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Product
High Parallel Test Handlers
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High parallelism test in strip or singulated device batch handling on carriers, WLCSP post singulation test.
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Product
Automatic System Function Tester
3260
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Chroma 3620 is an innovative system handler for high-volume multi-site IC testing at the system level.
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Product
High Speed Pick and Place Handler
Commander 2000
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At throughput rates in excess of 2000 Units per Hour the HT Commander 2000 system provides unparalleled performance for the production handling and programming of flash memory devices or modules.
