Product

Sub-Micron Probe Positioner

QP150 Series

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Quarter Research and Development

QP150 Series - Quarter Research and Development

Quater’s new QP150 sub-micron probe positioners are designed to significantly reduce mechanical crosstalk between axes resulting in fast and accurately placed probe touchdowns with zero pad or trace damage from unwanted needle deflections. Overall ergonomic design places micrometers within a compact zone allowing users to precisely control needle direction and speed.