Highly Accelerated Stress Test
High reliability testing using a destructive high temperature, humidity and pressure enviroment.
See Also: HAST
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Product
6TL10 Table Top Test Base
H71001000
Test Platform
The 6TL-08 base platform was designed to cover the most common testing and in-system programming (ISP) needs with a reduced initial budget. The system includes a robust manual linear push mechanism allowing a low-cost fixture strategy thanks to the exchangeable cassettes.The platform enclosure features an 8-Slot fixture receiver, compatible with VPC 90 Series Mass Interconnect Module, as well as 6TL intelligent YAVModules (YAV90MMU &YAV90059), with room for fast ISP devices, optional PXI chassis and various power supplies. A removable back panel allows easy placement of custom connectors or test auxiliary circuitry.
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Product
Encoder Stress Pattern
ESP™
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SRI's ESP is a sophisticated video clip consisting of specialized and complex artificial test patterns that stress various aspects of processing to quickly reveal television encoder deficiencies. Its unique motion sequences allow users to visually evaluate and objectively compare the quality and performance of standard- and high-definition encoders.
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Product
EMC Actuator for Accelerator Pedal
PSE-G
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Pneumatically operated actuator for operation of accelerator handle. External set-point of the pedal actuator position via analog voltage to closed-loop pressure regulator in external valve box.
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Product
Highly Versatile Component F73306B160G300
1009659
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The F73306B160G300 is a highly versatile component belonging to the family of Basic Threaded Probes, specifically designed for reliable and efficient contact in a variety of applications. With a pitch of 4.00 mm (157 mil), this probe offers a robust solution for both low and high-density connections, ensuring excellent performance across a broad temperature range of -45°C to +100°C. Its compact dimensions enhance usability in tight spaces, making it an ideal choice for modern electronic applications where precision is key.
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Product
LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments
NI-RFmx LTE/LTE-Advanced
Test Instrument
Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism
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Product
Scienlab Battery Test System – Pack Level, 110 KW Compact Version
SL1710A
Test System
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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Product
In-Line 2-Module In-Circuit Test System; i337x, Series 5i
E9988E
In-Circuit Test System
Short wire fixturing eliminates problems commonly found with long wire fixturing, such as noise and deterioration of test stability. This translates into transportable, repeatable and stable tests on your i3070 Series 5i, even if you need to deploy tests halfway across the globe, or on different manufacturing sites.
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Product
Rack based antenna test system
R&S®ATS800R CATR
Test System
Very compact far-field over-the-air (OTA) test system based on compact antenna test range (CATR) technologyUnrivaled quiet zone size within 0.8 m2 footprintState-of-the-art reflector ensuring a high quiet zone accuracyUnique rack based CATR system supporting over 50 GHzIndirect far-field method (approved by 3GPP for 5G OTA testing)
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Product
Linear Accelerators
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The latest interlaced dual-energy technology offers improved material discrimination, with an option to alternate X-ray energies on a pulse-to-pulse basis.
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Product
In-Line RF Test Station
AP770
RF Test System
ICT, Functional, Hipot, Vision, ISP and RF test with low cost fixtures in a very compact test station footprint Works with PCBs up to 450×550 mm or with palletized devices Space for up to 25 VPC mass interconnect modules or YAV switching units
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Product
UV Accelerated Weathering Testers
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Weice Testing Instrument Co.,Ltd.
UV accelerated weathering testers utilize fluorescent lamp to simulate the UV spectrum of sun shine, combined with temperature control, humidity system.
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Product
ESS Environment stress screening
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Temperature adaptability test under the condition of rapid change, or gradient for electrical, electronic, instruments and other products or spareparts, particularly applies to environmental stress screening test（ESS）
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Product
6TL60 Rotary Test Handler
H79006010
Test Platform
6TL60 has been designed according to the 6TL philosophy, following the concepts of flexibility, modularity and scalability, and with the aim of improving production efficiency as well as increase production capacity and reduce costs.The 6TL60 is the best production solution to automate test processes to reduce the cycle time and the footprint used in the manufacturing plan
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Product
Optical Receiver Stress Test Solution
N4917B
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The N4917B software provides an automated standard compliant stressed receiver sensitivity test according to 100GBASE-LR4, ER4 and SR4 test specification. In order to do this kind of test, several test instruments such as a bit error ratio tester, digital sampling oscilloscope, optical reference transmitter and tunable laser source are required to operate together to achieve a compliant, repeatable optical stressed eye. This stressed eye is then fed to the receiver under test, where bit error ratio is measured under the stress conditions as defined in the standard.
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Product
Automated Thermal Stress System
ATSS Series
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Thermotron's Automated Thermal Stress Systems (ATSS) facilitate extremely rapid product temperature change rates in a space-saving, self-contained design that accelerate a Thermal Stress test. Thermotron's ATSS chambers meet the latest MIL-STD 883E and MIL-STD 202F thermal shock specifications as well as JEDEC and IPC test methods. ATSS chambers are capable of the following: Rapid thermal shocking, Accelerated product stressing, Controlled thermal cycling in a self-contained, compact design. With separate hot and cold zones, the Automated Thermal Stress System was designed with a patented retractable product transfer carrier that makes full use of the available working volume in both temperature zones for increased product loading and throughput. The product transfer carrier reduces the overall height requirements of the chamber and is made as light as possible to minimize thermal loading restraints. Thermotron ATSS chambers can be used as part of most commercial reliability and quality control programs, helping to determine:
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Product
Scienlab Charging Discovery System (CDS) – High-Power Series
SL1047A
Battery Test Platform
The Scienlab Charging Discovery System – High-Power Series from Keysight enables you to test charging interfaces of electric vehicles (EVs) and EV supply equipment (EVSE) during high-power charging up to 1,500 V DC and ±600 A DC. With the CDS can perform all necessary conformance and interoperability tests according to worldwide charging standards. Our new solution, which features the separate Scienlab Cooling Unit with interchangeable liquid-cooled charging adapters, also enables a high-power upgrade of the SL1040A Scienlab Charging Discovery System - Portable Series.
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Product
Series Dual Temp / Acceleration Sensors
TA104
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Dual Temperature / Acceleration Output, Side Exit Connector / Cable, 100 mV/g, 10 mV/?C
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Product
Acceleration (Centrifuge) Testing
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Environment Associates provides centrifuge equipment for acceleration testing. Our acceleration testing equipment measures 3 ft. (0.91 m) and a 6 ft. (1.82 m) lengths that provides constant accelerations of 50 Gs and can handle payloads of 20 lbs. to 50 lbs. The Acceleration Testing is also called G-Force Testing
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Product
Seno-Con Test System
PANTHER 2K QST
Test System
Qmax Test Technologies Pvt. Ltd.
Panther 2K-QST is a versatile ultra fast Seno-Con test system designed to test high volume ,low to high pin count consumer semiconductor IC’s for its assembly line wire bonding faults. Its innovative test technology helps learn from known good device and test against target device drastically reduces time required to develop Test programs.The operating software is designed in such a way that it is fully user friendly with GUI programming.
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Product
Environmental Stress Screening (ESS) Chamber
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Guangdong Test EQ Equipment co., Ltd.
- Integral structure, the inner wall special process rolling molding, the whole using TIG seamless welding, beautiful appearance; Door lock device adopts lever power opening mechanism.- The use of Chinese+English color LCD touch man-machine interface + high-performance programmable controller (PLC), with TESTEQ test box special software, with automatic, intelligent, human control and other characteristics.- Control mode: constant operation mode, program operation mode.- Patented "Cold and heat balance technology”, low temperature constant temperature season can be more than 30%.- Refrigeration compressor and key accessories are selected international and domestic well-known brands, long-term and reliable operation; Environmentally friendly refrigerant, in line with the requirements of international environmental protection conventions.- Configure RJ45 communication interface, remote control system (open data transmission protocol support Modbus/OPC).- Surface electrostatic powder spraying; Box color "TESTEQ White ", controller panel color "TESTEQ Blue ".- TESTEQ patent cold well adsorption anti-condensation function (optional).
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Product
Photodiode Burn-in Reliability Test System
58606
Test System
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
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Product
DC Automated Accelerated Reliability Test Station (AARTS)
DC-HTOL
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The DC Automated Accelerated Reliability Test Station (AARTS) systems are designed to maximize channel density. The first systems developed by Accel-RF (ARF) were intended for RF and DC stimulus to the Device Under Test (DUT). However, there are some applications in which RF stimulus is not required.
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Product
Automated Screenshots of Webpages for Accelerated Layout Testing
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Auto-generate full-paged screenshots of your webpages across multiple devices, operating systems, browsers, and resolutions - in a single go! LambdaTest Automated Browser Screenshot feature accelerates your UI and Layout testing helping you quickly identify layout issues across browser versions and screen sizes.
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Product
Memory Test Systems
T5503HS2
Test System
Semiconductor memories are in high demand to meet the needs of fast-growing end markets such as portable electronics and servers. It has been forecasted that applications ranging from mobile devices and data centers to automobiles, gaming systems and graphics cards will consume an estimated 120 billion gigabits of DRAM capacity. To meet this market demand, new generations of memories with data-transfer speeds of 6.4 Gbps and higher are being developed. Advantest’s second-generation T5503HS2 tester is designed to handle these ultra-high-speed memory ICs.
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Product
Accelerate the Process of Evaluating
Simulia
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Powered by the Powered by the 3DEXPERIENCE® Platform, SIMULIA delivers realistic simulation applications that enable users to explore real-world behavior of product, nature and life.
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Product
EBIRST 50-pin D-type To 25-pin D-type Adapter
93-005-414
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
Accelerated Aging Testing
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Accelerated aging is a testing method used to estimate the useful lifespan of a product when actual lifespan data is unavailable. This occurs with products that have not existed long enough to have gone through their useful lifespan: for example, a new type of car engine or a new polymer for replacement joints or medical products and packaging.
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Product
Semiconductors Testing
test
Our Testers support the production lines of variety of products such as 40/100 GBps Mux/DeMux, LNA, WiMAX RF Transceivers, Microwave & Millimeter Wave components. This high reliability products are being used in (a) Networking & Communications (b) Consumer Electronics (c) Military & Space
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Product
Shear Stress Sensors
DirectShear™
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Micromachined floating element shear stress sensor that enables time-resolved, one-dimensional, direct shear stress measurements. Direct measurement of shear stress — no heat transfer calibration. Non-intrusive — minimal flow disturbance. Simultaneous mean and fluctuating shear stress measurements. High resolution, dynamic range and bandwidth. Highly accurate, quantitative measurements.
