S-Parameters
Scattering Parameters quantifies high frequency RF power waves propagation through a network.
See Also: Vector Network Analyzers
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Product
TDR Cable Analyzer
CT100B
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The CT100B is special for two reasons: (1) It is the industry''s only high-resolution portable TDR providing step TDR impedance waveforms with resolution sufficient to show connector detail (~1 cm), and (2) it is the industry''s first portable TDR capable of making frequency domain S-parameter measurements including return loss (S11) and cable loss / insertion loss (S21). "High resolution TDR is extremely useful for detecting and localizing cable faults and characterizing cable and connector performance, but historically, portable TDRs have been unable to display OSL-calibrated S-parameter measurements," said Brandt Mohr, MOHR chief technologist. "The CT100B includes that capability, making it a very versatile instrument. If you can only carry one cable tester out into the field with you, it should be the CT100B."
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Product
S-parameter Measurement System
DPS21
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Unlike a coaxial tube type or a wave guide tube type, this method does not make errors caused by air-gap as specimens are not put into a fixture. Practical data can be obtained even at the rough, uneven surfaces where the specimen is placed on.It enables compactness and measuring specimens by plane wave because of direct installment of lens with an antenna.It enables measurement by monitoring S21 and S11 parameter with connections of a test fixture to a vector network analyzer and PC.
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Product
CTGcalc™ Software
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CTGcalc™ is a Windows application that sets up microwave network analyzers, acquires measured S-parameter data, and analyzes the acquired data for CTG’s various measurement fixtures. CTGcalc™ allows the user to extract complex dielectric permittivity, magnetic permeability, or sheet impedance of the measured specimens.
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Product
PNA-L Microwave Network Analyzer
N5234B
Network Analyzer
Perform basic analysis of passive components and simple active devices Measure S-parameters with good accuracy up to43.5 GHz in cost-sensitive applications Get the world's best price-to-performance ratio for microwave manufacturing Configure an economical solution for signal-integrity measurements and materials characterization Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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Product
Probing Solutions
ES62X-CMPS
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The ES62X-CMPS compact manual probe station is a rugged wafer probing solution designed for high reliability, compact size and low investment cost. It enables manual wafer level measurements up to 300 mm wafers. The probing station can also be used for TLP, HMM, HBM, LV-Surge, RF, S-parameter and DC-measurements. Micro positioners with vacuum as well as magnetic base can be attached. The chuck has a vacuum interface for the wafer and is electrically isolated. Multiple 4 mm connectors can be used to connect a voltage potential to the wafer backside.
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Product
Vector Network Analyzer
R42XXE
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The R42XXE Vector Network Analyzers are designed for measuring of S-parameters, VSWR and impedance of waveguide networks in the full frequency ranges of standard waveguides between 33 and 170 GHz. Frequency accuracy is ±0.2%. The measurement range of reflection factor modulus is from 0 to 1. The measurement range of reflection factor phase is from 0 to ±180° for 0.1< |Гx|<1 with accuracy ±7.5 o in 18-75 GHz frequency range and ±9.6° in 75-170 GHz frequency range. The measurement range of transmission factor phase is from 0 to ±180 o with accuracy ±(5+0.1 |Ax|) o for Ax >-50 dB in frequency range to 75 GHz, for Ax >-30 dB - to 170 GHz. Data can be displayed in the rectangular, Smith or polar diagrams. VNA requires Personal Computer with USB interface.
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Product
Signal Integrity Test Products
RoBAT RCI
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*TDR & TDT, Measurement Capabilities*Impedance, Skew, Backdrill measurements*Automated Optical Inspection*DC Electrical Test*Now available with 4 heads*24 port (1 port per channel) TDR/TDT unit*Future capabilities – Fully automated VNA test (4 port S-Parameter Measurement)
