Laser Test
-
Product
Test Solutions
-
Our range of test solutions is far reaching, comprised of off-the-shelf test instruments and interfaces, standard automated test systems, and custom solutions for test, simulation, and training. Put our E2E focus and experience to work for you with these solutions: automated test equipment, maintenance trainers, and test management software.
-
Product
Iot Test
-
According to different needs, Uni-Trend provides different product portfolios to ensure customer investment return. You can build the Internet of things at all stages of the R&D circle ensures performance, reliability and to market faster with Uni-Trend portfolio.
-
Product
Non-Destructive Tests
-
Non-destructive tests on reinforced concrete and masonry structures are the first method of investigation for verifying the real conditions of a building or structure, existing or under construction. As indicated by the anti-seismic legislation, these tests can be performed by all authorized operators.
-
Product
Wide Area Thrubeam Laser Sensor
LV-H300/100
-
Wide Area Thrubeam Laser Sensor. World's smallest size. Linear area beam (Transmitter). Light diffusion sheet (Receiver). Easy adjustment of beam axis
-
Product
Laser Type Edge Detection Sensor
LD
-
Panasonic Industrial Devices Sales Company of America
The Panasonic LD Series Laser Type Edge Detection Sensor can easily measure the outer diameter of objects. It can also sense inclines, detect the notch of a wafer and judge the height of small objects.
-
Product
Flame Testing
-
Helping you ensure acceptable flammability and flame resistance for electronic products and components.
-
Product
Test System
2000/DATS
-
WesTest Engineering Corporation
The WesTest-2000/DATS features Teradyne's high performance Digital Test Instrument and state-of-the-art intrsuments from Agilent, Elgar and North Atlantic.
-
Product
Blockchain Testing
-
ZenQ’s BlockChain Testing Centre of Excellence provides Testing services for Blockchain platforms and implementations.
-
Product
Hardness Testing
-
Wilson® hardness testers include a comprehensive range of hardness testers from Rockwell®, Knoop/Vickers, and Brinell to fully automatic production systems. Our hardness testers are complemented by a range of ISO test blocks, accessories, and fixtures. Our calibration laboratory is recognized as the global leader in the production of premium ISO test blocks and indenters.
-
Product
Modal Testing
-
We pioneered the use of random excitation for modal testing and extended the method to include multishaker random testing and polyreference data processing. We have unsurpassed experience in modal testing of aerospace and industrial systems, including large scale testing for aerospace systems with over 400 accelerometers and eight shakers.
-
Product
Photonics for Measuring Laser Output
Ray gt Photonic
-
raygt photonics for measuring laser output assist international research laboratories and laser technology manufacturers with precise positioning and output data.
-
Product
Test Management Software
ActivATE™
-
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
-
Product
Wafer Testing
Trio Vertical
-
SV TCL's TrioTM is a reliable solution for advanced wafer testing challenges, specifically full array and parallel probing. We offer a complete line of vertical probe card products, each designed for your unique application.
-
Product
Regression Testing
-
Regularly refreshing your website or app attracts new customers and keeps your existing user base engaged. But releasing new functionality and features or fixing known bugs can trigger problems in apparently unconnected areas.
-
Product
Test Devices
-
qCf - quickCONNECT - efficient, accurate, safe!Measurements on internal components of the fuel cell and electrolysis
-
Product
Testing Accessories
-
Instron has used its wealth of applications and engineering experience to produce the most extensive range of accessories for materials testing instruments in the industry. Made up of hundreds of grips, fixtures, load cells, and other accessories, our vast range of general purpose and application-focused accessories are designed to help you get the most from your materials testing system.
-
Product
3D Laser Imager
Vector-DD
-
The Vector 3D laser imager offers multi wavelength, full waveform data capture, coupled with the flexibility of an all-sky scanner. The Vector-DD is a direct detection (DD) 3D (range, angle, angle) active imager with an all-sky full hemisphere scanner. It employs a nodal point design so that all the lines-of-sight converge to a single point at the instrument*. In addition, two wavelengths can be transmitted so that differential reflectivity information can be derived. The unit is compact and portable and operates from 24V DC.
-
Product
Single Frequency CW 532 NM Laser up to 18W
EQUINOX
-
Equinox is a single frequency, 532 nm continuous wave laser designed for a range of scientific applications including pumping any Ti:Sapphire laser systems. It is engineered to meet the needs of experimentalists requiring high-performance systems with an emphasis on reliability, stability and ease of use. The laser incorporates pump diodes within the central unit and is fully automated with hands-free operation and control via ethernet, webpage and TCP/IP remote interface. This completely sealed system is inherently stable with low noise levels <0.05 % RMS and ultra-stable output powers with ±0.5 % stability. Equinox has options of high output power up to 18 W. Other major applications include mixing source, pump source for dye lasers and frequency doublers, optical tweezers, and biomedical imaging.
-
Product
Conformance Testing
Clarinet-TTCN ATM ETS
-
Protocol: UNI 3.1 ATM Layer Conformance Test Suite for End SystemsIUT: ATM Equipment UNI 3.0ATS: ATM-FORUM standards af-test-0060.000 covers the test of UNI 3.0 ATM Layer of End Systems
-
Product
Test & Calibration
-
Gamma Scientific is ISO/IEC 17025 accredited by NVLAP (NVLAP lab code 200823-0). In addition to assurance of measurement accuracy, accreditation ensures traceability to known standards, provides international acceptance of measured values, and is important for compliance purposes for your own ISO/IEC certifications. Our state-of-the-art, ISO 17025 accredited calibration laboratories in San Diego, California offer a range of test and calibration services including:
-
Product
Microwave Testing
10
-
PICOPROBE® MODEL 10 is a multipurpose, high speed, passive probe which can be used for driving as well as receiving signals. The Model 10 consists of a one meter length of flexible 50 ohm coaxial cable terminated by a carefully trimmed SMA on one end and by a miniature, high speed 50 ohm connector, specially developed to receive Model 10 replaceable coaxial probe tips, on the other. The 50 ohm coaxial cable was custom designed for Model 10 to be high speed, yet very flexible, so that moving the cable would not disturb the probe points.
-
Product
Automation Testing
-
Automated tests require a short execution time and let you avoid unwanted delays. Day or night, your automated tests will run around the clock. As a result of automation, you get a faster time to market. We automate thousands of simultaneous manual tests maximizing test coverage, and letting you lower the costs of testing in the long run.
-
Product
High Speed, Multi-Point Laser Displacement Sensor
HL-D3
-
Panasonic Industrial Devices Sales Company of America
The HL-D3 Series was developed based on a new concept of capturing the shape of objects with points instead of a line. The new Panasonic Displacement Sensors feature faster measurement, achieved by selecting only the desired sensing points; and adjustable light intensity for each sensing point, which contributes to stable, precision detection; both without compromising the Z-axis resolution. This is equivalent to the performance of 500 high-precision Displacement Sensors with a resolution of 1 μm 0.039 mil.
-
Product
Test Software
Yelo Test Environment V5.0
-
The Yelo Test Environment (YTE) is an automated test environment developed by Yelo. Test sequences can be developed for multiple products and are tailored to customer needs and specifications. Flexibility in testing is a key benefit of the YTE and is provided to the user by allowing management of test sequence order. There is also the ability for the user to change the test limits or parameters for more or less stringent testing depending on requirements.
-
-
Product
Testing Solutions
-
Within the test strategy the final functional test complements the quality strategy. Therefore meaningful results of functional tests shouldn't be focused only on good/bad selection. Goal is to get correct data for statitistics and trend analysis.Under economical point of view you should consider following points as very important in test conceptions:Stability of measurementsAccuracyand the throughput
-
Product
Amplifier Built-in Ultra-compact Laser Sensor
EX-L200
-
Panasonic Industrial Devices Sales Company of America
The EX-L200, the one of the world’s smallest Laser Sensors with a built-in amplifier, is designed to detect minute objects with utmost accuracy. Despite its miniature size, the Thru-Beam Type (EX-L211) can detect minute objects with a diameter of just 0.3mm, and the Spot Reflective Type (EX-L221) can even detect gold wire whose diameter is a mere 0.01mm. To facilitate solving application tasks, these sensors come equipped with a Potentiometer and two indicator LEDs. For the Thru-Beam Type, reflective material on the receiver allows users to visualize the laser beam, easing beam-axis alignment.
-
Product
PXI Semiconductor/IC Test System
-
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
-
Product
Physical Testing
-
Testing is confidential and can be conducted according to the client's specifications, or such Standards as MIL-202, 331, 750, 810 and 883, as well as GSA, ASTM, ISTA, BIFMA, ANSI, industry and government.
-
Product
Semiconductor Testing
-
Teradyne’s semiconductor test portfolio is transforming the way you test chipsets for automotive, industrial, communications, consumer, smartphones, and computer and electronic game applications. Semiconductor devices span a broad range of functionality, from very simple low-cost devices such as appliance microcontrollers, operational amplifiers or voltage regulators to complex digital signal processors and microprocessors as well as memory devices.
