Highly Accelerated Life Test
Processes a product through extreme temperature, vibration and product tailored stresses to expose design limits.
See Also: HALT
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Product
EMC Actuator for Accelerator Pedal
PSE-G
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Pneumatically operated actuator for operation of accelerator handle. External set-point of the pedal actuator position via analog voltage to closed-loop pressure regulator in external valve box.
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Product
Highly Versatile Component F73306B160G300
1009659
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The F73306B160G300 is a highly versatile component belonging to the family of Basic Threaded Probes, specifically designed for reliable and efficient contact in a variety of applications. With a pitch of 4.00 mm (157 mil), this probe offers a robust solution for both low and high-density connections, ensuring excellent performance across a broad temperature range of -45°C to +100°C. Its compact dimensions enhance usability in tight spaces, making it an ideal choice for modern electronic applications where precision is key.
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Product
LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments
NI-RFmx LTE/LTE-Advanced
Test Instrument
Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism
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Product
Scienlab Battery Test System – Pack Level, 110 KW Compact Version
SL1710A
Test System
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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Product
SSD Life
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SSD Life analyzes how actively you use your solid-state drive and uses a special algorithm to calculate its estimated lifetime. Of course, the date of the lifetime expiration is corrected depending on how intensively you keep using your drive.
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Product
In-Line 2-Module In-Circuit Test System; i337x, Series 5i
E9988E
In-Circuit Test System
Short wire fixturing eliminates problems commonly found with long wire fixturing, such as noise and deterioration of test stability. This translates into transportable, repeatable and stable tests on your i3070 Series 5i, even if you need to deploy tests halfway across the globe, or on different manufacturing sites.
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Product
Spectrophotometer For Life Science
BioSpec-nano
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Capable of performing quantitation and purity checking of nucleic acids, quantitation of proteins, and photometric measurements (OD values displayed and printed for specified wavelengths, up to 8 wavelengths). Simply drop 1 to 2 μL of the sample onto the measurement window and press the instrument's Start button (or click the Start Measurement button in the software window), and all steps in the process, from setting the optical path length, measurement, up until the task of wiping off the sample from the measurement window, are all carried out automatically. Troublesome work of moving arm up and down and wiping the sample from the measurement window now unnecessary. Moreover, when using the specialized software, all it takes to perform a measurement, output a report, export data, or carry out other common tasks is to click buttons on the toolbar.
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Product
Rack based antenna test system
R&S®ATS800R CATR
Test System
Very compact far-field over-the-air (OTA) test system based on compact antenna test range (CATR) technologyUnrivaled quiet zone size within 0.8 m2 footprintState-of-the-art reflector ensuring a high quiet zone accuracyUnique rack based CATR system supporting over 50 GHzIndirect far-field method (approved by 3GPP for 5G OTA testing)
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Product
Minority Carrier Life Time System
MWR-SIM
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MWR-SIM Lifetime determination is based on measuring photoconductivity decay after pulselight photo-exciting with usage of reflected microwave as probe.It enables repetition and contactless of measurement and does not require specialsurface treatment before measurement or wafer cutting.
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Product
Linear Accelerators
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The latest interlaced dual-energy technology offers improved material discrimination, with an option to alternate X-ray energies on a pulse-to-pulse basis.
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Product
Life Science Instrumentation
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With a wide spectrum of Teledyne technologies such as high-performance cameras, sensors, automation and pumps, OEM solutions serves the vast Life Science industry in many ways.
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Product
Probe System for Life
PS4L
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The Probe System for Life, or PS4L, is SemiProbe’s patented adaptive probe system architecture. Unlike traditional probe systems, all of the basics components of our systems, including the bases, stages, chucks, microscope mounts, and manipulators, are interchangeable, upgrade-able, and configurable. The PS4L Adaptive Architecture ensures and optimal test configuration for each individual customer application.
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Product
In-Line RF Test Station
AP770
RF Test System
ICT, Functional, Hipot, Vision, ISP and RF test with low cost fixtures in a very compact test station footprint Works with PCBs up to 450×550 mm or with palletized devices Space for up to 25 VPC mass interconnect modules or YAV switching units
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Product
UV Accelerated Weathering Testers
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Weice Testing Instrument Co.,Ltd.
UV accelerated weathering testers utilize fluorescent lamp to simulate the UV spectrum of sun shine, combined with temperature control, humidity system.
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Product
High Accelerated Life Test Chamber
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Guangdong Test EQ Equipment co., Ltd.
- Rapid Temperature Cycling: Achieves rates up to 100°C/min for accelerated stress screening hass.- Multi-Axis Vibration: Combines pneumatic (6-DOF) and electrodynamic vibration for multi-stress accelerated life testing halt simulations.- Precision Control: halt process ±0.5°C temperature uniformity and real-time monitoring.- Customizable Profiles: Supports stress levels user-defined stress protocols (step-stress, dwell times).- Durability: Robust construction with corrosion-resistant materials
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Product
6TL60 Rotary Test Handler
H79006010
Test Platform
6TL60 has been designed according to the 6TL philosophy, following the concepts of flexibility, modularity and scalability, and with the aim of improving production efficiency as well as increase production capacity and reduce costs.The 6TL60 is the best production solution to automate test processes to reduce the cycle time and the footprint used in the manufacturing plan
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Product
Accelerated Stress Test Chamber
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CSZ's accelerated stress test chambers combine mechanical refrigeration; LN2 cooling and high velocity air flow for fast product temperature change rates. Chambers are typically designed with a change rate up to 30C (54F) per minute based upon the part temperature. Common uses are production stress testing circuit boards, electronic drives, assemblies, etc. Design allows the user to quickly control and change the temperature of the product.
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Product
Non-Contact Mapping Life Time System
MWR-2S-3
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The device is designed for express non-destructive contactless local measurement of non-equilibrium charge carrier effective lifetime in silicon substrates, epi-wafers and solar cells at different stages of manufacturing cycle. It can be used for incoming and outcoming inspection of silicon ingots and wafers, tuning and periodic inspection of semiconductor and solar cell technology quality. Lifetime determination is based on measuring photoconductivity decay after pulselight photo-exciting with usage of reflected microwave as a probe.
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Product
Long Life Serismic Energy Source
2800LLX
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Bolt introduced the LONG-LIFE air gun in 1992. Since then it has become the standard energy source for marine seismic exploration.
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Product
Scienlab Charging Discovery System (CDS) – High-Power Series
SL1047A
Battery Test Platform
The Scienlab Charging Discovery System – High-Power Series from Keysight enables you to test charging interfaces of electric vehicles (EVs) and EV supply equipment (EVSE) during high-power charging up to 1,500 V DC and ±600 A DC. With the CDS can perform all necessary conformance and interoperability tests according to worldwide charging standards. Our new solution, which features the separate Scienlab Cooling Unit with interchangeable liquid-cooled charging adapters, also enables a high-power upgrade of the SL1040A Scienlab Charging Discovery System - Portable Series.
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Product
Series Dual Temp / Acceleration Sensors
TA104
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Dual Temperature / Acceleration Output, Side Exit Connector / Cable, 100 mV/g, 10 mV/?C
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Product
Acceleration (Centrifuge) Testing
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Environment Associates provides centrifuge equipment for acceleration testing. Our acceleration testing equipment measures 3 ft. (0.91 m) and a 6 ft. (1.82 m) lengths that provides constant accelerations of 50 Gs and can handle payloads of 20 lbs. to 50 lbs. The Acceleration Testing is also called G-Force Testing
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Product
Seno-Con Test System
PANTHER 2K QST
Test System
Qmax Test Technologies Pvt. Ltd.
Panther 2K-QST is a versatile ultra fast Seno-Con test system designed to test high volume ,low to high pin count consumer semiconductor IC’s for its assembly line wire bonding faults. Its innovative test technology helps learn from known good device and test against target device drastically reduces time required to develop Test programs.The operating software is designed in such a way that it is fully user friendly with GUI programming.
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Product
Photodiode Burn-in Reliability Test System
58606
Test System
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
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Product
DC Automated Accelerated Reliability Test Station (AARTS)
DC-HTOL
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The DC Automated Accelerated Reliability Test Station (AARTS) systems are designed to maximize channel density. The first systems developed by Accel-RF (ARF) were intended for RF and DC stimulus to the Device Under Test (DUT). However, there are some applications in which RF stimulus is not required.
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Product
Automated Screenshots of Webpages for Accelerated Layout Testing
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Auto-generate full-paged screenshots of your webpages across multiple devices, operating systems, browsers, and resolutions - in a single go! LambdaTest Automated Browser Screenshot feature accelerates your UI and Layout testing helping you quickly identify layout issues across browser versions and screen sizes.
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Product
Memory Test Systems
T5503HS2
Test System
Semiconductor memories are in high demand to meet the needs of fast-growing end markets such as portable electronics and servers. It has been forecasted that applications ranging from mobile devices and data centers to automobiles, gaming systems and graphics cards will consume an estimated 120 billion gigabits of DRAM capacity. To meet this market demand, new generations of memories with data-transfer speeds of 6.4 Gbps and higher are being developed. Advantest’s second-generation T5503HS2 tester is designed to handle these ultra-high-speed memory ICs.
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Product
Accelerate the Process of Evaluating
Simulia
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Powered by the Powered by the 3DEXPERIENCE® Platform, SIMULIA delivers realistic simulation applications that enable users to explore real-world behavior of product, nature and life.
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Product
EBIRST 50-pin D-type To 25-pin D-type Adapter
93-005-414
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
