT150 Series
-
Hitachi High-Technologies Corp.
The FT150 is a high-end fluorescent X-ray coating thickness gauge equipped with the polycapillary X-ray focusing optics and Vortex silicon drift detector. The improved X-ray detection efficiency enables high throughput and high precision measurement. Furthermore, new design to secure wide space around sample position gives exellent operability.
-
Product
Energy Dispersive X-ray Fluorescence (ED-XRF) Spectrometer
XEPOS
-
SPECTRO Analytical Instruments GmbH
The new SPECTRO XEPOS spectrometer represents a quantum leap in energy dispersive X-ray fluorescence technology. It provides breakthrough advances in multi-elemental analysis of major, minor, and trace element concentrations. New developments in excitation and detection deliver outstanding sensitivity and detection limits yielding remarkable gains in precision and accuracy. The amazing SPECTRO XEPOS excels at critical tasks from rapid screening analysis to precise product quality control. Apply it for at-line processing in a variety of industries, for geology and mining, for environmental and waste monitoring, and for research and academia.
-
Product
Constant Potential Generator Metal Ceramic X-Ray Tube 30 to 300 kV
CP300C
-
The CP300C is the first panoramic x-ray generator of the CPSeries product range. Equipped with a metal-ceramic tube, the CP300C is a light (less than 30kg) and powerful generator (300 kV), able to penetrate up to 52mm of steel in 10 minutes, making it the best power-to-weight ratio in the world.The efficiency of the CP300C is also maximum thanks to its real 100% duty cycle that allows longer exposure time (> one hour).A full range of accessories is available (holding bars, tripod…) and even a 60°x40° lead diaphragm to convert the CP300C into a directional unit.
-
Product
Continuous Particulate Monitor with X-ray Fluorescence
PX-375
-
There has been a growing concern regarding particulate matter (PM) pollution and its effects on health. For effective preventative measures, the determination of source PM concentration is extremely important. Therefore, indication of PM and elemental concentrations is critical. The PX-375 analyzer employs automatic sampling, continuous on-line PM quantitative and qualitative analysis for rapid air pollution measurements.
-
Product
Digital Cabinet X-ray System
XPERT 80
-
Kubtec's XPERT 80 brings high quality imaging and ease of use to science and research. The XPERT 80's compact self-contained cabinet, with a high resolution x-ray source, provides the sharpest images for every application. Optional sources are also available for micro-focus and soft x-ray applications.
-
Product
Benchtop Small Angle X-ray Scattering (SAXS) Instrument
NANOPIX mini
-
Non-destructive measurement of particle size and size distribution.Rigaku NANOPIX mini is the world’s first benchtop small angle X-ray scattering (SAXS) system that is engineered to deliver automatic nanoparticle size distribution analysis for both quality control (QC) and research and development (R&D) applications. Nanoparticle size, size distribution, and particle shape are the key pieces of information obtained from SAXS. Samples may range from solutions, suspensions or slurries to solid plastics, rubbers or polymers.
-
Product
X-Ray Inspection System
MXI Quadra 5
-
Quadra™ 5 is the X-ray inspection system of choice for sub micron applications such as PCB and semiconductor package inspection, counterfeit component screening and finished goods quality control.
-
Product
X-ray Fluorescence Measuring System
FISCHERSCOPE X-RAY 5000
-
Inline measuring with highest precision for thin films. Robust XRF instrument for measuring and analyzing thin films and layer systems in the running process with connection to the production control system.
-
Product
X-ray Fluorescence Spectroscopy (XRF) Services
-
Work we''ve done: Coating identification, Measuring lead levels in paint and solder, Elemental comparison of two metal ingots, Restriction of Hazardous Substance (RoHS) testing.
-
Product
Entry-level X-ray Inspection System
X-eye 5100 Series
-
100kV ~ 130kV Micro-focus Closed tube and high-definition Flat Panel Detector are installed and high-resolution image can be gained.Customer convenience is primarily considered in operation and maintenance of the product.Customization is available because it is specially designed to be add up any necessary functions depends on customer needs with reasonable prices.
-
Product
Multi-Channel X-Ray Fluorescence Spectrometer
FACTORY LAB MXF-2400
-
Wavelength Dispersive X-Ray Fluorescence Spectrometer The Shimadzu MXF-2400 is an improved version of the Shimadzu Multi-Channel X-ray fluorescence spectrometer, which has been rated highly in the overseas market as well as in the Japanese market. The latest hardware designed to fully utilize the principle of X-ray fluorescence spectrometry and the data processing unit that uses various software programs to permit automatic management of analysis data combine to provide high analytical productivity both in R&D and production control. Up to 36 elements can be simultaneously determined by the fixed monochrometer and up to 48 elements can be determined sequentially by the optional scanning monochrometer. High analytical precision is provided even in high sensitivity analysis of a few ppm quantity level.
-
Product
Portable X-RAY Fluorescence Measuring System
FISCHERSCOPE® X-RAY XAN® 500
-
Mobile and universal handheld device for precise coating thickness measurement and material analysis - even with difficult material combinations.
-
Product
Real-Time X-Ray Imaging and Variable Pressure Scanning Electron Microscope
-
Trialon has the equipment and experienced staff to operate this highly technical piece of laboratory equipment. Our state-of-the-art materials analysis lab located in Auburn Hills, MI is managed by a Ph.D with over 20 years of hands-on experience in root cause failure analysis of design, material and process for current and future products.
